JPH0761894A - Method for growth control of single crystal drawing part - Google Patents
Method for growth control of single crystal drawing partInfo
- Publication number
- JPH0761894A JPH0761894A JP20628593A JP20628593A JPH0761894A JP H0761894 A JPH0761894 A JP H0761894A JP 20628593 A JP20628593 A JP 20628593A JP 20628593 A JP20628593 A JP 20628593A JP H0761894 A JPH0761894 A JP H0761894A
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- speed
- diameter
- crucible
- pulling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明はCZ法( Czochralski法
)による単結晶育成における単結晶絞り部育成制御方法
に関する。The present invention relates to the CZ method (Czochralski method).
) Relates to a method for controlling growth of a single crystal narrowed portion in growing a single crystal.
【0002】[0002]
【従来の技術】CZ法を採用する単結晶育成装置におい
ては、石英ルツボに供給させた多結晶シリコン等の原料
がヒーターによって加熱されて溶融され、この溶融した
融液(以下、メルトと称す)にワイヤー等の引上げ軸の
下端に取り付けられた種結晶が浸漬され、該引上げ軸を
回転させながらこれを所定の速度で引き上げることによ
って、種結晶の先に単結晶が育成される。2. Description of the Related Art In a single crystal growth apparatus employing the CZ method, a raw material such as polycrystalline silicon supplied to a quartz crucible is heated and melted by a heater, and a molten melt (hereinafter referred to as "melt"). A seed crystal attached to the lower end of a pulling shaft such as a wire is dipped in and is pulled at a predetermined speed while rotating the pulling shaft to grow a single crystal at the tip of the seed crystal.
【0003】ところで、CZ法では、種結晶をメルトに
浸けて単結晶の育成を開始してからの結晶の無転位化を
図るため、直径を2〜5mm程度に細く絞って絞り部を
形成する絞り工程が不可欠である。尚、絞り工程の後に
は、育成単結晶を規定直径まで徐々に広げるコーン工程
と、規定直径のまま単結晶を育成させる直胴工程と、単
結晶を切り離すときの熱応力によって単結晶にスリップ
が入るのを防ぐために単結晶の直径を徐々に細くしてい
くテール工程が実施される。By the way, in the CZ method, the diameter of the seed crystal is narrowed to about 2 to 5 mm to form a narrowed portion in order to make the crystal dislocation-free after immersing the seed crystal in the melt and starting the growth of the single crystal. The drawing process is essential. After the drawing step, a cone step of gradually expanding the grown single crystal to a specified diameter, a straight body step of growing the single crystal with the specified diameter, and a slip of the single crystal due to thermal stress when separating the single crystal. A tailing process is performed in which the diameter of the single crystal is gradually reduced to prevent entry.
【0004】而して、前記絞り工程では、単結晶絞り部
の直径は偏差0.5mm程度以下の精度で制御される必
要があり、直径を絞り過ぎると、育成単結晶がメルトか
ら切れて単結晶の育成が不可能となったり、絞り部の強
度不足のためにその後に育成される直胴部を支持できな
くなり、逆に直径が大き過ぎると、絞り部で結晶の無転
位化が十分に行なわれず、コーン部又はこれに続く直胴
部において結晶が有転位化し、単結晶の品質が低下す
る。Therefore, in the drawing step, the diameter of the single crystal drawn portion needs to be controlled with an accuracy of deviation of about 0.5 mm or less. If the diameter is too narrow, the grown single crystal is cut from the melt and the single crystal is cut. It becomes impossible to grow crystals, or it becomes impossible to support the straight body part that is to be grown thereafter due to insufficient strength of the drawing part. Conversely, if the diameter is too large, dislocation-free crystals are sufficiently formed in the drawing part. If this is not done, the crystals will have dislocations in the cone portion or in the straight body portion that follows, and the quality of the single crystal will deteriorate.
【0005】従って、単結晶絞り部の直径は高精度に制
御されねばならず、従来は結晶引上げ速度とヒーター温
度によって単結晶絞り部の直径制御がなされていた。具
体的には、単結晶の種類によって異なるが、例えば上限
値2〜3mm/min以上の速度で単結晶を引き上げる
と、単結晶に突起が生じて結晶欠陥の原因となるため、
結晶引上げ速度は2〜3mm/min以下の範囲で制御
されるが、この範囲で制御し切れない場合には、ヒータ
ー温度によっても制御していた。Therefore, the diameter of the single crystal narrowed portion must be controlled with high precision, and conventionally, the diameter of the single crystal narrowed portion was controlled by the crystal pulling speed and the heater temperature. Specifically, depending on the type of the single crystal, for example, when the single crystal is pulled at a speed of the upper limit value of 2 to 3 mm / min or more, protrusions are generated in the single crystal and cause crystal defects,
The crystal pulling rate is controlled in the range of 2 to 3 mm / min or less, but if it cannot be controlled in this range, it was also controlled by the heater temperature.
【0006】[0006]
【発明が解決しようとする課題】しかしながら、ヒータ
ー温度の制御では、メルトの表面温度が安定するまでに
10〜30minの時間を要するために制御応答性が悪
く、単結晶絞り部の直径制御性も悪くなるという問題が
あった。However, in controlling the heater temperature, it takes 10 to 30 minutes for the surface temperature of the melt to stabilize, so the control response is poor and the controllability of the diameter of the single crystal drawn portion is also poor. There was a problem of getting worse.
【0007】本発明は上記問題に鑑みてなされたもの
で、その目的とする処は、単結晶絞り部の直径制御性を
高めることができる単結晶絞り部育成制御方法を提供す
ることにある。The present invention has been made in view of the above problems, and an object of the present invention is to provide a method for controlling the growth of a single crystal drawn portion which can improve the diameter controllability of the single crystal drawn portion.
【0008】[0008]
【課題を解決するための手段】上記目的を達成すべく本
発明は、所定速度CRで回転するルツボ内の原料融液
に、引上げ軸の下端に取り付けられた種結晶を浸漬せし
め、該引上げ軸を回転させながらこれを所定の速度SE
で引上げることによって単結晶を育成させるCZ法にお
ける単結晶絞り工程において、少なくとも前記単結晶引
上げ速度SEと前記ルツボ回転速度CRをパラメータと
して単結晶絞り部の直径を制御することを特徴とする。In order to achieve the above object, the present invention is to dip a seed crystal attached to a lower end of a pulling shaft into a raw material melt in a crucible rotating at a predetermined speed CR, and to pull the pulling shaft. While rotating the
In the single crystal drawing step in the CZ method of growing a single crystal by pulling the single crystal, the diameter of the single crystal drawn portion is controlled by using at least the single crystal pulling speed SE and the crucible rotation speed CR as parameters.
【0009】[0009]
【作用】本発明によれば、単結晶絞り部の直径制御パラ
メータとして、従来のヒーター温度に代えて、制御応答
性の高いルツボ回転速度CRを用いるため、単結晶絞り
部の直径制御性が高められて単結晶育成の成功率向上が
図られる。According to the present invention, since the crucible rotation speed CR having high control response is used as the diameter control parameter of the single crystal narrowed portion, instead of the conventional heater temperature, the diameter controllability of the single crystal narrowed portion is improved. As a result, the success rate of single crystal growth can be improved.
【0010】因に、ルツボ回転速度CRを上げると、メ
ルト中心温度が下がるために単結晶絞り部の直径は大き
くなり、逆にルツボ回転速度CRを下げると、メルト中
心温度が上がるために単結晶絞り部の直径は小さくな
る。By the way, when the crucible rotation speed CR is increased, the melt center temperature is lowered, so that the diameter of the single crystal narrowed portion is increased. Conversely, when the crucible rotation speed CR is decreased, the melt center temperature is increased and the single crystal is increased. The diameter of the narrowed portion becomes smaller.
【0011】[0011]
【実施例】以下に本発明の一実施例を添付図面に基づい
て説明する。An embodiment of the present invention will be described below with reference to the accompanying drawings.
【0012】図1は本発明方法を実施するための単結晶
育成装置の概略断面図であり、図中、1はステンレス製
のチャンバーであって、該チャンバー1の内部には石英
ルツボ2がシャフト3上に取り付けられて収納されてい
る。尚、シャフト3及び石英ルツボ2は、不図示の駆動
手段によってその中心軸周りに速度CRで回転駆動され
る。FIG. 1 is a schematic sectional view of an apparatus for growing a single crystal for carrying out the method of the present invention. In the figure, 1 is a stainless steel chamber in which a quartz crucible 2 has a shaft. It is attached and stored on top of the 3rd floor. The shaft 3 and the quartz crucible 2 are rotationally driven around its central axis at a speed CR by a driving unit (not shown).
【0013】又、上記チャンバー1内の前記石英ルツボ
2の周囲にはカーボン製のヒーター4が配され、該ヒー
ター4と前記石英ルツボ2はその周囲を同じくカーボン
製の円筒状断熱部材5によって囲繞されている。A heater 4 made of carbon is arranged around the quartz crucible 2 in the chamber 1, and the heater 4 and the quartz crucible 2 are surrounded by a cylindrical heat insulating member 5 made of carbon. Has been done.
【0014】一方、チャンバー1内には、モーター6に
よって昇降される引上げ軸であるワイヤー7が垂下して
おり、該ワイヤー7の下端には保持具8を介して種結晶
9が保持されている。On the other hand, in the chamber 1, a wire 7 as a pulling shaft which is elevated and lowered by a motor 6 is hung, and a seed crystal 9 is held at a lower end of the wire 7 via a holder 8. .
【0015】又、チャンバー1の肩部に設けられた窓1
0の近傍には、育成中の単結晶の直径を光学的に測定す
るためのCCDカメラ11が設置されている。A window 1 provided on the shoulder of the chamber 1
In the vicinity of 0, a CCD camera 11 for optically measuring the diameter of the growing single crystal is installed.
【0016】次に、本単結晶育成装置の作用を説明す
る。Next, the operation of the present single crystal growing apparatus will be described.
【0017】例えば、シリコン単結晶のCZ法による育
成に際しては、チャンバー1内がArガス雰囲気の減圧
状態(例えば、内圧30mbar)に保たれ、石英ルツ
ボ2内に供給された多結晶シリコンがヒーター4によっ
て加熱されて溶融され、従って、石英ルツボ2内には多
結晶シリコンの融液(メルト)12が収容される。For example, when growing a silicon single crystal by the CZ method, the inside of the chamber 1 is kept under a reduced pressure (eg, an internal pressure of 30 mbar) in an Ar gas atmosphere, and the polycrystalline silicon supplied into the quartz crucible 2 is heated by a heater 4. The quartz crucible 2 is heated and melted by the, so that a melt 12 of polycrystalline silicon is contained in the quartz crucible 2.
【0018】次に、モーター6が駆動されてワイヤー7
が下げられると、該ワイヤー7の下端に保持された種結
晶9が石英ルツボ2内のメルト12に浸漬され、石英ル
ツボ2がシャフト3と共に図示矢印方向(時計方向)に
速度CRで回転駆動されると同時に、種結晶9も図示矢
印方向(反時計方向)に速度SRで回転されながら所定
の速度SEで引き上げられると、種結晶9の先には図示
のように単結晶13が成長する。Next, the motor 6 is driven to drive the wire 7
When the temperature is lowered, the seed crystal 9 held at the lower end of the wire 7 is immersed in the melt 12 in the quartz crucible 2, and the quartz crucible 2 is rotationally driven together with the shaft 3 in the direction of the arrow (clockwise direction) at a speed CR. At the same time, when the seed crystal 9 is also pulled at a predetermined speed SE while being rotated at a speed SR in the direction of the arrow (counterclockwise direction) in the drawing, a single crystal 13 grows on the tip of the seed crystal 9 as shown in the drawing.
【0019】ところで、CZ法においては、種結晶9を
メルト12に浸けて単結晶13の育成を開始してからの
該単結晶13の無転位化を図るため、直径を2〜5mm
程度に細く絞って絞り部を形成する絞り工程が不可欠で
あり、前述のように絞り部の直径は高精度に制御される
必要がある。By the way, in the CZ method, the seed crystal 9 is dipped in the melt 12 and the growth of the single crystal 13 is started.
A drawing process of forming a narrowed portion by narrowing down to a certain degree is indispensable, and as described above, the diameter of the narrowed portion needs to be controlled with high accuracy.
【0020】ここで、本発明に係る単結晶絞り部の直径
制御方法を図2乃至図4に基づいて説明する。尚、図2
は単結晶絞り部の直径制御手順を示すフローチャート、
図3及び図4は結晶引上げ速度SEとルツボ回転速度C
Rの経時変化を示す図である。Now, a method of controlling the diameter of the single crystal narrowed portion according to the present invention will be described with reference to FIGS. 2 to 4. Incidentally, FIG.
Is a flow chart showing the diameter control procedure of the single crystal drawing portion,
3 and 4 show the crystal pulling speed SE and the crucible rotation speed C.
It is a figure which shows the time-dependent change of R.
【0021】本実施例では、直径制御パラメータとし
て、結晶引上げ速度SE、ルツボ回転速度CR及び時間
を用いており、ヒーター4の温度は一定に保たれてい
る。In this embodiment, the crystal pulling speed SE, the crucible rotation speed CR and the time are used as the diameter control parameters, and the temperature of the heater 4 is kept constant.
【0022】絞り工程が開始されると(図2のSTEP
1)、ルツボ回転速度CRは初期値(CR)O =14r
pmに設定され、前記CCDカメラ11によって測定さ
れる単結晶絞り部の直径に応じて結晶引上げ速度SEが
0.25〜2mm/minの範囲で制御される(図2の
STEP2)。即ち、単結晶絞り部の直径が設定値よりも大
きくなれば、引上げ速度SEが上げられ、逆に単結晶絞
り部の直径が設定値よりも小さくなれば、引上げ速度S
Eが下げられる。When the drawing process is started (STEP in FIG. 2)
1), crucible rotation speed CR is initial value (CR) O = 14r
The crystal pulling speed SE is set in the range of 0.25 to 2 mm / min according to the diameter of the single crystal diaphragm portion measured by the CCD camera 11 (see FIG. 2).
STEP 2). That is, if the diameter of the single crystal drawn portion is larger than the set value, the pulling speed SE is increased, and conversely, if the diameter of the single crystal drawn portion is smaller than the set value, the pulling speed S is set.
E can be lowered.
【0023】而して、本実施例では、結晶引上げ速度S
Eの下限設定値(SE)MIN として0.4mm/mi
n、上限設定値(SE)MAX として1.9mm/min
が設定されており、引上げ速度SEが(SE)MIN 〜
(SE)MAX (0.4〜1.9mm/min)の範囲を
逸脱した状態が所定時間継続する毎にルツボ回転速度C
Rを1rpmずつ増減する制御がなされる。Thus, in this embodiment, the crystal pulling speed S
0.4 mm / mi as the lower limit set value (SE) MIN of E
n, upper limit set value (SE) MAX as 1.9 mm / min
Is set, and the pulling speed SE is (SE) MIN ~
(SE) The crucible rotation speed C every time the state deviating from the range of MAX (0.4 to 1.9 mm / min) continues for a predetermined time.
Control for increasing / decreasing R by 1 rpm is performed.
【0024】即ち、単結晶絞り部の長さが設定長さ(絞
り部直径の10倍以上の長さ)に達しない間(図2のST
EP3)に、メルト12の温度が高いために絞り部の直径
が小さくなり、そのために単結晶引上げ速度SEが下限
設定値(SE)MIN (=0.4mm/min)以下とな
る状態(SE≦(SE)MIN )が40sec間継続する
と、図3に示すように、その時点でルツボ回転速度CR
が1rpm上げられ(図2のSTEPP4,5)、例えばC
R=15rpmに設定され、その状態が更に120se
c間継続すれば、その時点でルツボ回転速度CRが更に
1rpm上げられ(図2のSTEP6,7)、例えばCR=
16rpmに設定される。このようにルツボ回転速度C
Rが上げられると、メルト12の中心温度が下がり、絞
り部の直径は大きくなる側に制御される。That is, while the length of the single crystal narrowing portion does not reach the set length (10 times or more the diameter of the narrowing portion) (ST of FIG. 2).
In EP3), the diameter of the narrowed portion becomes small because the temperature of the melt 12 is high, and as a result, the single crystal pulling speed SE is below the lower limit set value (SE) MIN (= 0.4 mm / min) (SE ≦ If (SE) MIN ) continues for 40 seconds, as shown in FIG.
Is increased by 1 rpm (STEP P4, 5 in FIG. 2), for example C
R = 15 rpm and the state is further 120 sec
If it continues for c times, the crucible rotation speed CR is further increased by 1 rpm at that point (STEPs 6 and 7 in FIG. 2), for example, CR =
It is set to 16 rpm. Thus, the crucible rotation speed C
When R is increased, the central temperature of the melt 12 is decreased and the diameter of the narrowed portion is controlled to be increased.
【0025】又、逆にメルト12の温度が低いために絞
り部の直径が大きくなり、そのために単結晶引上げ速度
SEが上限設定値(SE)MAX (=1.9mm/mi
n)以上となる状態(SE≧(SE)MAX )が210s
ec間継続すれば、図4に示すように、その時点でルツ
ボ回転速度CRが1rpm下げられ(図2のSTEP8,
9)、例えばCR=13rpm(図2のSTEP4,6での
判断結果が何れもNOである場合)に設定され、その状
態が更に420sec間継続すれば、その時点でルツボ
回転速度CRが更に1rpm下げられ(図2のSTEP1
0,11)、例えばCR=12rpm(図2のSTEP4,
6での判断結果が何れもNOである場合)に設定され
る。このようにルツボ回転速度CRが下げられると、メ
ルト12の中心温度が上がり、絞り部の直径は小さくな
る側に制御される。尚、図2のSTEP4,6及びSTEP8,
10の判断結果(YES又はNO)の組み合せにより、
ルツボ回転速度CRは、初期値(CR)O ±2rpm
(12〜16rpm)の範囲で増減される。On the contrary, since the temperature of the melt 12 is low, the diameter of the narrowed portion is large, which causes the single crystal pulling speed SE to be the upper limit set value (SE) MAX (= 1.9 mm / mi).
n) or more (SE ≧ (SE) MAX ) is 210s
If it continues for ec, as shown in FIG. 4, the crucible rotation speed CR is reduced by 1 rpm at that time (STEP8 of FIG. 2,
9), for example, CR = 13 rpm (when the judgment results in STEP4 and STEP6 in FIG. 2 are both NO), and if that state continues for a further 420 seconds, the crucible rotation speed CR will further increase by 1 rpm. Lowered (STEP 1 in Figure 2
0, 11), for example CR = 12 rpm (STEP 4,
6) is set to NO). When the crucible rotation speed CR is lowered in this way, the central temperature of the melt 12 rises and the diameter of the throttle portion is controlled to the smaller side. In addition, STEP4, 6 and STEP8 of FIG.
By combining the 10 judgment results (YES or NO),
Crucible rotation speed CR is initial value (CR) O ± 2 rpm
It is increased or decreased within the range of (12 to 16 rpm).
【0026】以上のように、本実施例においては、単結
晶絞り部の直径制御パラメータとして、従来のヒーター
温度に代えて、制御応答性の高いルツボ回転速度CRを
用いるため、単結晶絞り部の直径制御性が高められて単
結晶育成の成功率向上が図られる。As described above, in this embodiment, since the crucible rotation speed CR having high control response is used as the diameter control parameter of the single crystal narrowed portion, instead of the conventional heater temperature, the single crystal narrowed portion is controlled. The diameter controllability is improved and the success rate of single crystal growth is improved.
【0027】[0027]
【発明の効果】以上の説明で明らかな如く、本発明によ
れば、所定速度CRで回転するルツボ内の原料融液に、
引上げ軸の下端に取り付けられた種結晶を浸漬せしめ、
該引上げ軸を回転させながらこれを所定の速度SEで引
上げることによって単結晶を育成させるCZ法における
単結晶絞り工程において、少なくとも前記単結晶引上げ
速度SEと前記ルツボ回転速度CRをパラメータとして
単結晶絞り部の直径を制御するようにしたため、単結晶
絞り部の直径制御性を高めることができるという効果が
得られる。As is apparent from the above description, according to the present invention, the raw material melt in the crucible rotating at the predetermined speed CR is
Immerse the seed crystal attached to the lower end of the pulling shaft,
In the single crystal drawing step in the CZ method for growing a single crystal by pulling it at a predetermined speed SE while rotating the pulling shaft, at least the single crystal pulling speed SE and the crucible rotation speed CR are used as parameters. Since the diameter of the narrowed portion is controlled, there is an effect that the diameter controllability of the single crystal narrowed portion can be enhanced.
【図1】本発明方法を実施するための単結晶育成装置の
概略断面図である。FIG. 1 is a schematic cross-sectional view of a single crystal growth apparatus for carrying out the method of the present invention.
【図2】単結晶絞り部の直径制御手順を示すフローチャ
ートである。FIG. 2 is a flowchart showing a diameter control procedure of a single crystal drawing portion.
【図3】結晶引上げ速度SEとルツボ回転速度CRの経
時変化を示す図である。FIG. 3 is a diagram showing changes over time in a crystal pulling speed SE and a crucible rotation speed CR.
【図4】結晶引上げ速度SEとルツボ回転速度CRの経
時変化を示す図である。FIG. 4 is a diagram showing changes over time in a crystal pulling speed SE and a crucible rotation speed CR.
2 石英ルツボ(ルツボ) 7 ワイヤー(引上げ軸) 9 種結晶 12 メルト(原料融液) 13 単結晶 CR ルツボ回転速度 SE 単結晶引上げ速度 (SE)MAX 結晶引上げ速度の上限設定値 (SE)MIN 結晶引上げ速度の下限設定値2 Quartz crucible (crucible) 7 Wire (pulling shaft) 9 Seed crystal 12 Melt (melt of raw material) 13 Single crystal CR crucible rotation speed SE Single crystal pulling speed (SE) MAX Set upper limit of crystal pulling speed (SE) MIN crystal Lower limit setting value of pulling speed
フロントページの続き (72)発明者 吉田 道明 群馬県安中市磯部2丁目13番1号信越半導 体株式会社磯部工場内 (72)発明者 茂木 公夫 群馬県安中市磯部2丁目13番1号信越半導 体株式会社磯部工場内Front page continued (72) Inventor Michiaki Yoshida 2-13-1, Isobe, Annaka-shi, Gunma Shin-Etsu Semiconductor Co., Ltd. Isobe Factory (72) Inventor Kimio Mogi 2-13-1, Isobe, Gunma Prefecture Shin-Etsu Semiconductor Co., Ltd.
Claims (2)
融液に、引上げ軸の下端に取り付けられた種結晶を浸漬
せしめ、該引上げ軸を回転させながらこれを所定の速度
SEで引上げることによって単結晶を育成させるCZ法
における単結晶絞り工程において、少なくとも前記単結
晶引上げ速度SEと前記ルツボ回転速度CRをパラメー
タとして単結晶絞り部の直径を制御することを特徴とす
る単結晶絞り部育成制御方法1. A seed crystal attached to a lower end of a pulling shaft is immersed in a raw material melt in a crucible rotating at a predetermined speed CR, and the seed crystal is pulled up at a predetermined speed SE while rotating the pulling shaft. In the single crystal drawing step in the CZ method of growing a single crystal by means of the above method, the diameter of the single crystal drawing part is controlled by using at least the single crystal pulling speed SE and the crucible rotation speed CR as parameters. Control method
設定値(SE)MIN以下の状態が所定時間継続する毎に
前記ルツボ回転速度CRを上げ、同単結晶引上げ速度S
Eが所定の上限設定値(SE)MAX 以上の状態が所定時
間継続する毎にルツボ回転速度CRを下げることを特徴
とする請求項1記載の単結晶絞り部育成制御方法。2. The crucible rotation speed CR is increased every time the single crystal pulling speed SE is equal to or lower than a predetermined lower limit set value (SE) MIN for a predetermined time, and the single crystal pulling speed S is increased.
The method for controlling growth of a single crystal drawn portion according to claim 1, wherein the crucible rotation speed CR is lowered every time a state where E is equal to or larger than a predetermined upper limit set value (SE) MAX continues for a predetermined time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20628593A JPH0761894A (en) | 1993-08-20 | 1993-08-20 | Method for growth control of single crystal drawing part |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20628593A JPH0761894A (en) | 1993-08-20 | 1993-08-20 | Method for growth control of single crystal drawing part |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0761894A true JPH0761894A (en) | 1995-03-07 |
Family
ID=16520783
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20628593A Pending JPH0761894A (en) | 1993-08-20 | 1993-08-20 | Method for growth control of single crystal drawing part |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0761894A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102409397A (en) * | 2011-12-06 | 2012-04-11 | 江西旭阳雷迪高科技股份有限公司 | Monocrystalline silicon rod drawing process |
-
1993
- 1993-08-20 JP JP20628593A patent/JPH0761894A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102409397A (en) * | 2011-12-06 | 2012-04-11 | 江西旭阳雷迪高科技股份有限公司 | Monocrystalline silicon rod drawing process |
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