JPH0784281A - Active element - Google Patents
Active elementInfo
- Publication number
- JPH0784281A JPH0784281A JP22913593A JP22913593A JPH0784281A JP H0784281 A JPH0784281 A JP H0784281A JP 22913593 A JP22913593 A JP 22913593A JP 22913593 A JP22913593 A JP 22913593A JP H0784281 A JPH0784281 A JP H0784281A
- Authority
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- Prior art keywords
- ferroelectric
- active layer
- substance
- electrode
- active
- Prior art date
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Abstract
(57)【要約】
【目的】二つの電極に強誘電体のアクティブ層が挟まれ
た構造のアクティブ素子において、電極とアクティブ層
の剥離が抑制された信頼性の高い素子を提供する。
【構成】アクティブ層を二層の強誘電体膜で構成し、一
方の強誘電体膜をもう一方の強誘電体膜より導電性の高
い材料で形成する。この構成により、導電性の高い膜の
側に印加される電界を小さくし、この層においては分極
反転が発生しないようにする。こうして、素子の動作中
における電極とアクティブ層の歪の発生を抑制する。
(57) [Summary] [PROBLEMS] To provide a highly reliable active element having a structure in which a ferroelectric active layer is sandwiched between two electrodes, in which peeling between the electrode and the active layer is suppressed. [Structure] The active layer is composed of two layers of ferroelectric films, and one ferroelectric film is formed of a material having higher conductivity than the other ferroelectric film. With this configuration, the electric field applied to the side of the highly conductive film is reduced, and polarization inversion does not occur in this layer. In this way, the occurrence of strain in the electrodes and the active layer during the operation of the device is suppressed.
Description
【0001】[0001]
【産業上の利用分野】本発明は表示装置等のスイッチン
グ素子に用いられる非線形素子に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a non-linear element used as a switching element of a display device or the like.
【0002】[0002]
【従来の技術】表示装置等のスイッチング素子に用いら
れるアクティブ素子は、概ね二つの電極膜の間にアクテ
ィブ層を設けた構成を成し、特に、このアクティブ層に
強誘電体を用いたアクティブ素子は、以下に示すような
理由から、多用され、盛んに研究が行われている。2. Description of the Related Art An active element used as a switching element of a display device or the like has a structure in which an active layer is provided between two electrode films, and in particular, an active element using a ferroelectric substance in this active layer. Has been extensively used and actively researched for the following reasons.
【0003】図4にアクティブ素子の基本的な構造を示
す。このアクティブ素子は、図4に示すように、絶縁性
の基板21上に第1の電極22が形成されており、この
第1の電極22を覆って、アクティブ層23として強誘
電体膜が形成されている。この強誘電体膜上に第2の電
極24が形成されており、第1の電極22、アクティブ
層23(強誘電体膜)、第2の電極24がともに交差す
る部分で素子を構成する。このような構造のアクティブ
素子に電界を加えると、アクティブ層である強誘電体の
表面には電荷が誘起される。この強誘電体表面に誘起さ
れる電荷の単位面積当りの量を電気変位という。FIG. 4 shows the basic structure of an active element. In this active element, as shown in FIG. 4, a first electrode 22 is formed on an insulating substrate 21, and a ferroelectric film is formed as an active layer 23 so as to cover the first electrode 22. Has been done. The second electrode 24 is formed on the ferroelectric film, and the element is constituted by a portion where the first electrode 22, the active layer 23 (ferroelectric film) and the second electrode 24 intersect each other. When an electric field is applied to the active element having such a structure, electric charges are induced on the surface of the ferroelectric substance which is the active layer. The amount of electric charge induced on the surface of the ferroelectric substance per unit area is called electric displacement.
【0004】図5に、強誘電体に印加される電界と電気
変位の関係を示す。図において、横軸に強誘電体に印加
する電界E、縦軸に強誘電体表面に生ずる電気変位Dを
示す。FIG. 5 shows the relationship between the electric field applied to the ferroelectric substance and the electric displacement. In the figure, the horizontal axis shows the electric field E applied to the ferroelectric substance, and the vertical axis shows the electric displacement D generated on the surface of the ferroelectric substance.
【0005】強誘電体に電界Eを印加し、電界Eを0か
ら次第に強くして行き、その都度、電気変位Dを測定し
て行くと、図のOAの曲線に沿って変化するが、ある値
以上に電界Eを強くしても電気変位は増加しなくなり、
電気変位Dは飽和点Aに達する。この電気変位Dの飽和
点Aから電界Eを減らして0にしても、電気変位Dは0
とならず、強誘電体表面に電荷が残る。この強誘電体表
面に残留する電荷が残留分極PRである。電界Eが0の
この状態から逆方向に電界Eを印加して行くと、電界E
の値が(−EC)になって初めて電気変位Dが0にな
る。このときの電界Eの値|EC|を抗電界ECといい、
電気変位Dを保つ度合を示す。さらに進んで電界Eを印
加して行くと電気変位Dは図の−ECBの曲線に沿って
変化し、逆方向の飽和点Bに達する。この飽和点Bから
逆向きに電界Eを減らしていくと、このときも電界Eが
0になっても電気変位Dは0にはならず、逆符号の電荷
が残留分極−PRとして残る。このグラフの位置から、
最初の向きの電界Eを加えて行くと、電界Eが(EC)
の値になって初めて電気変位Dが0になる。このときの
電界Eの値も抗電界ECという。電界Eをさらに強めて
行くと、電気変位Dは図のECAの曲線に沿って変化
し、先述の電気変位Dの飽和点Aに達する。このよう
に、強誘電体はそれに印加される電界Eと電気変位Dと
の間に図のようなヒステリシス特性を示す。ここで、電
気変位Dは強誘電体の結晶構造における自発分極(強誘
電分極)と、強誘電体に印加する電界Eの強度に比例し
た分極(常誘電分極)との和として観測される。残留分
極PRは、印加する電界Eが0の時の自発分極を表すこ
とになる。(実際の強誘電体では、強誘電体の結晶構造
に於ける自発分極は完全でないので、残留分極PRは、
印加する電界Eが0の時の理論上の自発分極PSよりは
小さくなる。) このような挙動を示す強誘電体をアクティブ層に有する
アクティブ素子においては、アクティブ層23に抗電界
EC以上の電界を加えると、強誘電体内の分子の自発分
極の反転が起こる。自発分極の反転が起こると分極反転
電流が発生する。強誘電体をアクティブ層23に有する
アクティブ素子では、この分極反転電流を電気的に読み
出すことによってスイッチング動作を行わせる。When the electric field E is applied to the ferroelectric substance and the electric field E is gradually increased from 0 and the electric displacement D is measured each time, the electric field E changes along the curve OA in the figure. Even if the electric field E is made stronger than the value, the electric displacement does not increase,
The electric displacement D reaches the saturation point A. Even if the electric field E is reduced from the saturation point A of the electric displacement D to 0, the electric displacement D becomes 0.
However, electric charges remain on the surface of the ferroelectric substance. The electric charge remaining on the surface of the ferroelectric substance is the remanent polarization P R. When the electric field E is applied in the opposite direction from this state where the electric field E is 0, the electric field E
The electric displacement D becomes 0 only when the value of becomes (-E C ). The value of the electric field E at this time | E C | is called the coercive electric field E C ,
The degree of maintaining the electric displacement D is shown. It goes further electric displacement D when going by applying an electric field E varies along the curve of -E C B of FIG reach the reverse saturation point B. When the electric field E is reduced in the opposite direction from the saturation point B, the electric displacement D does not become 0 even when the electric field E becomes 0 at this time, and the electric charge of the opposite sign remains as the residual polarization −P R. From the position of this graph,
When the electric field E in the first direction is added, the electric field E becomes (E C )
The electric displacement D becomes 0 only when the value becomes. The value of the electric field E at this time is also called a coercive electric field E C. When the electric field E is further strengthened, the electric displacement D changes along the curve E C A in the figure and reaches the saturation point A of the electric displacement D described above. Thus, the ferroelectric exhibits a hysteresis characteristic as shown between the electric field E applied to it and the electric displacement D. Here, the electric displacement D is observed as the sum of the spontaneous polarization (ferroelectric polarization) in the crystal structure of the ferroelectric substance and the polarization (paraelectric polarization) proportional to the strength of the electric field E applied to the ferroelectric substance. The remanent polarization P R represents the spontaneous polarization when the applied electric field E is zero. (In an actual ferroelectric substance, the spontaneous polarization in the crystal structure of the ferroelectric substance is not perfect, so the remanent polarization P R is
It is smaller than the theoretical spontaneous polarization P S when the applied electric field E is 0. In an active element having a ferroelectric substance having such behavior in the active layer, when an electric field higher than the coercive electric field E C is applied to the active layer 23, the spontaneous polarization of molecules in the ferroelectric substance is inverted. When the spontaneous polarization is inverted, a polarization inversion current is generated. In the active element having the ferroelectric layer in the active layer 23, the switching operation is performed by electrically reading the polarization inversion current.
【0006】また、この強誘電体の自発分極の反転は、
一旦、反転が起こると、次に逆方向の抗電界EC以上の
大きさの電界Eが印加されるまで保持される。すなわ
ち、メモリ性を有する。それ故、この強誘電体のメモリ
性を利用して、強誘電体をアクティブ層に有するアクテ
ィブ素子を、例えば、単純マトリクス型の液晶表示装置
のスイッチング素子に用いた場合、点灯時と非点灯時の
印加電圧を抗電界ECを境とする電圧に設定しておけ
ば、非点灯時に液晶に電圧が印加されることがなく、ク
ロストークのない表示が可能となる。また、液晶に印加
される点灯時と非点灯時の電圧の差を大きく、確実に保
てるので残像の発生もほぼ解消され良好な表示を得るこ
とができる。The reversal of the spontaneous polarization of this ferroelectric substance is
Once the reversal occurs, the electric field E having a magnitude equal to or larger than the coercive electric field E C in the opposite direction is maintained. That is, it has a memory property. Therefore, when an active element having a ferroelectric substance in an active layer is used as a switching element of a simple matrix type liquid crystal display device by utilizing the memory property of the ferroelectric substance, it can be turned on and off. If the voltage applied to the liquid crystal is set to a voltage with the coercive electric field E C as a boundary, no voltage is applied to the liquid crystal when it is not lit, and display without crosstalk is possible. Further, since the difference between the voltages applied to the liquid crystal when the light is turned on and when the light is not turned on is large and can be reliably maintained, the occurrence of an afterimage is almost eliminated and a good display can be obtained.
【0007】アクティブ層に強誘電体を用いたアクティ
ブ素子としては、この強誘電体としてチタン酸ジルコン
酸ランタン鉛を用い、これを液晶表示装置のスイッチン
グ素子に応用したものがMolec.Clyst.Li
q.Clyst.,15,95,(1971)に紹介さ
れている。As an active element using a ferroelectric material for an active layer, lead lanthanum zirconate titanate is used as the ferroelectric material, which is applied to a switching element of a liquid crystal display device by Molec. Clyst. Li
q. Clyst. , 15, 95, (1971).
【0008】また、ポリフッ化ビニリデン−トリフロロ
エチレン共重合体をアクティブ層に用いて、同じく液晶
表示装置のスイッチング素子に応用したものがProc
eeding S.I.D.91,p18(1991)
に紹介されている。ポリフッ化ビニリデン−トリフロロ
エチレン共重合体等の高分子強誘電体を用いたものは抗
電界の安定性、素子の作製プロセスの容易さといった利
点があり、盛んに研究されている。Also, a polyvinylidene fluoride-trifluoroethylene copolymer is used as an active layer and is also applied to a switching element of a liquid crystal display device as Proc.
Seeding S. I. D. 91, p18 (1991)
Have been introduced to. Those using a polymer ferroelectric such as polyvinylidene fluoride-trifluoroethylene copolymer have advantages such as stability of coercive electric field and easiness of manufacturing process of an element, and have been actively studied.
【0009】[0009]
【発明が解決しようとする課題】しかしながら、強誘電
体をアクティブ層に用いたアクティブ素子においては、
強誘電体が圧電性を有するので、分極反転によって体積
が変化し、長時間の使用の内に強誘電体に接して形成さ
れた電極膜が剥離するという問題がある。However, in an active element using a ferroelectric substance as an active layer,
Since the ferroelectric substance has piezoelectricity, there is a problem that the volume changes due to polarization reversal and the electrode film formed in contact with the ferroelectric substance peels off during long-term use.
【0010】本発明は、強誘電体をアクティブ層に用い
たアクティブ素子における電極膜剥離の問題を解決し、
信頼性の高い強誘電体アクティブ素子を提供することに
ある。The present invention solves the problem of electrode film peeling in an active element using a ferroelectric as an active layer,
It is to provide a highly reliable ferroelectric active device.
【0011】[0011]
【課題を解決するための手段】本発明のアクティブ素子
は、第1の電極と第2の電極との間にアクティブ層を有
するアクティブ素子であって、該アクティブ層が強誘電
体で形成され、該強誘電体中に該強誘電体の導電率を大
きくする物質を含有するアクティブ素子であって、その
ことにより、上記目的が達成される。An active element of the present invention is an active element having an active layer between a first electrode and a second electrode, the active layer being formed of a ferroelectric material. An active element containing a substance for increasing the electric conductivity of the ferroelectric substance in the ferroelectric substance, whereby the above object is achieved.
【0012】好ましくは、前記強誘電体中に有機化合物
を含有する。[0012] Preferably, the ferroelectric contains an organic compound.
【0013】好ましくは、前記有機化合物がポリフッ化
ビニリデン、ポリフッ化ビニル、トリフロロエチレン、
テトラフロロエチレン、ナイロンの内の少なくとも一つ
をモノマー単位として含有する。Preferably, the organic compound is polyvinylidene fluoride, polyvinyl fluoride, trifluoroethylene,
It contains at least one of tetrafluoroethylene and nylon as a monomer unit.
【0014】ある実施例では、前記アクティブ層を第1
の強誘電体膜と該第1の強誘電体膜より導電率の大きい
第2の強誘電体膜の二層構造とする。In one embodiment, the active layer is a first layer.
And a second ferroelectric film having a conductivity higher than that of the first ferroelectric film.
【0015】ある実施例では、前記強誘電体の導電率を
大きくする物質の濃度を前記強誘電体の厚み方向に変化
させる。In one embodiment, the concentration of the substance that increases the conductivity of the ferroelectric substance is changed in the thickness direction of the ferroelectric substance.
【0016】[0016]
【作用】本発明のアクティブ素子は第1の電極と第2の
電極とを有し、両電極の間に強誘電体で形成されたアク
ティブ層を有するアクティブ素子であって、このアクテ
ィブ層を、強誘電体の表層にその導電率を大きくする物
質を含有させた一層構造で形成するか、または、一つの
強誘電体膜と導電性物質を含有したもう一つの強誘電体
膜の二層構造で形成する。この構成により、アクティブ
層の導電率の大きくなった部分でアクティブ層に印加さ
れる電界を小さくする。このことにより、アクティブ層
の導電率の大きい部分では分極反転が起こらず、アクテ
ィブ層の体積変化が抑制されるので電極−アクティブ層
間の歪が小さくなる。The active element of the present invention is an active element having a first electrode and a second electrode, and an active layer formed of a ferroelectric material between the two electrodes. The ferroelectric layer is formed in a single-layer structure in which a substance that increases the conductivity is contained in the surface layer, or a two-layer structure in which one ferroelectric film and another ferroelectric film containing a conductive substance are formed. To form. With this configuration, the electric field applied to the active layer is reduced in the portion where the conductivity of the active layer is high. As a result, polarization reversal does not occur in the portion where the conductivity of the active layer is large, and the volume change of the active layer is suppressed, so that the strain between the electrode and the active layer is reduced.
【0017】[0017]
【実施例】以下、本発明の実施例を説明する。本実施例
によって本発明が限定されるものではない。図1およ
び、図2に本実施例に係るアクティブ素子の構造を示
す。EXAMPLES Examples of the present invention will be described below. The present invention is not limited to the embodiments. 1 and 2 show the structure of the active element according to this embodiment.
【0018】このアクティブ素子は、図1に示すよう
に、絶縁性の基板1上に第1の電極2が形成されてお
り、この第1の電極2を覆って、第1の強誘電体膜4が
形成されている。この第1の強誘電体膜4を覆って第2
の強誘電体膜5が形成されており、第1の強誘電体膜4
と第2の強誘電体膜5の二層構造がこのアクティブ素子
のアクティブ層3である。この第2の強誘電体膜5上に
第2の電極6が形成されており、第1の電極2、第1の
強誘電体膜4、第2の強誘電体膜5、第2の電極6がと
もに交差する部分が素子の機能を果たす。このような素
子は以下のようにして作製される。In this active element, as shown in FIG. 1, a first electrode 2 is formed on an insulating substrate 1, and a first ferroelectric film is formed so as to cover the first electrode 2. 4 are formed. The second ferroelectric film 4 is covered with the second ferroelectric film 4.
Of the first ferroelectric film 4 is formed.
The two-layer structure of the second ferroelectric film 5 and the second ferroelectric film 5 is the active layer 3 of this active element. The second electrode 6 is formed on the second ferroelectric film 5, and the first electrode 2, the first ferroelectric film 4, the second ferroelectric film 5 and the second electrode are formed. The part where 6 intersects together functions as an element. Such an element is manufactured as follows.
【0019】まず、ガラス、石英、樹脂、シリコン、セ
ラミクス等を用いた絶縁性の基板1表面上にタンタル
(Ta)やチタン(Ti)等の導電材料を用いて第1の
電極2用の薄膜を形成する。この第1の電極2用の導電
材としては、他に、ニオブ、アルミニウム、モリブデ
ン、銅、インジウム錫酸化物(ITO)等を用いること
ができる。薄膜形成法としては、スパッタリング、電子
ビーム蒸着、熱蒸着等の方法を用いることができる。こ
の薄膜に対し、フォトリソグラフィ、マスクデボ等の公
知の技術で所定の形状にパターニングして第1の電極2
を形成する。First, a thin film for the first electrode 2 is formed by using a conductive material such as tantalum (Ta) or titanium (Ti) on the surface of an insulating substrate 1 made of glass, quartz, resin, silicon, ceramics or the like. To form. As the conductive material for the first electrode 2, niobium, aluminum, molybdenum, copper, indium tin oxide (ITO) or the like can be used. As the thin film forming method, a method such as sputtering, electron beam evaporation, or thermal evaporation can be used. The thin film is patterned into a predetermined shape by a known technique such as photolithography and mask devotion, and the first electrode 2
To form.
【0020】次に、この第1の電極2を覆って、第1の
強誘電体膜4を形成する。強誘電体膜の材料としては、
チタン酸バリウム、ジルコン酸チタン酸鉛、ジルコン酸
チタン酸ランタン鉛等の無機強誘電体や、ポリフッ化ビ
ニリデン、ポリフッ化ビニリデン/トリフロロエチレン
共重合体、ポリフッ化ビニリデン/テトラフロロエチレ
ン共重合体、ポリシアン化ビニリデン/酢酸エチル共重
合体、ポリアクリロニトリル、奇数ナイロン、強誘電性
液晶、強誘電性液晶高分子等の有機強誘電体のいずれで
もよく、あるいは、これらの混合物でもよいが、本実施
例では作製工程中の基板の耐熱性、作製の容易さといっ
た観点から、ポリフッ化ビニリデン/トリフロロエチレ
ン共重合体を用いた。このポリフッ化ビニリデン/トリ
フロロエチレン共重合体は3%のメチルエチルケトン溶
液とし、スピンコートによって形成した。2000rp
mの回転速度の塗布により、200nmの膜厚を得た。
このようにして形成したポリフッ化ビニリデン/トリフ
ロロエチレン共重合体の薄膜を140℃のクリーンオー
ブンで30分間焼成した後、50℃/時の速度で降温し
た。ポリフッ化ビニリデン/トリフロロエチレン共重合
体は特別な処理を施さなくても強誘電性を発現するが、
ポーリングやせん断応力を加えることによって強制的に
強誘電性を発現させることもできる。Next, a first ferroelectric film 4 is formed so as to cover the first electrode 2. As the material of the ferroelectric film,
Inorganic ferroelectrics such as barium titanate, lead zirconate titanate, lead lanthanum zirconate titanate, polyvinylidene fluoride, polyvinylidene fluoride / trifluoroethylene copolymer, polyvinylidene fluoride / tetrafluoroethylene copolymer, Any organic ferroelectric such as polyvinylidene cyanide / ethyl acetate copolymer, polyacrylonitrile, odd-numbered nylon, ferroelectric liquid crystal, ferroelectric liquid crystal polymer, or a mixture thereof may be used. Then, a polyvinylidene fluoride / trifluoroethylene copolymer was used from the viewpoints of heat resistance of the substrate during the production process and ease of production. This polyvinylidene fluoride / trifluoroethylene copolymer was formed by spin coating with a 3% methyl ethyl ketone solution. 2000 rp
A film thickness of 200 nm was obtained by coating at a rotation speed of m.
The polyvinylidene fluoride / trifluoroethylene copolymer thin film thus formed was baked in a clean oven at 140 ° C. for 30 minutes and then cooled at a rate of 50 ° C./hour. Polyvinylidene fluoride / trifluoroethylene copolymer exhibits ferroelectricity without any special treatment,
Ferroelectricity can be forcibly expressed by applying poling or shear stress.
【0021】次に、この第1の強誘電体膜4を覆って第
2の強誘電体膜5を形成する。この第2の強誘電体膜5
としては、前記第1の強誘電体膜4と同じポリフッ化ビ
ニリデン/トリフロロエチレン共重合体をベースとし
て、これにインジウム錫酸化物またはアルミニウム等の
金属粒子やTCNQ(テトラ・シアノ・キノジメタン)
/TTF(テトラ・チアフル・ジバレン)等の導電性物
質を含有させて形成した。ベースとなる強誘電体物質と
して無機物を用いる場合、これをスパッタリングで形成
する際のターゲットとしては、上記導電性物質を混合し
たものを用いるとよい。また、ゾル/ゲル法で形成する
場合には、ゾル中に上記導電性物質を混合したものを用
いるとよい。当然のことながらこの含有させる導電性物
質として有機導電性物質を用いることは、耐熱性の点か
ら非常に困難である。ベースとしてポリフッ化ビニリデ
ンや本実施例で用いたポリフッ化ビニリデン/トリフロ
ロエチレン共重合体等の有機強誘電体を用いる場合に
は、含有させる導電性物質は無機、有機いずれの場合で
あっても、強誘電体の溶液中に混入して、塗布、焼成す
ればよい。Next, a second ferroelectric film 5 is formed so as to cover the first ferroelectric film 4. This second ferroelectric film 5
Is based on the same polyvinylidene fluoride / trifluoroethylene copolymer as that of the first ferroelectric film 4, on which metal particles such as indium tin oxide or aluminum or TCNQ (tetra-cyano-quinodimethane) is added.
/ TTF (tetra thiaful divalene) and other conductive materials are contained. When an inorganic substance is used as the base ferroelectric substance, it is preferable to use a mixture of the above-mentioned conductive substances as a target when the inorganic substance is formed by sputtering. When the sol / gel method is used, it is preferable to use a mixture of the above-mentioned conductive substance in the sol. As a matter of course, it is very difficult to use an organic conductive material as the conductive material to be contained in terms of heat resistance. When an organic ferroelectric such as polyvinylidene fluoride or a polyvinylidene fluoride / trifluoroethylene copolymer used in this example is used as the base, the conductive substance to be contained may be either inorganic or organic. Alternatively, it may be mixed in the ferroelectric solution, coated and fired.
【0022】このようにして、第1の強誘電体膜4と第
2の強誘電体膜5の二層からなるアクティブ層3を形成
したが、アクティブ層3としては、図2に示すように、
構造上は一層とし、ベースとなる強誘電体物質に含有さ
せる導電性物質の濃度を強誘電体層の厚み方向に勾配を
もたせた形のものを形成してもよい。この構造であれ
ば、アクティブ層3内部での層の剥離もなく、機能上は
二層構造のものと同一の効果をもたらす素子を得ること
ができる。作製工程も簡略化される。この単層構造のア
クティブ層3は以下のようにして作製される。In this way, the active layer 3 composed of the two layers of the first ferroelectric film 4 and the second ferroelectric film 5 was formed. The active layer 3 is as shown in FIG. ,
The structure may be a single layer, and the concentration of the conductive substance contained in the base ferroelectric substance may be formed to have a gradient in the thickness direction of the ferroelectric layer. With this structure, it is possible to obtain an element that functionally has the same effect as that of the two-layer structure without peeling of layers inside the active layer 3. The manufacturing process is also simplified. The active layer 3 having the single-layer structure is manufactured as follows.
【0023】先述した要領と同じ要領で、基板1表面上
に第1の電極2を形成した後、TCNQとTTFをモル
比1:1に調整した10wt%のエタノール溶液に強誘
電体膜としてポリフッ化ビニリデン/トリフロロエチレ
ン共重合体の膜を用い、TCNQとTTFをモル比1:
1に調整した10wt%のエタノール溶液に24時間デ
ィップし、導電性物質であるTCNQ/TTFを含浸さ
せた。こうすると、第1の電極2付近では強誘電体膜の
導電性物質の含有率の低い部分7が形成され、第2の電
極6(あるいは強誘電体)付近では強誘電体膜の導電性
物質の含有率の高い部分8が形成される。After forming the first electrode 2 on the surface of the substrate 1 in the same manner as described above, a 10 wt% ethanol solution in which TCNQ and TTF are adjusted to have a molar ratio of 1: 1 is used as a ferroelectric film to form a polyfluoride film. A vinylidene chloride / trifluoroethylene copolymer membrane was used, and TCNQ and TTF were used in a molar ratio of 1:
It was dipped in a 10 wt% ethanol solution adjusted to 1 for 24 hours to impregnate it with TCNQ / TTF which is a conductive substance. Thus, a portion 7 of the ferroelectric film having a low content of the conductive substance is formed near the first electrode 2, and a conductive substance of the ferroelectric film is formed near the second electrode 6 (or the ferroelectric substance). A portion 8 having a high content rate of is formed.
【0024】アクティブ層3を形成した後は、このアク
ティブ層3を覆ってTa(タンタル)やTi(チタン)
等の導電性の薄膜を形成し、パターニングによって第2
の電極6を形成する。この第2の電極6用の導電性膜材
料としては第1の電極2のものと同一のものを用いても
よい。After forming the active layer 3, Ta (tantalum) or Ti (titanium) is covered to cover the active layer 3.
A conductive thin film such as
The electrode 6 is formed. As the conductive film material for the second electrode 6, the same material as that for the first electrode 2 may be used.
【0025】このようにして作製したアクティブ素子
に、50V、60Hzのパルス波を加えて動作させた
が、2000時間動作させた時点においても電極の剥離
は無く、良好な動作特性を示した。The active element thus manufactured was operated by applying a pulse wave of 50 V and 60 Hz, but no peeling of the electrode was observed even after 2000 hours of operation, and good operating characteristics were exhibited.
【0026】以上のようにして作製された本実施例のア
クティブ素子に対し、アクティブ層3をポリフッ化ビニ
リデン/トリフロロエチレン共重合体の膜のみで形成し
たアクティブ素子は同じ条件で作動させた場合、約50
時間動作させた時点から第2の電極6の剥離が発生し、
2000時間動作させた後では、素子の容量が初期の容
量の約10%にまで低下した。In contrast to the active element of the present example produced as described above, the active element in which the active layer 3 is formed of only the polyvinylidene fluoride / trifluoroethylene copolymer film is operated under the same conditions. , About 50
The peeling of the second electrode 6 occurs from the point of time of operation,
After operating for 2000 hours, the capacity of the device decreased to about 10% of the initial capacity.
【0027】図3に本発明にかかるアクティブ素子とア
クティブ層をポリフッ化ビニリデン/トリフロロエチレ
ン共重合体の膜のみで形成したアクティブ素子を、とも
に、50V、60Hzのパルス波を加えて2000時間
動作させた時のヒステリシス特性を示す。図において横
軸は素子に対する印加電圧E、縦軸は測定用コンデンサ
に誘起される電圧Vを示す。図に示されるように、本実
施例によるアクティブ素子によれば、従来例の項で説明
した強誘電体の正常なヒステリシス曲線を描くが、従来
の素子では、そのヒステリシス曲線は偏平な楕円形状を
なし、誘起される電圧Vが小さく、殆ど正常な動作をし
ていないことがわかる。In FIG. 3, the active element according to the present invention and the active element in which the active layer is formed of only the polyvinylidene fluoride / trifluoroethylene copolymer film are operated for 2000 hours by applying a pulse wave of 50 V and 60 Hz. The hysteresis characteristic when it is made to show is shown. In the figure, the horizontal axis represents the applied voltage E to the element, and the vertical axis represents the voltage V induced in the measuring capacitor. As shown in the figure, according to the active element of this example, a normal hysteresis curve of the ferroelectric substance described in the section of the conventional example is drawn, but in the conventional element, the hysteresis curve has a flat elliptical shape. None, the induced voltage V is small, and it can be seen that almost no normal operation is performed.
【0028】[0028]
【発明の効果】本発明によれば、第1の電極と第2の電
極とを有し、両電極の間に強誘電体より成るアクティブ
層を有するアクティブ素子において、長時間動作させて
も、従来より電極剥離が抑制された、信頼性の高い強誘
電性アクティブ素子を得ることができる。According to the present invention, an active element having a first electrode and a second electrode, and an active layer made of a ferroelectric material between the two electrodes, even when operated for a long time, It is possible to obtain a highly reliable ferroelectric active element in which peeling of electrodes is suppressed as compared with the related art.
【図1】本実施例のアクティブ素子を示す図。FIG. 1 is a diagram showing an active element of this embodiment.
【図2】本実施例のアクティブ素子の他の例を示す図。FIG. 2 is a diagram showing another example of the active element of the present embodiment.
【図3】本実施例のアクティブ素子のヒステリシス特性
と従来素子のヒステリシス特性を示す図。FIG. 3 is a diagram showing a hysteresis characteristic of an active element of this embodiment and a hysteresis characteristic of a conventional element.
【図4】従来のアクティブ素子の一例を示す図。FIG. 4 is a diagram showing an example of a conventional active element.
【図5】強誘電体のヒステリシス特性を示す図。FIG. 5 is a diagram showing a hysteresis characteristic of a ferroelectric substance.
1 基板 2 第1の電極 3 アクティブ層 4 第1の強誘電体膜 5 第2の強誘電体膜 6 第2の電極 7 強誘電体膜の導電性物質の含有率の低い部分。 8 強誘電体膜の導電性物質の含有率の高い部分。 1 substrate 2 first electrode 3 active layer 4 first ferroelectric film 5 second ferroelectric film 6 second electrode 7 part of the ferroelectric film having a low content of a conductive substance. 8 A portion of the ferroelectric film having a high content of a conductive substance.
Claims (5)
ィブ層を有するアクティブ素子であって、 該アクティブ層が強誘電体で形成され、 該強誘電体中に該強誘電体の導電率を大きくする物質を
含有するアクティブ素子。1. An active device having an active layer between a first electrode and a second electrode, wherein the active layer is made of a ferroelectric material, and the active material is formed in the ferroelectric material. An active element containing a substance that increases conductivity.
請求項1に記載のアクティブ素子。2. The active element according to claim 1, wherein the ferroelectric contains an organic compound.
ン、ポリフッ化ビニル、トリフロロエチレン、テトラフ
ロロエチレン、ナイロンの内の少なくとも一つをモノマ
ー単位として含有する請求項2に記載のアクティブ素
子。3. The active element according to claim 2, wherein the organic compound contains at least one of polyvinylidene fluoride, polyvinyl fluoride, trifluoroethylene, tetrafluoroethylene, and nylon as a monomer unit.
該第1の強誘電体膜より導電率の大きい第2の強誘電体
膜の二層構造である請求項1に記載のアクティブ素子。4. The active layer according to claim 1, wherein the active layer has a two-layer structure of a first ferroelectric film and a second ferroelectric film having a conductivity higher than that of the first ferroelectric film. element.
の濃度が前記強誘電体の厚み方向に変化している請求項
1に記載のアクティブ素子。5. The active element according to claim 1, wherein the concentration of the substance that increases the conductivity of the ferroelectric substance changes in the thickness direction of the ferroelectric substance.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22913593A JPH0784281A (en) | 1993-09-14 | 1993-09-14 | Active element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22913593A JPH0784281A (en) | 1993-09-14 | 1993-09-14 | Active element |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0784281A true JPH0784281A (en) | 1995-03-31 |
Family
ID=16887312
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22913593A Withdrawn JPH0784281A (en) | 1993-09-14 | 1993-09-14 | Active element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0784281A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09223889A (en) * | 1996-02-14 | 1997-08-26 | Tosoh Corp | Electromagnetic wave absorber |
| JPH09223890A (en) * | 1996-02-14 | 1997-08-26 | Tosoh Corp | Radio wave absorber |
| JPH09232787A (en) * | 1996-02-27 | 1997-09-05 | Tosoh Corp | Radio wave absorber |
| JPH09232786A (en) * | 1996-02-27 | 1997-09-05 | Tosoh Corp | Radio wave absorber |
| US7253703B2 (en) | 2003-10-07 | 2007-08-07 | Samsung Electronics Co., Ltd. | Air-gap type FBAR, method for fabricating the same, and filter and duplexer using the same |
-
1993
- 1993-09-14 JP JP22913593A patent/JPH0784281A/en not_active Withdrawn
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09223889A (en) * | 1996-02-14 | 1997-08-26 | Tosoh Corp | Electromagnetic wave absorber |
| JPH09223890A (en) * | 1996-02-14 | 1997-08-26 | Tosoh Corp | Radio wave absorber |
| JPH09232787A (en) * | 1996-02-27 | 1997-09-05 | Tosoh Corp | Radio wave absorber |
| JPH09232786A (en) * | 1996-02-27 | 1997-09-05 | Tosoh Corp | Radio wave absorber |
| US7253703B2 (en) | 2003-10-07 | 2007-08-07 | Samsung Electronics Co., Ltd. | Air-gap type FBAR, method for fabricating the same, and filter and duplexer using the same |
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