JPH08233520A - Three-dimensional shape measuring device - Google Patents

Three-dimensional shape measuring device

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Publication number
JPH08233520A
JPH08233520A JP7061747A JP6174795A JPH08233520A JP H08233520 A JPH08233520 A JP H08233520A JP 7061747 A JP7061747 A JP 7061747A JP 6174795 A JP6174795 A JP 6174795A JP H08233520 A JPH08233520 A JP H08233520A
Authority
JP
Japan
Prior art keywords
light receiving
light
dimensional
measured
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7061747A
Other languages
Japanese (ja)
Inventor
Takeshi Sato
剛 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP7061747A priority Critical patent/JPH08233520A/en
Publication of JPH08233520A publication Critical patent/JPH08233520A/en
Pending legal-status Critical Current

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  • Measurement Of Optical Distance (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

(57)【要約】 【目的】 被測定物の面の傾きに左右されずに安定し
て、高い精度で被測定物の三次元形状を測定する。 【構成】 演算・制御部18は、スリット状の照射光1
4aの拡がり方向(Y方向)に対応する方向と直交する
方向に並んだ受光部15の2次元受光センサの受光素子
の列であって、受光部15の出力信号における当該列に
属する複数の受光素子にそれぞれ対応する複数のレベル
のうちの最大レベルが所定の範囲内に入る列、の数が多
くなるように、前記2次元受光センサの出力信号に基づ
いて、照射部駆動回路17に制御信号を与えて、スリッ
ト状の照射光14aの輝度を調整する。
(57) [Abstract] [Purpose] To measure the three-dimensional shape of a measured object with high accuracy, stably without being influenced by the inclination of the surface of the measured object. [Structure] The calculation / control unit 18 uses a slit-shaped irradiation light 1
A row of light receiving elements of the two-dimensional light receiving sensor of the light receiving section 15 arranged in a direction orthogonal to the direction corresponding to the spreading direction (Y direction) of 4a, and a plurality of light receiving elements belonging to the row in the output signal of the light receiving section 15 A control signal is sent to the irradiation unit drive circuit 17 based on the output signal of the two-dimensional light receiving sensor so that the number of columns in which the maximum level of the plurality of levels corresponding to each element falls within a predetermined range is increased. To adjust the brightness of the slit-shaped irradiation light 14a.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、スリット状の照射光を
利用した光距離センサを用いて、被測定物の三次元形状
を測定する三次元形状測定装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a three-dimensional shape measuring apparatus for measuring the three-dimensional shape of an object to be measured by using an optical distance sensor using slit-shaped irradiation light.

【0002】[0002]

【従来の技術】被測定物に対して照射光を照射する照射
部と被測定物からの反射光を受光する受光部とを備えた
光距離センサを用いて、非接触で被測定物の三次元形状
を測定することが、従来から広く行われている。この方
法は、接触式プローブによる測定に必ず付随するプロー
ブの接触圧による被測定物の変形、プローブ先端の接触
球の半径の補正等がなく、簡易で、精度も比較的良い方
法として広く知られている。
2. Description of the Related Art An optical distance sensor provided with an irradiating section for irradiating an object to be measured with irradiation light and a light receiving section for receiving reflected light from the object to be measured is used to non-contact the third order of the object to be measured. Conventionally, measuring the original shape has been widely performed. This method is widely known as a method that is simple and relatively good in accuracy, since it does not involve deformation of the object to be measured due to the contact pressure of the probe that is necessarily accompanied by measurement with the contact probe, correction of the radius of the contact sphere at the probe tip, etc. ing.

【0003】このような光距離センサの一つとして、三
角測量の原理を利用するとともにスリット状の照射光を
用いた三角測距式の光距離センサがある。
As one of such optical distance sensors, there is a triangulation type optical distance sensor which utilizes the principle of triangulation and uses slit-shaped irradiation light.

【0004】図4は、このような三角測距式の光距離セ
ンサ1の測定原理を示す説明図である。
FIG. 4 is an explanatory view showing the measuring principle of such a triangulation type optical distance sensor 1.

【0005】図4に示すように、この光距離センサ1
は、被測定物6に対してスリット状の照射光(図4に示
す例では、図4中の紙面に垂直な方向に拡がってい
る。)を照射する照射部2と、被測定物6からの反射光
を受光するCCDカメラなどの受光部3とを備えてい
る。受光部3は、2次元配列された複数の受光素子を持
った2次元CCDなどの2次元受光センサ4と、前記照
射光による被測定物6からの反射光、すなわち、前記照
射光による被測定物6上の像(光切断線)を、2次元受
光センサ4の受光面上に投影させる受光レンズ5とから
構成されている。
As shown in FIG. 4, this optical distance sensor 1
Is irradiated from a slit-shaped irradiation light (in the example shown in FIG. 4, it spreads in a direction perpendicular to the paper surface in FIG. 4) to the DUT 6, and from the DUT 6. And a light receiving section 3 such as a CCD camera for receiving the reflected light. The light receiving unit 3 includes a two-dimensional light receiving sensor 4 such as a two-dimensional CCD having a plurality of two-dimensionally arranged light receiving elements, and reflected light from the object 6 to be measured by the irradiation light, that is, the measurement by the irradiation light. The light receiving lens 5 is configured to project an image (light cutting line) on the object 6 onto the light receiving surface of the two-dimensional light receiving sensor 4.

【0006】この光距離センサ1によれば、照射部2か
ら発したスリット状の照射光は、被測定物6に照射さ
れ、その反射光が受光レンズ5を介し受光センサ4によ
り受光される。このとき、図4に示すように、被測定物
6の面の位置に応じて、受光センサ4に入る反射光の位
置が変化する。したがって、受光センサ4から、被測定
物6上の光切断線上の各点までの距離を示す出力が一括
して得られる。
According to the optical distance sensor 1, the slit-shaped irradiation light emitted from the irradiation unit 2 is applied to the DUT 6, and the reflected light is received by the light receiving sensor 4 via the light receiving lens 5. At this time, as shown in FIG. 4, the position of the reflected light entering the light receiving sensor 4 changes according to the position of the surface of the DUT 6. Therefore, an output indicating the distance from the light receiving sensor 4 to each point on the light cutting line on the DUT 6 is collectively obtained.

【0007】そして、前述したようなレーザー変位計等
の光距離センサを用いた従来の三次元形状測定装置で
は、前記スリット状の照射光を常に一定の輝度で照射
し、前記光距離センサと前記被測定物との間の相対位置
を変更しながら、光距離センサと被測定物との間の所定
の複数の相対位置に応じた光距離センサの出力に基づい
て、被測定物の三次元形状データを作製していた。
In the conventional three-dimensional shape measuring apparatus using the optical distance sensor such as the laser displacement meter as described above, the slit-shaped irradiation light is always radiated at a constant brightness, and the optical distance sensor and the Based on the output of the optical distance sensor according to a plurality of predetermined relative positions between the optical distance sensor and the object to be measured while changing the relative position to the object to be measured, the three-dimensional shape of the object to be measured. I was preparing the data.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、前記従
来の三次元形状測定装置では、被測定物の三次元形状を
測定する際、被測定物の面の傾斜によっては、測定不能
の箇所(形状データを得ることができない箇所)や測定
の精度の低下した箇所が出てくる場合が多かった。
However, in the above-described conventional three-dimensional shape measuring apparatus, when measuring the three-dimensional shape of the object to be measured, a portion (shape data) that cannot be measured due to the inclination of the surface of the object to be measured (shape data). In many cases) and in some cases the measurement accuracy was reduced.

【0009】これは、前述したような光距離センサにお
いては、光の照射方向及び被測定物からの反射光の受光
方向と、被測定物の測定点の面の傾きとの関係によっ
て、受光部の2次元受光センサに入射する反射光の光量
が著しく変化してしまうからである。
This is because in the optical distance sensor as described above, the light receiving portion is determined by the relationship between the light irradiation direction and the light receiving direction of the reflected light from the object to be measured and the inclination of the surface of the measuring point of the object to be measured. This is because the amount of reflected light that enters the two-dimensional light receiving sensor changes significantly.

【0010】例えば、図4に示す光距離センサ1を用い
た場合、図4に示すように、光距離センサ1の照射光軸
及び受光光軸に対して被測定物6の面の法線の傾斜が小
さいときには、光距離センサ1の受光部3は、被測定物
6から多量の反射光を受ける。
For example, when the optical distance sensor 1 shown in FIG. 4 is used, as shown in FIG. 4, the normal line of the surface of the DUT 6 with respect to the irradiation optical axis and the receiving optical axis of the optical distance sensor 1 is measured. When the inclination is small, the light receiving unit 3 of the optical distance sensor 1 receives a large amount of reflected light from the DUT 6.

【0011】一方、図5に示すように、光距離センサ1
の照射光軸及び受光光軸に対して被測定物6の面の法線
の傾斜が大きいときには、光距離センサ1の受光部3
は、被測定物6から少量の反射光しか受けることができ
ない。具体的には、図5に示すように、受光部3が照射
部2に対して右側に位置し、被測定物6の面が左側に大
きく傾いている場合、被測定物6からの反射光は照射部
2に対してほとんど左側に片寄ってしまい、受光部3は
少量の反射光しか受けることができない。
On the other hand, as shown in FIG. 5, the optical distance sensor 1
When the normal line of the surface of the DUT 6 has a large inclination with respect to the irradiation optical axis and the received optical axis, the light receiving unit 3 of the optical distance sensor 1
Can receive only a small amount of reflected light from the DUT 6. Specifically, as shown in FIG. 5, when the light receiving unit 3 is located on the right side with respect to the irradiation unit 2 and the surface of the DUT 6 is largely inclined to the left side, the reflected light from the DUT 6 is reflected. Is almost to the left of the irradiation unit 2, and the light receiving unit 3 can receive only a small amount of reflected light.

【0012】受光部3の受光量が減少すれば、外光の影
響を受け易くなり、いわゆるSN比が低下し、測定精度
が低下する。受光量が更に減少して所定の値以下となれ
ば、事実上測定は不可能となる。一方、受光部3の受光
量が大きすぎると、受光部3の2次元受光センサ4の受
光素子の出力が飽和してしまい、受光部3の2次元受光
センサ4上に投影された光切断線の像の中心位置を求め
るいわゆるサブピクセル処理を行う場合に、その中心位
置を精度良く求めることができなくなり、したがって、
測定精度はやはり低下する。
If the amount of light received by the light receiving section 3 is reduced, the light is more likely to be affected by outside light, the so-called SN ratio is lowered, and the measurement accuracy is lowered. If the amount of received light is further reduced to a predetermined value or less, measurement becomes virtually impossible. On the other hand, if the light receiving amount of the light receiving unit 3 is too large, the output of the light receiving element of the two-dimensional light receiving sensor 4 of the light receiving unit 3 will be saturated, and the light cutting line projected on the two-dimensional light receiving sensor 4 of the light receiving unit 3. When performing the so-called sub-pixel processing for obtaining the center position of the image of, it becomes impossible to obtain the center position with high accuracy, therefore,
The measurement accuracy is also reduced.

【0013】本発明は、このような従来の問題点に鑑み
てなされたもので、被測定物の面の傾きに左右されずに
安定して、高い精度で被測定物の三次元形状を測定でき
る三次元形状測定装置を提供することを目的とする。
The present invention has been made in view of such conventional problems, and stably measures the three-dimensional shape of an object to be measured with high accuracy without being influenced by the inclination of the surface of the object to be measured. An object is to provide a three-dimensional shape measuring device that can be used.

【0014】[0014]

【課題を解決するための手段】前記課題を解決するた
め、本発明の第1の態様による三次元形状測定装置は、
被測定物に対してスリット状の照射光を照射する照射部
と、2次元配列された複数の受光素子を持った2次元受
光センサを有する受光部であって、前記照射光による前
記被測定物上の像を前記2次元受光センサ上で受光する
受光部と、を備えた光距離センサと、前記光距離センサ
と前記被測定物との間の相対位置を変更させる位置変更
手段と、前記光距離センサと前記被測定物との間の所定
の複数の相対位置に応じた前記2次元受光センサの出力
信号に基づいて、前記被測定物の三次元形状データを作
製する三次元形状データ作製手段と、を備えた三次元形
状測定装置において、前記スリット状の照射光の拡がり
方向に対応する方向と直交する方向に並んだ前記2次元
受光センサの受光素子の列であって、前記出力信号にお
ける当該列に属する複数の受光素子にそれぞれ対応する
複数のレベルのうちの最大レベルが所定の範囲内に入る
列、の数が多くなるように、前記2次元受光センサの前
記出力信号に基づいて、前記照射光の輝度を調整する調
整手段を、更に備えたものである。
In order to solve the above-mentioned problems, the three-dimensional shape measuring apparatus according to the first aspect of the present invention comprises:
An irradiation unit for irradiating an object to be measured with slit-shaped irradiation light and a light receiving unit having a two-dimensional light receiving sensor having a plurality of two-dimensionally arranged light receiving elements, the object to be measured by the irradiation light. An optical distance sensor including a light receiving unit that receives the upper image on the two-dimensional light receiving sensor, a position changing unit that changes a relative position between the optical distance sensor and the object to be measured, and the light. Three-dimensional shape data creating means for creating three-dimensional shape data of the object to be measured based on output signals of the two-dimensional light receiving sensor corresponding to a plurality of predetermined relative positions between the distance sensor and the object to be measured. In the three-dimensional shape measuring apparatus comprising: a row of light-receiving elements of the two-dimensional light-receiving sensor arranged in a direction orthogonal to a direction corresponding to a spreading direction of the slit-shaped irradiation light, Belongs to the column Based on the output signal of the two-dimensional light receiving sensor, the number of rows in which the maximum level among the plurality of levels corresponding to the plurality of light receiving elements falls within a predetermined range is increased. It further comprises adjusting means for adjusting the brightness.

【0015】本発明の第2の態様による三次元形状測定
装置は、被測定物に対してスリット状の照射光を照射す
る照射部と、各々が、2次元配列された複数の受光素子
を持った2次元受光センサを有する複数の受光部であっ
て、各々が、前記照射光による前記被測定物上の像を前
記2次元受光センサ上で互いに異なる方向で受光する複
数の受光部と、を備えた光距離センサと、前記光距離セ
ンサと前記被測定物との間の相対位置を変更させる位置
変更手段と、前記光距離センサと前記被測定物との間の
所定の複数の相対位置に応じた前記複数の受光部の2次
元受光センサうちの少なくとも一つの出力信号に基づい
て、前記被測定物の三次元形状データを作製する三次元
形状データ作製手段と、を備えた三次元形状測定装置に
おいて、前記複数の受光部のうちの少なくとも1つに関
して、前記スリット状の照射光の拡がり方向に対応する
方向と直交する方向に並んだ前記2次元受光センサの受
光素子の列であって、前記出力信号における当該列に属
する複数の受光素子にそれぞれ対応する複数のレベルの
うちの最大レベルが所定の範囲内に入る列、の数が多く
なるように、前記2次元受光センサの前記出力信号に基
づいて、前記照射光の輝度を調整する調整手段を、更に
備えたものである。
A three-dimensional shape measuring apparatus according to a second aspect of the present invention has an irradiation section for irradiating an object to be measured with slit-shaped irradiation light, and a plurality of light receiving elements each two-dimensionally arranged. A plurality of light receiving portions each having a two-dimensional light receiving sensor, each light receiving portion receiving the image of the irradiation light on the object to be measured in different directions on the two-dimensional light receiving sensor. An optical distance sensor provided, position changing means for changing the relative position between the optical distance sensor and the object to be measured, at a predetermined plurality of relative positions between the optical distance sensor and the object to be measured. Three-dimensional shape measurement means for producing three-dimensional shape data of the object to be measured based on an output signal of at least one of the two-dimensional light receiving sensors of the plurality of light receiving units according to the three-dimensional shape measurement. In the device, the plurality of A row of light-receiving elements of the two-dimensional light-receiving sensor arranged in a direction orthogonal to a direction corresponding to the spread direction of the slit-shaped irradiation light with respect to at least one of the light-receiving units, and the row in the output signal. The irradiation based on the output signal of the two-dimensional light receiving sensor so that the number of columns in which the maximum level of the plurality of levels corresponding to the plurality of light receiving elements belonging to It further comprises adjusting means for adjusting the brightness of light.

【0016】[0016]

【作用】本発明によれば、調整手段により、照射光の輝
度の最適化が図られ、被測定物の面の傾きにかかわら
ず、2次元受光センサの多くの受光素子の受光量が一定
の範囲に保たれる。したがって、本発明によれば、測定
不能の箇所が少なくなるのみならず、外乱光による測定
精度の低下が少なくなるとともに、2次元受光センサの
多くの受光素子の出力が飽和しないことから2次元受光
センサ4上に投影された光切断線の像の中心位置を精度
良く求めることができる。よって、本発明によれば、被
測定物の面の傾きに左右されずに安定して、高い精度で
被測定物の三次元形状を測定できる。
According to the present invention, the brightness of the irradiation light is optimized by the adjusting means, and the light receiving amount of many light receiving elements of the two-dimensional light receiving sensor is constant regardless of the inclination of the surface of the object to be measured. Kept in range. Therefore, according to the present invention, not only the number of unmeasurable points is reduced, but also the deterioration of measurement accuracy due to ambient light is reduced and the outputs of many light receiving elements of the two-dimensional light receiving sensor are not saturated, so that the two-dimensional light receiving is performed. The center position of the image of the light cutting line projected on the sensor 4 can be accurately obtained. Therefore, according to the present invention, it is possible to stably measure the three-dimensional shape of the measured object without being influenced by the inclination of the surface of the measured object.

【0017】本発明の前記第1の態様では、受光部が単
一でもあってもよいのに対し、本発明の前記第2の態様
では、互いに異なる方向から光切断線を受光する複数の
受光部を備えている点で、両者は異なるが、両者は実質
的には同一である。
In the first aspect of the present invention, the single light-receiving portion may be provided, whereas in the second aspect of the present invention, a plurality of light-receiving portions for receiving the light cutting lines from mutually different directions. Although they are different in that they are provided with parts, they are substantially the same.

【0018】ただし、既に説明したように、受光する反
射光の光量が変化する原因が、光の照射方向及び被測定
物からの反射光の受光方向と被測定物の測定点の面の傾
きとの関係であるので、被測定物の測定箇所によってい
ずれか一方の受光部の受光状態の方が他方の受光部の受
光状態より良くなる。よって、前記第2の態様のよう
に、複数の受光部を用いると、各受光部の受光状態に応
じて良い方の受光部の出力を計測データとして採用する
ことができ、単一の受光部のみを用いる場合に比べて、
一層測定精度の向上を図ることができる。
However, as described above, the cause of the change in the quantity of the reflected light received is that the light irradiation direction and the light receiving direction of the reflected light from the measured object and the inclination of the surface of the measured point of the measured object. Therefore, the light receiving state of either one of the light receiving portions is better than the light receiving state of the other light receiving portion depending on the measurement location of the object to be measured. Therefore, if a plurality of light receiving units are used as in the second aspect, the output of the light receiving unit that is better depending on the light receiving state of each light receiving unit can be adopted as the measurement data, and a single light receiving unit can be used. Compared to using only
The measurement accuracy can be further improved.

【0019】[0019]

【実施例】以下、本発明の種々の実施例による三次元形
状測定装置について、図面を参照して説明する。なお、
以下の本実施例では、被測定物は、歯科用作業模型とす
る。もっとも、被測定物はこれに限定されるものではな
く、本発明による三次元形状測定装置は他の任意のもの
も測定することができる。
DESCRIPTION OF THE PREFERRED EMBODIMENTS A three-dimensional shape measuring apparatus according to various embodiments of the present invention will be described below with reference to the drawings. In addition,
In the following examples, the object to be measured is a dental work model. However, the object to be measured is not limited to this, and the three-dimensional shape measuring apparatus according to the present invention can measure any other object.

【0020】まず、本発明の第1の実施例による三次元
形状測定装置について、図1及び図2を参照して説明す
る。
First, a three-dimensional shape measuring apparatus according to a first embodiment of the present invention will be described with reference to FIGS. 1 and 2.

【0021】図1は、本発明の第1の実施例による三次
元形状測定装置の全体構成を模式的に示す図である。
FIG. 1 is a diagram schematically showing the overall structure of a three-dimensional shape measuring apparatus according to the first embodiment of the present invention.

【0022】本実施例による三次元形状測定装置は、図
1に示すように、本体基盤(図示せず)の上に取り付け
られX方向に移動可能なXステージ11と、Xステージ
11の上方において前記本体基盤に取り付けられた光距
離センサ12とを備えている。被測定物13はXステー
ジ11の上に載せられる。本実施例では、Xステージ1
1が、光距離センサ12と被測定物13との間の相対位
置を変更させる位置変更手段を構成している。
As shown in FIG. 1, the three-dimensional shape measuring apparatus according to the present embodiment has an X stage 11 mounted on a main body substrate (not shown) and movable in the X direction, and above the X stage 11. And an optical distance sensor 12 attached to the main body base. The device under test 13 is placed on the X stage 11. In this embodiment, the X stage 1
1 constitutes a position changing means for changing the relative position between the optical distance sensor 12 and the object to be measured 13.

【0023】なお、図1において、Xステージ11の動
きの理解を容易にするため、Xステージ11の固定部を
11aで示し、Xステージ11の可動部を11bで示し
ている。
Note that, in FIG. 1, in order to facilitate understanding of the movement of the X stage 11, the fixed portion of the X stage 11 is indicated by 11a, and the movable portion of the X stage 11 is indicated by 11b.

【0024】光距離センサ12は、図4に示した変位計
1と同様の構成を有している。すなわち、光距離センサ
12は、被測定物13に対してX方向に垂直なY方向に
拡がったスリット状の照射光14aを照射する照射部1
4と、被測定物13からの反射光を受光する受光部15
と、を有している。受光部15は、図面には示していな
いが、2次元配列された複数の受光素子を持った2次元
CCDなどの2次元受光センサを有しており、受光部1
5として例えばCCDカメラを用いることができる。な
お、照射部14及び受光部15は、両方とも前記本体基
盤に固定されている。
The optical distance sensor 12 has the same structure as the displacement meter 1 shown in FIG. That is, the optical distance sensor 12 irradiates the DUT 13 with the slit-shaped irradiation light 14a that spreads in the Y direction perpendicular to the X direction.
4 and a light receiving section 15 for receiving the reflected light from the DUT 13.
And have. Although not shown in the drawing, the light receiving unit 15 has a two-dimensional light receiving sensor such as a two-dimensional CCD having a plurality of two-dimensionally arranged light receiving elements.
For example, a CCD camera can be used as 5. Both the irradiation unit 14 and the light receiving unit 15 are fixed to the main body base.

【0025】また、本実施例による三次元形状測定装置
は、図1に示すように、Xステージ11の駆動モータ
(図示せず)を駆動するモータ駆動回路16と、光距離
センサ12の照射部14を駆動する照射部駆動回路17
と、各種の演算及び制御を行う演算・制御部18と、測
定者が演算・制御部18に各種の指令を与えるためのキ
ーボード等の入力装置19と、Xステージ11の位置
(又は駆動量)を検出するエンコーダ等の位置検出器
(図示せず)と、を備えている。
In the three-dimensional shape measuring apparatus according to this embodiment, as shown in FIG. 1, a motor drive circuit 16 for driving a drive motor (not shown) of the X stage 11 and an irradiation section of the optical distance sensor 12. Irradiation unit drive circuit 17 for driving 14
And a calculation / control unit 18 that performs various calculations and controls, an input device 19 such as a keyboard for a measurer to give various commands to the calculation / control unit 18, and the position (or drive amount) of the X stage 11. And a position detector (not shown) such as an encoder for detecting.

【0026】演算・制御部18は、図示しない記憶装置
やCPU等を内臓したマイクロコンピュータ等から構成
され、モータ駆動回路16及び照射部駆動回路17の動
作を制御する駆動制御部としての機能や、光距離センサ
12の受光部15からの出力及び前記位置検出器からの
出力(Xステージ11の位置検出信号)に基づいて三次
元形状データを作製する三次元形状データ作製部として
の機能や、後述するサブピクセル処理を行うサブピクセ
ル処理部としての機能などの各種の機能を担う。
The arithmetic / control unit 18 is composed of a microcomputer having a storage device, a CPU, etc. (not shown) built therein, and functions as a drive control unit for controlling the operation of the motor drive circuit 16 and the irradiation unit drive circuit 17, and The function as a three-dimensional shape data creating unit that creates three-dimensional shape data based on the output from the light receiving unit 15 of the optical distance sensor 12 and the output from the position detector (position detection signal of the X stage 11), and It performs various functions such as a function as a sub-pixel processing unit that performs sub-pixel processing.

【0027】なお、本実施例では、演算・制御部18で
作製された三次元形状データは、これを利用するCAD
装置20に供給されるようになっている。
In this embodiment, the three-dimensional shape data created by the arithmetic / control unit 18 is the CAD that uses this data.
It is adapted to be supplied to the device 20.

【0028】ここで、演算・制御部18で行われるサブ
ピクセル処理について、図2を参照して説明する。
The subpixel processing performed by the arithmetic / control unit 18 will be described with reference to FIG.

【0029】被測定物13に照射部14からスリット状
の照射光14aを照射させると、被測定物13の形状に
沿った切断線13aが形成され、この切断線13aが受
光部15により撮像される。すなわち、図2(a)に示
すように、受光部15の2次元受光センサの受光面上に
は、前記切断線13aの像21が投影される。
When the measurement object 13 is irradiated with the slit-shaped irradiation light 14a from the irradiation section 14, a cutting line 13a is formed along the shape of the measurement object 13, and the cutting line 13a is imaged by the light receiving section 15. It That is, as shown in FIG. 2A, the image 21 of the cutting line 13a is projected on the light receiving surface of the two-dimensional light receiving sensor of the light receiving unit 15.

【0030】図2(a)は、受光部15の2次元受光セ
ンサの受光面上の切断線13aの像21を示す図であ
る。図2(a)中の横軸は、図1中のY方向(すなわ
ち、スリット状の照射光14aの拡がり方向)に対応す
るY1方向の前記受光面上の位置を示している。図2
(a)中の縦軸は、前記受光面上のY1方向に垂直なZ
1方向の位置を示している。切断線13aの像21の太
さは、通常1つの受光素子の縦方向(Z1方向)の長さ
よりも大きく、例えば約10素子分程度の長さになって
いる。
FIG. 2A is a view showing an image 21 of the cutting line 13a on the light receiving surface of the two-dimensional light receiving sensor of the light receiving section 15. The horizontal axis in FIG. 2A indicates the position on the light receiving surface in the Y1 direction corresponding to the Y direction in FIG. 1 (that is, the spreading direction of the slit-shaped irradiation light 14a). Figure 2
The vertical axis in (a) is Z perpendicular to the Y1 direction on the light receiving surface.
The position in one direction is shown. The thickness of the image 21 of the cutting line 13a is usually larger than the length of one light receiving element in the vertical direction (Z1 direction), and is, for example, about 10 elements.

【0031】Y1方向のある位置においてZ1方向に並
んだ1列の受光素子に対応する2次元受光センサの出力
レベルの分布(2次元受光センサの受光面上の、Y1方
向のある位置においてZ1方向に沿った、受光量の分布
に相当)は、図2(b)に示すようになる。Y1方向の
この位置における切断線13aの像21のZ1方向の位
置は、図2(b)中の出力レベルが大きい位置に相当す
ることになる。なお、図2(b)中のDMAXは、Y1方
向のある位置においてZ1方向に並んだ1列の受光素子
に対応する出力レベルのうちの最大レベルを示してい
る。
At a certain position in the Y1 direction, the output level distribution of the two-dimensional light receiving sensor corresponding to one row of light receiving elements arranged in the Z1 direction (on the light receiving surface of the two-dimensional light receiving sensor, at a certain position in the Y1 direction, the Z1 direction (Corresponding to the distribution of the amount of received light) is as shown in FIG. The position in the Z1 direction of the image 21 of the cutting line 13a at this position in the Y1 direction corresponds to the position where the output level is large in FIG. 2B. It should be noted that D MAX in FIG. 2B represents the maximum level of the output levels corresponding to one row of light receiving elements arranged in the Z1 direction at a certain position in the Y1 direction.

【0032】図2(b)に示すような分布の形状から切
断線13aの像21のZ1方向の中心位置を推定する処
理が、いわゆるサブピクセル処理である。具体的には、
例えば、図2(b)中の所定の閾値D0以上の部分の加
重平均を以て切断線13aの像21のZ1方向の中心位
置とする。
The process of estimating the center position in the Z1 direction of the image 21 of the cutting line 13a from the shape of the distribution as shown in FIG. 2B is what is called subpixel process. In particular,
For example, the center position in the Z1 direction of the image 21 of the cutting line 13a is set by using the weighted average of the portion having a predetermined threshold value D 0 or more in FIG.

【0033】切断線13aの像21のZ1方向の中心位
置がY1方向の位置に対応する被測定物13の測定点ま
での距離を示すことになるので、演算・制御部18は、
三次元形状データの作製処理の一部として、受光部15
の2次元受光センサの出力信号に対して前述したサブピ
クセル処理を行うのである。
Since the center position of the image 21 of the cutting line 13a in the Z1 direction indicates the distance to the measurement point of the object to be measured 13 corresponding to the position in the Y1 direction, the calculation / control unit 18
As a part of the process of producing the three-dimensional shape data, the light receiving unit 15
The above-described sub-pixel processing is performed on the output signal of the two-dimensional light receiving sensor.

【0034】次に、本実施例による三次元形状測定装置
の動作の一例について、説明する。
Next, an example of the operation of the three-dimensional shape measuring apparatus according to this embodiment will be described.

【0035】まず、被測定物13である歯科用の模型の
測定に必要な測定箇所は歯の交合面及び側面であるか
ら、測定不要な面が下になるように、測定者が被測定物
13を接着剤(図示せず)でXステージ11に仮止めす
る。
First, since the measurement points necessary for the measurement of the dental model as the object to be measured 13 are the intersecting surfaces and the side surfaces of the teeth, the measurer places the object to be measured so that the surface not to be measured is facing down. 13 is temporarily fixed to the X stage 11 with an adhesive (not shown).

【0036】この状態で、演算・制御部18は、測定者
により入力装置19から与えられた測定開始指令に応答
して、照射部駆動回路17に制御信号を与え、照射部1
4から被測定物13に所定輝度のスリット光14aを照
射させ、被測定物13の形状に沿った切断線13aを形
成する。
In this state, the calculation / control section 18 gives a control signal to the irradiation section drive circuit 17 in response to the measurement start command given from the input device 19 by the measurer, and the irradiation section 1
The slit light 14a having a predetermined brightness is irradiated onto the DUT 13 from 4 to form a cutting line 13a along the shape of the DUT 13.

【0037】この切断線13aが受光部15により斜め
から撮像される。すなわち、図2(a)に示すように、
受光部15の2次元受光センサの受光面上には、切断線
13aの像21が投影される。その結果、その像21に
応じた出力信号が、受光部15の2次元受光センサから
得られる。
The cutting line 13a is imaged obliquely by the light receiving section 15. That is, as shown in FIG.
The image 21 of the cutting line 13a is projected on the light receiving surface of the two-dimensional light receiving sensor of the light receiving unit 15. As a result, an output signal corresponding to the image 21 is obtained from the two-dimensional light receiving sensor of the light receiving unit 15.

【0038】演算・制御部18は、この2次元受光セン
サの出力に基づいて、照射部駆動回路17に制御信号を
与えて、照射部駆動回路17を介して、照射部14に対
する駆動電圧等を調整することによって、スリット状の
照射光14aの輝度を調整する。
The calculation / control section 18 gives a control signal to the irradiation section drive circuit 17 based on the output of the two-dimensional light receiving sensor, and outputs a drive voltage to the irradiation section 14 via the irradiation section drive circuit 17. By adjusting, the brightness of the slit-shaped irradiation light 14a is adjusted.

【0039】すなわち、演算・制御部18は、スリット
状の照射光14aの拡がり方向(Y方向)に対応するZ
1方向に並んだ前記2次元受光センサの受光素子の列で
あって、前記2次元受光センサの前記出力信号における
当該列に属する複数の受光素子にそれぞれ対応する複数
のレベルのうちの最大レベルが所定の範囲(図2(b)
中のD1〜D2の範囲)に入る列、の数が多くなるように
(好ましくは、最大になるように)、前記2次元受光セ
ンサの前記出力信号に基づいて、スリット状の照射光1
4aの輝度を調整する。
That is, the calculation / control unit 18 sets Z corresponding to the spreading direction (Y direction) of the slit-shaped irradiation light 14a.
In the row of the light receiving elements of the two-dimensional light receiving sensor arranged in one direction, the maximum level of the plurality of levels corresponding to the plurality of light receiving elements belonging to the row in the output signal of the two-dimensional light receiving sensor is Predetermined range (Fig. 2 (b))
The slit-shaped irradiation light is increased based on the output signal of the two-dimensional light receiving sensor so that the number of columns falling within the range (D 1 to D 2 ) is large (preferably, maximum). 1
Adjust the brightness of 4a.

【0040】例えば、前記2次元受光センサが、500
×1000個の受光素子(図2(a)中のY1方向に5
00個の受光素子で、Z1方向に1000個の受光素
子)を有しているとすると、Z1方向に並んだ1000
個の受光素子の列が500列存在することになる。この
場合には、演算・制御部18は、この500列うち、前
記2次元受光センサの前記出力信号における当該列に属
する1000個の受光素子に対応する複数のレベルのう
ち最大レベル(図2(b)中のDMAXに相当)が図2
(b)中のD1〜D2の範囲に入る列の数が多くなるよう
に、スリット状の照射光14aの輝度を調整する。
For example, the two-dimensional light receiving sensor is 500
× 1000 light receiving elements (5 in the Y1 direction in FIG. 2 (a))
Assuming that 00 light receiving elements have 1000 light receiving elements in the Z1 direction, 1000 light receiving elements arranged in the Z1 direction are arranged.
This means that there are 500 rows of light receiving elements. In this case, the arithmetic / control unit 18 has the maximum level (see FIG. 2 (500) of the plurality of levels corresponding to 1000 light receiving elements belonging to the column in the output signal of the two-dimensional light receiving sensor in the 500 columns. 2) is equivalent to D MAX in b).
The brightness of the slit-shaped irradiation light 14a is adjusted so that the number of rows included in the range of D 1 to D 2 in (b) increases.

【0041】その具体的な調整は、例えば、前記500
列の各々の最大レベルDMAXを得て、これら500個の
最大レベルDMAXのレベル値の分布状態に基づいてスリ
ット状の照射光14aの輝度を設定することにより、行
うことができる。必要に応じて、スリット状の照射光1
4aの輝度を既知の複数の輝度にし、それぞれの輝度に
応じてそれぞれ500個の最大レベルDMAXを得、これ
らに基づいてスリット状の照射光14aの輝度を設定し
てもよい。
The specific adjustment can be performed by, for example, the above 500.
This can be done by obtaining the maximum level D MAX of each of the columns and setting the brightness of the slit-shaped irradiation light 14a based on the distribution state of the level values of these 500 maximum levels D MAX . If necessary, slit-shaped irradiation light 1
The luminance of 4a may be set to a plurality of known luminances, 500 maximum levels D MAX are obtained according to the respective luminances, and the luminance of the slit-shaped irradiation light 14a may be set based on these.

【0042】2次元受光センサの受光面上に投影された
切断線13aの像21の光量が余りにも大きいと受光素
子から得られる出力が飽和してしまい、前述したサブピ
クセル処理により切断線13aの像21の中心位置を決
めるときの精度が下がる。逆に、光量が小さくなりすぎ
ると外乱光の影響が大きくなり、やはり測定精度が低下
する。したがって、このような点を考慮して、前記範囲
1〜D2が定められている。例えば、この範囲の境界D
2は、受光素子の飽和出力レベルより若干小さく設定さ
れる。
If the light quantity of the image 21 of the cutting line 13a projected on the light receiving surface of the two-dimensional light receiving sensor is too large, the output obtained from the light receiving element will be saturated, and the cutting line 13a of the cutting line 13a will be saturated by the above-described sub-pixel processing. The accuracy in determining the center position of the image 21 decreases. On the contrary, if the light quantity becomes too small, the influence of ambient light becomes large, and the measurement accuracy also deteriorates. Therefore, the range D 1 to D 2 is set in consideration of such a point. For example, the boundary D of this range
2 is set to be slightly lower than the saturated output level of the light receiving element.

【0043】ところで、被測定物13上の切断線13a
の各点の面の傾きはそれぞれ異なるので、切断線13a
の像21の各部の光量はそれぞれ異なる。したがって、
スリット状の照射光14aの輝度を変化させても、切断
線13aの像21の全長にわたって受光部15の出力レ
ベルが前記範囲D1〜D2に入る保証は無い。そこで、前
述したように、前記列の数が多くなるようにスリット状
の照射光14aの輝度を調整しているのである。
Incidentally, the cutting line 13a on the object to be measured 13
Since the inclination of the surface of each point is different, the cutting line 13a
The amount of light at each part of the image 21 is different. Therefore,
Even when the brightness is changed in the slit-shaped illumination light 14a, no guarantee that the output level of the light receiving portion 15 enters the range D 1 to D 2 over the entire length of the image 21 of the cutting line 13a. Therefore, as described above, the brightness of the slit-shaped irradiation light 14a is adjusted so that the number of rows is increased.

【0044】演算・制御部18は、このようなスリット
状の照射光14aの調整が完了すると、前記2次元受光
センサの出力として得られる切断線13aの画像をフレ
ームメモリ(図示せず)に一旦記憶し、この画像データ
に対して前述したサブピクセル処理を行って、Y1方向
の各位置において切断線13aの像21のZ1方向の中
心位置を求め、そのデータをXステージの位置データと
対応させてメモリ(図示せず)に記憶させる。これで、
一つの切断線13aに対する測定が終了することにな
る。
When the adjustment of the slit-shaped irradiation light 14a is completed, the calculation / control unit 18 once stores the image of the cutting line 13a obtained as the output of the two-dimensional light receiving sensor in a frame memory (not shown). The image data is stored and subjected to the above-described sub-pixel processing to find the center position of the image 21 of the cutting line 13a in the Z1 direction at each position in the Y1 direction, and the data is associated with the position data of the X stage. To a memory (not shown). with this,
The measurement for one cutting line 13a is completed.

【0045】被測定物12の全体を計測するためにはX
ステージ11を所定量のピッチで動かした後、同様の手
順で測定を繰り返せば良い。被測定物13の全域が所定
のピッチで測定できたなら全ての測定が終了したことに
なる。
To measure the entire object 12 to be measured, X
After moving the stage 11 at a predetermined pitch, the measurement may be repeated in the same procedure. If the entire area of the DUT 13 can be measured at a predetermined pitch, all the measurements are completed.

【0046】本実施例によれば、スリット状の照射光1
4aの輝度の最適化が図られ、被測定物13の面の傾き
にかかわらず、受光部15の2次元受光センサの多くの
受光素子の受光量が一定の範囲に保たれる。したがっ
て、測定不能の箇所が少なくなるのみならず、外乱光に
よる測定精度の低下が少なくなるとともに、2次元受光
センサの多くの受光素子の出力が飽和しないことから2
次元受光センサ上に投影された光切断線の像の中心位置
を精度良く求めることができる。よって、被測定物13
の面の傾きに左右されずに安定して、高い精度で被測定
物13の三次元形状を測定できる。
According to this embodiment, slit-shaped irradiation light 1
The luminance of 4a is optimized, and the light-receiving amounts of many light-receiving elements of the two-dimensional light-receiving sensor of the light-receiving unit 15 are kept within a fixed range regardless of the inclination of the surface of the DUT 13. Therefore, not only the number of unmeasurable points decreases, but also the deterioration of measurement accuracy due to ambient light decreases and the outputs of many light receiving elements of the two-dimensional light receiving sensor do not saturate.
The center position of the image of the light cutting line projected on the three-dimensional light receiving sensor can be accurately obtained. Therefore, the DUT 13
The three-dimensional shape of the DUT 13 can be stably measured with high accuracy regardless of the inclination of the surface.

【0047】次に、本発明の第2の実施例による三次元
形状測定装置について、図3を参照して説明する。
Next, a three-dimensional shape measuring apparatus according to a second embodiment of the present invention will be described with reference to FIG.

【0048】図3は、本発明の第2の実施例による三次
元形状測定装置の全体構成を示す図である。図3におい
て、図1中の構成要素と同一又は対応する構成要素には
同一符号を付し、重複した説明は省略する。
FIG. 3 is a diagram showing the overall structure of a three-dimensional shape measuring apparatus according to the second embodiment of the present invention. 3, constituent elements that are the same as or correspond to the constituent elements in FIG. 1 are assigned the same reference numerals, and redundant description will be omitted.

【0049】本実施例が前述した第1の実施例と異なる
所は、以下の点である。
This embodiment is different from the above-mentioned first embodiment in the following points.

【0050】すなわち、本実施例では、前記第1の実施
例において、スリット状の照射光14aに対して受光部
15と対称な位置関係となるように前記本体基盤に固定
された受光部31が、追加されている。受光部31は光
距離センサ15と同一の構成を有している。なお、受光
部31は、必ずしも受光部15と対称となるように配置
する必要はなく、切断線13aの像を受光部15と異な
る方向から受光するように配置すればよい。
That is, in the present embodiment, in the first embodiment, the light receiving portion 31 fixed to the main body base is arranged so as to have a symmetrical positional relationship with the light receiving portion 15 with respect to the slit-shaped irradiation light 14a. , Has been added. The light receiving unit 31 has the same structure as the optical distance sensor 15. The light receiving unit 31 does not necessarily have to be arranged symmetrically with the light receiving unit 15, and may be arranged so as to receive the image of the cutting line 13 a from a direction different from that of the light receiving unit 15.

【0051】本実施例による三次元形状測定装置の動作
の一例について、説明する。
An example of the operation of the three-dimensional shape measuring apparatus according to this embodiment will be described.

【0052】まず、前記第1の実施例と同様に、被測定
物13がXステージ11に仮止めされる。
First, as in the first embodiment, the object to be measured 13 is temporarily fixed to the X stage 11.

【0053】この状態で、演算・制御部18は、前記第
1の実施例と同様に、照射部駆動回路17に制御信号を
与え、照射部14から被測定物13に所定輝度のスリッ
ト光14aを照射させ、被測定物13の形状に沿った切
断線13aを形成する。
In this state, the calculation / control section 18 gives a control signal to the irradiation section drive circuit 17 in the same manner as in the first embodiment, and the irradiation section 14 emits slit light 14a of a predetermined brightness to the object to be measured 13. Is irradiated to form a cutting line 13a along the shape of the DUT 13.

【0054】この切断線13aが受光部15,31によ
り斜めから撮像される。すなわち、図2(a)に示すよ
うに、受光部15の2次元受光センサの受光面及び受光
部31の2次元受光センサの受光面の上には、切断線1
3aの像がそれぞれ投影される。その結果、それらの像
に応じた出力信号が、受光部15の2次元受光センサ及
び受光部31の2次元受光センサから得られる。
The cutting line 13a is obliquely imaged by the light receiving portions 15 and 31. That is, as shown in FIG. 2A, the cutting line 1 is formed on the light receiving surface of the two-dimensional light receiving sensor of the light receiving unit 15 and the light receiving surface of the two-dimensional light receiving sensor of the light receiving unit 31.
The images of 3a are projected respectively. As a result, output signals corresponding to those images are obtained from the two-dimensional light receiving sensor of the light receiving unit 15 and the two-dimensional light receiving sensor of the light receiving unit 31.

【0055】演算・制御部18は、受光部15,31の
2次元受光センサの出力に基づいて、照射部駆動回路1
7に制御信号を与えて、照射部駆動回路17を介して、
照射部14に対する駆動電圧等を調整することによっ
て、スリット状の照射光14aの輝度を調整する。
The calculation / control unit 18 determines the irradiation unit drive circuit 1 based on the outputs of the two-dimensional light receiving sensors of the light receiving units 15 and 31.
7 by giving a control signal to the irradiation section drive circuit 17,
The brightness of the slit-shaped irradiation light 14a is adjusted by adjusting the drive voltage or the like for the irradiation unit 14.

【0056】すなわち、演算・制御部18は、受光部1
5,31のうちの少なくとも1つに関して、スリット状
の照射光14aの拡がり方向(Y方向)に対応する方向
に並んだ2次元受光センサの受光素子の列であって、当
該2次元受光センサの出力信号における当該列に属する
複数の受光素子にそれぞれ対応する複数のレベルのうち
の最大レベルが所定の範囲に入る列、の数が多くなるよ
うに(好ましくは、最大になるように)、前記2次元受
光センサの前記出力信号に基づいて、スリット状の照射
光14aの輝度を調整する。
That is, the calculation / control unit 18 is the light receiving unit 1
A row of light receiving elements of a two-dimensional light receiving sensor arranged in a direction corresponding to a spreading direction (Y direction) of the slit-shaped irradiation light 14a for at least one of the two-dimensional light receiving sensors. In order to increase the number of columns in which the maximum level of the plurality of levels corresponding to the plurality of light receiving elements belonging to the column in the output signal falls within a predetermined range (preferably, the maximum level), The brightness of the slit-shaped irradiation light 14a is adjusted based on the output signal of the two-dimensional light receiving sensor.

【0057】例えば、演算・制御部18は、まず、前記
第1の実施例と同様にして、受光部15に関して最大レ
ベルDMAXが所定範囲に入る列の数が多くなるようにス
リット状の照射光14aの輝度の調整を行う。そして、
このようにして調整された第1の輝度において、受光部
15に関して最大レベルDMAXが所定範囲に入る列の数
を得る。次に、前記第1の実施例と同様にして、受光部
31に関して最大レベルDMAXが所定範囲に入る列の数
が多くなるようにスリット状の照射光14aの輝度の調
整を行う。そして、このようにして調整された第2の輝
度において、受光部31に関して最大レベルDMAXが所
定範囲に入る列の数を得る。前記第1の輝度における受
光部15に関して最大レベルDMAXが所定範囲に入る列
の数と、前記第2の輝度における受光部31に関して最
大レベルDMAXが所定範囲に入る列の数とを比較し、ス
リット状の照射光14aの輝度を、その列の数が多い方
の受光部に対応する前記第1又は第2の輝度にする。
For example, the calculation / control unit 18 first performs slit-shaped irradiation so that the number of rows in which the maximum level D MAX falls within a predetermined range for the light-receiving unit 15 increases, as in the first embodiment. The brightness of the light 14a is adjusted. And
In the thus adjusted first luminance, the number of columns in which the maximum level D MAX falls within a predetermined range is obtained for the light receiving unit 15. Next, similarly to the first embodiment, the brightness of the slit-shaped irradiation light 14a is adjusted so that the number of rows in which the maximum level D MAX falls within the predetermined range is increased in the light receiving unit 31. Then, for the second luminance adjusted in this way, the number of columns in which the maximum level D MAX falls within the predetermined range is obtained for the light receiving unit 31. The number of columns in which the maximum level D MAX falls within a predetermined range for the light receiving unit 15 at the first luminance is compared with the number of columns in which the maximum level D MAX falls within a predetermined range for the light receiving unit 31 at the second luminance. The brightness of the slit-shaped irradiation light 14a is set to the first or second brightness corresponding to the light receiving section having the larger number of rows.

【0058】演算・制御部18は、このようなスリット
状の照射光14aの調整が完了すると、前記列の数が多
い方の受光部の2次元受光センサの出力として得られる
切断線13aの画像をフレームメモリ(図示せず)に一
旦記憶し、この画像データに対して前述したサブピクセ
ル処理を行って、Y1方向の各位置において切断線13
aの像21のZ1方向の中心位置を求め、そのデータを
Xステージの位置データと対応させてメモリ(図示せ
ず)に記憶させる。これで、一つの切断線13aに対す
る測定が終了することになる。
When the adjustment of the slit-shaped irradiation light 14a is completed, the arithmetic / control unit 18 produces an image of the cutting line 13a obtained as the output of the two-dimensional light receiving sensor of the light receiving unit having the larger number of rows. Is temporarily stored in a frame memory (not shown), the above-described sub-pixel processing is performed on this image data, and the cutting line 13 is formed at each position in the Y1 direction.
The center position of the image 21 of a in the Z1 direction is obtained, and the data is stored in a memory (not shown) in association with the position data of the X stage. This completes the measurement for one cutting line 13a.

【0059】被測定物13の全体を計測するためにはX
ステージ11を所定量のピッチで動かした後、同様の手
順で測定を繰り返せば良い。被測定物13の全域が所定
のピッチで測定できたなら全ての測定が終了したことに
なる。
To measure the entire object 13 to be measured, X
After moving the stage 11 at a predetermined pitch, the measurement may be repeated in the same procedure. If the entire area of the DUT 13 can be measured at a predetermined pitch, all the measurements are completed.

【0060】本実施例によっても、前記第1の実施例と
同様に、被測定物の面の傾きに左右されずに安定して、
高い精度で被測定物の三次元形状を測定できる。
Also in the present embodiment, similarly to the first embodiment, the stable measurement is performed without being influenced by the inclination of the surface of the object to be measured,
The three-dimensional shape of the measured object can be measured with high accuracy.

【0061】ただし、既に説明したように、受光する反
射光の光量が変化する原因が、光の照射方向及び被測定
物からの反射光の受光方向と被測定物の測定点の面の傾
きとの関係であるので、被測定物の測定箇所によってい
ずれか一方の受光部の受光状態の方が他方の受光部の受
光状態より良くなる。したがって、本実施例では、各受
光部15,31の受光状態に応じて良い方の受光部の出
力が計測データとして採用されることになり、単一の受
光部15のみを用いていた前記第1の実施例に比べて、
一層測定精度の向上を図ることができる。
However, as described above, the cause of the change in the amount of the reflected light received is that the light irradiation direction and the light receiving direction of the reflected light from the object to be measured and the inclination of the surface of the measuring point of the object to be measured. Therefore, the light receiving state of either one of the light receiving portions is better than the light receiving state of the other light receiving portion depending on the measurement location of the object to be measured. Therefore, in the present embodiment, the output of the light receiving unit that is better depending on the light receiving state of each of the light receiving units 15 and 31 is adopted as the measurement data, and only the single light receiving unit 15 is used. Compared to the first embodiment,
The measurement accuracy can be further improved.

【0062】以上、本発明の各実施例について説明した
が、本発明はこれらの実施例に限定されるものではな
い。
Although the respective embodiments of the present invention have been described above, the present invention is not limited to these embodiments.

【0063】例えば、単一の光距離センサが用いられて
いたが、複数の光距離センサを用いてもよい。また、光
距離センサにおける受光部の数も限定されるものではな
い。
For example, although a single optical distance sensor is used, a plurality of optical distance sensors may be used. Further, the number of light receiving parts in the optical distance sensor is not limited.

【0064】また、前記各実施例では、光距離センサと
被測定物との間の相対位置を変更させる位置変更手段と
してXステージ11が採用されていたが、その相対位置
を所望の三次元形状を得るのに必要な位置にすることが
できれば、位置変更手段として任意の構成を採用するこ
とができる。
Further, in each of the above-described embodiments, the X stage 11 is adopted as the position changing means for changing the relative position between the optical distance sensor and the object to be measured, but the relative position is changed to a desired three-dimensional shape. If the position necessary for obtaining the position can be obtained, any structure can be adopted as the position changing means.

【0065】[0065]

【発明の効果】以上説明したように、本発明によれば、
被測定物の面の傾きに左右されずに安定して、高い精度
で被測定物の三次元形状を測定できる。
As described above, according to the present invention,
It is possible to measure the three-dimensional shape of the measured object with high accuracy stably without being influenced by the inclination of the surface of the measured object.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施例による三次元形状測定装
置の全体構成を模式的に示す図である。
FIG. 1 is a diagram schematically showing an overall configuration of a three-dimensional shape measuring apparatus according to a first embodiment of the present invention.

【図2】受光部の2次元受光センサの受光状態を示す説
明図である。
FIG. 2 is an explanatory diagram showing a light receiving state of a two-dimensional light receiving sensor of a light receiving unit.

【図3】本発明の第2の実施例による三次元形状測定装
置の全体構成を模式的に示す図である。
FIG. 3 is a diagram schematically showing an overall configuration of a three-dimensional shape measuring apparatus according to a second embodiment of the present invention.

【図4】スリット状の照射光を用いた三角測距式の光距
離センサの測定原理を示す説明図である。
FIG. 4 is an explanatory diagram showing a measurement principle of a triangulation type optical distance sensor using slit-shaped irradiation light.

【図5】被測定物からの反射光の片寄りの状況を示す説
明図である。
FIG. 5 is an explanatory diagram showing a situation where the reflected light from the object to be measured is offset.

【符号の説明】[Explanation of symbols]

11 Xステージ 12 光距離センサ 13 被測定物 13a 切断線 14 照射部 15,31 受光部 16 モータ駆動回路 17 照射部駆動回路 18 演算・制御部 21 切断線の像 11 X stage 12 Optical distance sensor 13 Object to be measured 13a Cutting line 14 Irradiation unit 15, 31 Light receiving unit 16 Motor drive circuit 17 Irradiation unit drive circuit 18 Arithmetic / control unit 21 Image of cutting line

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 被測定物に対してスリット状の照射光を
照射する照射部と、2次元配列された複数の受光素子を
持った2次元受光センサを有する受光部であって、前記
照射光による前記被測定物上の像を前記2次元受光セン
サ上で受光する受光部と、を備えた光距離センサと、 前記光距離センサと前記被測定物との間の相対位置を変
更させる位置変更手段と、 前記光距離センサと前記被測定物との間の所定の複数の
相対位置に応じた前記2次元受光センサの出力信号に基
づいて、前記被測定物の三次元形状データを作製する三
次元形状データ作製手段と、 を備えた三次元形状測定装置において、 前記スリット状の照射光の拡がり方向に対応する方向と
直交する方向に並んだ前記2次元受光センサの受光素子
の列であって、前記出力信号における当該列に属する複
数の受光素子にそれぞれ対応する複数のレベルのうちの
最大レベルが所定の範囲内に入る列、の数が多くなるよ
うに、前記2次元受光センサの前記出力信号に基づい
て、前記照射光の輝度を調整する調整手段を、更に備え
たことを特徴とする三次元形状測定装置。
1. A light-receiving unit having a two-dimensional light receiving sensor having a plurality of light-receiving elements arranged two-dimensionally, and an irradiation unit for irradiating an object to be measured with slit-shaped irradiation light. An optical distance sensor including a light receiving section for receiving an image on the object to be measured by the two-dimensional light receiving sensor according to the above, and a position change for changing a relative position between the optical distance sensor and the object to be measured. Means for producing three-dimensional shape data of the object to be measured based on output signals of the two-dimensional light receiving sensor according to a plurality of predetermined relative positions between the optical distance sensor and the object to be measured. A three-dimensional shape measuring apparatus comprising: original shape data generating means, wherein a row of light receiving elements of the two-dimensional light receiving sensor is arranged in a direction orthogonal to a direction corresponding to a spreading direction of the slit-shaped irradiation light. , In the output signal Based on the output signal of the two-dimensional light receiving sensor so that the number of rows in which the maximum level among the plurality of levels corresponding to the plurality of light receiving elements belonging to the row falls within a predetermined range, increases. A three-dimensional shape measuring apparatus further comprising adjusting means for adjusting the brightness of the irradiation light.
【請求項2】 被測定物に対してスリット状の照射光を
照射する照射部と、各々が、2次元配列された複数の受
光素子を持った2次元受光センサを有する複数の受光部
であって、各々が、前記照射光による前記被測定物上の
像を前記2次元受光センサ上で互いに異なる方向で受光
する複数の受光部と、を備えた光距離センサと、 前記光距離センサと前記被測定物との間の相対位置を変
更させる位置変更手段と、 前記光距離センサと前記被測定物との間の所定の複数の
相対位置に応じた前記複数の受光部の2次元受光センサ
うちの少なくとも一つの出力信号に基づいて、前記被測
定物の三次元形状データを作製する三次元形状データ作
製手段と、 を備えた三次元形状測定装置において、 前記複数の受光部のうちの少なくとも1つに関して、前
記スリット状の照射光の拡がり方向に対応する方向と直
交する方向に並んだ前記2次元受光センサの受光素子の
列であって、前記出力信号における当該列に属する複数
の受光素子にそれぞれ対応する複数のレベルのうちの最
大レベルが所定の範囲内に入る列、の数が多くなるよう
に、前記2次元受光センサの前記出力信号に基づいて、
前記照射光の輝度を調整する調整手段を、更に備えたこ
とを特徴とする三次元形状測定装置。
2. An irradiation section for irradiating an object to be measured with slit-shaped irradiation light, and a plurality of light receiving sections each having a two-dimensional light receiving sensor having a plurality of two-dimensionally arranged light receiving elements. And an optical distance sensor, each of which includes a plurality of light receiving portions that receive the image of the object to be measured by the irradiation light on the two-dimensional light receiving sensor in different directions from each other; Of the two-dimensional light receiving sensors of the plurality of light receiving units according to a plurality of predetermined relative positions between the optical distance sensor and the object to be measured, a position changing unit that changes a relative position to the object to be measured. A three-dimensional shape data creating unit that creates three-dimensional shape data of the object to be measured based on at least one output signal of Regarding one, before A plurality of rows of light-receiving elements of the two-dimensional light-receiving sensor arranged in a direction orthogonal to the direction corresponding to the spread direction of the slit-shaped irradiation light, each row corresponding to a plurality of light-receiving elements belonging to the row in the output signal. Based on the output signal of the two-dimensional light receiving sensor, the number of columns in which the maximum level of the
The three-dimensional shape measuring apparatus further comprising an adjusting unit that adjusts the brightness of the irradiation light.
JP7061747A 1995-02-24 1995-02-24 Three-dimensional shape measuring device Pending JPH08233520A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7061747A JPH08233520A (en) 1995-02-24 1995-02-24 Three-dimensional shape measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7061747A JPH08233520A (en) 1995-02-24 1995-02-24 Three-dimensional shape measuring device

Publications (1)

Publication Number Publication Date
JPH08233520A true JPH08233520A (en) 1996-09-13

Family

ID=13180079

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7061747A Pending JPH08233520A (en) 1995-02-24 1995-02-24 Three-dimensional shape measuring device

Country Status (1)

Country Link
JP (1) JPH08233520A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003028717A (en) * 2001-07-13 2003-01-29 Advantest Corp Optical wavelength measuring device, method, program, and recording medium recording the program
WO2008156329A1 (en) * 2007-06-20 2008-12-24 Konkuk University Industrial Cooperation Corp. System for measuring the wrinkle on web in r2r process
US7791738B2 (en) 2007-01-17 2010-09-07 Konica Minolta Sensing, Inc. Three-dimensional shape measuring device, and portable measuring device
JP2012103266A (en) * 2006-10-05 2012-05-31 Keyence Corp Optical displacement gauge, optical displacement measuring method, and optical displacement measuring program

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003028717A (en) * 2001-07-13 2003-01-29 Advantest Corp Optical wavelength measuring device, method, program, and recording medium recording the program
JP2012103266A (en) * 2006-10-05 2012-05-31 Keyence Corp Optical displacement gauge, optical displacement measuring method, and optical displacement measuring program
US7791738B2 (en) 2007-01-17 2010-09-07 Konica Minolta Sensing, Inc. Three-dimensional shape measuring device, and portable measuring device
WO2008156329A1 (en) * 2007-06-20 2008-12-24 Konkuk University Industrial Cooperation Corp. System for measuring the wrinkle on web in r2r process
KR100916615B1 (en) * 2007-06-20 2009-09-14 건국대학교 산학협력단 Web wrinkle measuring system in roll-to-roll process

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