JPH09243794A - X-ray or gamma-ray shielding equipment - Google Patents

X-ray or gamma-ray shielding equipment

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Publication number
JPH09243794A
JPH09243794A JP8081906A JP8190696A JPH09243794A JP H09243794 A JPH09243794 A JP H09243794A JP 8081906 A JP8081906 A JP 8081906A JP 8190696 A JP8190696 A JP 8190696A JP H09243794 A JPH09243794 A JP H09243794A
Authority
JP
Japan
Prior art keywords
ray
shielding
rays
passage
opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8081906A
Other languages
Japanese (ja)
Inventor
Yoshinao Iizuka
義尚 飯塚
Masahiro Izutsu
政弘 井筒
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ebara Corp filed Critical Ebara Corp
Priority to JP8081906A priority Critical patent/JPH09243794A/en
Priority to PL97328797A priority patent/PL185245B1/en
Priority to PCT/JP1997/000772 priority patent/WO1997034305A1/en
Priority to DE69713304T priority patent/DE69713304T2/en
Priority to BR9707904A priority patent/BR9707904A/en
Priority to EP97907280A priority patent/EP0888622B1/en
Publication of JPH09243794A publication Critical patent/JPH09243794A/en
Priority to BG102734A priority patent/BG63177B1/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide an X-ray or γ-ray shielding equipment in which the space and material required for a shielding passage part can be significantly reduced. SOLUTION: In an X-ray or γ-ray shielding equipment in which an X-ray or γ-ray generating source 1 is enclosed by a shielding wall 2 having an opening part, a bent partitioning plate 4 is set in the opening part of the shielding wall 2 or a passage 3 leading to the opening part which uses the shielding wall as the outer wall (hereinafter referred to as shielding passage). The bent partitioning plate 4 is preferably set in such a manner that the outlet can not be directly seen from the shielding wall opening part or the inlet of the passage leading to it, and can be formed of a screen-like plate or spiral plate.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、X線又はγ線の遮
蔽設備に係り、開口部から外部に漏洩するX線又はγ線
を遮蔽するためのX線又はγ線遮蔽設備に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to X-ray or γ-ray shielding equipment, and more particularly to X-ray or γ-ray shielding equipment for shielding X-rays or γ-rays leaking from an opening to the outside.

【0002】[0002]

【従来の技術】従来、X線又はγ線を遮蔽する場合、線
源の周囲をコンクリート、鉛、鉄などの遮蔽壁で囲うこ
とでX線又はγ線を壁内で減衰させ、外部への漏洩を防
いでいる。しかし、X線又はγ線発生時にも物質の出入
りがあるために、遮蔽壁を完全に密閉出来なく、開口部
分のある場合、例えば、発生源が製造ラインの工程の一
部であって、製造物を開口部から取り出す場合や、排ガ
スや排水の連続処理工程の一部であって、処理物を開口
部から取り出す場合、あるいは遮蔽設備内の換気口に対
しては、開口部分から外部に漏洩するX線又はγ線を、
別の方法で遮蔽しなければならない。一般に、電磁波で
あるX線又はγ線は、物質内を透過する際に減衰する他
に、線源からの距離が離れるほど減衰し、物質表面で反
射する毎に減衰する。したがって、開口部分から外部に
漏洩するX線又はγ線を遮蔽するためには、線源部分と
開口部の間にX線又はγ線が漏洩しないような遮蔽壁で
囲った通路(以下遮蔽通路という)を設け、かつその通
路を長くして、さらに屈曲させることでX線又はγ線を
減衰させる方法が用いられている。
2. Description of the Related Art Conventionally, in the case of shielding X-rays or γ-rays, by surrounding the radiation source with a shielding wall made of concrete, lead, iron or the like, the X-rays or γ-rays are attenuated inside the wall to Prevents leakage. However, when the X-rays or γ-rays enter and exit the substance, the shielding wall cannot be completely sealed and there is an opening, for example, the source is part of the process of the production line, When taking out a product from the opening, or when taking out the processed product from the opening as a part of the continuous treatment process of exhaust gas or wastewater, or when the ventilation port in the shielding facility is leaked to the outside from the opening. X-rays or γ-rays
Must be shielded in another way. In general, X-rays or γ-rays, which are electromagnetic waves, are attenuated when they pass through a substance, and are attenuated as the distance from the radiation source increases, and are attenuated each time they are reflected by the substance surface. Therefore, in order to shield X-rays or γ-rays leaking from the opening to the outside, a passage surrounded by a shielding wall (hereinafter referred to as a shielding passage) between the radiation source portion and the opening so as not to leak X-rays or γ-rays. Is provided and the passage is lengthened and further bent to attenuate X-rays or γ-rays.

【0003】この方法を用いた遮蔽設備の一例を図7に
示す。遮蔽通路部分での距離と反射による減衰の効果
(以下減衰率という。遮蔽部分の入口と出口で放射線強
度が100分の1になるとき、この遮蔽の減衰率は10
0である。)を計算する場合、次の式1に示す経験式が
用いられており、図7のような遮蔽通路部分の設計は式
1によって行われている。 I=I0 ×L-2×R-N ・・・式1 ここで、I0 はX線又はγ線の線源での強度、Iは通路
出口位置での強度、Lは線源から出口までの距離、Rは
X線の反射1回あたりの減衰率、Nは線源から開口部分
に至るまでのX線又はγ線の反射回数である。つまり、
遮蔽通路部分でのX線の減衰率η(=L2 ×RN )は、
線源からの距離の2乗に比例し、反射回数の指数乗に比
例する。
An example of shielding equipment using this method is shown in FIG. The distance in the shielded passage and the effect of attenuation due to reflection (hereinafter referred to as the attenuation rate. When the radiation intensity becomes 1/100 at the entrance and the exit of the shielded part, the attenuation rate of this shield is 10
0. ), The empirical formula shown in the following formula 1 is used, and the design of the shield passage portion as shown in FIG. I = I 0 × L −2 × R −N ( 1) where I 0 is the intensity of the X-ray or γ-ray at the source, I is the intensity at the passage exit position, and L is the outlet from the source. To R, R is the attenuation rate per reflection of X-rays, and N is the number of reflections of X-rays or γ-rays from the radiation source to the opening. That is,
The attenuation rate η (= L 2 × RN ) of X-rays in the shield passage portion is
It is proportional to the square of the distance from the radiation source and to the exponential power of the number of reflections.

【0004】X線又はγ線の減衰率は、式1で示される
ように距離と反射回数に依存するため、開口部分を持つ
遮蔽設備は、密閉型の設備に比べて遮蔽に要するスペー
スと資材が、大幅に増加する結果となる。そして、X線
又はγ線の発生量が増えるほど、またエネルギーが高く
なるほど、遮蔽に必要な距離と反射回数が増えるため、
遮蔽に要するスペースと資材の増加の割合も高くなる。
また、設備内に出入りする物質の量が増えれば、遮蔽通
路の断面積が大きくなり、やはりスペースと資材の増加
の割合はさらに高くなる。スペースの増加は設備配置上
の障害になり、資材の増加は遮蔽設備のコスト上昇ばか
りではなく、重量増加による基礎工事のコスト上昇にも
つながる。
Since the attenuation rate of X-rays or γ-rays depends on the distance and the number of reflections as shown by the equation 1, the shielding equipment having an opening portion requires more space and materials for shielding than the closed type equipment. However, this results in a large increase. As the amount of X-rays or γ-rays generated increases and the energy increases, the distance required for shielding and the number of reflections increase,
The rate of increase in space and materials required for shielding will also increase.
In addition, as the amount of substances entering and exiting the facility increases, the cross-sectional area of the shielding passage increases, and the rate of increase in space and materials also increases. An increase in space will be an obstacle to equipment layout, and an increase in materials will not only increase the cost of shielding equipment, but also increase the cost of foundation work due to the increase in weight.

【0005】[0005]

【発明が解決しようとする課題】本発明は、上記従来技
術の問題点を解消し、遮蔽通路部分に要するスペースと
資材を大幅に削減することができるX線又はγ線の遮蔽
設備を提供することを課題とする。
SUMMARY OF THE INVENTION The present invention solves the problems of the prior art and provides an X-ray or γ-ray shield facility which can significantly reduce the space and materials required for the shield passage portion. This is an issue.

【0006】[0006]

【課題を解決するための手段】上記課題を解決するため
に、本発明では、X線又はγ線の発生源を、開口部を持
つ遮蔽壁で囲むX線又はγ線の遮蔽設備において、該遮
蔽壁の開口部又は該遮蔽壁を外壁とする開口部に至る通
路(以下遮蔽通路という)に、屈曲した仕切板を設置す
ることとしたものである。前記X線又はγ線の遮蔽設備
において、屈曲した仕切板は、遮蔽壁開口部又はそこに
至る通路の入口から出口を直接見通せないように設置す
るのがよく、そして、該屈曲した仕切板は、屏風状の板
又は螺旋状の板とすることができる。また、本発明のX
線又はγ線の遮蔽設備は、電子ビームを用いる排ガス処
理法等においての電子ビーム照射時に発生するX線又は
γ線を遮蔽することができる。
In order to solve the above problems, the present invention provides an X-ray or γ-ray shielding facility in which an X-ray or γ-ray source is surrounded by a shielding wall having an opening. A bent partition plate is installed in the opening of the shield wall or a passage (hereinafter referred to as a shield passage) leading to the opening having the shield wall as an outer wall. In the X-ray or γ-ray shielding equipment, it is preferable that the bent partition plate is installed so as not to directly see the entrance to the exit of the shield wall opening or the passage leading to it. , A folding plate or a spiral plate. In addition, X of the present invention
The X-ray or γ-ray shielding facility can shield X-rays or γ-rays generated during electron beam irradiation in an exhaust gas treatment method using an electron beam.

【0007】[0007]

【発明の実施の形態】次に、本発明を図面を用いて説明
する。図1は、本発明のX線又はγ線の遮蔽設備の一例
を示す水平断面図であり、図2に、図1で用いる仕切板
の拡大斜視図を示す。図1において、1はX線発生源
(電子加速器)、2は遮蔽壁、3は開口部又は開口部通
路、4は仕切板であり、ここでは4-1、4-2の2板設置
している。X線の入射側をA、出口側をBとする。仕切
板4の拡大図を図2に示し、図2で、5は板7を固定す
る天板であり、6は同床板であり、ここでは板7を3枚
90°に折り曲げて5と6で固定して仕切板4としてい
る。図3は本発明のX線又はγ線の遮蔽設備の他の例を
示す水平断面図であり、この例では、仕切板4が螺旋状
8となっており、他は図1と同じである。
Next, the present invention will be described with reference to the drawings. FIG. 1 is a horizontal sectional view showing an example of X-ray or γ-ray shielding equipment of the present invention, and FIG. 2 shows an enlarged perspective view of a partition plate used in FIG. In FIG. 1, 1 is an X-ray generation source (electron accelerator), 2 is a shield wall, 3 is an opening or an opening passage, 4 is a partition plate, and here two plates of 4 -1 , 4 -2 are installed. ing. Let X be the incident side of X-rays and B be the exit side. An enlarged view of the partition plate 4 is shown in FIG. 2. In FIG. 2, 5 is a top plate for fixing the plate 7, 6 is the same floor plate, and here, the plates 7 are bent at 90 ° to form 5 and 6 It is fixed as and is used as the partition plate 4. FIG. 3 is a horizontal cross-sectional view showing another example of the X-ray or γ-ray shielding equipment of the present invention. In this example, the partition plate 4 has a spiral shape 8 and is otherwise the same as FIG. .

【0008】[0008]

【実施例】以下、本発明を実施例により具体的に説明す
る。 実施例1 試験に用いた仕切板は図2に示すものであり、図2の仕
切板を図1のように2段並べ電子ビーム照射によるX線
遮蔽試験を行った。入射X線の最大エネルギーは0.5
MeVと0.8MeVで行い、それぞれのエネルギーに
対して仕切板の材質と厚さを表1のように変えて測定を
行った。表1中の対半価層比とは、表2に示した半価層
(X線強度を半分に減衰させるのに必要な厚さ)に対す
る仕切板の厚さ比である。
The present invention will be described below in more detail with reference to examples. Example 1 The partition plate used in the test is shown in FIG. 2, and the partition plate of FIG. 2 was arranged in two stages as shown in FIG. 1 to perform an X-ray shielding test by electron beam irradiation. Maximum energy of incident X-ray is 0.5
Measurement was performed at MeV and 0.8 MeV, and the material and thickness of the partition plate were changed as shown in Table 1 for each energy. The ratio to the half-value layer in Table 1 is the thickness ratio of the partition plate to the half-value layer (thickness required to reduce the X-ray intensity to half) shown in Table 2.

【0009】[0009]

【表1】 [Table 1]

【0010】[0010]

【表2】 注:半価層算出にあたり物質の全吸収係数は「放射線」 (共立出版)、また密度は「理科年表」(丸善)よ り引用した。[Table 2] Note: In calculating the half-value layer, the total absorption coefficient of the substance was quoted from "Radiation" (Kyoritsu Publishing), and the density was quoted from "Science Chronology" (Maruzen).

【0011】図1で遮蔽設備のX線入射側をA点、出口
側をB点とする。A点でのX線強度をIA 、B点でのX
線強度をIB とすると、この試験装置でのX線減衰率η
はη=IA /IB となる。仕切板の材質と板厚、及び入
射X線エネルギーを変えた一連の実験で、半価層比に対
する減衰率をグラフにしたものが図4である。仕切板の
厚さが、半価層の2.5倍(減衰率で22.5=5.
7)あれば透過X線は抑えられることが確認された。ま
た、仕切板が半価層の2.5倍よりも薄い場合において
も、仕切板がない場合の距離のみの減衰に対して、依然
大きな減衰効果が得られることが確認された。例えば半
価層比0.1の場合においても、減衰率50〜100と
効果は大きい。逆に、仕切板をさらに厚くしても、減衰
の効果は変わらないが、施工上あるいは経済的なデメリ
ットが増えるのみなので、現実的には半価層の数10倍
程度が上限と考える。
In FIG. 1, the X-ray entrance side of the shielding equipment is designated as point A, and the exit side is designated as point B. X-ray intensity at point A is I A , X at point B
If the line intensity is I B , the X-ray attenuation rate η in this test apparatus is
Becomes η = I A / I B. FIG. 4 is a graph showing the attenuation rate with respect to the half-value layer ratio in a series of experiments in which the material and thickness of the partition plate and the incident X-ray energy were changed. The thickness of the partition plate is 2.5 times that of the half-value layer (22.5 = 5.
It was confirmed that the transmitted X-rays could be suppressed if 7). Further, it was confirmed that even when the partition plate is thinner than 2.5 times the half-value layer, a large damping effect can still be obtained against the attenuation of only the distance when there is no partition plate. For example, even when the half-value layer ratio is 0.1, the effect is large with an attenuation rate of 50 to 100. On the contrary, even if the partition plate is made thicker, the damping effect does not change, but only the demerit in construction or economically increases, so in reality, it is considered that the upper limit is about several tens of times the half-value layer.

【0012】次に、仕切板の厚さは変えずに、図1の装
置の設置段数を増加して測定を行った(図1中の破線部
分にも仕切板を設置し、合計3段とした)。X線の最大
エネルギーを0.5MeV、仕切板の板厚を鉛20mm
とし、1段、2段、3段で減衰率を測定した結果が図5
である。図5は、鉛仕切板の板厚が20mmあるため、
透過X線の影響のない、反射X線の減衰効果のみを示し
ている。この結果、得られた仕切板の設置段数と減衰率
の関係は、式1の関係式ではなく、我々が独自に見いだ
した以下の関係式(式2)を満足することが確認され
た。 In =In-1 ×(α×Ln 2 /S+β)-1 ・・・式2
Next, without changing the thickness of the partition plate, the number of installation stages of the apparatus of FIG. 1 was increased and the measurement was carried out (a partition plate was also installed in the broken line portion in FIG. did). Maximum energy of X-ray is 0.5 MeV, partition plate thickness is lead 20 mm
Fig. 5 shows the results of measuring the attenuation rate at 1st stage, 2nd stage and 3rd stage.
It is. 5 shows that the lead partition plate has a thickness of 20 mm,
Only the attenuation effect of reflected X-rays without the influence of transmitted X-rays is shown. As a result, it was confirmed that the relation between the number of installation steps of the partition plate and the damping rate obtained does not satisfy the relational expression of Equation 1 but the following relational equation (Equation 2) that we independently found. I n = I n-1 × (α × L n 2 / S + β) -1 Equation 2

【0013】ここで式2について説明する。例えば、図
6のような遮蔽通路において、曲がり部分P1 、P2
・・・、Pn でのX線強度を、それぞれI1 、I2 、・
・・、In とし、通路断面積をS、通路曲がり部分P
n-1 からPn までの距離をLnとすれば、Pn でのX線
強度In は、1つ前の曲がり部分Pn-1 での強度In-1
をもとに、式2のように計算できる。αとβは通路断面
形状に依存する定数であり、(α×Ln 2 /S+β)が
曲がり1回当たりの減衰率である。つまり、式2によれ
ば、遮蔽通路の曲がり部分での減衰は、反射点からの距
離の2乗に比例し、通路の断面積に反比例することがわ
かる。この作用に着目すれば、反射の回数と距離を増や
す以外に、仕切板のピッチを狭くするなどして、通路断
面積を小さくすることでも減衰効果を上げることができ
る。
Equation 2 will now be described. For example, in a shielded passage as shown in FIG. 6, curved portions P 1 , P 2 ,
..., X-ray intensities at P n are I 1 , I 2 , ...
.., I n , cross-sectional area of passage S, passage bent portion P
If the distance from the n-1 to P n and L n, X-ray intensity I n at P n, the intensity I n-1 at the previous bend P n-1
Based on, it can be calculated as in Equation 2. α and β are constants depending on the cross-sectional shape of the passage, and (α × L n 2 / S + β) is the damping rate per turn. That is, according to Equation 2, it can be seen that the attenuation at the curved portion of the shielded passage is proportional to the square of the distance from the reflection point and inversely proportional to the cross-sectional area of the passage. Focusing on this action, in addition to increasing the number of reflections and the distance, the damping effect can be enhanced by reducing the passage cross-sectional area by narrowing the partition plate pitch.

【0014】実施例2 次に、螺旋状の仕切板を用いて、電子ビーム照射による
X線遮蔽試験を行った。実験装置全体は図3に示すとお
りである。仕切板は10mm厚の鉄板を用い、入射X線
の最大エネルギーは0.5MeVと0.8MeVで測定
を行った。この試験の結果、実験装置でのX線減衰率η
(η=IA /IB )として0.5MeVでη=200
0、0.8MeVでη=1500が得られ、実施例1と
同様の遮蔽効果が確認された。
Example 2 Next, an X-ray shielding test by electron beam irradiation was conducted using a spiral partition plate. The whole experimental apparatus is as shown in FIG. A 10 mm thick iron plate was used as the partition plate, and the maximum energy of the incident X-ray was measured at 0.5 MeV and 0.8 MeV. As a result of this test, the X-ray attenuation rate η
(Η = I A / I B ) as in 0.5 MeV eta = 200
Η = 1500 was obtained at 0 and 0.8 MeV, and the same shielding effect as in Example 1 was confirmed.

【0015】[0015]

【発明の効果】本発明によれば、開口部をもつX線遮蔽
設備の開口部又は遮蔽通路部分に、前記のように仕切板
を設置することにより、X線遮蔽効率を高め、遮蔽設備
の設置スペースと建設コストを節約することができる。
According to the present invention, the partition plate is installed in the opening portion or the shield passage portion of the X-ray shielding equipment having the opening portion as described above, whereby the X-ray shielding efficiency is improved and the shielding equipment Installation space and construction cost can be saved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のX線又はγ線の遮蔽設備の一例を示す
水平断面図。
FIG. 1 is a horizontal sectional view showing an example of X-ray or γ-ray shielding equipment of the present invention.

【図2】図1の仕切板の拡大斜視図。FIG. 2 is an enlarged perspective view of the partition plate of FIG.

【図3】本発明のX線又はγ線の遮蔽設備の他の例を示
す水平断面図。
FIG. 3 is a horizontal sectional view showing another example of X-ray or γ-ray shielding equipment of the present invention.

【図4】対半価層比に対するX線減衰率を示すグラフ。FIG. 4 is a graph showing an X-ray attenuation rate with respect to a half-value layer ratio.

【図5】仕切板設置段数とX線減衰率を示すグラフ。FIG. 5 is a graph showing the number of partitions installed and the X-ray attenuation rate.

【図6】式2を説明するための遮蔽通路図。FIG. 6 is a shielding path diagram for explaining Expression 2.

【図7】従来の開口部を持つ遮蔽設備の水平断面図。FIG. 7 is a horizontal sectional view of a conventional shielding facility having an opening.

【符号の説明】[Explanation of symbols]

1:X線発生源、2:遮蔽壁、3:開口部又は開口部通
路、4:仕切板、5:固定天板、6:固定床板、7:
板、8:螺旋状仕切板、
1: X-ray generation source, 2: Shielding wall, 3: Opening or opening passage, 4: Partition plate, 5: Fixed top plate, 6: Fixed floor plate, 7:
Board, 8: spiral partition board,

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 X線又はγ線の発生源を、開口部を持つ
遮蔽壁で囲むX線又はγ線の遮蔽設備において、該遮蔽
壁の開口部又は該遮蔽壁を外壁とする開口部に至る通路
(以下遮蔽通路という)に、屈曲した仕切板を設置する
ことを特徴とするX線又はγ線の遮蔽設備。
1. An X-ray or γ-ray shielding facility in which a source of X-rays or γ-rays is surrounded by a shielding wall having an opening, in an opening of the shielding wall or an opening having the shielding wall as an outer wall. A shielding facility for X-rays or γ-rays, characterized in that a curved partition plate is installed in a passage (hereinafter referred to as a shielding passage) to reach.
【請求項2】 前記屈曲した仕切板は、遮蔽壁開口部又
はそこに至る通路の入口から出口を直接見通せないよう
に設置することを特徴とする請求項1記載のX線又はγ
線の遮蔽設備。
2. The X-ray or γ according to claim 1, wherein the bent partition plate is installed so that an opening and an exit of a shielding wall opening or a passage leading to the opening cannot be directly seen through.
Line shielding equipment.
【請求項3】 前記屈曲した仕切板が、屏風状の板であ
ることを特徴とする請求項1又は2記載のX線又はγ線
の遮蔽設備。
3. The X-ray or γ-ray shielding facility according to claim 1, wherein the bent partition plate is a folding screen plate.
【請求項4】 前記屈曲した仕切板が、螺旋状の板であ
ることを特徴とする請求項1又は2記載のX線又はγ線
の遮蔽設備。
4. The X-ray or γ-ray shielding facility according to claim 1, wherein the bent partition plate is a spiral plate.
【請求項5】 前記X線又はγ線が、電子ビーム照射時
に発生するX線又はγ線であることを特徴とする請求項
1〜4のいずれか1項記載のX線又はγ線の遮蔽設備。
5. The shielding of X-rays or γ-rays according to claim 1, wherein the X-rays or γ-rays are X-rays or γ-rays generated during electron beam irradiation. Facility.
【請求項6】 前記電子ビーム照射が、電子ビームを用
いた排ガス処理法において行われることを特徴とする請
求項5記載のX線又はγ線の遮蔽設備。
6. The X-ray or γ-ray shielding facility according to claim 5, wherein the electron beam irradiation is performed in an exhaust gas treatment method using an electron beam.
JP8081906A 1996-03-12 1996-03-12 X-ray or gamma-ray shielding equipment Pending JPH09243794A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP8081906A JPH09243794A (en) 1996-03-12 1996-03-12 X-ray or gamma-ray shielding equipment
PL97328797A PL185245B1 (en) 1996-03-12 1997-03-12 X-rays screening device
PCT/JP1997/000772 WO1997034305A1 (en) 1996-03-12 1997-03-12 SHIELDING FACILITY FOR X-RAYS OR η-RAYS
DE69713304T DE69713304T2 (en) 1996-03-12 1997-03-12 SHIELDING DEVICE FOR X-RAY OR Gamma RAYS
BR9707904A BR9707904A (en) 1996-03-12 1997-03-12 Shielded installations for x-rays or gamma rays
EP97907280A EP0888622B1 (en) 1996-03-12 1997-03-12 Shielding facility for x-rays or gamma-rays
BG102734A BG63177B1 (en) 1996-03-12 1998-08-28 Screening device of x-ray or gamma-rays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8081906A JPH09243794A (en) 1996-03-12 1996-03-12 X-ray or gamma-ray shielding equipment

Publications (1)

Publication Number Publication Date
JPH09243794A true JPH09243794A (en) 1997-09-19

Family

ID=13759495

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8081906A Pending JPH09243794A (en) 1996-03-12 1996-03-12 X-ray or gamma-ray shielding equipment

Country Status (1)

Country Link
JP (1) JPH09243794A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014167973A1 (en) * 2013-04-10 2014-10-16 三菱電機株式会社 Particle beam irradiation chamber
JP2020106335A (en) * 2018-12-26 2020-07-09 三菱造船株式会社 Method for inspecting shielding body

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5015120Y1 (en) * 1973-12-28 1975-05-12
JPS58169588U (en) * 1982-05-07 1983-11-12 株式会社日立製作所 Tight wall penetration part Tight structure
JPS5979747U (en) * 1982-11-19 1984-05-30 東洋エンジニアリング株式会社 Louver with shielding performance
JPS63236999A (en) * 1987-03-25 1988-10-03 動力炉・核燃料開発事業団 radiation shielding device
JPH05223987A (en) * 1992-01-31 1993-09-03 Nec Corp Medical radiation shield room
JPH05281400A (en) * 1992-04-03 1993-10-29 Nissin High Voltage Co Ltd Ventilation hole device for electron irradiation device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5015120Y1 (en) * 1973-12-28 1975-05-12
JPS58169588U (en) * 1982-05-07 1983-11-12 株式会社日立製作所 Tight wall penetration part Tight structure
JPS5979747U (en) * 1982-11-19 1984-05-30 東洋エンジニアリング株式会社 Louver with shielding performance
JPS63236999A (en) * 1987-03-25 1988-10-03 動力炉・核燃料開発事業団 radiation shielding device
JPH05223987A (en) * 1992-01-31 1993-09-03 Nec Corp Medical radiation shield room
JPH05281400A (en) * 1992-04-03 1993-10-29 Nissin High Voltage Co Ltd Ventilation hole device for electron irradiation device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014167973A1 (en) * 2013-04-10 2014-10-16 三菱電機株式会社 Particle beam irradiation chamber
US9399147B2 (en) 2013-04-10 2016-07-26 Mitsubishi Electric Corporation Particle beam irradiation chamber
JP6076470B2 (en) * 2013-04-10 2017-02-08 三菱電機株式会社 Particle beam irradiation room
JP2020106335A (en) * 2018-12-26 2020-07-09 三菱造船株式会社 Method for inspecting shielding body

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