JPH09281188A - Ic-testing apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To calibrate a testing device in a short time by setting between the testing device and a performance board a means for electrically separating the performance board from the testing device and calibrating each part of the testing device without detaching the performance board from on a test head. SOLUTION: A switch is connected as a separating means 60 between a testing device 20 and a cable 15. Because of setting the separating means 60, a performance board 10 can be electrically separated from the testing device 20 without being detached from on a test head 13. Accordingly, a calibration can be started with the manipulation of the switch only. Moreover, the device is restored simply with the manipulation of the switch when the calibration is finished. A time required for the calibration is thus shortened, whereby an IC is tested efficiently.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an IC tester for testing whether an IC operates normally.

[0002]

2. Description of the Related Art FIG. 3 shows a schematic configuration of a conventional IC test apparatus. In the figure, 10 is a performance board, 11 is an IC socket mounted on this performance board 10, 1
2 is an IC to be tested brought into contact with the IC socket 11, 1
Reference numeral 3 denotes a test head for electrically connecting the performance board 10 to a test device, and reference numeral 14 denotes a contactor called a pogo pin provided on the upper surface of the test head 13 so as to project. Each terminal of the IC under test 12 is connected to the test apparatus 20 via the contactor 14 and the cable 15.

The test apparatus 20 includes a function test apparatus 30 for testing the operation of the IC 12 under test, a DC test apparatus 40 for measuring the DC characteristics of each terminal of the IC 12 under test, and a program for performing a load test on the IC 12 under test. And a load test device 50. In the figure, the IC under test 12
Only the configuration for testing one of the terminals is shown. The functional test apparatus 30 includes a driver 31 that gives a test pattern signal to the IC under test 12, and a comparator 32 that determines whether the waveform of the output signal of the IC under test 12 is within a predetermined voltage range. Signals are exchanged with the IC under test 12 via 31 and the comparator 32.

The DC test apparatus 40 comprises a voltage generator for generating a voltage having an accurate value, a current generator for outputting a current having an accurate value, a voltage and current measuring device, etc.
A voltage applied current measurement test to see if a predetermined current flows when a predetermined voltage is applied to the terminal of C12, and a predetermined voltage is applied to the terminal of the IC12 under test with a predetermined current applied. Perform the current applied voltage measurement test to see if it occurs.

The program load test apparatus 50 includes a load resistor 51, a diode bridge 52, a current source 53,
54, a variable voltage source 55, and a switch 56. The switch 56 is set to the ON state, and the signal is output from the IC 12 under test with the load resistor 51 connected to the terminal of the IC 12 under test. The waveform of this signal is taken in through a comparator provided in the functional test device 30, the rising speed and the falling speed are measured, and it is tested whether the rising speed and the falling speed of the output waveform are within the predetermined standard range. . Further, as another test, the switch 56 is set to OFF and the voltage of the variable voltage source 55 is changed to I under test.
The voltage VT in the middle of the output waveform of C12 is set, and I
An output signal is output from C12. Since the voltage of the terminal of the IC under test 12 is lower than the voltage VT set in the variable voltage source 55 when the output signal is in the L logic, the current IP flowing through the current source 53 through the diode bridge 52 flows into the terminal of the IC under test 12. Becomes In addition, I
When the terminal of C12 outputs H logic, the voltage of this terminal becomes higher than the voltage VT of the variable voltage source 55. In this case, the current IN flows out from the terminal of the IC 12 under test, and this current IN is the current source. 54 is sucked. This test tests whether the IC 12 under test outputs a predetermined current to the output terminal in the L logic state and the H logic state.

[0006]

As described above, the test apparatus 20 performs various tests, but in order to ensure the reliability of the test, the output voltage and output current of each test apparatus must be properly calibrated. I won't. For example, the functional test device 30
Then, L of the test pattern signal output from the driver 31
Whether or not the logic voltage and the H logic voltage are properly set, whether or not the threshold voltage of the comparator is set to a predetermined voltage, or in the program load test device 50, the current sources 53 and 54 are set. Whether the current is set in advance to a predetermined current value, the variable voltage source 55
It is necessary to calibrate whether or not the voltage of is the correct value.

When performing these calibrations, the calibration is performed using a voltage generator, a current generator and a voltage / current measuring device provided in the DC test apparatus 40. To perform this calibration, remove the performance board 10 in the past,
With nothing connected to the end of the cable 15, the voltage and current of each part are measured by the DC test device 40.
That is, since various circuits are connected to the performance board 10, the circuit on the performance board 10 becomes a load and affects the calibration. Therefore, it is necessary to remove the performance board 10 and perform calibration.

It takes at least several people to remove the performance board 10 from the test head 13, and it takes a long time only for the removal and the restoration work, not the simple work, and the time required for the calibration work is added. Therefore, the down time (non-operation time) becomes long. As a result, there is a drawback that the efficiency of the IC test becomes poor. An object of the present invention is to provide an IC test apparatus which can complete calibration work in a short time.

[0009]

In the present invention, the IC to be tested is
Calibrate the voltage and current values of each part of the functional test device and the program load test device for performing the functional test of the IC by using the DC test device for testing the DC characteristic of each terminal of I.
In the C test apparatus, a means for electrically disconnecting the performance board is provided between the test apparatus and the performance board.

According to the structure of the present invention, the means for electrically disconnecting the test device and the performance board is provided. Therefore, each part of the test equipment can be calibrated by this disconnecting means without removing the performance board from the test head. be able to. As a result, each part of the test apparatus can be calibrated in a short time, and there is an advantage that the time for which the IC test apparatus is inactive can be significantly reduced.

[0011]

FIG. 1 shows an embodiment of an IC test apparatus according to the present invention. Portions corresponding to those in FIG. 3 are designated by the same reference numerals. In this embodiment, a switch is connected between the test apparatus 20 and the cable 15, and this switch is used as the disconnecting means 60. By providing the separating means 60, the performance board 10 can be mounted on the test head 13
It is possible to electrically disconnect the performance board 10 from the test apparatus 20 without removing it from above.

Therefore, the calibration work can be started only by operating the switch. Further, even when the calibration is completed, it can be restored only by operating the switch, so that there is an advantage that the time required for the calibration can be shortened. FIG. 2 shows another embodiment of the present invention. In the embodiment shown in FIG. 2, the performance board 10 is attached to the holding means 70 for holding the performance board 10 to the test head 13 in a state where the performance board 10 is unlocked.
4 has a structure in which a separating means 60 for separating from 4 is added. The disconnecting means 60 shown in this embodiment moves the performance board 10 to a movable stroke of the contactor 14 (the pogo pin has a movable portion to which a biasing force is applied at the tip in the direction of protruding by a spring, and the stroke of the movable portion). It is composed of means for moving the above. In the example of FIG. 2, the lever 71
The case where the pressing means 70 and the separating means 60 are configured to be moved by is shown.

[0013]

As described above, according to the present invention, the performance board 10 can be electrically separated from the test apparatus 20 by the separation means 60. Therefore, the work of removing the performance board 10 from the test head 13 does not have to be performed, so that each part of the test apparatus 20 can be calibrated in a short time. Therefore, there is an advantage that the IC test can be efficiently performed.

[Brief description of drawings]

FIG. 1 is a connection diagram showing one embodiment of the present invention.

FIG. 2 is a side view showing a modified embodiment of the present invention.

FIG. 3 is a connection diagram for explaining a conventional technique.

[Explanation of symbols]

 10 Performance Board 11 IC Socket 12 IC Under Test 13 Test Head 14 Contact 15 Cable 20 Test Device 30 Functional Test Device 40 DC Test Device 50 Program Load Test Device 60 Disconnection Means

Claims (1)

[Claims] 1. An IC test apparatus comprising a performance board on which an IC under test is mounted and a test head for connecting each terminal provided on the performance board to a test apparatus, the test head comprising: An IC test apparatus comprising means for electrically disconnecting the performance board.