JPH10197890A - Method of manufacturing liquid crystal display panel substrate - Google Patents
Method of manufacturing liquid crystal display panel substrateInfo
- Publication number
- JPH10197890A JPH10197890A JP9000470A JP47097A JPH10197890A JP H10197890 A JPH10197890 A JP H10197890A JP 9000470 A JP9000470 A JP 9000470A JP 47097 A JP47097 A JP 47097A JP H10197890 A JPH10197890 A JP H10197890A
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- Japan
- Prior art keywords
- electrode
- electrodes
- substrate
- inspection
- electrode group
- Prior art date
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
(57)【要約】
【課題】 液晶表示装置に使用されるITO平行電極の
なぞり式短絡検査方法において、一対の検査電極の正確
な位置合わせを必要とせず、検査装置の機種切替え時間
の短縮化と信頼性の高い短絡検査を実現する。
【解決手段】 (a)のように、平行電極となる各電極
n1 ,n2 ,n3 ,n4,n5 ,……は、1本おきに接
続される第1の電極群4と、第1の電極群4を構成する
各電極の間に挟まれた第2の電極群5とが形成されるよ
う基板1上にパターニングし、(b)のように、検査電
極2bを第1の電極群4に接続し、第2の検査電極2a
を平行電極の前記各電極に順次接触するように矢印A方
向に走査させて導通を検査し、その後に第1の電極群4
の各電極を(c)のように電気的に分離する。
(57) [Summary] [PROBLEMS] In a trace-type short-circuit inspection method for ITO parallel electrodes used in a liquid crystal display device, accurate positioning of a pair of inspection electrodes is not required, and the time required to switch the model of the inspection device is reduced. And highly reliable short circuit inspection. As shown in (a), each of electrodes n 1 , n 2 , n 3 , n 4 , n 5 ,... To be parallel electrodes is connected to a first electrode group 4 connected every other electrode. Is patterned on the substrate 1 so that the second electrode group 5 sandwiched between the electrodes constituting the first electrode group 4 is formed, and as shown in FIG. And the second inspection electrode 2a
Are scanned in the direction of arrow A so as to sequentially contact the respective electrodes of the parallel electrodes to check the continuity.
Are electrically separated as shown in FIG.
Description
【0001】[0001]
【発明の属する技術分野】本発明は液晶表示パネルに使
用する基板の製造方法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a substrate used for a liquid crystal display panel.
【0002】[0002]
【従来の技術】上下の基板間に液晶を狭持してなる液晶
表示パネルの製造には、多数のITO平行電極が形成さ
れた液晶表示パネル用基板が使用される。2. Description of the Related Art In manufacturing a liquid crystal display panel having liquid crystal sandwiched between upper and lower substrates, a substrate for a liquid crystal display panel on which a number of ITO parallel electrodes are formed is used.
【0003】従来、この平行電極の間の短絡を検出する
ためには、一対の検査電極を隣接するITO平行電極と
順次接触させて検査電極間の抵抗を測定する(以下、
「なぞり方式」と称す)、あるいは、ITO平行電極と
等ピッチの複数の検査電極をITO平行電極に接触させ
て抵抗を測定していた。Conventionally, in order to detect a short circuit between the parallel electrodes, a pair of test electrodes are sequentially brought into contact with an adjacent ITO parallel electrode, and the resistance between the test electrodes is measured (hereinafter, referred to as “test electrode”).
The resistance was measured by contacting a plurality of test electrodes at the same pitch as the ITO parallel electrode with the ITO parallel electrode.
【0004】図3はこの従来のなぞり方式によるITO
平行電極の配置例と検査方法を示すものである。基板1
の上には平行に配置された複数のITO電極N1 ,N
2 ,…,Nn ,N n+1 ,… が形成されている。このI
TO電極の検査するのに、なぞり方式では、抵抗値検出
器2の一方の検査電極2aを例えば電極Nn に接触さ
せ、他方の検査電極2bを電極Nn+1 に接触させて、隣
接する電極間(Nn −Nn+1 )の導通をチェックし、以
下同様に検査電極2a,2bと基板1を相対移動させ
て、具体的には基板1に対して電極の配列方向(矢印A
方向)に検査電極2a,2bを移動させて次々に抵抗値
を測定して短絡(導通)の有無を確認して液晶表示パネ
ル用基板を製造している。FIG. 3 shows an ITO using the conventional tracing method.
3 shows an example of arrangement of parallel electrodes and an inspection method. Substrate 1
A plurality of ITO electrodes N arranged in parallel1 , N
Two , ..., Nn , N n + 1 , ... are formed. This I
To inspect the TO electrode, the tracing method detects the resistance value
The one inspection electrode 2a of the detector 2n Contacted
And the other inspection electrode 2b is connected to the electrode Nn + 1 Contact
Between the contacting electrodes (Nn -Nn + 1 Check the continuity of
Similarly, the inspection electrodes 2a and 2b and the substrate 1 are relatively moved.
Specifically, the electrode arrangement direction (arrow A
Direction), the test electrodes 2a and 2b are moved in
To check for short-circuit (continuity)
Manufactures substrates for electronic devices.
【0005】[0005]
【発明が解決しようとする課題】このような従来の液晶
表示パネル用基板の製造方法では、一対の検査電極2
a,2bのピッチ寸法とITO平行電極のピッチ寸法を
正確に合わせる必要があるため、製造する液晶表示パネ
ルの機種の切り換え時点では、検査装置の機種切替えに
時間を要し、検査装置の稼働率を低下させている。In such a conventional method of manufacturing a substrate for a liquid crystal display panel, a pair of test electrodes 2 are provided.
Since it is necessary to accurately match the pitch dimensions of a and 2b with the pitch dimensions of the ITO parallel electrodes, it takes time to switch the type of the inspection device when switching the type of the liquid crystal display panel to be manufactured, and the operating rate of the inspection device is high. Is decreasing.
【0006】また、検査電極2a,2bのピッチ寸法の
誤差が大きくなると正しく検査できなくなるという問題
点を有している。本発明は製造する液晶表示パネルの機
種の切り換えが簡単で、検査電極2a,2bのピッチ寸
法の誤差が大きくなっても正しい検査を実施できる液晶
表示パネル用基板の製造方法を提供することを目的とす
る。Another problem is that if the error in the pitch dimension of the test electrodes 2a and 2b increases, the test cannot be performed correctly. An object of the present invention is to provide a method of manufacturing a substrate for a liquid crystal display panel, in which a model of a liquid crystal display panel to be manufactured can be easily switched and a correct inspection can be performed even if an error of a pitch dimension of the inspection electrodes 2a and 2b becomes large. And
【0007】[0007]
【課題を解決するための手段】本発明の液晶表示パネル
用基板の製造方法は、基板上に平行電極を形成する時点
で各電極を電気的に完全に分離してパターニングするの
ではなくて、1本おきに接続される第1の電極群と、第
1の電極群を構成する各電極の間に挟まれた第2の電極
群とが形成されるよう基板上にパターニングし、第1の
電極群とこの第1の電極群を含む全ての電極との間の導
通を測定し、この測定の結果に基づいて平行電極の良否
を判定し、その後に第1の電極群の各電極を電気的に分
離して、良好な平行電極を有する基板を完成させる。According to the method of manufacturing a substrate for a liquid crystal display panel of the present invention, when forming parallel electrodes on a substrate, each electrode is not completely separated and patterned. The first electrode group connected every other electrode and the second electrode group sandwiched between the electrodes constituting the first electrode group are patterned on the substrate to form the first electrode group. The continuity between the electrode group and all the electrodes including the first electrode group is measured, and the pass / fail of the parallel electrode is determined based on the result of the measurement. Thereafter, each electrode of the first electrode group is electrically connected. To complete a substrate having good parallel electrodes.
【0008】この本発明によると、製造する液晶表示パ
ネルの機種の切り換えが簡単で、検査電極のピッチ寸法
の誤差が大きくなっても正しい検査を実施できる。According to the present invention, it is easy to switch the type of the liquid crystal display panel to be manufactured, and a correct inspection can be performed even if an error in the pitch dimension of the inspection electrode becomes large.
【0009】[0009]
【発明の実施の形態】本発明の液晶表示パネル用基板の
製造方法は、多数の平行電極が形成された液晶表示パネ
ル用基板を製造するに際し、前記平行電極となる各電極
は、1本おきに接続される第1の電極群と、第1の電極
群を構成する各電極の間に挟まれた第2の電極群とが形
成されるよう基板上にパターニングし、第1の検査電極
を第1の電極群に接続し、第2の検査電極を平行電極の
前記各電極に順次接触するように前記平行電極の配列方
向に走査させて第1,第2の検査電極の間の導通を検査
し、前記導通検査によって得られる検出波形に基づいて
前記平行電極の良否を判定し、その後に第1の電極群の
各電極を電気的に分離することを特徴とする。BEST MODE FOR CARRYING OUT THE INVENTION According to the method of manufacturing a substrate for a liquid crystal display panel of the present invention, when manufacturing a substrate for a liquid crystal display panel on which a large number of parallel electrodes are formed, every other electrode serving as the parallel electrode is alternately provided. Are patterned on the substrate so that a first electrode group connected to the first electrode group and a second electrode group sandwiched between the electrodes constituting the first electrode group are formed on the substrate. The first inspection electrode is connected to the first electrode group, and the second inspection electrode is scanned in the arrangement direction of the parallel electrodes so as to sequentially contact the respective electrodes of the parallel electrodes, thereby establishing conduction between the first and second inspection electrodes. Inspection and pass / fail of the parallel electrodes are determined based on a detection waveform obtained by the continuity test, and thereafter, each electrode of the first electrode group is electrically separated.
【0010】具体的には、第1の電極群の各電極は、基
板の端部に形成された帯状電極部に一端が接続されて互
いに電気接続されるように基板上にパターニングし、平
行電極の良否の判定後に前記基板の帯状電極部が形成さ
れている端部を分離除去して第1の電極群の各電極を電
気的に分離する。Specifically, each electrode of the first electrode group is patterned on the substrate so that one end is connected to a strip-shaped electrode portion formed at the end of the substrate and is electrically connected to each other. After the determination of pass / fail, the end of the substrate on which the strip-shaped electrode portion is formed is separated and removed to electrically separate the electrodes of the first electrode group.
【0011】以下、本発明の液晶表示パネル用基板の製
造方法を具体的な実施の形態に基づいて説明する。図1
は本発明の製造方法の工程を示す。Hereinafter, a method for manufacturing a substrate for a liquid crystal display panel according to the present invention will be described based on specific embodiments. FIG.
Shows the steps of the production method of the present invention.
【0012】基板1の上に平行電極となる各電極n1 ,
n2 ,n3 ,n4 ,n5 ,…… をパターニングする場
合には、図1の(a)に示すように基板1の端部に沿っ
て形成された帯状電極3に一端が接続された第1の電極
群4のITO電極n1 ,n3,n5 ,… と、この第1
の電極群4のITO電極のn1 とn3 の間,n3 とn 5
の間と云うように、第1の電極群4のITO電極の間に
それぞれ電気的に独立して形成された第2の電極群5の
ITO電極n2 ,n4 ,…とが形成されるようパターニ
ングする。Each electrode n serving as a parallel electrode on a substrate 11 ,
nTwo , NThree , NFour , NFive For patterning, ……
In this case, along the edge of the substrate 1 as shown in FIG.
Electrode having one end connected to a strip electrode 3 formed by
Group 4 ITO electrode n1 , NThree, NFive , ... and this first
N of the ITO electrode of the electrode group 4 of1 And nThree During nThree And n Five
Between the ITO electrodes of the first electrode group 4
Each of the second electrode groups 5 formed electrically independently
ITO electrode nTwo , NFour , ... and Pattani are formed
To run.
【0013】次に、図1の(b)に示すように検査用電
極2a,2bでITO電極n1 ,n 2 ,n3 ,n4 ,n
5 ,…… を配列方向(矢印A方向)に走査して抵抗値
検出器2で導通を測定する。Next, as shown in FIG.
ITO electrode n at poles 2a and 2b1 , N Two , NThree , NFour , N
Five , …… are scanned in the array direction (direction of arrow A) to
The continuity is measured by the detector 2.
【0014】具体的には、検査用電極2a,2bを配列
方向(矢印A方向)に一体に定速で移動させて抵抗値を
測定する。このとき検査用電極2bは連続して常に帯状
電極3に接触している。Specifically, the resistance values are measured by moving the test electrodes 2a and 2b integrally at a constant speed in the arrangement direction (the direction of arrow A). At this time, the inspection electrode 2b is always in contact with the strip electrode 3 continuously.
【0015】このように検査用電極2a,2bを走査さ
せると、抵抗値は図2のように周期的な導通の有無とし
て検出される。しかし、任意の隣接したITO平行電極
間で短絡があると、導通の無いはずのところ(図2の破
線部分)で導通を検出するために短絡の検出ができる。When the inspection electrodes 2a and 2b are scanned as described above, the resistance value is detected as the presence or absence of periodic conduction as shown in FIG. However, if there is a short circuit between any adjacent ITO parallel electrodes, a short circuit can be detected to detect conduction at a place where there should be no conduction (broken line portion in FIG. 2).
【0016】上記の測定で隣接するITO電極間で短絡
していない良品の基板は、次に図1の(c)に示すよう
に帯状電極3が形成されている基板1の端部1aが切断
除去されて、第1の電極群4のITO電極n1 ,n3 ,
n5 ,… が電気的に分離されて平行電極を有する液晶
表示パネル用基板が完成する。A non-defective substrate having no short circuit between the adjacent ITO electrodes in the above measurement is then cut off at the end 1a of the substrate 1 on which the strip electrode 3 is formed as shown in FIG. After being removed, the ITO electrodes n 1 , n 3 ,
n 5, ... is a substrate for a liquid crystal display panel having parallel electrodes are electrically isolated is completed.
【0017】このように検査電極2a,2bのピッチ寸
法の正確な位置合わせが不要となり、検査装置の切替え
時間の短縮化と検査の安定化を図ることができる。上記
の実施の形態では検査電極2a,2bと基板1を相対移
動させたが、基板1における検査電極2bの位置を固定
した状態で、検査電極2aと基板1とを相対移動させて
も同様の効果を期待できる。As described above, it is not necessary to accurately adjust the pitch dimension of the inspection electrodes 2a and 2b, and it is possible to shorten the switching time of the inspection apparatus and stabilize the inspection. In the above-described embodiment, the inspection electrodes 2a and 2b and the substrate 1 are relatively moved. However, the same applies when the inspection electrode 2a and the substrate 1 are relatively moved while the position of the inspection electrode 2b on the substrate 1 is fixed. The effect can be expected.
【0018】上記の実施の形態において、パターニング
された第1の電極群4は電極の相互間が帯状電極3で接
続したが、検査電極2bが接触する電極を基板1の任意
の隅に、例えば方形状に設け、この方形状の電極に第1
の電極群4の端部を電気的に接続するパターンを基板1
の端部に設け、前記方形状の電極に検査電極2bを当接
させ、上記のように検査電極2aと基板1とを相対移動
させても同様の効果を期待できる。In the above-described embodiment, the patterned first electrode group 4 has the electrodes connected to each other by the strip-shaped electrode 3, but the electrode to be contacted with the inspection electrode 2b is placed at any corner of the substrate 1, for example, Provided in a square shape, the first electrode
The pattern for electrically connecting the ends of the electrode group 4 of
The same effect can be expected even if the test electrode 2b is brought into contact with the rectangular electrode and the test electrode 2a and the substrate 1 are relatively moved as described above.
【0019】[0019]
【発明の効果】以上のように本発明によると、平行電極
となる各電極は、1本おきに接続される第1の電極群
と、第1の電極群を構成する各電極の間に挟まれた第2
の電極群とが形成されるよう基板上にパターニングし、
第1の検査電極を第1の電極群に接続し、第2の検査電
極を平行電極の前記各電極に順次接触するように前記平
行電極の配列方向に走査させて第1,第2の検査電極の
間の導通を検査し、前記導通検査によって得られる検出
波形に基づいて前記平行電極の良否を判定し、その後に
第1の電極群の各電極を電気的に分離するので、検査装
置の切替え時間の短縮化と信頼性の高い短絡検査を実現
できる。As described above, according to the present invention, each electrode serving as a parallel electrode is sandwiched between a first electrode group connected every other electrode and each electrode constituting the first electrode group. Second
Patterning on the substrate to form an electrode group of
A first inspection electrode is connected to a first electrode group, and a second inspection electrode is scanned in the arrangement direction of the parallel electrodes so as to sequentially contact the respective electrodes of the parallel electrodes to perform first and second inspections. Inspect the continuity between the electrodes, determine the quality of the parallel electrodes based on the detected waveform obtained by the continuity test, and then electrically separate the electrodes of the first electrode group. Short switching time and highly reliable short-circuit inspection can be realized.
【図1】本発明の液晶表示パネル用基板の製造方法の実
施の形態の工程図FIG. 1 is a process chart of an embodiment of a method of manufacturing a substrate for a liquid crystal display panel according to the present invention.
【図2】同実施の形態の抵抗値測定の結果図FIG. 2 is a diagram showing a result of resistance measurement of the embodiment.
【図3】従来のITO平行電極の短絡検査の概要図FIG. 3 is a schematic view of a conventional short-circuit inspection of an ITO parallel electrode.
1 基板 2 抵抗値検出器 2a,2b 検査用電極 3 帯状電極 4 第1の電極群 5 第2の電極群 n1 ,n2 ,n3 ,n4 ,n5 ,…… 平行電極と
なる各電極1 substrate 2 resistance detector 2a, 2b inspection electrodes 3 strip electrode 4 first electrode group 5 and the second electrode group n 1, n 2, n 3 , n 4, n 5, each becomes ...... parallel electrodes electrode
Claims (2)
ル用基板を製造するに際し、 前記平行電極となる各電極は、1本おきに接続される第
1の電極群と、第1の電極群を構成する各電極の間に挟
まれた第2の電極群とが形成されるよう基板上にパター
ニングし、 第1の検査電極を第1の電極群に接続し、第2の検査電
極を平行電極の前記各電極に順次接触するように前記平
行電極の配列方向に走査させて第1,第2の検査電極の
間の導通を検査し、 前記導通検査によって得られる検出波形に基づいて前記
平行電極の良否を判定し、 その後に第1の電極群の各電極を電気的に分離する液晶
表示パネル用基板の製造方法。When manufacturing a liquid crystal display panel substrate on which a large number of parallel electrodes are formed, each of the electrodes serving as the parallel electrodes includes a first electrode group connected every other electrode and a first electrode. Patterning is performed on the substrate so that a second electrode group sandwiched between the electrodes constituting the group is formed, the first inspection electrode is connected to the first electrode group, and the second inspection electrode is connected to the first electrode group. Scanning is performed in the arrangement direction of the parallel electrodes so as to sequentially contact the respective electrodes of the parallel electrodes to check the continuity between the first and second test electrodes, and based on the detection waveform obtained by the continuity test, A method for manufacturing a substrate for a liquid crystal display panel, comprising: judging pass / fail of parallel electrodes, and thereafter electrically separating each electrode of the first electrode group.
成された帯状電極部に一端が接続されて互いに電気接続
されるように基板上にパターニングし、平行電極の良否
の判定後に前記基板の帯状電極部が形成されている端部
を分離除去して第1の電極群の各電極を電気的に分離す
る請求項1記載の液晶表示パネル用基板の製造方法。2. The method according to claim 1, wherein each electrode of the first electrode group is patterned on the substrate so that one end is connected to a strip-shaped electrode portion formed at an end of the substrate and is electrically connected to each other. 2. The method for manufacturing a substrate for a liquid crystal display panel according to claim 1, wherein after the determination, an end of the substrate on which the strip-shaped electrode portion is formed is separated and removed to electrically separate each electrode of the first electrode group.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9000470A JPH10197890A (en) | 1997-01-07 | 1997-01-07 | Method of manufacturing liquid crystal display panel substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9000470A JPH10197890A (en) | 1997-01-07 | 1997-01-07 | Method of manufacturing liquid crystal display panel substrate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH10197890A true JPH10197890A (en) | 1998-07-31 |
Family
ID=11474692
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9000470A Pending JPH10197890A (en) | 1997-01-07 | 1997-01-07 | Method of manufacturing liquid crystal display panel substrate |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH10197890A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101339302B (en) | 2007-07-05 | 2010-06-16 | 比亚迪股份有限公司 | A kind of ITO test board and test method |
-
1997
- 1997-01-07 JP JP9000470A patent/JPH10197890A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101339302B (en) | 2007-07-05 | 2010-06-16 | 比亚迪股份有限公司 | A kind of ITO test board and test method |
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