JPS5369582A - Coating method for photo-resist - Google Patents
Coating method for photo-resistInfo
- Publication number
- JPS5369582A JPS5369582A JP14600576A JP14600576A JPS5369582A JP S5369582 A JPS5369582 A JP S5369582A JP 14600576 A JP14600576 A JP 14600576A JP 14600576 A JP14600576 A JP 14600576A JP S5369582 A JPS5369582 A JP S5369582A
- Authority
- JP
- Japan
- Prior art keywords
- photo
- resist
- coating method
- coating
- photo resist
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
PURPOSE: To prevent the peeling of film and pin holes from being caused, by coating the photo resist on one surface after coating the photo resist film on other surface and processing under prebake temperature.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14600576A JPS5369582A (en) | 1976-12-03 | 1976-12-03 | Coating method for photo-resist |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14600576A JPS5369582A (en) | 1976-12-03 | 1976-12-03 | Coating method for photo-resist |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5369582A true JPS5369582A (en) | 1978-06-21 |
Family
ID=15397937
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14600576A Pending JPS5369582A (en) | 1976-12-03 | 1976-12-03 | Coating method for photo-resist |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5369582A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08227929A (en) * | 1988-02-12 | 1996-09-03 | Tokyo Electron Ltd | Processing equipment |
| JPH08227928A (en) * | 1988-02-12 | 1996-09-03 | Tokyo Electron Ltd | Resist processing apparatus and resist processing method |
-
1976
- 1976-12-03 JP JP14600576A patent/JPS5369582A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08227929A (en) * | 1988-02-12 | 1996-09-03 | Tokyo Electron Ltd | Processing equipment |
| JPH08227928A (en) * | 1988-02-12 | 1996-09-03 | Tokyo Electron Ltd | Resist processing apparatus and resist processing method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS53108390A (en) | Semiconductor device and its manufacture | |
| JPS51120180A (en) | Pattern printing device | |
| JPS5372464A (en) | Method and apparatus for rotary coating | |
| JPS5369582A (en) | Coating method for photo-resist | |
| JPS52149978A (en) | Developing treatment method of photoresist film | |
| JPS522531A (en) | Method for preventing wear at the surface of a phtosensitive member an d film formation at toner surface | |
| JPS51126073A (en) | Pattern printing equpment made available by photo-etching method | |
| JPS5414165A (en) | Selective oxidation method for semiconductor substrate | |
| JPS5387668A (en) | Forming method of patterns | |
| JPS52117077A (en) | Electron beam-exposing method | |
| JPS533081A (en) | Integrated circuit wiring method | |
| JPS5359978A (en) | Method of nipping parts | |
| JPS5360177A (en) | Photo mask | |
| JPS5318965A (en) | Resist coating method | |
| JPS548467A (en) | Photo etching method | |
| JPS5255866A (en) | Etching method | |
| JPS533821A (en) | Exposure method | |
| JPS52126184A (en) | Preparation of semiconductor device | |
| JPS5316631A (en) | Photographic exposure method | |
| JPS5315073A (en) | Production of semiconductor device | |
| JPS5255381A (en) | Photo exposure method | |
| JPS5338277A (en) | Production of semiconductor device | |
| JPS5368070A (en) | Etching method | |
| JPS5373971A (en) | Manufacture for semiconductor device | |
| JPS5321578A (en) | Function inspection method of semiconductor elements |