JPS54130965A - Resistance measuring circuit of automatically temperature compensated type - Google Patents
Resistance measuring circuit of automatically temperature compensated typeInfo
- Publication number
- JPS54130965A JPS54130965A JP3815178A JP3815178A JPS54130965A JP S54130965 A JPS54130965 A JP S54130965A JP 3815178 A JP3815178 A JP 3815178A JP 3815178 A JP3815178 A JP 3815178A JP S54130965 A JPS54130965 A JP S54130965A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- voltage
- circuit
- current
- compensated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 abstract 1
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Abstract
PURPOSE: To make it possible to accomplish the direct display of measurements, which are accomplished at a room temperature as the resistances of resistors having temperature coefficients at a reference temperature, by setting temperature coefficient setting means and reference temperature setting means at desired values.
CONSTITUTION: The surrounding temperature t of a resistor RX is detected by a temperature detecting circuit TD so that a voltage Vt proportional to the room temperature is obtained in response to the detected signals. A circuit TCG for generating a temperature-compensated voltage is supplied with the voltage Vt and with the voltage Vt0 which are preset in a manner to correspond to a reference temperature t0. That circuit TCG is equipped with means for setting its gain in accordance with the temperature coefficient a of the resistor RX thereby to generate a temperature-compensated voltage Vc having a relationship with the difference between the surrounding temperature t and a reference temperature t0, the temperature coefficient a and a preset refernce voltage Vn of a measured current generating circuit MI. Then, the circuit MI generated a reference measuring current IMO in response to a preset reference voltage Vn and generates a temperature-compensated current Ic in response to the temperature-compensated voltage Vc. These two are added to generate an output current IM. This current IM is fed to the resistor RX so that the resistance can be directly measured.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3815178A JPS54130965A (en) | 1978-04-03 | 1978-04-03 | Resistance measuring circuit of automatically temperature compensated type |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3815178A JPS54130965A (en) | 1978-04-03 | 1978-04-03 | Resistance measuring circuit of automatically temperature compensated type |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS54130965A true JPS54130965A (en) | 1979-10-11 |
Family
ID=12517408
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3815178A Pending JPS54130965A (en) | 1978-04-03 | 1978-04-03 | Resistance measuring circuit of automatically temperature compensated type |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54130965A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4408157A (en) * | 1981-05-04 | 1983-10-04 | Associated Research, Inc. | Resistance measuring arrangement |
| JPS6214383U (en) * | 1985-07-12 | 1987-01-28 | ||
| JPH0399280A (en) * | 1989-09-13 | 1991-04-24 | Hioki Ee Corp | Resistance meter with temperature correction function |
| CN103792430A (en) * | 2012-10-26 | 2014-05-14 | 无锡华润上华科技有限公司 | Self-adaptive range resistance test method |
| CN114113293A (en) * | 2021-10-28 | 2022-03-01 | 汉威科技集团股份有限公司 | Active sensitivity compensation method for photoionization detector, detector and detector |
-
1978
- 1978-04-03 JP JP3815178A patent/JPS54130965A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4408157A (en) * | 1981-05-04 | 1983-10-04 | Associated Research, Inc. | Resistance measuring arrangement |
| JPS6214383U (en) * | 1985-07-12 | 1987-01-28 | ||
| JPH0399280A (en) * | 1989-09-13 | 1991-04-24 | Hioki Ee Corp | Resistance meter with temperature correction function |
| CN103792430A (en) * | 2012-10-26 | 2014-05-14 | 无锡华润上华科技有限公司 | Self-adaptive range resistance test method |
| CN114113293A (en) * | 2021-10-28 | 2022-03-01 | 汉威科技集团股份有限公司 | Active sensitivity compensation method for photoionization detector, detector and detector |
| CN114113293B (en) * | 2021-10-28 | 2023-10-20 | 汉威科技集团股份有限公司 | Photo-ionization detector active sensitivity compensation method, detector and detector |
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