JPS6233545B2 - - Google Patents
Info
- Publication number
- JPS6233545B2 JPS6233545B2 JP52126082A JP12608277A JPS6233545B2 JP S6233545 B2 JPS6233545 B2 JP S6233545B2 JP 52126082 A JP52126082 A JP 52126082A JP 12608277 A JP12608277 A JP 12608277A JP S6233545 B2 JPS6233545 B2 JP S6233545B2
- Authority
- JP
- Japan
- Prior art keywords
- rays
- chlorine
- ray
- characteristic
- sulfur
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
【発明の詳細な説明】
この発明は、例えば石油等の炭化水素化合物に
含まれる硫黄元素含有量を、重金属等下純物混在
下においても精度良く測定する螢光X線硫黄分析
装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a fluorescent X-ray sulfur analyzer that accurately measures the sulfur element content contained in hydrocarbon compounds such as petroleum, even in the presence of pure substances such as heavy metals. be.
従来この種の装置として第1図に示すものがあ
つた。図において1は放射線源であつて例えば
55FeなどのRI線源、あるいはチタン陽極または
タングステン陽極等のX線管を用いている。2
は、石油等の炭化水素化合物試料を収容する試料
部、3は試料から発生する硫黄の特性X線を検出
するX線検出器、4は試料部2と検出器3の間に
介装された妨害X線を除去するためのフイルタで
ある。 A conventional device of this type is shown in FIG. In the figure, 1 is a radiation source, for example
An RI source such as 55 Fe or an X-ray tube with a titanium or tungsten anode is used. 2
3 is an X-ray detector that detects characteristic X-rays of sulfur generated from the sample; 4 is an X-ray detector interposed between the sample portion 2 and the detector 3; This is a filter for removing interfering X-rays.
螢光X線分析いわゆる励起法は、放射線源1か
ら発生する励起放射線を試料部2に収容された試
料に放射させ、試料部2から発生する硫黄の特性
X線等のX線をX線検出器3で検出する。ここで
更に検出された検出X線は図示しない波高弁別器
を併用してエネルギー分析を行なうことにより、
硫黄の特性X線強度を弁別計数し、硫黄含有量の
定量を行なつている。 Fluorescence X-ray analysis In the so-called excitation method, excitation radiation generated from a radiation source 1 is emitted onto a sample housed in a sample section 2, and X-rays such as characteristic X-rays of sulfur generated from the sample section 2 are detected by X-rays. Detected by device 3. The detected X-rays further detected here are subjected to energy analysis using a pulse height discriminator (not shown).
The sulfur content is determined by differentially counting the characteristic X-ray intensity of sulfur.
上記従来装置における検出系での信号計数率
は、一般に次式(1)で表わせる。 The signal count rate in the detection system of the conventional device described above can generally be expressed by the following equation (1).
Ip=I・K・PμS・S/(μH′+μH″)H+(μC′+μC″)C+(μS′+μS″)・S (1)
ここでK;測定系の検出効率
P;硫黄元素の螢光収率(約5×10-2)
H、C、S;単位体積当たりの各組成物の重量
(g/cm3)
μH′、μC′、μS′;励起放射線に対する各組
成元素の全質量吸収係数(cm2/g)
μH″、μC″、μS″;硫黄の特性X線エネルギー
(約2.3kev)での各組成元素の全質量吸収係数
(cm2/g)
μS;励起放射線に対する硫黄元素の光電吸収
係数(cm2/g)
Ip;硫黄の特性X線強度(cps)
I;励起放射線強度(cps)
式中質量吸収係数(μ)はエネルギー依存性が
あり、
特に硫黄の光電効果係数(μS)値が、検出効
率に大きな寄与を示す。これは励起放射線エネル
ギーで与えられ、第1図に示す装置において放射
線源1がγ線源の場合、 55Feの約5.9kev単色X
線、X線管の場合陽極材料によつてチタンの場合
にはその単色特性X線であり、タングステンの場
合は、制動副射等が、励起放射線源として一般に
使用される。 Ip=I・K・Pμ S・S/(μ H ′+μ H ″) H + (μ C ′+ μ C ″) C + (μ S ′+ μ S ″)・S (1) Here, K; Detection efficiency P: Fluorescence yield of sulfur element (approximately 5×10 -2 ) H, C, S: Weight of each composition per unit volume (g/cm 3 ) μH′, μC ′, μS ′ ; Total mass absorption coefficient of each constituent element for excitation radiation (cm 2 /g) μ H ″, μ C ″, μ S ″; Total mass absorption of each constituent element at the characteristic X-ray energy of sulfur (approximately 2.3 kev) Coefficient (cm 2 /g) μ S : Photoelectric absorption coefficient of sulfur element for excitation radiation (cm 2 /g) Ip : Characteristic X-ray intensity of sulfur (cps) I : Excitation radiation intensity (cps) In the formula, mass absorption coefficient ( μ) is energy dependent, and in particular, the photoelectric effect coefficient (μ S ) value of sulfur makes a large contribution to detection efficiency. This is given by the excitation radiation energy, and when the radiation source 1 is a γ-ray source in the apparatus shown in Figure 1, approximately 5.9ke monochromatic X of 55Fe
In the case of titanium, its monochromatic characteristic X-rays, in the case of tungsten, bremsstrahlung secondary radiation, etc. are generally used as the source of excitation radiation, depending on the anode material in the case of X-ray tubes.
しかしながら、石油などの炭化水素化合物中に
は塩素元素が多少共含まれており、硫黄分析の際
にこれが硫黄含有量の定量誤差となつて、影響を
与えている。この理由は、従来、励起放射線源に
第1図のものが使用されている為であり、励起照
射の際、硫黄元素より原子番号が1つ高い塩素元
素を励起させる結果になる。したがつて、X線検
出の過程では、検出器のエネルギー分解能に限界
があることから、塩素の特性X線の一部が、事実
上、硫黄の特性X線と区別できなくなる。これ
は、後段に付設される波高弁別器によつても選別
不可能である。ただし、波高弁別器の上下限設定
位置をずらしウインドウ巾を狭くする限りに於い
て、相当程度の改善効果が期待できるものの、硫
黄の特性X線の計数効率の低下を犠性とするもの
である。 However, hydrocarbon compounds such as petroleum contain some elemental chlorine, which causes an error in determining the sulfur content during sulfur analysis. The reason for this is that the excitation radiation source shown in FIG. 1 has conventionally been used, and upon excitation irradiation, the chlorine element, which has an atomic number one higher than the sulfur element, is excited. Therefore, in the process of X-ray detection, some of the characteristic X-rays of chlorine become virtually indistinguishable from the characteristic X-rays of sulfur due to the limited energy resolution of the detector. This cannot be discriminated even by a wave height discriminator attached at a subsequent stage. However, although a considerable improvement effect can be expected by shifting the upper and lower limit setting positions of the wave height discriminator and narrowing the window width, this comes at the cost of a decrease in the counting efficiency of the characteristic X-rays of sulfur. .
そこで従来例では、この塩素の影響を防ぐ為、
試料部2と検出器3の間にフイルタ4が介装され
ている。石油硫黄分析の場合には、フイルター材
料に硫黄を含む物質を使い、硫黄のエネルギー対
質量吸収係数特性(μ(E))を利用している。 Therefore, in the conventional example, in order to prevent the influence of this chlorine,
A filter 4 is interposed between the sample section 2 and the detector 3. In the case of petroleum sulfur analysis, a substance containing sulfur is used as a filter material, and the energy versus mass absorption coefficient characteristic (μ(E)) of sulfur is utilized.
しかしながら、このフイルタは、製作上困難で
あるほか、その効果も、一般的には、高くはなか
つた。 However, this filter is difficult to manufacture and is generally not very effective.
これは、検出X線の通過路上にフイルタを配置
することから、同フイルターの吸収特性により、
塩素の特性X線を、相当程度吸収せしめる反面、
硫黄の特性X線の方にもある程度の通過損失を伴
なうからである。 This is because a filter is placed on the passage of the detected X-rays, and due to the absorption characteristics of the filter,
While it absorbs a considerable amount of the characteristic X-rays of chlorine,
This is because the characteristic X-rays of sulfur are also accompanied by a certain degree of transmission loss.
従来の螢光X線硫黄分析装置は以上のように構
成されているので、石油中の塩素元素の影響があ
る。しかも、これを防ぐ為にフイルタを使用する
が、製作上困難であると共に、その効果も少ない
などの欠点があつた。 Since the conventional fluorescent X-ray sulfur analyzer is configured as described above, it is affected by the chlorine element in petroleum. Moreover, although a filter is used to prevent this, it is difficult to manufacture and has drawbacks such as being ineffective.
この発明は上記のような従来のものの欠点を除
去する為になされたもので一次放射線源に加え、
塩素が主成分で、かつ、その共存組成元素が塩素
原子よりも原子番号の小さな元素を含む物質(以
下、塩素を含む物質という)からなり、一次放射
線を照射されて特性X線を発生する2次線源とな
るターゲツトを付加した放射線源を構成すること
により、石油中に含まれる塩素元素の影響をフイ
ルタ等の手段を用いることなく、事実上ほとんど
取り除くことができる螢光X線硫黄分析装置を提
供することを目的としている。 This invention was made to eliminate the drawbacks of the conventional ones as mentioned above, and in addition to the primary radiation source,
A substance whose main component is chlorine and whose coexisting constituent elements include an element with an atomic number smaller than that of the chlorine atom (hereinafter referred to as a chlorine-containing substance), which generates characteristic X-rays when irradiated with primary radiation2 Fluorescent X-ray sulfur analysis equipment that can virtually eliminate the effects of chlorine elements contained in petroleum without using filters or other means by configuring a radiation source with a target that serves as a secondary radiation source. is intended to provide.
以下、この発明の一実施例を図について説明す
る。第2図において1,2および3は上記従来装
置と同様の部分を示すので説明を省略する。5は
一次放射線源1からの放射線を受けて特性X線を
発生する塩素を含む物質から成り二次X線源とな
るターゲツトである。(なお、1は一次放射線源
を構成する。)
次に動作について説明する。なお励起用放射線
源として、一次放射線源1にX線管を使用し、2
次線源としてのターゲツト5に塩素を含む物質か
ら成る材料を用いた構成を考える。 An embodiment of the present invention will be described below with reference to the drawings. In FIG. 2, reference numerals 1, 2, and 3 indicate the same parts as in the conventional device described above, and the explanation thereof will be omitted. Reference numeral 5 denotes a target which is made of a substance containing chlorine and which generates characteristic X-rays upon receiving radiation from the primary radiation source 1, and serves as a secondary X-ray source. (Note that 1 constitutes a primary radiation source.) Next, the operation will be explained. As the excitation radiation source, an X-ray tube is used as the primary radiation source 1, and
Consider a configuration in which the target 5 as a secondary radiation source is made of a material containing chlorine.
一次放射線源1から発生する一次励起線を、上
記のターゲツト5に照射すればターゲツト物質と
の相互作用の結果、散乱線及び特性X線が発生す
る。ここでX線管陽極高電圧を調整して、X線出
力最大波長及び平均波長を変化させれば、特性X
線と散乱線の発生強度比を高め得る。したがつて
ターゲツト表面からは、材料元素特有の特性単色
X線を放出する二次線源が容易に得られる。これ
は、螢光X線石油硫黄分析上、良質の励起線源と
なり得る。 When primary excitation rays generated from the primary radiation source 1 are irradiated onto the target 5, scattered rays and characteristic X-rays are generated as a result of interaction with the target material. If the X-ray tube anode high voltage is adjusted here and the X-ray output maximum wavelength and average wavelength are changed, the characteristic
It is possible to increase the intensity ratio of generated radiation and scattered radiation. Therefore, a secondary radiation source that emits characteristic monochromatic X-rays specific to the material element can be easily obtained from the target surface. This can serve as a high-quality excitation radiation source for fluorescent X-ray petroleum sulfur analysis.
次いで具体的な方法として、外部ターゲツト5
を付加した上記の構成に於いて、ターゲツト材料
に塩素を含む物質を使用すると、塩素の特性単色
X線を得る。更にこれを2次X線源として、石油
等の試料を収容した試料部2に照射すれば、試料
中の測定物質である硫黄元素を効率良く励起させ
ることができる。また、他方では、試料中の妨害
元素である塩素元素がこの励起エネルギーでは励
起されないので、塩素の特性X線が発生しない。
従来の放射線源では、塩素の特性X線が発生し、
検出過程で硫黄信号に一部含まれて測定される為
分析定量誤差となつて悪影響を及ぼしていたのに
比べ、本発明の放射線源に依れば試料中の塩素に
基づく妨害X線の発生を防止できるものである。 Next, as a specific method, external target 5
In the above configuration in which chlorine is added, if a substance containing chlorine is used as the target material, monochromatic X-rays characteristic of chlorine are obtained. Furthermore, by using this as a secondary X-ray source and irradiating the sample section 2 containing a sample of petroleum or the like, it is possible to efficiently excite the sulfur element, which is the substance to be measured, in the sample. On the other hand, since the chlorine element, which is an interfering element in the sample, is not excited by this excitation energy, characteristic X-rays of chlorine are not generated.
Conventional radiation sources produce characteristic X-rays of chlorine,
In contrast, the radiation source of the present invention eliminates the generation of interfering X-rays due to chlorine in the sample, compared to the case where a portion of the sulfur signal was included in the measurement during the detection process, causing an error in analysis and quantification and causing an adverse effect. This is something that can be prevented.
また、実用上、ターゲツト5の材料として使用
できるものとして、塩素と塩素より原子番号の小
さい元素とで構成された物質を用いたものが好適
に用いられる。この理由は、これらの元素は塩素
より吸収効果が小さい為、塩素の特性X線発生強
度の損失はわずかである。また、これら元素への
吸収効果に基づく特性KX線はエネルギーが低い
ため塩素も硫黄も励起しないので妨害にならな
い。具体的には、2次線源ターゲツトとして塩化
ナトリウムが好適に用いられる。これには、潮解
防止用に従来技術により表面に膜が施される。ま
たは、塩化ビニールの含塩素有機化合物を用いる
こともできる。 Practically speaking, as a material for the target 5, a substance composed of chlorine and an element having a smaller atomic number than chlorine is preferably used. The reason for this is that these elements have a smaller absorption effect than chlorine, so the loss in the characteristic X-ray emission intensity of chlorine is slight. In addition, the characteristic KX-rays based on the absorption effects of these elements have low energy and do not excite either chlorine or sulfur, so they do not cause interference. Specifically, sodium chloride is preferably used as the secondary radiation source target. A film is applied to the surface by conventional techniques to prevent deliquescence. Alternatively, a chlorine-containing organic compound such as vinyl chloride can also be used.
また、X線管についてはその内部陽極は材料上
特に限定する必要はなく、いずれのものも好適に
用いることができる。 Furthermore, the internal anode of the X-ray tube does not need to be particularly limited in terms of material, and any material can be suitably used.
なお、上記実施例では、各構成部品の配置を簡
単な形で設けているが、各々の配置関係は、幾何
学的効率が向上する限度で変更されたり、外部タ
ーゲツトの寸法、形状等についても、線源効率が
改善できる場合に、変更がなされても、同様の効
果を奏する。 In the above example, the arrangement of each component is provided in a simple manner, but the arrangement relationship may be changed to the extent that geometrical efficiency is improved, or the dimensions, shape, etc. of the external target may be changed. , the same effect can be achieved even if the change is made if the source efficiency can be improved.
また、一次放射線源1としてはX線管に限定さ
れず、γ線を放射するものであつても勿論差支え
ない。 Further, the primary radiation source 1 is not limited to an X-ray tube, and may of course be one that emits gamma rays.
以上のように、この発明によれば、励起放射線
源にX線管などの1次放射線源から放射される放
射線によつて特性X線を放出する塩素を含む物質
からなるターゲツト(2次線源)を用いるように
したので安価な装置で石油などの炭化水素化合物
中に含まれる塩素による塩素誤差をほとんど取り
除くことができる効果がある。 As described above, according to the present invention, a target (secondary radiation source) made of a substance containing chlorine that emits characteristic X-rays by radiation emitted from a primary radiation source such as an X-ray tube is used as an excitation radiation source. ), it is possible to eliminate most of the chlorine errors caused by chlorine contained in hydrocarbon compounds such as petroleum using inexpensive equipment.
第1図は従来の螢光X線硫黄分析装置を示す概
略構成図、第2図は、この発明の一実施例を示す
概略構成図である。
1……一次放射線源、2……試料部、3……X
線検出器、5……ターゲツト、なお、図中、同一
符号は同一、又は相当部分を示す。
FIG. 1 is a schematic diagram showing a conventional fluorescent X-ray sulfur analyzer, and FIG. 2 is a schematic diagram showing an embodiment of the present invention. 1...Primary radiation source, 2...Sample part, 3...X
Line detector, 5...Target. In the drawings, the same reference numerals indicate the same or corresponding parts.
Claims (1)
射線源と、 塩素原子および塩素原子よりも原子番号の小さ
な元素とでなる物質からなり、前記一次放射線源
からの放射線を受けて第1の特性X線を放出する
ターゲツトと、 前記ターゲツトからの前記第1の特性X線の照
射を受ける試料部と、 前記試料部に配置される炭化水素化合物から発
生する硫黄の第2の特性X線を検出するX線検出
器と、 を備えてなる螢光X線硫黄分析装置。 2 塩化ナトリウムでなるターゲツトを備えた特
許請求の範囲第1項記載の螢光X線硫黄分析装
置。 3 含塩素有機化合物でなるターゲツトを備えた
特許請求の範囲第1項記載の螢光X線硫黄分析装
置。 4 含塩素化合物が塩化ビニールである特許請求
の範囲第3項記載の螢光X線硫黄分析装置。[Scope of Claims] 1. A substance consisting of a primary radiation source that generates either X-rays or γ-rays, and a chlorine atom and an element with an atomic number smaller than the chlorine atom, which emits radiation from the primary radiation source. a target that receives and emits first characteristic X-rays; a sample section that receives the first characteristic X-rays from the target; A fluorescent X-ray sulfur analyzer comprising: an X-ray detector that detects characteristic X-rays; and a fluorescent X-ray sulfur analyzer. 2. The fluorescent X-ray sulfur analyzer according to claim 1, which includes a target made of sodium chloride. 3. A fluorescent X-ray sulfur analyzer according to claim 1, which includes a target made of a chlorine-containing organic compound. 4. The fluorescent X-ray sulfur analyzer according to claim 3, wherein the chlorine-containing compound is vinyl chloride.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12608277A JPS5459193A (en) | 1977-10-19 | 1977-10-19 | Fluorescent x-ray sulfur analytical apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12608277A JPS5459193A (en) | 1977-10-19 | 1977-10-19 | Fluorescent x-ray sulfur analytical apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5459193A JPS5459193A (en) | 1979-05-12 |
| JPS6233545B2 true JPS6233545B2 (en) | 1987-07-21 |
Family
ID=14926150
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12608277A Granted JPS5459193A (en) | 1977-10-19 | 1977-10-19 | Fluorescent x-ray sulfur analytical apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5459193A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4577338A (en) * | 1982-11-01 | 1986-03-18 | Xertex Corporation | X-Ray fluorescence spectrometer and method of calibrating the same |
| JPS603458U (en) * | 1983-06-21 | 1985-01-11 | 日本電気株式会社 | Fluorescent X-ray intensity measurement system holder for EXAFS measurement |
| JPH1038825A (en) * | 1996-07-18 | 1998-02-13 | Rigaku Ind Co | Fluorescent x-ray specromerer |
| EP2333529B1 (en) * | 2009-09-07 | 2013-10-16 | Rigaku Corporation | X-ray fluorescence analyzing method |
-
1977
- 1977-10-19 JP JP12608277A patent/JPS5459193A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5459193A (en) | 1979-05-12 |
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