JPS54877A - Marking method for semiconductor chip - Google Patents
Marking method for semiconductor chipInfo
- Publication number
- JPS54877A JPS54877A JP6549577A JP6549577A JPS54877A JP S54877 A JPS54877 A JP S54877A JP 6549577 A JP6549577 A JP 6549577A JP 6549577 A JP6549577 A JP 6549577A JP S54877 A JPS54877 A JP S54877A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor chip
- marking method
- marks
- plural
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6549577A JPS54877A (en) | 1977-06-03 | 1977-06-03 | Marking method for semiconductor chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6549577A JPS54877A (en) | 1977-06-03 | 1977-06-03 | Marking method for semiconductor chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS54877A true JPS54877A (en) | 1979-01-06 |
Family
ID=13288719
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6549577A Pending JPS54877A (en) | 1977-06-03 | 1977-06-03 | Marking method for semiconductor chip |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54877A (ja) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01189908A (ja) * | 1988-01-26 | 1989-07-31 | Seiko Instr & Electron Ltd | マーキング装置 |
| JPH05326653A (ja) * | 1992-05-15 | 1993-12-10 | Mitsubishi Electric Corp | 不良icの区別方法及びその検査装置 |
| JP2002280276A (ja) * | 2001-03-16 | 2002-09-27 | Kawasaki Microelectronics Kk | 半導体装置およびそのマーキング方法 |
| JP2006351772A (ja) * | 2005-06-15 | 2006-12-28 | Fujifilm Holdings Corp | 半導体チップの識別情報記録方法及び撮像装置 |
-
1977
- 1977-06-03 JP JP6549577A patent/JPS54877A/ja active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01189908A (ja) * | 1988-01-26 | 1989-07-31 | Seiko Instr & Electron Ltd | マーキング装置 |
| JPH05326653A (ja) * | 1992-05-15 | 1993-12-10 | Mitsubishi Electric Corp | 不良icの区別方法及びその検査装置 |
| JP2002280276A (ja) * | 2001-03-16 | 2002-09-27 | Kawasaki Microelectronics Kk | 半導体装置およびそのマーキング方法 |
| JP2006351772A (ja) * | 2005-06-15 | 2006-12-28 | Fujifilm Holdings Corp | 半導体チップの識別情報記録方法及び撮像装置 |
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