JPS54970A - Impurity diffusion method - Google Patents
Impurity diffusion methodInfo
- Publication number
- JPS54970A JPS54970A JP6575777A JP6575777A JPS54970A JP S54970 A JPS54970 A JP S54970A JP 6575777 A JP6575777 A JP 6575777A JP 6575777 A JP6575777 A JP 6575777A JP S54970 A JPS54970 A JP S54970A
- Authority
- JP
- Japan
- Prior art keywords
- impurity diffusion
- diffusion method
- atomosphere
- gettering
- sio2
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/14—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase
- H10P32/1408—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase from or through or into an external applied layer, e.g. photoresist or nitride layers
- H10P32/141—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase from or through or into an external applied layer, e.g. photoresist or nitride layers the applied layer comprising oxides only
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/17—Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material
- H10P32/171—Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material being group IV material
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
PURPOSE:To increase the stability at the boundary of Si-SiO2, by performing heat treatment of the substrate coated by impurity diffusion source and gettering the contamination of heavy metals, under the atomosphere including halogen gas.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6575777A JPS54970A (en) | 1977-06-06 | 1977-06-06 | Impurity diffusion method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6575777A JPS54970A (en) | 1977-06-06 | 1977-06-06 | Impurity diffusion method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS54970A true JPS54970A (en) | 1979-01-06 |
Family
ID=13296212
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6575777A Pending JPS54970A (en) | 1977-06-06 | 1977-06-06 | Impurity diffusion method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54970A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61121326A (en) * | 1984-11-19 | 1986-06-09 | Oki Electric Ind Co Ltd | Manufacture of semiconductor device |
| EP0598438A1 (en) * | 1992-11-17 | 1994-05-25 | Koninklijke Philips Electronics N.V. | Method for diffusing a dopant into a semiconductor |
-
1977
- 1977-06-06 JP JP6575777A patent/JPS54970A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61121326A (en) * | 1984-11-19 | 1986-06-09 | Oki Electric Ind Co Ltd | Manufacture of semiconductor device |
| EP0598438A1 (en) * | 1992-11-17 | 1994-05-25 | Koninklijke Philips Electronics N.V. | Method for diffusing a dopant into a semiconductor |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS5390033A (en) | Heat treatment equipment | |
| JPS51115212A (en) | Apparatus for heat treatment with non-oxidizing atmosphere | |
| JPS5420671A (en) | Production of semiconductor devices | |
| JPS5343473A (en) | Impurity driving-in method | |
| JPS51133116A (en) | A method and apparatus for cooling of metal strips | |
| JPS52127496A (en) | Removal of trace amounts of halogen in sulfuric acid | |
| JPS5211086A (en) | Surface trimming equipment for steel | |
| JPS544069A (en) | Producing method of oxide film | |
| JPS5326567A (en) | Production of shadow mask | |
| JPS53108373A (en) | Manufacture for semiconductor device | |
| JPS522163A (en) | Wafer cleaning and drying device | |
| JPS53123070A (en) | Impurity diffusing method | |
| JPS5230163A (en) | Method for junction of semiconductor parts | |
| JPS5425159A (en) | Thermal processing method for semiconductor | |
| JPS51117573A (en) | Manufacturing method of semiconductor | |
| JPS51147250A (en) | Treatment method of semiconductor substrate | |
| JPS5434755A (en) | Manufacture of semiconductor device | |
| JPS5275267A (en) | Production of semiconductor device | |
| JPS5261479A (en) | Production of semiconductor device | |
| JPS5213239A (en) | Elevation path assembly device for elevator of industrial use | |
| JPS53112668A (en) | Preparing method for oxide film | |
| JPS5382166A (en) | Electrode forming mrthod of semiconductor device | |
| JPS5314556A (en) | Heat treatment method of semiconductor wafers | |
| JPS5242366A (en) | Method of preventing occurence of crystal defects of silicon wafers | |
| JPS5230379A (en) | Process of semiconductor device |