JPS551122A - Field-effect transistor - Google Patents
Field-effect transistorInfo
- Publication number
- JPS551122A JPS551122A JP7358778A JP7358778A JPS551122A JP S551122 A JPS551122 A JP S551122A JP 7358778 A JP7358778 A JP 7358778A JP 7358778 A JP7358778 A JP 7358778A JP S551122 A JPS551122 A JP S551122A
- Authority
- JP
- Japan
- Prior art keywords
- impurity density
- voltage
- gate
- per cubic
- cubic centimeter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/213—Channel regions of field-effect devices
- H10D62/221—Channel regions of field-effect devices of FETs
Landscapes
- Bipolar Transistors (AREA)
- Junction Field-Effect Transistors (AREA)
Abstract
PURPOSE: To raise the proof voltage and the output of a field-effect transistor, by making the impurity density of an operating layer as high as 2×1017 or more per cubic centimeter and setting a low impurity density low near the surface of crystal whereon a Scottky junction is produced.
CONSTITUTION: The impurity density near the surface of crystal whereon a Schottky metal is provided is made as relatively low as about 1017 per cubic centimeter. Therefore, the inverse proof voltage of the gate is 20 V or more, and a depletion layer extends to a point A because of the electric field in the Schottky junction when the gate voltage is zero. Because a layer AA' which is really modulated by the gate voltage has an impurity density of 2×1017 to 5×1017 or more per cubic centimeter, the value Gm is very large and the output increases when the drain saturation current is constant. The drain-gate proof voltage in not extremely decreased. The impurity density of the operating layer is made high. The value Gm is raised. The pinch-off voltage is reduced. The output is augmented.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7358778A JPS551122A (en) | 1978-06-16 | 1978-06-16 | Field-effect transistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7358778A JPS551122A (en) | 1978-06-16 | 1978-06-16 | Field-effect transistor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS551122A true JPS551122A (en) | 1980-01-07 |
Family
ID=13522582
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7358778A Pending JPS551122A (en) | 1978-06-16 | 1978-06-16 | Field-effect transistor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS551122A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55123172A (en) * | 1979-03-15 | 1980-09-22 | Nec Corp | Schottky-barrier-gate field-effect transistor |
| JPS593977A (en) * | 1982-06-29 | 1984-01-10 | Fujitsu Ltd | Semiconductor device |
| JPS6399579A (en) * | 1986-10-16 | 1988-04-30 | Hitachi Ltd | Manufacture of field effect transistor |
| JPS6476774A (en) * | 1987-09-18 | 1989-03-22 | Nec Corp | Semiconductor device |
| JPH03264108A (en) * | 1990-03-13 | 1991-11-25 | Kobe Steel Ltd | Method for hot-extruding al containing ti alloy |
| JPWO2013018580A1 (en) * | 2011-08-01 | 2015-03-05 | 株式会社村田製作所 | Field effect transistor |
-
1978
- 1978-06-16 JP JP7358778A patent/JPS551122A/en active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55123172A (en) * | 1979-03-15 | 1980-09-22 | Nec Corp | Schottky-barrier-gate field-effect transistor |
| JPS593977A (en) * | 1982-06-29 | 1984-01-10 | Fujitsu Ltd | Semiconductor device |
| JPS6399579A (en) * | 1986-10-16 | 1988-04-30 | Hitachi Ltd | Manufacture of field effect transistor |
| JPS6476774A (en) * | 1987-09-18 | 1989-03-22 | Nec Corp | Semiconductor device |
| JPH03264108A (en) * | 1990-03-13 | 1991-11-25 | Kobe Steel Ltd | Method for hot-extruding al containing ti alloy |
| JPWO2013018580A1 (en) * | 2011-08-01 | 2015-03-05 | 株式会社村田製作所 | Field effect transistor |
| US9099341B2 (en) | 2011-08-01 | 2015-08-04 | Murata Manufacturing Co., Ltd. | Field effect transistor |
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