JPS5558524A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5558524A
JPS5558524A JP13216878A JP13216878A JPS5558524A JP S5558524 A JPS5558524 A JP S5558524A JP 13216878 A JP13216878 A JP 13216878A JP 13216878 A JP13216878 A JP 13216878A JP S5558524 A JPS5558524 A JP S5558524A
Authority
JP
Japan
Prior art keywords
film
slice
line
region
type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13216878A
Other languages
Japanese (ja)
Other versions
JPS5850413B2 (en
Inventor
Masao Akiyama
Yoichi Okabayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP53132168A priority Critical patent/JPS5850413B2/en
Publication of JPS5558524A publication Critical patent/JPS5558524A/en
Publication of JPS5850413B2 publication Critical patent/JPS5850413B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Bipolar Transistors (AREA)

Abstract

PURPOSE: To minimize a strain to arise on an Si slice at diffusing impurities from its one face by providing an insulating film having an opening along a split line to prevent diffusion on the other face.
CONSTITUTION: SiO2 films 4 and 4' to work as a mask at the time of base diffusion are sticked on both front and back of an n-type Si slice 1 working as a collector, and a photoresist film 8 having an opening is applied on the back film 4' at a region corresponding to a split line 9 of the slice 1. Next, the front film 4 is removed all and the back film 4' by the portion exposed in the line 9 through etching with the film 8 working as a mask. Thus the back of the slice 1 other than the line 9 is all covered with the film 4', and p-type base region 10 and p-type split domain 11 are formed within the line 9 on front and back of the slice 1 respectively by diffusing Al. The film 4' is removed thereafter, n-type emitter region is provided in the slice 1 coming between region 11 and separated from the region 11.
COPYRIGHT: (C)1980,JPO&Japio
JP53132168A 1978-10-26 1978-10-26 Manufacturing method of semiconductor device Expired JPS5850413B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53132168A JPS5850413B2 (en) 1978-10-26 1978-10-26 Manufacturing method of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53132168A JPS5850413B2 (en) 1978-10-26 1978-10-26 Manufacturing method of semiconductor device

Publications (2)

Publication Number Publication Date
JPS5558524A true JPS5558524A (en) 1980-05-01
JPS5850413B2 JPS5850413B2 (en) 1983-11-10

Family

ID=15074947

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53132168A Expired JPS5850413B2 (en) 1978-10-26 1978-10-26 Manufacturing method of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5850413B2 (en)

Also Published As

Publication number Publication date
JPS5850413B2 (en) 1983-11-10

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