JPS5572811A - Pattern check unit - Google Patents
Pattern check unitInfo
- Publication number
- JPS5572811A JPS5572811A JP14687078A JP14687078A JPS5572811A JP S5572811 A JPS5572811 A JP S5572811A JP 14687078 A JP14687078 A JP 14687078A JP 14687078 A JP14687078 A JP 14687078A JP S5572811 A JPS5572811 A JP S5572811A
- Authority
- JP
- Japan
- Prior art keywords
- data
- register
- pattern
- stored
- light beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Image Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14687078A JPS5572811A (en) | 1978-11-28 | 1978-11-28 | Pattern check unit |
| US06/197,345 US4392120A (en) | 1978-10-30 | 1979-10-25 | Pattern inspection system |
| PCT/JP1979/000271 WO1980001002A1 (en) | 1978-10-30 | 1979-10-25 | Pattern inspection system |
| ES79485536A ES485536A1 (es) | 1978-10-30 | 1979-10-30 | Perfeccionamientos en sistemas de inspeccion de patrones pa-ra fotomascaras de circuitos impresos |
| US06/428,605 US4547895A (en) | 1978-10-30 | 1982-09-30 | Pattern inspection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14687078A JPS5572811A (en) | 1978-11-28 | 1978-11-28 | Pattern check unit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5572811A true JPS5572811A (en) | 1980-06-02 |
Family
ID=15417421
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14687078A Pending JPS5572811A (en) | 1978-10-30 | 1978-11-28 | Pattern check unit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5572811A (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58223328A (ja) * | 1982-06-22 | 1983-12-24 | Toshiba Corp | マスク欠陥検査装置 |
| JPS6170673A (ja) * | 1984-09-13 | 1986-04-11 | Fuji Electric Co Ltd | 画像処理装置 |
| JPH0192878A (ja) * | 1987-10-02 | 1989-04-12 | Toyo Ink Mfg Co Ltd | 微小な不要または欠陥部分の検出方法 |
-
1978
- 1978-11-28 JP JP14687078A patent/JPS5572811A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58223328A (ja) * | 1982-06-22 | 1983-12-24 | Toshiba Corp | マスク欠陥検査装置 |
| JPS6170673A (ja) * | 1984-09-13 | 1986-04-11 | Fuji Electric Co Ltd | 画像処理装置 |
| JPH0192878A (ja) * | 1987-10-02 | 1989-04-12 | Toyo Ink Mfg Co Ltd | 微小な不要または欠陥部分の検出方法 |
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