JPS5598376A - Ic test device - Google Patents
Ic test deviceInfo
- Publication number
- JPS5598376A JPS5598376A JP677879A JP677879A JPS5598376A JP S5598376 A JPS5598376 A JP S5598376A JP 677879 A JP677879 A JP 677879A JP 677879 A JP677879 A JP 677879A JP S5598376 A JPS5598376 A JP S5598376A
- Authority
- JP
- Japan
- Prior art keywords
- thermostat
- guide
- guide rail
- hooking
- incident
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000002093 peripheral effect Effects 0.000 abstract 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To prevent the hooking incident of IC in a thermostat by disposing IC press guide and a ring like guide.
CONSTITUTION: A plurality of ring like guides 6 formed in a belt shape adjacently to a IC slide face of IC guide rail 4 is disposed at a thermostat 1 so as to intersect at a right angle with a peripheral face of a rotating drum 3 by its plate face with a longer spacing than a length of IC 5 to be tested, and attached to a cylindrical IC press guide 7 provided outside thereof. Thus, in the thermostat 1, IC 5 engaged by a terminal pin so as to bridge over the prism like IC guide rail 4 is separated one by one to be accommodated on the IC guide rail 4 and the attitude thereof does not change even if there is unevenness in shape therebetween, without pushing with each other, and also mutual wedge action is not generated and hooking incident is not produced and they are successively fed downward.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP677879A JPS5598376A (en) | 1979-01-22 | 1979-01-22 | Ic test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP677879A JPS5598376A (en) | 1979-01-22 | 1979-01-22 | Ic test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5598376A true JPS5598376A (en) | 1980-07-26 |
Family
ID=11647627
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP677879A Pending JPS5598376A (en) | 1979-01-22 | 1979-01-22 | Ic test device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5598376A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60141571U (en) * | 1984-02-29 | 1985-09-19 | ロ−ム株式会社 | Heating equipment for electronic parts |
| JPS6332380A (en) * | 1986-07-26 | 1988-02-12 | Mitsubishi Electric Corp | Ic device test handler device |
| JPH0683374U (en) * | 1993-05-20 | 1994-11-29 | 株式会社岡村製作所 | Support bar erection device |
| JP2008164595A (en) * | 2006-12-05 | 2008-07-17 | Ueno Seiki Kk | Apparatus for raising/lowering temperature, and high and low temperature test handler |
| JP2009008652A (en) * | 2007-05-25 | 2009-01-15 | Ueno Seiki Kk | To-high temperature-low temperature changing device and test handler with to-high temperature-low temperature changing device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51129068A (en) * | 1975-05-01 | 1976-11-10 | Mitsubishi Alum Co Ltd | Hook direction adjusting device |
-
1979
- 1979-01-22 JP JP677879A patent/JPS5598376A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51129068A (en) * | 1975-05-01 | 1976-11-10 | Mitsubishi Alum Co Ltd | Hook direction adjusting device |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60141571U (en) * | 1984-02-29 | 1985-09-19 | ロ−ム株式会社 | Heating equipment for electronic parts |
| JPS6332380A (en) * | 1986-07-26 | 1988-02-12 | Mitsubishi Electric Corp | Ic device test handler device |
| JPH0683374U (en) * | 1993-05-20 | 1994-11-29 | 株式会社岡村製作所 | Support bar erection device |
| JP2008164595A (en) * | 2006-12-05 | 2008-07-17 | Ueno Seiki Kk | Apparatus for raising/lowering temperature, and high and low temperature test handler |
| JP2009008652A (en) * | 2007-05-25 | 2009-01-15 | Ueno Seiki Kk | To-high temperature-low temperature changing device and test handler with to-high temperature-low temperature changing device |
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