JPS56146253A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS56146253A JPS56146253A JP4920980A JP4920980A JPS56146253A JP S56146253 A JPS56146253 A JP S56146253A JP 4920980 A JP4920980 A JP 4920980A JP 4920980 A JP4920980 A JP 4920980A JP S56146253 A JPS56146253 A JP S56146253A
- Authority
- JP
- Japan
- Prior art keywords
- film
- bonding
- hole
- photoetching
- piled
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07551—Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/59—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/923—Bond pads having multiple stacked layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
- H10W72/952—Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/981—Auxiliary members, e.g. spacers
- H10W72/983—Reinforcing structures, e.g. collars
Landscapes
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Wire Bonding (AREA)
Abstract
PURPOSE:To obtain a good bonding in low contact resistance by a method wherein a part of the upper electrode wiring is removed to form a contact formation region or a bonding region in a multilayer electrode wiring structure. CONSTITUTION:A MOS transistor is formed in an Si substrate 10, and a field oxide film 5 and a PSG film 7 are formed. Then, a contact hole is opened to alloy an Al film 20 and an SiO2 film 30 to be piled up. An Al electrode is formed by a photoetching to permit the PSG film or CVD-SiO2 film 40 to be piled up. Then, a hole 33 is formed in the PSG film 40 by the photoetching and the Si film 30 in the hole 33 is removed. The contact resistance at a time when the bonding 25 and the Al two- layered wiring are formed is reduced and the satisfactory bonding can be attained.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4920980A JPS56146253A (en) | 1980-04-16 | 1980-04-16 | Semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4920980A JPS56146253A (en) | 1980-04-16 | 1980-04-16 | Semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56146253A true JPS56146253A (en) | 1981-11-13 |
Family
ID=12824580
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4920980A Pending JPS56146253A (en) | 1980-04-16 | 1980-04-16 | Semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56146253A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01233739A (en) * | 1988-03-14 | 1989-09-19 | Hitachi Ltd | Manufacture of semiconductor device |
| JPH02237135A (en) * | 1989-03-10 | 1990-09-19 | Fujitsu Ltd | Manufacture of semiconductor device |
| JPH02312235A (en) * | 1989-05-26 | 1990-12-27 | Fujitsu Ltd | Manufacture of semiconductor device |
| JP2008164408A (en) * | 2006-12-28 | 2008-07-17 | Yokogawa Electric Corp | Electrical transmission mechanism and residual chlorine meter utilizing the same |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4984788A (en) * | 1972-11-29 | 1974-08-14 | ||
| JPS52155971A (en) * | 1976-06-19 | 1977-12-24 | Mitsubishi Electric Corp | Electrode formation method of semiconductor device |
-
1980
- 1980-04-16 JP JP4920980A patent/JPS56146253A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4984788A (en) * | 1972-11-29 | 1974-08-14 | ||
| JPS52155971A (en) * | 1976-06-19 | 1977-12-24 | Mitsubishi Electric Corp | Electrode formation method of semiconductor device |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01233739A (en) * | 1988-03-14 | 1989-09-19 | Hitachi Ltd | Manufacture of semiconductor device |
| JPH02237135A (en) * | 1989-03-10 | 1990-09-19 | Fujitsu Ltd | Manufacture of semiconductor device |
| JPH02312235A (en) * | 1989-05-26 | 1990-12-27 | Fujitsu Ltd | Manufacture of semiconductor device |
| JP2008164408A (en) * | 2006-12-28 | 2008-07-17 | Yokogawa Electric Corp | Electrical transmission mechanism and residual chlorine meter utilizing the same |
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