JPS5679969A - Logic circuit testing system - Google Patents

Logic circuit testing system

Info

Publication number
JPS5679969A
JPS5679969A JP15766179A JP15766179A JPS5679969A JP S5679969 A JPS5679969 A JP S5679969A JP 15766179 A JP15766179 A JP 15766179A JP 15766179 A JP15766179 A JP 15766179A JP S5679969 A JPS5679969 A JP S5679969A
Authority
JP
Japan
Prior art keywords
adapter
replacement unit
connector
logic device
replacement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15766179A
Other languages
Japanese (ja)
Inventor
Oku Maruyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP15766179A priority Critical patent/JPS5679969A/en
Publication of JPS5679969A publication Critical patent/JPS5679969A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To enable the fault points in the parts in the system to be easily specified by providing an adapter which connects an arbitrary replacement unit to a logic device and comparing the output signals when the 1st and 2nd replacement units are connected.
CONSTITUTION: The specific replacement unit 2A substituted with an adapter 5 is connected to a logic device 1 via a connector 6, the internal connection of the adapter 5 and a connector 3. On the other hand, the replacement unit 2B to be tested is connected to the adapter 5 via a connector 7. Both of the specific replacement unit 2A and the replacement unit 2B to be tested are put in the operating state of the logic device 1, and the logic signals on the corresponding output terminals of the respective replacement units are compared in a comparator 9, and further if there is any difference, this is displayed in a holding and displaying circuit 10.
COPYRIGHT: (C)1981,JPO&Japio
JP15766179A 1979-12-05 1979-12-05 Logic circuit testing system Pending JPS5679969A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15766179A JPS5679969A (en) 1979-12-05 1979-12-05 Logic circuit testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15766179A JPS5679969A (en) 1979-12-05 1979-12-05 Logic circuit testing system

Publications (1)

Publication Number Publication Date
JPS5679969A true JPS5679969A (en) 1981-06-30

Family

ID=15654603

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15766179A Pending JPS5679969A (en) 1979-12-05 1979-12-05 Logic circuit testing system

Country Status (1)

Country Link
JP (1) JPS5679969A (en)

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