JPS5693320A - Method for pattern formation - Google Patents
Method for pattern formationInfo
- Publication number
- JPS5693320A JPS5693320A JP16916279A JP16916279A JPS5693320A JP S5693320 A JPS5693320 A JP S5693320A JP 16916279 A JP16916279 A JP 16916279A JP 16916279 A JP16916279 A JP 16916279A JP S5693320 A JPS5693320 A JP S5693320A
- Authority
- JP
- Japan
- Prior art keywords
- resist
- mark
- pattern
- formation
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
Landscapes
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
PURPOSE:To reduce the process of work as well as to cut down the cost price by a method wherein the resist which was used for the formation of marks is made usable again for the formation of device patterns by forming metal marks with plating. CONSTITUTION:A positive type resist 3 is applied and baked on the metal conductive layer 2 of a substrate 1. Then a concaved section 4, having the exposed layer 2, is formed by performing the exposure and developing processes of the mark pattern and then removing the resist from the section where the mark will be formed. Then a metal mark 5 is formed on the concaved section 4 by performing plating. Then the device pattern is positioned on the resist 2 and a resist pattern 6, whereon the resist on the section corresponding to the device pattern has been removed by exposure and developing the device pattern, is formed. As a result, the resist which was used for the mark can be used again for the formation of the device pattern, without exfoliation, thereby allowing to reduce the process of work as well as to cut down the cost price.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16916279A JPS5693320A (en) | 1979-12-27 | 1979-12-27 | Method for pattern formation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16916279A JPS5693320A (en) | 1979-12-27 | 1979-12-27 | Method for pattern formation |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5693320A true JPS5693320A (en) | 1981-07-28 |
Family
ID=15881413
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16916279A Pending JPS5693320A (en) | 1979-12-27 | 1979-12-27 | Method for pattern formation |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5693320A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61272720A (en) * | 1985-05-28 | 1986-12-03 | Seiko Instr & Electronics Ltd | Production of color filter |
-
1979
- 1979-12-27 JP JP16916279A patent/JPS5693320A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61272720A (en) * | 1985-05-28 | 1986-12-03 | Seiko Instr & Electronics Ltd | Production of color filter |
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