JPS57167635A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS57167635A JPS57167635A JP56035022A JP3502281A JPS57167635A JP S57167635 A JPS57167635 A JP S57167635A JP 56035022 A JP56035022 A JP 56035022A JP 3502281 A JP3502281 A JP 3502281A JP S57167635 A JPS57167635 A JP S57167635A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- heat treatment
- silicon
- onto
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/90—Thermal treatments, e.g. annealing or sintering
Abstract
PURPOSE:To omit a polishing process by thermally treating a silicon substrate, forming an epitaxial layer onto the surface of the substrate and diffusing an impurity to the epitaxial layer. CONSTITUTION:Heat treatment containing a temperature raising process at the rate of 5 deg.C/min or lower is executed to the semiconductor substrate 11 consisting of silicon, the silicon epitxial layer 12 with not less than 2mum thickness is formed onto the surface of the substrate and the impurity is diffused to the layer 12. Heat treatment through the temperature raising process is repeated at least once or more, and the speed of a temperature rise of the first process is made the same as or later than the speed of the temperature rise after the second time, thus shaping a crystal defect up to the surface of the substrate in excellent controllability. A protective film such as SiO2 is formed or an oxygen atomosphere is introduced during a heat treatment process in order to protect the surface of the substrate, and an oxide film is shaped onto the surface of the substrate.
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56035022A JPS57167635A (en) | 1981-03-11 | 1981-03-11 | Manufacture of semiconductor device |
| DE8282301212T DE3280219D1 (en) | 1981-03-11 | 1982-03-10 | METHOD FOR PRODUCING A SEMICONDUCTOR ARRANGEMENT WITH GLOWING A SEMICONDUCTOR BODY. |
| EP82301212A EP0060676B1 (en) | 1981-03-11 | 1982-03-10 | A method for the production of a semiconductor device comprising annealing a silicon wafer |
| IE559/82A IE55966B1 (en) | 1981-03-11 | 1982-03-11 | A method for the production of a semiconductor device comprising annealing a silicon wafer |
| US06/598,544 US4597804A (en) | 1981-03-11 | 1984-04-12 | Methods of forming denuded zone in wafer by intrinsic gettering and forming bipolar transistor therein |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56035022A JPS57167635A (en) | 1981-03-11 | 1981-03-11 | Manufacture of semiconductor device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57167635A true JPS57167635A (en) | 1982-10-15 |
| JPS6216537B2 JPS6216537B2 (en) | 1987-04-13 |
Family
ID=12430429
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56035022A Granted JPS57167635A (en) | 1981-03-11 | 1981-03-11 | Manufacture of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57167635A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6251050U (en) * | 1985-09-20 | 1987-03-30 |
-
1981
- 1981-03-11 JP JP56035022A patent/JPS57167635A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6216537B2 (en) | 1987-04-13 |
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