JPS57207343A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS57207343A JPS57207343A JP56092493A JP9249381A JPS57207343A JP S57207343 A JPS57207343 A JP S57207343A JP 56092493 A JP56092493 A JP 56092493A JP 9249381 A JP9249381 A JP 9249381A JP S57207343 A JPS57207343 A JP S57207343A
- Authority
- JP
- Japan
- Prior art keywords
- film
- layer
- si3n4
- oxidation
- resisting layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0112—Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
Landscapes
- Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To reduce the fluctuation of the surface impurity density of an element region and contrive the yield improvement by heat treatment after forming a semiconductor element region later to form a protecting film for oxidation and water resistances on an oxide film covering the element. CONSTITUTION:After forming an insulation isolating layer 4, P<+> base 5 and P<+> resisting layer 6, an Si3N4 film 14 is interposed on an SiO2 film 9 on the resisting layer 6. Next, an N<+> emitter layer 7 is provided with electrodes 10- 14. The Si3N4 film 14 on the resisting layer 6 blocks oxidation at the interface between the N<+> layer 6 and SiO2 film 9 to prevent the inhomogeneity of resistance values. Not only an Si3N4, but a film for oxidation and water resistances may be used. Further, the Si3N4 film may be removed on a fixed process on a half way.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56092493A JPS57207343A (en) | 1981-06-16 | 1981-06-16 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56092493A JPS57207343A (en) | 1981-06-16 | 1981-06-16 | Manufacture of semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57207343A true JPS57207343A (en) | 1982-12-20 |
Family
ID=14055817
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56092493A Pending JPS57207343A (en) | 1981-06-16 | 1981-06-16 | Manufacture of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57207343A (en) |
-
1981
- 1981-06-16 JP JP56092493A patent/JPS57207343A/en active Pending
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