JPS573300A - Semicondutor storage device - Google Patents

Semicondutor storage device

Info

Publication number
JPS573300A
JPS573300A JP7747280A JP7747280A JPS573300A JP S573300 A JPS573300 A JP S573300A JP 7747280 A JP7747280 A JP 7747280A JP 7747280 A JP7747280 A JP 7747280A JP S573300 A JPS573300 A JP S573300A
Authority
JP
Japan
Prior art keywords
data
circuit
cell part
written
clock
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7747280A
Other languages
Japanese (ja)
Other versions
JPS6040120B2 (en
Inventor
Junzo Yamada
Junichi Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP55077472A priority Critical patent/JPS6040120B2/en
Publication of JPS573300A publication Critical patent/JPS573300A/en
Publication of JPS6040120B2 publication Critical patent/JPS6040120B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE:To test a data system circuit while it is isolated from memory cells, by delaying a readout clock only during writing operation and by outputting fetched data on a data line without reference to information of a memory cell part. CONSTITUTION:When data is written while the clock of a write clock generating circuit 12 is at a high level, a readout clock from a readout clock generator 23 is delayed through a delay circuit 26, and input data is fetched to a data line 16 via a data input circuit 14 and, while written and stored in a memory cell part 17, outputted through a multiplexer 24, a data output circuit 25, etc. For this purpose, the data while written in the cell part 17 applied to the circuit and data outputted from an output terminal 19 are compared mutually, so that while the operation of the cell part 17 is isolated, which of the circuit 14, data line 16, multiplexer 24, output circuit 25, etc., in the data system circuit is faulty is tested.
JP55077472A 1980-06-09 1980-06-09 semiconductor storage device Expired JPS6040120B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55077472A JPS6040120B2 (en) 1980-06-09 1980-06-09 semiconductor storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55077472A JPS6040120B2 (en) 1980-06-09 1980-06-09 semiconductor storage device

Publications (2)

Publication Number Publication Date
JPS573300A true JPS573300A (en) 1982-01-08
JPS6040120B2 JPS6040120B2 (en) 1985-09-09

Family

ID=13634920

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55077472A Expired JPS6040120B2 (en) 1980-06-09 1980-06-09 semiconductor storage device

Country Status (1)

Country Link
JP (1) JPS6040120B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6432491A (en) * 1987-07-27 1989-02-02 Nippon Electric Ic Microcomput Semiconductor storage device
JPH01277950A (en) * 1988-04-30 1989-11-08 Hitachi Ltd Digital processor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6432491A (en) * 1987-07-27 1989-02-02 Nippon Electric Ic Microcomput Semiconductor storage device
JPH01277950A (en) * 1988-04-30 1989-11-08 Hitachi Ltd Digital processor

Also Published As

Publication number Publication date
JPS6040120B2 (en) 1985-09-09

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