JPS5745966A - Semiconductor device and manufacture thereof - Google Patents
Semiconductor device and manufacture thereofInfo
- Publication number
- JPS5745966A JPS5745966A JP55121565A JP12156580A JPS5745966A JP S5745966 A JPS5745966 A JP S5745966A JP 55121565 A JP55121565 A JP 55121565A JP 12156580 A JP12156580 A JP 12156580A JP S5745966 A JPS5745966 A JP S5745966A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- electrode
- window
- polysilicon
- type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D88/00—Three-dimensional [3D] integrated devices
Landscapes
- Bipolar Transistors (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To stereoscopically form a resistance layer on an electrode forming region without damaging a diffused layer by emitting a laser to a polysilicon grown at a low temperature on the electrode window of a semiconductor substrate finished with diffusing step to single-crystallizing it. CONSTITUTION:A p type layer 3 and an n<+> type layer 2 are formed on an n type epitaxial layer 4 isolated with a p<+> type layer, A window is selectively opened at an SiO2 film 5, and polysilicon 6 and an SiO2 film 7 are laminated. A window is selectively opened at the SiO2 film 7, a doped polysilicon 9 is superposed thereon, and a laser beam is emitted to the electrode arranging region 9' to convert the polysilicon into a single-crystalline Si. It is then photographically etched to form a resistance layer 10 on the electrode window, is then etched with fluoric acid to selectively retain an annular SiO27'. Then, aluminum electrode and wire 11 are formed, and a PSG12 is covered. With this configuration desired conductive type and desired resistance value resistance can be stereoscopically formed on the desired electrode, but it does not occupy the surface area of the substrate nor disturb the function of the difused layer thus completely formed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55121565A JPH0666315B2 (en) | 1980-09-02 | 1980-09-02 | Semiconductor device and manufacturing method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55121565A JPH0666315B2 (en) | 1980-09-02 | 1980-09-02 | Semiconductor device and manufacturing method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5745966A true JPS5745966A (en) | 1982-03-16 |
| JPH0666315B2 JPH0666315B2 (en) | 1994-08-24 |
Family
ID=14814372
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55121565A Expired - Lifetime JPH0666315B2 (en) | 1980-09-02 | 1980-09-02 | Semiconductor device and manufacturing method thereof |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0666315B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04330120A (en) * | 1991-03-26 | 1992-11-18 | Kunio Watanabe | Sheathing, boundary concrete block, and constructing method therefore |
-
1980
- 1980-09-02 JP JP55121565A patent/JPH0666315B2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04330120A (en) * | 1991-03-26 | 1992-11-18 | Kunio Watanabe | Sheathing, boundary concrete block, and constructing method therefore |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0666315B2 (en) | 1994-08-24 |
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