JPS5759372A - Circuit structure altering device for integrated semiconductor circuit - Google Patents
Circuit structure altering device for integrated semiconductor circuitInfo
- Publication number
- JPS5759372A JPS5759372A JP56127321A JP12732181A JPS5759372A JP S5759372 A JPS5759372 A JP S5759372A JP 56127321 A JP56127321 A JP 56127321A JP 12732181 A JP12732181 A JP 12732181A JP S5759372 A JPS5759372 A JP S5759372A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- integrated semiconductor
- altering device
- structure altering
- circuit structure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/49—Adaptable interconnections, e.g. fuses or antifuses
- H10W20/493—Fuses, i.e. interconnections changeable from conductive to non-conductive
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
- H01C17/23—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by opening or closing resistor geometric tracks of predetermined resistive values, e.g. snapistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45484—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with bipolar transistors as the active amplifying circuit
- H03F3/45596—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with bipolar transistors as the active amplifying circuit by offset reduction
- H03F3/45618—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with bipolar transistors as the active amplifying circuit by offset reduction by using balancing means
- H03F3/45623—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with bipolar transistors as the active amplifying circuit by offset reduction by using balancing means using switching means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45696—Indexing scheme relating to differential amplifiers the LC comprising more than two resistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45702—Indexing scheme relating to differential amplifiers the LC comprising two resistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45726—Indexing scheme relating to differential amplifiers the LC comprising more than one switch, which are not cross coupled
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Semiconductor Integrated Circuits (AREA)
- Hall/Mr Elements (AREA)
- Logic Circuits (AREA)
- Amplifiers (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19803030620 DE3030620A1 (de) | 1980-08-13 | 1980-08-13 | Anordnung zur aenderung der elektrischen schaltungskonfiguration von integrierten halbleiterschaltkreisen |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5759372A true JPS5759372A (en) | 1982-04-09 |
Family
ID=6109541
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56127321A Pending JPS5759372A (en) | 1980-08-13 | 1981-08-13 | Circuit structure altering device for integrated semiconductor circuit |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4438347A (ja) |
| EP (1) | EP0045895A1 (ja) |
| JP (1) | JPS5759372A (ja) |
| DE (1) | DE3030620A1 (ja) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60254763A (ja) * | 1984-05-31 | 1985-12-16 | Sanken Electric Co Ltd | 集積回路の製造方法 |
| JP2020148699A (ja) * | 2019-03-15 | 2020-09-17 | エイブリック株式会社 | 半導体装置 |
Families Citing this family (67)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4792920A (en) * | 1983-06-29 | 1988-12-20 | Canon Denshi Kabushiki Kaisha | Interface providing impedance matching by selective connection of a resistor array to a power supply |
| JPH01245165A (ja) * | 1988-03-28 | 1989-09-29 | Seiko Instr & Electron Ltd | 電圧検出回路 |
| JPH0233644A (ja) * | 1988-07-15 | 1990-02-02 | Ncr Corp | フレキシブル基板を用いた固有コードの設定方法及び装置 |
| JPH02189607A (ja) * | 1989-01-18 | 1990-07-25 | Seiko Instr Inc | ボルテージ・レギュレーター |
| US5079442A (en) * | 1990-03-28 | 1992-01-07 | Advanced Micro Devices, Inc. | Apparatus adaptable for use as a replacement output driver in a signal generating circuit |
| US6100747A (en) * | 1994-05-30 | 2000-08-08 | Stmicroelectronics, S.R.L. | Device for selecting design options in an integrated circuit |
| EP0685887B1 (en) * | 1994-05-30 | 1998-07-01 | STMicroelectronics S.r.l. | A device for selecting design options in an integrated circuit |
| DE69712302T2 (de) | 1996-12-31 | 2002-10-24 | Stmicroelectronics, Inc. | Struktur und Bauelement zur Auswahl von Entwurfsmöglichkeiten in einem integrierten Schaltkreis |
| DE10036283A1 (de) * | 2000-07-26 | 2002-02-07 | Bosch Gmbh Robert | Laserdiodenanordnung |
| TW573335B (en) * | 2001-08-28 | 2004-01-21 | Anachip Corp | Adjustment system, method and apparatus of using magnetic field to conduct micro-adjustment onto packaged chip |
| US9823090B2 (en) | 2014-10-31 | 2017-11-21 | Allegro Microsystems, Llc | Magnetic field sensor for sensing a movement of a target object |
| US7923996B2 (en) | 2008-02-26 | 2011-04-12 | Allegro Microsystems, Inc. | Magnetic field sensor with automatic sensitivity adjustment |
| DE112010000848B4 (de) | 2009-02-17 | 2018-04-05 | Allegro Microsystems, Llc | Schaltungen und Verfahren zum Erzeugen eines Selbsttests eines Magnetfeldsensors |
| WO2011011479A1 (en) | 2009-07-22 | 2011-01-27 | Allegro Microsystems, Inc. | Circuits and methods for generating a diagnostic mode of operation in a magnetic field sensor |
| JP2012168899A (ja) * | 2011-02-16 | 2012-09-06 | Seiko Instruments Inc | ボルテージレギュレータ |
| US8680846B2 (en) | 2011-04-27 | 2014-03-25 | Allegro Microsystems, Llc | Circuits and methods for self-calibrating or self-testing a magnetic field sensor |
| US8604777B2 (en) | 2011-07-13 | 2013-12-10 | Allegro Microsystems, Llc | Current sensor with calibration for a current divider configuration |
| US9201122B2 (en) | 2012-02-16 | 2015-12-01 | Allegro Microsystems, Llc | Circuits and methods using adjustable feedback for self-calibrating or self-testing a magnetic field sensor with an adjustable time constant |
| US9817078B2 (en) | 2012-05-10 | 2017-11-14 | Allegro Microsystems Llc | Methods and apparatus for magnetic sensor having integrated coil |
| US9383425B2 (en) | 2012-12-28 | 2016-07-05 | Allegro Microsystems, Llc | Methods and apparatus for a current sensor having fault detection and self test functionality |
| US10725100B2 (en) | 2013-03-15 | 2020-07-28 | Allegro Microsystems, Llc | Methods and apparatus for magnetic sensor having an externally accessible coil |
| US10495699B2 (en) | 2013-07-19 | 2019-12-03 | Allegro Microsystems, Llc | Methods and apparatus for magnetic sensor having an integrated coil or magnet to detect a non-ferromagnetic target |
| US10145908B2 (en) | 2013-07-19 | 2018-12-04 | Allegro Microsystems, Llc | Method and apparatus for magnetic sensor producing a changing magnetic field |
| US9810519B2 (en) | 2013-07-19 | 2017-11-07 | Allegro Microsystems, Llc | Arrangements for magnetic field sensors that act as tooth detectors |
| EP3080627B1 (en) | 2013-12-26 | 2020-10-14 | Allegro MicroSystems, LLC | Methods and apparatus for sensor diagnostics |
| US9645220B2 (en) | 2014-04-17 | 2017-05-09 | Allegro Microsystems, Llc | Circuits and methods for self-calibrating or self-testing a magnetic field sensor using phase discrimination |
| US9735773B2 (en) | 2014-04-29 | 2017-08-15 | Allegro Microsystems, Llc | Systems and methods for sensing current through a low-side field effect transistor |
| US9739846B2 (en) | 2014-10-03 | 2017-08-22 | Allegro Microsystems, Llc | Magnetic field sensors with self test |
| US9719806B2 (en) | 2014-10-31 | 2017-08-01 | Allegro Microsystems, Llc | Magnetic field sensor for sensing a movement of a ferromagnetic target object |
| US10712403B2 (en) | 2014-10-31 | 2020-07-14 | Allegro Microsystems, Llc | Magnetic field sensor and electronic circuit that pass amplifier current through a magnetoresistance element |
| US9823092B2 (en) | 2014-10-31 | 2017-11-21 | Allegro Microsystems, Llc | Magnetic field sensor providing a movement detector |
| US9720054B2 (en) | 2014-10-31 | 2017-08-01 | Allegro Microsystems, Llc | Magnetic field sensor and electronic circuit that pass amplifier current through a magnetoresistance element |
| US10466298B2 (en) | 2014-11-14 | 2019-11-05 | Allegro Microsystems, Llc | Magnetic field sensor with shared path amplifier and analog-to-digital-converter |
| US9804249B2 (en) | 2014-11-14 | 2017-10-31 | Allegro Microsystems, Llc | Dual-path analog to digital converter |
| US9841485B2 (en) | 2014-11-14 | 2017-12-12 | Allegro Microsystems, Llc | Magnetic field sensor having calibration circuitry and techniques |
| US9638764B2 (en) | 2015-04-08 | 2017-05-02 | Allegro Microsystems, Llc | Electronic circuit for driving a hall effect element with a current compensated for substrate stress |
| US9851417B2 (en) | 2015-07-28 | 2017-12-26 | Allegro Microsystems, Llc | Structure and system for simultaneous sensing a magnetic field and mechanical stress |
| US10107873B2 (en) | 2016-03-10 | 2018-10-23 | Allegro Microsystems, Llc | Electronic circuit for compensating a sensitivity drift of a hall effect element due to stress |
| US10132879B2 (en) | 2016-05-23 | 2018-11-20 | Allegro Microsystems, Llc | Gain equalization for multiple axis magnetic field sensing |
| US10260905B2 (en) | 2016-06-08 | 2019-04-16 | Allegro Microsystems, Llc | Arrangements for magnetic field sensors to cancel offset variations |
| US10012518B2 (en) | 2016-06-08 | 2018-07-03 | Allegro Microsystems, Llc | Magnetic field sensor for sensing a proximity of an object |
| US10041810B2 (en) | 2016-06-08 | 2018-08-07 | Allegro Microsystems, Llc | Arrangements for magnetic field sensors that act as movement detectors |
| US10162017B2 (en) | 2016-07-12 | 2018-12-25 | Allegro Microsystems, Llc | Systems and methods for reducing high order hall plate sensitivity temperature coefficients |
| US11428755B2 (en) | 2017-05-26 | 2022-08-30 | Allegro Microsystems, Llc | Coil actuated sensor with sensitivity detection |
| US10837943B2 (en) | 2017-05-26 | 2020-11-17 | Allegro Microsystems, Llc | Magnetic field sensor with error calculation |
| US10996289B2 (en) | 2017-05-26 | 2021-05-04 | Allegro Microsystems, Llc | Coil actuated position sensor with reflected magnetic field |
| US10310028B2 (en) | 2017-05-26 | 2019-06-04 | Allegro Microsystems, Llc | Coil actuated pressure sensor |
| US10324141B2 (en) | 2017-05-26 | 2019-06-18 | Allegro Microsystems, Llc | Packages for coil actuated position sensors |
| US10641842B2 (en) | 2017-05-26 | 2020-05-05 | Allegro Microsystems, Llc | Targets for coil actuated position sensors |
| US10520559B2 (en) | 2017-08-14 | 2019-12-31 | Allegro Microsystems, Llc | Arrangements for Hall effect elements and vertical epi resistors upon a substrate |
| US10866117B2 (en) | 2018-03-01 | 2020-12-15 | Allegro Microsystems, Llc | Magnetic field influence during rotation movement of magnetic target |
| US11255700B2 (en) | 2018-08-06 | 2022-02-22 | Allegro Microsystems, Llc | Magnetic field sensor |
| US10823586B2 (en) | 2018-12-26 | 2020-11-03 | Allegro Microsystems, Llc | Magnetic field sensor having unequally spaced magnetic field sensing elements |
| US11061084B2 (en) | 2019-03-07 | 2021-07-13 | Allegro Microsystems, Llc | Coil actuated pressure sensor and deflectable substrate |
| US10955306B2 (en) | 2019-04-22 | 2021-03-23 | Allegro Microsystems, Llc | Coil actuated pressure sensor and deformable substrate |
| US11237020B2 (en) | 2019-11-14 | 2022-02-01 | Allegro Microsystems, Llc | Magnetic field sensor having two rows of magnetic field sensing elements for measuring an angle of rotation of a magnet |
| US11280637B2 (en) | 2019-11-14 | 2022-03-22 | Allegro Microsystems, Llc | High performance magnetic angle sensor |
| US11194004B2 (en) | 2020-02-12 | 2021-12-07 | Allegro Microsystems, Llc | Diagnostic circuits and methods for sensor test circuits |
| US11169223B2 (en) | 2020-03-23 | 2021-11-09 | Allegro Microsystems, Llc | Hall element signal calibrating in angle sensor |
| US11262422B2 (en) | 2020-05-08 | 2022-03-01 | Allegro Microsystems, Llc | Stray-field-immune coil-activated position sensor |
| US11493361B2 (en) | 2021-02-26 | 2022-11-08 | Allegro Microsystems, Llc | Stray field immune coil-activated sensor |
| US11630130B2 (en) | 2021-03-31 | 2023-04-18 | Allegro Microsystems, Llc | Channel sensitivity matching |
| US11578997B1 (en) | 2021-08-24 | 2023-02-14 | Allegro Microsystems, Llc | Angle sensor using eddy currents |
| US11994541B2 (en) | 2022-04-15 | 2024-05-28 | Allegro Microsystems, Llc | Current sensor assemblies for low currents |
| US12510611B2 (en) | 2023-11-07 | 2025-12-30 | Allegro Microsystems, Llc | TMR sensor having magnetic field generation for pillar stimulation |
| US12455301B2 (en) | 2023-12-11 | 2025-10-28 | Allegro Microsystems, Llc | Hall plate current sensor having stress compensation |
| US12523717B2 (en) | 2024-02-15 | 2026-01-13 | Allegro Microsystems, Llc | Closed loop magnetic field sensor with current control |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1243175A (en) * | 1967-09-01 | 1971-08-18 | Lucas Industries Ltd | Electrical component assemblies |
| US3758745A (en) | 1971-09-07 | 1973-09-11 | Microsystems Int Ltd | Substrate positioned determination structure and method |
| US3820152A (en) | 1973-04-24 | 1974-06-25 | Du Pont | Circuit package with fugitive shorting bar |
| DE2614781B2 (de) | 1976-04-06 | 1979-04-05 | Robert Bosch Gmbh, 7000 Stuttgart | Integrierte Schaltungsanordnung |
| GB1500394A (en) * | 1976-04-27 | 1978-02-08 | Welwyn Electric Ltd | Electrical resistor network |
| US4100437A (en) | 1976-07-29 | 1978-07-11 | Intel Corporation | MOS reference voltage circuit |
| US4182024A (en) * | 1977-12-15 | 1980-01-08 | National Semiconductor Corporation | Automatic control of integrated circuit trimming |
| US4201970A (en) * | 1978-08-07 | 1980-05-06 | Rca Corporation | Method and apparatus for trimming resistors |
| US4225878A (en) | 1979-03-08 | 1980-09-30 | National Semiconductor Corporation | Integrated circuit on chip trimming |
-
1980
- 1980-08-13 DE DE19803030620 patent/DE3030620A1/de not_active Withdrawn
-
1981
- 1981-07-27 EP EP81105923A patent/EP0045895A1/de not_active Withdrawn
- 1981-08-07 US US06/291,112 patent/US4438347A/en not_active Expired - Fee Related
- 1981-08-13 JP JP56127321A patent/JPS5759372A/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60254763A (ja) * | 1984-05-31 | 1985-12-16 | Sanken Electric Co Ltd | 集積回路の製造方法 |
| JP2020148699A (ja) * | 2019-03-15 | 2020-09-17 | エイブリック株式会社 | 半導体装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE3030620A1 (de) | 1982-03-11 |
| EP0045895A1 (de) | 1982-02-17 |
| US4438347A (en) | 1984-03-20 |
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