JPS5768079A - Semiconductor pressure sensor - Google Patents
Semiconductor pressure sensorInfo
- Publication number
- JPS5768079A JPS5768079A JP55143626A JP14362680A JPS5768079A JP S5768079 A JPS5768079 A JP S5768079A JP 55143626 A JP55143626 A JP 55143626A JP 14362680 A JP14362680 A JP 14362680A JP S5768079 A JPS5768079 A JP S5768079A
- Authority
- JP
- Japan
- Prior art keywords
- film
- thin film
- polysilicon thin
- single crystal
- crystal substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
- H10D48/50—Devices controlled by mechanical forces, e.g. pressure
Landscapes
- Measuring Fluid Pressure (AREA)
- Pressure Sensors (AREA)
Abstract
PURPOSE:To detect the pressure difference between an insulating single crystal substrate side a polysilicon thin film side by the variation in the resistance induced by a strain by forming the polysilicon thin film on an insulating film on the insulating single crystal substrate or on a semiconductor substrate. CONSTITUTION:An SiO2 film 2 is formed on the (001) plane of an Si single crystal substrate 1, and a polysilicon thin film 3 is formed in an island. A gate oxidized film 4 is formed by oxidation, polysilicon 5 is superposed, is plasma etched, and a gate region is formed. It is treated in a POCl3 atmosphere to form an N type source 6, a drain 7 and a gate electrode 5. An SiO2 film 8 is covered, a window 9 is opened, an aluminum electrode is attached, and is annealed. With this structure, a sensor having temperature dependency smaller than the conventional one can be obtained, the irregularity between the lot or wafer can be managed only by controlling the thickness of the polysilicon thin film, and the dependency in the variation of the temperature characteritics can be almost eliminated.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55143626A JPS5768079A (en) | 1980-10-16 | 1980-10-16 | Semiconductor pressure sensor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55143626A JPS5768079A (en) | 1980-10-16 | 1980-10-16 | Semiconductor pressure sensor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5768079A true JPS5768079A (en) | 1982-04-26 |
| JPS6222540B2 JPS6222540B2 (en) | 1987-05-19 |
Family
ID=15343121
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55143626A Granted JPS5768079A (en) | 1980-10-16 | 1980-10-16 | Semiconductor pressure sensor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5768079A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5503017A (en) * | 1993-05-21 | 1996-04-02 | Nippondenso Co., Ltd. | Semiconductor acceleration sensor |
| US5504356A (en) * | 1992-11-16 | 1996-04-02 | Nippondenso Co., Ltd. | Semiconductor accelerometer |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4831078A (en) * | 1971-08-26 | 1973-04-24 | ||
| JPS54150987A (en) * | 1978-05-18 | 1979-11-27 | Gulton Ind Inc | Strain gauge transducer and method of fabricating same |
-
1980
- 1980-10-16 JP JP55143626A patent/JPS5768079A/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4831078A (en) * | 1971-08-26 | 1973-04-24 | ||
| JPS54150987A (en) * | 1978-05-18 | 1979-11-27 | Gulton Ind Inc | Strain gauge transducer and method of fabricating same |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5504356A (en) * | 1992-11-16 | 1996-04-02 | Nippondenso Co., Ltd. | Semiconductor accelerometer |
| US5503017A (en) * | 1993-05-21 | 1996-04-02 | Nippondenso Co., Ltd. | Semiconductor acceleration sensor |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6222540B2 (en) | 1987-05-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS5691464A (en) | Semiconductor device | |
| JPS6459866A (en) | Manufacture of mos transistor | |
| JPS54146584A (en) | Manufacture of semiconductor device | |
| JPS645075A (en) | Semiconductor pressure sensor and manufacture of the same | |
| JPS5763842A (en) | Preparation of semiconductor integrated circuit | |
| JPS56104468A (en) | Manufacture of mos semiconductor device | |
| JPS6435958A (en) | Thin film transistor | |
| JPS5768049A (en) | Semiconductor device and manufacture thereof | |
| JPS5664460A (en) | Semiconductor device | |
| JPS55162270A (en) | Semiconductor device | |
| JPS56146254A (en) | Manufacture of semiconductor device | |
| JPS5681953A (en) | Semiconductor device | |
| JPS56125846A (en) | Surface treatment of semiconductor | |
| JPS57113275A (en) | Manufacture of semiconductor device | |
| JPS5764972A (en) | Silicon gate type field-effect semiconductor device and manufacture thereof | |
| JPS567482A (en) | Manufacturing of semiconductor device | |
| GB1338042A (en) | Method for the production of a field effect transistor | |
| JPS5666074A (en) | Insulating gate type field-effect transistor | |
| JPS5718362A (en) | Semiconductor device and manufacture thereof | |
| JPS577968A (en) | Semiconductor device | |
| JPS5749271A (en) | Insulated-gate type field-effect semiconductor device | |
| JPS5694633A (en) | Manufacture of semiconductor device | |
| JPS6420636A (en) | Manufacture of semiconductor device | |
| JPS5712526A (en) | Manufacture of semiconductor device | |
| JPS57184217A (en) | Manufacture of semiconductor device |