JPS5771137A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5771137A JPS5771137A JP55146792A JP14679280A JPS5771137A JP S5771137 A JPS5771137 A JP S5771137A JP 55146792 A JP55146792 A JP 55146792A JP 14679280 A JP14679280 A JP 14679280A JP S5771137 A JPS5771137 A JP S5771137A
- Authority
- JP
- Japan
- Prior art keywords
- wiring
- package
- heat treatment
- highly reliable
- header
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/694—Inorganic materials composed of nitrides
- H10P14/6943—Inorganic materials composed of nitrides containing silicon
- H10P14/69433—Inorganic materials composed of nitrides containing silicon the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
PURPOSE:To produce a highly reliable device capable of resisting moisture outside by a method wherein a protective coating is provided after completion of the bonding of the device to a header and of the wiring from the device to the package. CONSTITUTION:Diffusion layers 2, an insulator layer 3, and an Al wiring 4 are as usual formed on an Si substrate 1. The device is mounted on a package header 9 via an An-Si eutectic layer 11 and an Al lead 7 connects the pad 6 of the Al wiring 4 to a socket 8. Next, the device and package are placed in a heat treatment unit with the metal made socket 8 protected by a quartz made jig 12. The heat treatment consists of a reaction between SiH4 and NH4 at a temperature of approximately 300 deg.C, which results in an Si3N4 coating 5. The heat treated device is then potted. Thanks to the Si3N4 coating 5 keeping away moisture, C, O, N2 and the like when the device is live and thereby Al wiring deterioration and migrating ion caused fluctuations in MOS characteristics prevented, a highly reliable device is produced.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55146792A JPS5771137A (en) | 1980-10-22 | 1980-10-22 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55146792A JPS5771137A (en) | 1980-10-22 | 1980-10-22 | Manufacture of semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5771137A true JPS5771137A (en) | 1982-05-01 |
Family
ID=15415636
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55146792A Pending JPS5771137A (en) | 1980-10-22 | 1980-10-22 | Manufacture of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5771137A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58206129A (en) * | 1982-05-27 | 1983-12-01 | Seiko Epson Corp | Semiconductor device |
| JPS59231840A (en) * | 1983-06-14 | 1984-12-26 | Semiconductor Energy Lab Co Ltd | Semiconductor device and manufacture thereof |
| JPS62186553A (en) * | 1986-02-12 | 1987-08-14 | Seiko Epson Corp | Molded structure of wire bonding part |
| JPS63313829A (en) * | 1988-05-06 | 1988-12-21 | Semiconductor Energy Lab Co Ltd | Manufacture of semiconductor device |
| JPH02346A (en) * | 1989-02-10 | 1990-01-05 | Semiconductor Energy Lab Co Ltd | Semiconductor device |
| JPH02345A (en) * | 1989-02-10 | 1990-01-05 | Semiconductor Energy Lab Co Ltd | Manufacture of semiconductor device |
-
1980
- 1980-10-22 JP JP55146792A patent/JPS5771137A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58206129A (en) * | 1982-05-27 | 1983-12-01 | Seiko Epson Corp | Semiconductor device |
| JPS59231840A (en) * | 1983-06-14 | 1984-12-26 | Semiconductor Energy Lab Co Ltd | Semiconductor device and manufacture thereof |
| JPS62186553A (en) * | 1986-02-12 | 1987-08-14 | Seiko Epson Corp | Molded structure of wire bonding part |
| JPS63313829A (en) * | 1988-05-06 | 1988-12-21 | Semiconductor Energy Lab Co Ltd | Manufacture of semiconductor device |
| JPH02346A (en) * | 1989-02-10 | 1990-01-05 | Semiconductor Energy Lab Co Ltd | Semiconductor device |
| JPH02345A (en) * | 1989-02-10 | 1990-01-05 | Semiconductor Energy Lab Co Ltd | Manufacture of semiconductor device |
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