JPS5776443A - Testing method for transmission od radiant ray of metallic material - Google Patents

Testing method for transmission od radiant ray of metallic material

Info

Publication number
JPS5776443A
JPS5776443A JP55152176A JP15217680A JPS5776443A JP S5776443 A JPS5776443 A JP S5776443A JP 55152176 A JP55152176 A JP 55152176A JP 15217680 A JP15217680 A JP 15217680A JP S5776443 A JPS5776443 A JP S5776443A
Authority
JP
Japan
Prior art keywords
section
picture
scanning
cross
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55152176A
Other languages
English (en)
Inventor
Isamu Taguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP55152176A priority Critical patent/JPS5776443A/ja
Publication of JPS5776443A publication Critical patent/JPS5776443A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP55152176A 1980-10-31 1980-10-31 Testing method for transmission od radiant ray of metallic material Pending JPS5776443A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55152176A JPS5776443A (en) 1980-10-31 1980-10-31 Testing method for transmission od radiant ray of metallic material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55152176A JPS5776443A (en) 1980-10-31 1980-10-31 Testing method for transmission od radiant ray of metallic material

Publications (1)

Publication Number Publication Date
JPS5776443A true JPS5776443A (en) 1982-05-13

Family

ID=15534701

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55152176A Pending JPS5776443A (en) 1980-10-31 1980-10-31 Testing method for transmission od radiant ray of metallic material

Country Status (1)

Country Link
JP (1) JPS5776443A (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59221643A (ja) * 1983-05-31 1984-12-13 Toshiba Corp セラミツクス物品の検査法
JPS60181640A (ja) * 1984-02-29 1985-09-17 Nippon Steel Corp 工業用放射線断層撮影方法
JPS61115508U (ja) * 1984-12-28 1986-07-21
CN110473646A (zh) * 2018-07-02 2019-11-19 中广核研究院有限公司 一种可控同位素中子源

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4084094A (en) * 1975-07-11 1978-04-11 Emi Limited Radiographic apparatus
JPS5573247A (en) * 1978-11-27 1980-06-02 Philips Nv Tomographing inspection method and its device
JPS55116244A (en) * 1979-02-28 1980-09-06 Hitachi Zosen Hihakai Kensa Kk Testing and determining quality of meat of animal
JPS5536335B2 (ja) * 1975-09-24 1980-09-19

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4084094A (en) * 1975-07-11 1978-04-11 Emi Limited Radiographic apparatus
JPS5536335B2 (ja) * 1975-09-24 1980-09-19
JPS5573247A (en) * 1978-11-27 1980-06-02 Philips Nv Tomographing inspection method and its device
JPS55116244A (en) * 1979-02-28 1980-09-06 Hitachi Zosen Hihakai Kensa Kk Testing and determining quality of meat of animal

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59221643A (ja) * 1983-05-31 1984-12-13 Toshiba Corp セラミツクス物品の検査法
JPS60181640A (ja) * 1984-02-29 1985-09-17 Nippon Steel Corp 工業用放射線断層撮影方法
JPS61115508U (ja) * 1984-12-28 1986-07-21
CN110473646A (zh) * 2018-07-02 2019-11-19 中广核研究院有限公司 一种可控同位素中子源

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