JPS58178663U - infrared gas analyzer - Google Patents
infrared gas analyzerInfo
- Publication number
- JPS58178663U JPS58178663U JP7731982U JP7731982U JPS58178663U JP S58178663 U JPS58178663 U JP S58178663U JP 7731982 U JP7731982 U JP 7731982U JP 7731982 U JP7731982 U JP 7731982U JP S58178663 U JPS58178663 U JP S58178663U
- Authority
- JP
- Japan
- Prior art keywords
- infrared
- gas
- infrared light
- gas analyzer
- light beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図ないし第３歯は従来の赤外線ガス分析計の概略構
成図、第４図は本考案の一実施例の概略構成図、第５図
は第４図の反射板の表面状態説明図、第６図は尿考案の
他の実施例の概略構成図である。
８・・・赤外線光束、１７・・・検出器、２０．３５・
・・検出部、２１・・・前部検出室、２２・・・後部検
出室１．３２．３９．３９Ａ・・・反射板、３６・・・
第１検出室、３７・・・第２検出室。1 to 3 are a schematic configuration diagram of a conventional infrared gas analyzer, FIG. 4 is a schematic configuration diagram of an embodiment of the present invention, and FIG. 5 is an explanatory diagram of the surface state of the reflector in FIG. 4. FIG. 6 is a schematic diagram of another embodiment of the urine device. 8... Infrared light flux, 17... Detector, 20.35.
...Detection section, 21...Front detection chamber, 22...Rear detection chamber 1.32.39.39A...Reflector, 36...
1st detection chamber, 37... 2nd detection chamber.
Claims (1)
束が照射され導入された試料ガスに含まれる被測定ガス
の濃度に応じて吸収される測定セルと、前記測定セルを
透過した赤外線光束が照射され前記測定ガスと同種類の
ガスが充填される検・ 山部と、この検出部の背面
を全面遮光するように設けられ前記検出部を透過した赤
外線光束を前記検出部に反射させる反射板とを備え、前
記反射板による赤外線反射量により前記検出部の赤外線
吸収量を変化させて出力特性を調節可能にしたことを特
徴とする赤外線ガス分析計。An infrared light source, a measurement cell that is irradiated with an infrared light beam emitted from the infrared light source and absorbed in accordance with the concentration of a gas to be measured contained in an introduced sample gas, and a measurement cell that is irradiated with an infrared light beam that has passed through the measurement cell. A detection peak portion is filled with the same type of gas as the measurement gas, and a reflection plate is provided to completely shield the back surface of the detection portion and reflects the infrared light beam transmitted through the detection portion back to the detection portion. An infrared gas analyzer comprising: an infrared gas analyzer, wherein the amount of infrared absorption of the detection section is changed depending on the amount of infrared reflection by the reflector, so that output characteristics can be adjusted.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7731982U JPS58178663U (en) | 1982-05-25 | 1982-05-25 | infrared gas analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7731982U JPS58178663U (en) | 1982-05-25 | 1982-05-25 | infrared gas analyzer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58178663U true JPS58178663U (en) | 1983-11-29 |
Family
ID=30086586
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7731982U Pending JPS58178663U (en) | 1982-05-25 | 1982-05-25 | infrared gas analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58178663U (en) |
-
1982
- 1982-05-25 JP JP7731982U patent/JPS58178663U/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS58178663U (en) | infrared gas analyzer | |
| JPS58136757U (en) | Infrared radiation gas analyzer | |
| JPS60148959U (en) | Equipment for measuring water vapor components in mixed gas | |
| JPS5987653U (en) | Gas concentration measuring device | |
| JPS6117656U (en) | Equipment for testing reflective surfaces | |
| JPS58136756U (en) | Infrared radiation gas analyzer | |
| JPS60165847U (en) | Calibration mechanism of infrared analyzer | |
| JPS545778A (en) | Gas density analyzer | |
| JPS611156U (en) | Gas concentration measuring device | |
| JPH0283454U (en) | ||
| JPS60123681U (en) | radiation measuring device | |
| JPS58136758U (en) | Infrared radiation gas analyzer | |
| JPS593354U (en) | Moisture measuring device | |
| JPS58136760U (en) | Infrared radiation gas analyzer | |
| JPS603458U (en) | Fluorescent X-ray intensity measurement system holder for EXAFS measurement | |
| JPS6029272U (en) | atmospheric attenuation rate measuring instrument | |
| JPS5921783U (en) | Radiation intensity measuring device | |
| JPS60152955U (en) | infrared analyzer | |
| JPS6083952U (en) | Wavelength selection device for light source in gas analyzer | |
| JPH01151242U (en) | ||
| JPS59195548U (en) | Humidity measuring device | |
| JPS5865557U (en) | Absorbance measuring device | |
| JPH0325143U (en) | ||
| JPS6142453U (en) | Turbidity measuring device | |
| JPS60177810U (en) | Laser cancer measuring device |