JPS58188043A - Beam processing device - Google Patents
Beam processing deviceInfo
- Publication number
- JPS58188043A JPS58188043A JP57071822A JP7182282A JPS58188043A JP S58188043 A JPS58188043 A JP S58188043A JP 57071822 A JP57071822 A JP 57071822A JP 7182282 A JP7182282 A JP 7182282A JP S58188043 A JPS58188043 A JP S58188043A
- Authority
- JP
- Japan
- Prior art keywords
- pulse
- output
- oscillation circuit
- circuit
- control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
- Physical Vapour Deposition (AREA)
- ing And Chemical Polishing (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、イオンビーム、電子ビーム、プラズマビーム
、レーザービーム等のビームを加工部に照射して掘削加
工、溶接、エツチング、ブレーティング、熱処理等の加
工を行うビーム加工装置の改良に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to beam processing in which a processing part is irradiated with a beam such as an ion beam, an electron beam, a plasma beam, a laser beam, etc. to perform processing such as drilling, welding, etching, brating, heat treatment, etc. Concerning improvements to equipment.
従来ビームを発生する1電■、例えば電子、イオンを加
速する加速電源には定状直流高電圧を利用しているが、
この場合加工韮ネルギが充分精密に制御できない。また
レーザに於てコンデンサに貯えたエネルギを放電管に放
電してレーザ発振さぜることは知られ(いる。しかしこ
のコデンサの放電を目的に合せて任意に制御するという
わけにはいかない。ビーム加−[に於て加−r性能、特
に精密な加工を打うIこめにはビームの制御が極めて重
要であるが、従来は何れのものも充分な制御ができなか
った。Conventionally, a constant DC high voltage is used for the acceleration power source that generates the beam, such as electrons and ions.
In this case, processing energy cannot be controlled with sufficient precision. It is also known that in a laser, the energy stored in a capacitor is discharged into a discharge tube to cause laser oscillation.However, it is not possible to arbitrarily control the discharge of this condenser to suit the purpose.Beam Beam control is extremely important for machining performance, especially for precision machining, but in the past it has not been possible to adequately control either of these.
本発明は電源に単位パルスのパルス数を制御するパルス
電源を設けたことを特徴とづるものである。The present invention is characterized in that the power source is provided with a pulse power source that controls the number of unit pulses.
以ド図面の一実施例により本発明を説明すると、第1図
に於て、第1は陰極を構成するフィラメントで、2が加
熱用電源、3は電子放射を制御するウェーネルト電極、
4,5は電子加速用電極で、この間に静電レンズ用電極
6が設けられている。The present invention will now be described with reference to an embodiment of the drawings. In FIG. 1, 1 is a filament constituting a cathode, 2 is a heating power source, 3 is a Wehnelt electrode for controlling electron emission,
4 and 5 are electrodes for electron acceleration, and an electrode 6 for an electrostatic lens is provided between these electrodes.
7はビーム集束用電磁レンズで、集束したビームスポッ
トを被加工体13に与えて加工する。8はパルス変圧器
で、変圧出力を整流器9で整流して加速電極に印加する
。10は直流電源、11は直流をスイッチングしてパル
スを発生するスイッチ素子。Reference numeral 7 denotes a beam focusing electromagnetic lens, which applies a focused beam spot to the workpiece 13 for processing. 8 is a pulse transformer, and the transformer output is rectified by a rectifier 9 and applied to the accelerating electrode. 10 is a DC power supply, and 11 is a switching element that switches DC to generate pulses.
12が制御パルスを発生するパルス発生回路である。12 is a pulse generation circuit that generates control pulses.
陰極フィラメント1の加熱により陰極から放射する電子
ビームはウェーネルト3のスリットを通り電極4.5.
6の加速集束作用を受け、被加工体13の加工部に焦点
を結ぶ、勿論このビーム照射の雰囲気は真空ポンプによ
って高真空に排気されている。被加工体13は加速電子
ビームによって溶解、蒸発等して加工されるが、微細精
密加工に於て照射ビームのエネルギ制御が重要になって
くる。The electron beam emitted from the cathode by heating the cathode filament 1 passes through the slits of Wehnelt 3 and passes through the electrodes 4.5.
The atmosphere of this beam irradiation is, of course, evacuated to a high vacuum by a vacuum pump. The workpiece 13 is processed by melting, evaporating, etc. with an accelerated electron beam, and controlling the energy of the irradiation beam becomes important in fine precision processing.
エネルギ制御はパルス電源のパルス数の制御によって行
う。Energy control is performed by controlling the number of pulses of the pulsed power source.
パルス発生回路12の詳細は第2図の通りで、121が
単位パルス列を発生する発振回路、122が継続するパ
ルス数を制御するパルス発生用の発振回路で、両者の出
力をAND回路123により結合することによって所定
のパルス数が継続するパルスを出力し増巾器124で増
巾してスイッチ11を制御する。発振回路121は一定
のパルス巾と休止中を有するパルスを発生し続けるので
、このパルス数によってエネルギ制御がデジタルに精密
に制御て、きる3、即りR振開回路121出力パルスと
発振回路122の出ツノパルスとはA N l’)回路
123によってノ′ント結a4るので・、発振回路1
22の出力のAンパルス時間jごGj l 情パルスか
出カケることになり、Aンバルス中の制御によ・〕(単
位パルス数を容易に制御づる(−とができる。The details of the pulse generation circuit 12 are shown in FIG. 2. 121 is an oscillation circuit that generates a unit pulse train, 122 is an oscillation circuit for pulse generation that controls the number of continuous pulses, and the outputs of both are combined by an AND circuit 123. By doing so, a pulse that continues for a predetermined number of pulses is outputted, amplified by the amplifier 124, and the switch 11 is controlled. Since the oscillation circuit 121 continues to generate pulses with a constant pulse width and pauses, the energy can be precisely controlled digitally depending on the number of pulses. The output horn pulse is A N l') circuit 123, which connects the note a4, so the oscillation circuit 1
The A pulse time j of the output of 22 is output, and the number of unit pulses can be easily controlled by the control during the A pulse.
よl、甲(&パルス列が中断づる時間+i+も発振回路
122の出力オノパルス時間により容易に精密に制御す
ることかCき、これによりスイッチ11′Aン。The time +i+ during which the pulse train is interrupted can be easily and precisely controlled by the output pulse time of the oscillation circuit 122, thereby turning on the switch 11'A.
A]し弯If器8で・昇圧して加速電極に加えるエネル
1が容易にM密に制御でさ、ビーへJネルギの制御か(
さ、照射加Iの精密制御ができるものである。A] The energy 1 that is boosted and applied to the accelerating electrode can be easily and precisely controlled by the If device 8, and the energy 1 for B can be controlled (
This allows precise control of irradiation I.
L、/、が)(この本発明!4 N G;よれば、加り
部照射Jネル−1″−の制御が任意に精密に制御できる
ので、細削加1.溶接、[ツチング、ブレーJインク。According to the present invention! 4 N G;, the control of the irradiated J-flange J-1" can be arbitrarily and precisely controlled, so that fine cutting 1. Welding, [touching, braking] J ink.
熱処理等の加1を[」的に対しく常に11−確に什1げ
る(丁とが(さる。Additions such as heat treatment, etc., to the target are always 11 - exactly 1 tithe.
尚前記パルス発9回路12は発振回路121の発9パル
スを/Jウンタで計数して所定数に達する毎に単イ)“
lパルス列を中断させるようにしても単位パルスのパル
ス数の制御が任意にでき精密な制御がて・きる。また単
位パルスを発生する発振回路121の発振作動を所定時
間もしくはパルス発生毎に中断制御するようにしてもよ
く、その他パルス発生回路12は任意のものが利用でき
る。The pulse generator 9 circuit 12 counts the 9 pulses generated by the oscillator circuit 121 with a /J counter, and each time it reaches a predetermined number, it counts the 9 pulses generated by the oscillation circuit 121 and outputs a single a).
Even if the pulse train is interrupted, the number of unit pulses can be controlled arbitrarily and precise control can be achieved. Further, the oscillation operation of the oscillation circuit 121 that generates a unit pulse may be controlled to be interrupted at a predetermined time or every time a pulse is generated, and any other arbitrary circuit can be used as the pulse generation circuit 12.
また本発明は前記パルス電源を設けることによって電子
ビーム、イオンビームに限らず、プラズマ、レーリ“−
等のビームの制御も容易にでき、これらによるビーム加
工が正確に高性能に行える効果を秦づる1゜Furthermore, by providing the pulse power source, the present invention can be used not only for electron beams and ion beams, but also for plasma, Rayleigh, etc.
It is easy to control beams such as
第1図は本発明装置の一実施例構成図、第2図はぞの一
部分の詳細図である。
]・・・・・・・・・フィラメント
2・・・・・・・・・つ1−ネルト
4.5.6・・・・・・・・・電極
8・・・・・・・・・変圧器
9・・・・・・・・・整流器
10・・・・・・・・・直流電源
11・・・・・・・・・スイツチ
12・・・・・・・・・パルス発生回路13・・・・・
・・・・液加1体
特 許 出 願 人
株式会社井1シトパックス研究所
代表省 井 1− 潔FIG. 1 is a block diagram of one embodiment of the apparatus of the present invention, and FIG. 2 is a detailed diagram of a portion thereof. ]......Filament 2...1-Nelt 4.5.6...Electrode 8... Transformer 9...... Rectifier 10... DC power supply 11... Switch 12... Pulse generating circuit 13・・・・・・
...liquid-addition-one-unit patent filed by Kiyoshi I1, representative of Citopax Research Institute, I1 Co., Ltd.
Claims (1)
加工装置に於て、前記畠エネルギビームを発生する主電
源に単位パルスのパルス数を制御するパルス電源を設け
たことを特徴とするビーム加工装置。A beam processing device for processing a workpiece by irradiating a high-energy beam thereon, characterized in that the main power supply for generating the Hatake energy beam is provided with a pulse power supply for controlling the number of pulses per unit pulse. Device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57071822A JPS58188043A (en) | 1982-04-28 | 1982-04-28 | Beam processing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57071822A JPS58188043A (en) | 1982-04-28 | 1982-04-28 | Beam processing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58188043A true JPS58188043A (en) | 1983-11-02 |
| JPH0447422B2 JPH0447422B2 (en) | 1992-08-03 |
Family
ID=13471626
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57071822A Granted JPS58188043A (en) | 1982-04-28 | 1982-04-28 | Beam processing device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58188043A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006244871A (en) * | 2005-03-03 | 2006-09-14 | Fujitsu Ltd | Method for depositing particles, electron emission device and transistor |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7339222B2 (en) | 2020-09-03 | 2023-09-05 | 株式会社神戸製鋼所 | Pig iron manufacturing method |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5728686A (en) * | 1980-07-28 | 1982-02-16 | Daihen Corp | Working apparatus by charged particle beam |
-
1982
- 1982-04-28 JP JP57071822A patent/JPS58188043A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5728686A (en) * | 1980-07-28 | 1982-02-16 | Daihen Corp | Working apparatus by charged particle beam |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006244871A (en) * | 2005-03-03 | 2006-09-14 | Fujitsu Ltd | Method for depositing particles, electron emission device and transistor |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0447422B2 (en) | 1992-08-03 |
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