JPS58188043A - Beam processing device - Google Patents

Beam processing device

Info

Publication number
JPS58188043A
JPS58188043A JP57071822A JP7182282A JPS58188043A JP S58188043 A JPS58188043 A JP S58188043A JP 57071822 A JP57071822 A JP 57071822A JP 7182282 A JP7182282 A JP 7182282A JP S58188043 A JPS58188043 A JP S58188043A
Authority
JP
Japan
Prior art keywords
pulse
output
oscillation circuit
circuit
control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57071822A
Other languages
Japanese (ja)
Other versions
JPH0447422B2 (en
Inventor
Kiyoshi Inoue
潔 井上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Inoue Japax Research Inc
Original Assignee
Inoue Japax Research Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inoue Japax Research Inc filed Critical Inoue Japax Research Inc
Priority to JP57071822A priority Critical patent/JPS58188043A/en
Publication of JPS58188043A publication Critical patent/JPS58188043A/en
Publication of JPH0447422B2 publication Critical patent/JPH0447422B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/24Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
  • Physical Vapour Deposition (AREA)
  • ing And Chemical Polishing (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To enable those beams of such as plasma and a laser as well as an electron beam and an ion beam to be controlled easily, thus making it possible to perform beam processing thereby with accuracy and a high performance, by providing a pulse power source. CONSTITUTION:An electron beam emitted from a cathode by heating a cathode filament 1 passes through a slit of a Wehnelt cylinder 3 to be focussed on the work part of an object to be processed 13. A pulse having a continuous specified pulse number is output by combining the output of an oscillation circuit 121 with that of the oscillation circuit 122 for pulse generation through an AND circuit 123 in order to control a switch 11 after amplifying it by an amplifier 124. The oscillation circuit 121 continues to generate the pulse having the prescribed width and half width so that the energy controll may be carried out digitally and accurately by means of said pulse number. That is to say the output pulse of the oscillation circuit 121 is bound with the output pulse of the oscillation circuit 122 through the AND circuit 123 so as to output a unit pulse so long as an on-pulse time of the output of the oscillation circuit 122 thus making it possible to easily control the unit pulse number through the control of impulse width.

Description

【発明の詳細な説明】 本発明は、イオンビーム、電子ビーム、プラズマビーム
、レーザービーム等のビームを加工部に照射して掘削加
工、溶接、エツチング、ブレーティング、熱処理等の加
工を行うビーム加工装置の改良に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to beam processing in which a processing part is irradiated with a beam such as an ion beam, an electron beam, a plasma beam, a laser beam, etc. to perform processing such as drilling, welding, etching, brating, heat treatment, etc. Concerning improvements to equipment.

従来ビームを発生する1電■、例えば電子、イオンを加
速する加速電源には定状直流高電圧を利用しているが、
この場合加工韮ネルギが充分精密に制御できない。また
レーザに於てコンデンサに貯えたエネルギを放電管に放
電してレーザ発振さぜることは知られ(いる。しかしこ
のコデンサの放電を目的に合せて任意に制御するという
わけにはいかない。ビーム加−[に於て加−r性能、特
に精密な加工を打うIこめにはビームの制御が極めて重
要であるが、従来は何れのものも充分な制御ができなか
った。
Conventionally, a constant DC high voltage is used for the acceleration power source that generates the beam, such as electrons and ions.
In this case, processing energy cannot be controlled with sufficient precision. It is also known that in a laser, the energy stored in a capacitor is discharged into a discharge tube to cause laser oscillation.However, it is not possible to arbitrarily control the discharge of this condenser to suit the purpose.Beam Beam control is extremely important for machining performance, especially for precision machining, but in the past it has not been possible to adequately control either of these.

本発明は電源に単位パルスのパルス数を制御するパルス
電源を設けたことを特徴とづるものである。
The present invention is characterized in that the power source is provided with a pulse power source that controls the number of unit pulses.

以ド図面の一実施例により本発明を説明すると、第1図
に於て、第1は陰極を構成するフィラメントで、2が加
熱用電源、3は電子放射を制御するウェーネルト電極、
4,5は電子加速用電極で、この間に静電レンズ用電極
6が設けられている。
The present invention will now be described with reference to an embodiment of the drawings. In FIG. 1, 1 is a filament constituting a cathode, 2 is a heating power source, 3 is a Wehnelt electrode for controlling electron emission,
4 and 5 are electrodes for electron acceleration, and an electrode 6 for an electrostatic lens is provided between these electrodes.

7はビーム集束用電磁レンズで、集束したビームスポッ
トを被加工体13に与えて加工する。8はパルス変圧器
で、変圧出力を整流器9で整流して加速電極に印加する
。10は直流電源、11は直流をスイッチングしてパル
スを発生するスイッチ素子。
Reference numeral 7 denotes a beam focusing electromagnetic lens, which applies a focused beam spot to the workpiece 13 for processing. 8 is a pulse transformer, and the transformer output is rectified by a rectifier 9 and applied to the accelerating electrode. 10 is a DC power supply, and 11 is a switching element that switches DC to generate pulses.

12が制御パルスを発生するパルス発生回路である。12 is a pulse generation circuit that generates control pulses.

陰極フィラメント1の加熱により陰極から放射する電子
ビームはウェーネルト3のスリットを通り電極4.5.
6の加速集束作用を受け、被加工体13の加工部に焦点
を結ぶ、勿論このビーム照射の雰囲気は真空ポンプによ
って高真空に排気されている。被加工体13は加速電子
ビームによって溶解、蒸発等して加工されるが、微細精
密加工に於て照射ビームのエネルギ制御が重要になって
くる。
The electron beam emitted from the cathode by heating the cathode filament 1 passes through the slits of Wehnelt 3 and passes through the electrodes 4.5.
The atmosphere of this beam irradiation is, of course, evacuated to a high vacuum by a vacuum pump. The workpiece 13 is processed by melting, evaporating, etc. with an accelerated electron beam, and controlling the energy of the irradiation beam becomes important in fine precision processing.

エネルギ制御はパルス電源のパルス数の制御によって行
う。
Energy control is performed by controlling the number of pulses of the pulsed power source.

パルス発生回路12の詳細は第2図の通りで、121が
単位パルス列を発生する発振回路、122が継続するパ
ルス数を制御するパルス発生用の発振回路で、両者の出
力をAND回路123により結合することによって所定
のパルス数が継続するパルスを出力し増巾器124で増
巾してスイッチ11を制御する。発振回路121は一定
のパルス巾と休止中を有するパルスを発生し続けるので
、このパルス数によってエネルギ制御がデジタルに精密
に制御て、きる3、即りR振開回路121出力パルスと
発振回路122の出ツノパルスとはA N l’)回路
 123によってノ′ント結a4るので・、発振回路1
22の出力のAンパルス時間jごGj l 情パルスか
出カケることになり、Aンバルス中の制御によ・〕(単
位パルス数を容易に制御づる(−とができる。
The details of the pulse generation circuit 12 are shown in FIG. 2. 121 is an oscillation circuit that generates a unit pulse train, 122 is an oscillation circuit for pulse generation that controls the number of continuous pulses, and the outputs of both are combined by an AND circuit 123. By doing so, a pulse that continues for a predetermined number of pulses is outputted, amplified by the amplifier 124, and the switch 11 is controlled. Since the oscillation circuit 121 continues to generate pulses with a constant pulse width and pauses, the energy can be precisely controlled digitally depending on the number of pulses. The output horn pulse is A N l') circuit 123, which connects the note a4, so the oscillation circuit 1
The A pulse time j of the output of 22 is output, and the number of unit pulses can be easily controlled by the control during the A pulse.

よl、甲(&パルス列が中断づる時間+i+も発振回路
122の出力オノパルス時間により容易に精密に制御す
ることかCき、これによりスイッチ11′Aン。
The time +i+ during which the pulse train is interrupted can be easily and precisely controlled by the output pulse time of the oscillation circuit 122, thereby turning on the switch 11'A.

A]し弯If器8で・昇圧して加速電極に加えるエネル
1が容易にM密に制御でさ、ビーへJネルギの制御か(
さ、照射加Iの精密制御ができるものである。
A] The energy 1 that is boosted and applied to the accelerating electrode can be easily and precisely controlled by the If device 8, and the energy 1 for B can be controlled (
This allows precise control of irradiation I.

L、/、が)(この本発明!4 N G;よれば、加り
部照射Jネル−1″−の制御が任意に精密に制御できる
ので、細削加1.溶接、[ツチング、ブレーJインク。
According to the present invention! 4 N G;, the control of the irradiated J-flange J-1" can be arbitrarily and precisely controlled, so that fine cutting 1. Welding, [touching, braking] J ink.

熱処理等の加1を[」的に対しく常に11−確に什1げ
る(丁とが(さる。
Additions such as heat treatment, etc., to the target are always 11 - exactly 1 tithe.

尚前記パルス発9回路12は発振回路121の発9パル
スを/Jウンタで計数して所定数に達する毎に単イ)“
lパルス列を中断させるようにしても単位パルスのパル
ス数の制御が任意にでき精密な制御がて・きる。また単
位パルスを発生する発振回路121の発振作動を所定時
間もしくはパルス発生毎に中断制御するようにしてもよ
く、その他パルス発生回路12は任意のものが利用でき
る。
The pulse generator 9 circuit 12 counts the 9 pulses generated by the oscillator circuit 121 with a /J counter, and each time it reaches a predetermined number, it counts the 9 pulses generated by the oscillation circuit 121 and outputs a single a).
Even if the pulse train is interrupted, the number of unit pulses can be controlled arbitrarily and precise control can be achieved. Further, the oscillation operation of the oscillation circuit 121 that generates a unit pulse may be controlled to be interrupted at a predetermined time or every time a pulse is generated, and any other arbitrary circuit can be used as the pulse generation circuit 12.

また本発明は前記パルス電源を設けることによって電子
ビーム、イオンビームに限らず、プラズマ、レーリ“−
等のビームの制御も容易にでき、これらによるビーム加
工が正確に高性能に行える効果を秦づる1゜
Furthermore, by providing the pulse power source, the present invention can be used not only for electron beams and ion beams, but also for plasma, Rayleigh, etc.
It is easy to control beams such as

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明装置の一実施例構成図、第2図はぞの一
部分の詳細図である。 ]・・・・・・・・・フィラメント 2・・・・・・・・・つ1−ネルト 4.5.6・・・・・・・・・電極 8・・・・・・・・・変圧器 9・・・・・・・・・整流器 10・・・・・・・・・直流電源 11・・・・・・・・・スイツチ 12・・・・・・・・・パルス発生回路13・・・・・
・・・・液加1体 特  許  出  願  人 株式会社井1シトパックス研究所 代表省 井 1−   潔
FIG. 1 is a block diagram of one embodiment of the apparatus of the present invention, and FIG. 2 is a detailed diagram of a portion thereof. ]......Filament 2...1-Nelt 4.5.6...Electrode 8... Transformer 9...... Rectifier 10... DC power supply 11... Switch 12... Pulse generating circuit 13・・・・・・
...liquid-addition-one-unit patent filed by Kiyoshi I1, representative of Citopax Research Institute, I1 Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 加工部分に高エネルギビームを[射して加工するビーム
加工装置に於て、前記畠エネルギビームを発生する主電
源に単位パルスのパルス数を制御するパルス電源を設け
たことを特徴とするビーム加工装置。
A beam processing device for processing a workpiece by irradiating a high-energy beam thereon, characterized in that the main power supply for generating the Hatake energy beam is provided with a pulse power supply for controlling the number of pulses per unit pulse. Device.
JP57071822A 1982-04-28 1982-04-28 Beam processing device Granted JPS58188043A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57071822A JPS58188043A (en) 1982-04-28 1982-04-28 Beam processing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57071822A JPS58188043A (en) 1982-04-28 1982-04-28 Beam processing device

Publications (2)

Publication Number Publication Date
JPS58188043A true JPS58188043A (en) 1983-11-02
JPH0447422B2 JPH0447422B2 (en) 1992-08-03

Family

ID=13471626

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57071822A Granted JPS58188043A (en) 1982-04-28 1982-04-28 Beam processing device

Country Status (1)

Country Link
JP (1) JPS58188043A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006244871A (en) * 2005-03-03 2006-09-14 Fujitsu Ltd Method for depositing particles, electron emission device and transistor

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7339222B2 (en) 2020-09-03 2023-09-05 株式会社神戸製鋼所 Pig iron manufacturing method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5728686A (en) * 1980-07-28 1982-02-16 Daihen Corp Working apparatus by charged particle beam

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5728686A (en) * 1980-07-28 1982-02-16 Daihen Corp Working apparatus by charged particle beam

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006244871A (en) * 2005-03-03 2006-09-14 Fujitsu Ltd Method for depositing particles, electron emission device and transistor

Also Published As

Publication number Publication date
JPH0447422B2 (en) 1992-08-03

Similar Documents

Publication Publication Date Title
US2267714A (en) Device for producing filters
US7706506B1 (en) X-ray system for irradiating material used in transfusions
US3371190A (en) Apparatus and method for perforating sheet plastic by means of an electron beam
US4393295A (en) Apparatus and method for engraving with an electron beam
US3875366A (en) Method and apparatus for regulating the beam current in industrial charge carrier beam apparatus
US5335258A (en) Submicrosecond, synchronizable x-ray source
JPS58188043A (en) Beam processing device
US4551606A (en) Beamed energy radiation control method and apparatus
JPH08155670A (en) Laser beam machine and its machining method
JP5813536B2 (en) Ion source
US5097178A (en) RF electron gun with cathode activating device
JPS58147B2 (en) X-ray generator
JP2637948B2 (en) Beam plasma type ion gun
JP2621369B2 (en) Electron beam processing equipment
JP3397390B2 (en) Processing method using focused ion beam
JPH0223973B2 (en)
JP2006142315A (en) Energy beam machining device and energy beam machining method
EP0127706A1 (en) Beamed energy radiation control method and apparatus, and processes and equipment comprising said method and apparatus respectively
JPS59191250A (en) Radioactive ray generation device
JPH06176723A (en) Electron beam generating device
JP2002323598A (en) X-ray focusing method and apparatus by laser induced plasma
JP2544236B2 (en) Multi-charged ion generation method
JPH03261057A (en) Charged particle beam device
JPH03167742A (en) Protection of beam limiting at the time of generation of electron pulse beam
JP2637947B2 (en) Beam plasma type ion gun