JPS5824797Y2 - テスタ接続装置 - Google Patents

テスタ接続装置

Info

Publication number
JPS5824797Y2
JPS5824797Y2 JP12478U JP12478U JPS5824797Y2 JP S5824797 Y2 JPS5824797 Y2 JP S5824797Y2 JP 12478 U JP12478 U JP 12478U JP 12478 U JP12478 U JP 12478U JP S5824797 Y2 JPS5824797 Y2 JP S5824797Y2
Authority
JP
Japan
Prior art keywords
tester
pair
characteristic
signal lines
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP12478U
Other languages
English (en)
Japanese (ja)
Other versions
JPS54104870U (2
Inventor
亮三 吉野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP12478U priority Critical patent/JPS5824797Y2/ja
Publication of JPS54104870U publication Critical patent/JPS54104870U/ja
Application granted granted Critical
Publication of JPS5824797Y2 publication Critical patent/JPS5824797Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
JP12478U 1978-01-06 1978-01-06 テスタ接続装置 Expired JPS5824797Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12478U JPS5824797Y2 (ja) 1978-01-06 1978-01-06 テスタ接続装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12478U JPS5824797Y2 (ja) 1978-01-06 1978-01-06 テスタ接続装置

Publications (2)

Publication Number Publication Date
JPS54104870U JPS54104870U (2) 1979-07-24
JPS5824797Y2 true JPS5824797Y2 (ja) 1983-05-27

Family

ID=28801075

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12478U Expired JPS5824797Y2 (ja) 1978-01-06 1978-01-06 テスタ接続装置

Country Status (1)

Country Link
JP (1) JPS5824797Y2 (2)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57113377A (en) * 1981-01-07 1982-07-14 Hitachi Ltd Semiconductor testing device

Also Published As

Publication number Publication date
JPS54104870U (2) 1979-07-24

Similar Documents

Publication Publication Date Title
US5680039A (en) Probe apparatus for use in both high and low frequency measurements
US4962359A (en) Dual directional bridge and balun used as reflectometer test set
JPS5824797Y2 (ja) テスタ接続装置
JPH0712940Y2 (ja) Ｉｃ試験装置
JPH0637347Y2 (ja) Ｉｃ試験用スキャナ
JPS635013Y2 (2)
JPH0134847Y2 (2)
JPH095461A (ja) 測定用信号の伝播遅延時間測定回路
JPS59119276A (ja) 絶縁抵抗測定装置
JPH0524666B2 (2)
JP2001308277A (ja) 半導体装置
JP2502931Y2 (ja) テストプラグ
JPS6319815Y2 (2)
JPH03270248A (ja) Ｉｃパッケージの特性評価治具
JPS6318933Y2 (2)
JPS63279179A (ja) 集積回路装置の測定用ソケット
JPS60185274U (ja) 配線試験装置
JPS6135701B2 (2)
JPH0545574U (ja) 三線式ケーブル試験器
JPH065321A (ja) Ｉｃクリップ
JPS5828360Y2 (ja) Ｉｃクリツプ
JPH0582769B2 (2)
JPS5893880U (ja) 試料選択装置
JPH0574897A (ja) 半導体デバイスの検査装置
JPH0426069B2 (2)