JPS5842920A - 記録装置 - Google Patents

記録装置

Info

Publication number
JPS5842920A
JPS5842920A JP57146307A JP14630782A JPS5842920A JP S5842920 A JPS5842920 A JP S5842920A JP 57146307 A JP57146307 A JP 57146307A JP 14630782 A JP14630782 A JP 14630782A JP S5842920 A JPS5842920 A JP S5842920A
Authority
JP
Japan
Prior art keywords
recording
record carrier
trace
recording device
record
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57146307A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0416723B2 (fr
Inventor
ダン・オ−スチン
ルツツ・イエ−ニツヒ
カ−ル−ハインツ・シユルツ
ペ−タ−・ク−ン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Digital Kienzle Computersysteme GmbH and Co KG
Original Assignee
Kienzle Apparate GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kienzle Apparate GmbH filed Critical Kienzle Apparate GmbH
Publication of JPS5842920A publication Critical patent/JPS5842920A/ja
Publication of JPH0416723B2 publication Critical patent/JPH0416723B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D15/00Component parts of recorders for measuring arrangements not specially adapted for a specific variable
    • G01D15/06Electric recording elements, e.g. electrolytic
    • G01D15/08Electric recording elements, e.g. electrolytic for spark erosion
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D15/00Component parts of recorders for measuring arrangements not specially adapted for a specific variable
    • G01D15/10Heated recording elements acting on heatsensitive layers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D15/00Component parts of recorders for measuring arrangements not specially adapted for a specific variable
    • G01D15/34Recording surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Recording Measured Values (AREA)
  • Time Recorders, Dirve Recorders, Access Control (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Navigation (AREA)
JP57146307A 1981-08-26 1982-08-25 記録装置 Granted JPS5842920A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE31336663 1981-08-26
DE19813133666 DE3133666C2 (de) 1981-08-26 1981-08-26 Registrieranordnung

Publications (2)

Publication Number Publication Date
JPS5842920A true JPS5842920A (ja) 1983-03-12
JPH0416723B2 JPH0416723B2 (fr) 1992-03-25

Family

ID=6140115

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57146307A Granted JPS5842920A (ja) 1981-08-26 1982-08-25 記録装置

Country Status (4)

Country Link
JP (1) JPS5842920A (fr)
DE (1) DE3133666C2 (fr)
FR (1) FR2512200A1 (fr)
GB (1) GB2105039B (fr)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1120717B (de) * 1956-04-26 1961-12-28 Siemens Ag Schreibstift zum Erzeugen von Schreibspuren durch Einwirkung eines elektrischen Potentials auf metallisierte Aufzeichnungstraeger
DE1095531B (de) * 1958-07-04 1960-12-22 Kienzle Apparate Gmbh Diagrammpapier
US3035267A (en) * 1958-07-04 1962-05-15 Kienzle Apparate Gmbh Recording apparatus
DE2246436A1 (de) * 1972-09-21 1974-04-11 Licentia Gmbh Elektrische schreibvorrichtung
DE2455672A1 (de) * 1974-11-25 1976-07-08 Renker Gmbh Kontrollelement
DE2630070C2 (de) * 1976-07-03 1984-02-16 Kienzle Apparate Gmbh, 7730 Villingen-Schwenningen Registriergerät, in welchem der Registriervorgang durch Ausbrennen einer metallischen Registrierschicht erfolgt
DE2645485C3 (de) * 1976-10-08 1979-10-31 Robert Bosch Gmbh, 7000 Stuttgart Aufzeichnungsträger für Registrierzwecke in elektrosensitiven Registriergeräten
GB2014089B (en) * 1977-11-21 1982-02-03 Wiggins Teape Group Ltd Method of and apparatus for writing on material

Also Published As

Publication number Publication date
FR2512200B1 (fr) 1985-01-11
JPH0416723B2 (fr) 1992-03-25
GB2105039B (en) 1985-08-07
DE3133666C2 (de) 1994-05-11
DE3133666A1 (de) 1983-03-17
FR2512200A1 (fr) 1983-03-04
GB2105039A (en) 1983-03-16

Similar Documents

Publication Publication Date Title
EP0209140B1 (fr) Méthode de mesure d'une infime hauteur de vol d'un objet et appareil à disque magnétique
ATE473506T1 (de) Otpische platte, aufzeichnungsvorrichtung und verfahren für optische platte und verfahren zu ihrer reproduktion
ATE189077T1 (de) Optische platte mit metallischer reflektionsschicht
JPS5842920A (ja) 記録装置
US5715060A (en) Apparatus and method for measuring linear nanometric distances using evanescent radiation
KR960042568A (ko) 광학 데이타 기록의 동시 검증을 위한 시스템과 방법, 및 광학 데이타 기록 매체
JPS595447A (ja) 消去可能な光記録媒体
JPS5625243A (en) Optical memory medium
EP0395374A1 (fr) Echelle métrologique optique
JPS57212640A (en) Optical information recording medium
JPS6417234A (en) Optical information recording method and information recording medium
JPS60129945A (ja) 光情報記録媒体
JPH05303769A (ja) 光ディスク
JPS57150149A (en) Optical recording medium
JP2820253B2 (ja) 磁気ディスク基板及びその製造方法
JPS6350707A (ja) 磁気ヘツドスライダ−の浮上量測定方法
JPS58172503A (ja) 膜厚測定装置
JPH0529244B2 (fr)
KR100238081B1 (ko) 상변화 기록막의 결정화시간 측정방법
JP3536579B2 (ja) 遮光マーク,フィルム,光ディスク
JPS60105905A (ja) 光デイスク評価装置
EP1471509A3 (fr) Support d'enregistrement, dispositif d'enregistrementd'informations et dispositif de reproduction d'informations
JPS59165243A (ja) 磁気デイスク
JPS63140936A (ja) 塗膜の表面硬度評価方法及び評価装置
JPH06251422A (ja) 光ディスク