JPS584456A - Failure analysis system for wiring system of material to be tested - Google Patents

Abstract

PURPOSE:To easily analyze a system failure, by collecting a related error data of mainly a noted test wiring system with a wiring test device and collating the data with a wiring sequential data for failure analysis with a central processor. CONSTITUTION:Analysis of failures such as open wire and short-circuit of wiring systems L1-Ln wired between terminal pins of a material to be tested is processed by using a computer. In this case, a wiring test device 2 is connected to a device 1 to be tested, each terminal pin of the device 1 is sequentially scanned to obtain a section data of each obtained pin. A test program data for continuity test corresponding to the normal order of wiring stored in a file deice 5 is compared with said section data and related error data are collected in a file 6. The location of failures and the types are analyzed by collating said related error data with the failure analysis wiring sequence data stored in a storage device 9 at a processor and the result is displayed.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a wiring system failure analysis method for analyzing failures such as disconnections and short circuits in a wiring system wired between terminal pins of a test object such as a circuit board in an electronic exchange. In particular, it allows failure analysis to be processed using a computer.

Conventionally, when conducting a continuity test on a test object, when performing a failure analysis of a wiring series that is wired in a predetermined pattern between each terminal pin, a wiring test device is used to connect each terminal pin to the first pin and the other pins. Scan all the bins, the 211th bin, and all other bins, and compare the section data of each terminal bin with the continuity test test program data to obtain the test results. , the cloth series OW@ obtained from this test F result can be directly determined by simply saying that there is a problem in the cloth series. I can't come.

Therefore, when performing this type of handicap writing scale analysis, the worker must refer to the nine printed lines written on the paper and check the handicapped writing cloth.
Check all the bottles in the series using a buzzer checker, for example, and use this to find any areas where the bottle is missing.

However, since this method of solving handicapped books involves manual labor and judgment, there is a risk of zero-scale analysis of the faulty parts, and the work is complicated and requires a lot of manpower. There were some drawbacks, such as the need for

The actual problem is to solve the conventional problem as mentioned above, and the purpose is to use a computer to analyze the effects of the cloth lineage of the test object, thereby changing human judgment. To provide a 0-fabric-sequence failure analysis method for a tested object, which enables instructions for determining faulty parts with little need, and also enables even beginners to easily point out defective parts of the tested object.

The fabric line analysis method according to the present invention scans each terminal bin to which a test object is wired (using a fabric testing device), and uses the obtained section data of each bin and the normal Continuity test test program data corresponding to the wiring order data and all the error data that reaches this Kll are recorded centering on the test fabric series that is being focused on, and the related error data and the fault that occurred are recorded. It is possible to analyze the parts of the series' records, such as cuts and blanks, by comparing it with the wiring order data for the series's fault analysis using the central AM system.

Embodiments of the present invention will be described below with reference to the drawings.

No. iml shows a functional block diagram of a fabric-sequence failure analysis method for a conductive test object according to the present invention. At the same time, 1 is a conductivity test object which is wired between terminal pins at a predetermined distance, and 2 is a widened test device]. Many onion bins arranged in one row square ■,■,・
. . , and by wiring between these arbitrary WLO bins outside the predetermined O layer, a fabric series Lie b- is formed.

In this way, the fabric-testing device 8-
■Each bottle through the apme etc. not shown.

■, - and each one is made up of an electric KII gun (shi), and each bottle ■, ■, - is the 1! - From the book name to all the bottles in the bottle ■ and all the bottles in the work, as in the cloth - test device 2) It's about to come out.

9. The above *line test II is connected to the test strip for continuity testing via the pass line 3.
and test end terminal bin data is filled 7 times to erase duplicate data, unnecessary data, and IO.
Furthermore, the fabric test device 2 is connected to the serial test results (error data) obtained by comparing each bin at-chi-dime obtained from this with the test strip for continuity testing via the bus twin controller. Nine series of error data are now filed in ktlkfl@], and the file device 6 records all 0 error data centered on one test cloth series. The station processing unit is the central processing unit (hereinafter referred to as CP machine) 7 which is stored in the pre-distribution line testing device 2, Tess F Bougraph data storage device 4jlP, and file device S. Kt
I'm here.

First, the output of the related error data file device 6 is the first analysis of the social error report. 4) on the input side of the failure analysis device 8;
A large storage device 9 is connected to a large storage device 9 that stores a test program for failure analysis in order data K1m, and a file device 6 is connected to the related error data and storage device. Day! (Analysis data) is analyzed on the I&III device 8 to analyze the defective location and type of defect in the series of interest that is causing the error, and the analysis results are displayed on the display device IO. ing.

Next, the operation of the handshake seismic analysis of the present invention configured as described above will be explained.

First, the cloth series ζ for the bottle of test object 1.

The patterns of L and PL are wired as shown in Figure 2, and the lines connecting the convergent lines are the regular wiring series for the test object IK. This means that the line that has been connected is disconnected, the ``double-'' means that the wiring is different, and the ``K11-'' means that the line is shorted. 9. The above-mentioned continuity test pot fabric series L□, L,,I,.

The test program data IO mode for continuity testing is as shown in Table 10 below, and is stored in the test program data storage device 4.

Table-I At the time of the prayer of the test subject 1 including the above error part, the company, the test subject 1 was placed on the right front test device! -ky), then operate the fabric testing device 2 to test each bottle as follows: bottle ■, bottle ■, bottle ■, bottle ■... and so on for one bottle! ll Scan to see if there is continuity between the scissor bottle and other bottles.

Scanning operation #c Enlarged bin (2) The scanning operation #c is also performed uniformly for the following items, and is performed for all bins. Once we meet, the end of the test is recorded in the bin section data company file device 4, and the end of the test is recorded in the section data of the terminal bin. It's like K. This improves the processing speed of line terminal pin data and reduces the amount of data memory! This is my second time.

In this way, the order is retrieved and stored in the storage device 4.
It is compared with the continuity test test program data from L1. O test program data (0001
, 0002, 0003) Extract error data obtained from series test results according to K. This error recorder 1 is operated by the wired test device 2, the storage device 4, and the CPU 7. The error data based on the test results is as follows.

100010■−■−■−t+−o−eφ U■
1010+[F]+・・OOO2U[Yes]−■ @OO03w(171+・ In other words, in the case of 9 when performing the series test of cloth-series L1 with Bin ■ as the representative bottle, Bin ■, Bin ■, ■ As a result, during the series test (this ○ type and + odd test was performed, it was confirmed that the -r-k "・The error data to be applied to
This is interpreted as an error during series testing.
be done.

In this ζ, "-1" indicates that the voltage of the bottle ■ is not conductive to the representative bin ■. However, the above error data is the correct series (0001) tJ representative bin @ of the bin, ■
, ■, 0.0 is insufficient, and! It is related to Therefore, what is the relationship between the above missing bins? Have the missing bin in (・oooi) as the representative bin! ! Extract the Kojiko Etsudeday from the unanalyzed error data. At this time, the O error data is ■ 10 ■ 10 + 10 and &jl, which is the series L1Kj
Recorded as error data. Here, the mark ``su'' placed in front of the error data represents an empty terminal test and that the bottle ■ has been tested once as a representative, and 9 and ``10'' indicate that each bin is connected. It represents one thing.

Thereafter, the same process as above is performed even if there are missing pins ■, @-KsI-, but in this case, the missing pins 0, ■, ■
, O is the distribution show, and even if the error group I is taken out with this as the representative bin, the result will be the same as the one with bin ■ as the representative bin, so it is necessary to collect the error data. Good.

t, Cloth series Ryo KTh! Test the sled series test using bin e, the youngest book name in the l scissors series, as a representative bin! (If you decide based on Goo, rounding is done so that the bin 0 is conductive and the bin [phase] and [stock] are non-conductive, and the error data company-000 is based on the series test results.)
2LJ [Co., Ltd.] - and 1), this is collected as error data for the series. At this time, the correct series (0
0G is the 0 representative bin, but the bin becomes the missing bin,
Since this bin has become an empty terminal due to the disconnection IIK, rounding is performed, and even if an empty terminal test is performed using the missing bin in the above 0002LJ[phase]- as a representative bin, no empty terminal error data will be obtained. In other words, if it is simply determined as an empty terminal, it becomes 1.

Furthermore, in the cloth series L5, test the series Tess F using the lowest numbered bin O of the stroke number series as the representative bin! (000B), both bottle O and bottle .
03LJO+), the error data will be collected as a series of error data.

As mentioned above, each series of error data collected as above is filed in the cheetah file device 6, and the error data associated with the error data is stored in the cheetah file device 6, and this file contains nine series of error data as test program data for failure analysis. Processing 11m18 along with the wiring order data from the storage device 9
By introducing a multi-series fault l- and its fault location, the judgment results are displayed on the display device 10. The test results and judgment results are shown in Tables - Table 3 - Table 8 - WK.

Table-1 (0001 series) Table-1 (000m series) Table-W (000m series) In the above Tables-Seal to Table-W, cloth 1 order data 101 [I
According to Kle, the arrangement of the nine terminal bin numbers is correct for each wired series L.
xeL2eLs Along K, from bin ■ to O, from bin O [
Stock], from bottle O to ■ are expressed in single silver letters, and the ○ mark indicates continuity, and the x mark indicates non-continuity (broken line). Therefore, as is clear from these tables, if you look at the determination results displayed on the display device 10, you can tell which bin section of each fabric series in the test object IK is broken or has a spot. Judging by Yong JIK's judgment, it is 0.

′ & shi, in the above example, the th! Cloth with pattern shown in IIK-
Regarding the series O disorder book scale analysis, the actual fact is that such pattern series method 640KIIR is not used, but cloth
The wiring configuration between the terminals is not limited to a single type, and may be a pair wire, a triple wire, or a printed wiring. te, the error data IO judgment result is 11II (displayed data is failure location 9)
Of course, it is possible to include the wiring type 08lIII, etc., without limiting the chain.

As described above, according to the present report, from the interval data of each bin of the test object detected by the wiring test device) and the test program data for continuity testing corresponding to the original cloth order data, Collect all error data related to the focused test fabric series, and use the related error data and the fabric order data for troubleshooting analysis of the series in which the failure is occurring to the central sense 1111tK. Yo) Collation #! Since it is possible to analyze the sequential fault location and its 01m11, etc. by using the process of In addition to eliminating judgment errors, it also allows even beginners with no skill to easily test the continuity of the test object, and has the advantage of significantly shortening the continuity test work.

[Brief explanation of drawings]

FIG. 1 is a functional block diagram showing an example of a fabric line failure analysis method according to the present invention, and FIG. 2 is an explanatory diagram showing an example of a wiring line pattern of a test object applied to the failure analysis of the present invention. . DESCRIPTION OF SYMBOLS 1... Test object, 2... Wiring test device, 3... Pass line, 4... Storage device for test program data for continuity testing, 5... File device for confirming test end terminal, 6...Related error data file device, 7...
CPU, 8... Failure analysis processing device, 9... Storage device for test program data for failure analysis, 10... Display device. Patent applicant: Fujitsu Limited

Claims (2)

[Claims] (1) A wired test device that detects the section data of each terminal pin by scanning each terminal pin of the test object in which a wired series is formed, and a test strip for continuity testing that corresponds to the normal order. and a storage device for storing the previous I! From the 6-section data from the cloth wiping test device and the test program data for O continuity testing from the □ storage device, it was detected that there were 5 identical wiring lines in the mass series! (Hereafter referred to as “Related Error Day!”)
``The means to collect the data, and the related error data from the said means and the 80th camp disaster scale prayer cloth m* order data that is causing the failure, and the series of campbooks known as the stones. A method for analyzing cloth-type lines of a test object, comprising means for analyzing the material. (2) Note! Error day to raise (by series test of I bird-series)! Take it out and Mukuro Error Day! Claim 1: A series of empty terminal error data is extracted using the zero-defective bin or excess bin as a representative bin, and these error data are collected as related error data of the wiring series of interest.
Wiring sequence failure analysis method for the test object described in Section 2.