JPS5890122A - Inferring system for in-plant trouble cause - Google Patents

Inferring system for in-plant trouble cause

Info

Publication number
JPS5890122A
JPS5890122A JP18787881A JP18787881A JPS5890122A JP S5890122 A JPS5890122 A JP S5890122A JP 18787881 A JP18787881 A JP 18787881A JP 18787881 A JP18787881 A JP 18787881A JP S5890122 A JPS5890122 A JP S5890122A
Authority
JP
Japan
Prior art keywords
failure
source
devices
plant
estimated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18787881A
Other languages
Japanese (ja)
Inventor
Masazumi Furukawa
古河 雅澄
Satoshi Miyazaki
聡 宮崎
Sadanori Shintani
新谷 定則
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP18787881A priority Critical patent/JPS5890122A/en
Publication of JPS5890122A publication Critical patent/JPS5890122A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00Measuring or testing not otherwise provided for

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は、原子カプラント、化学プラント、上下水道プ
ラントなど複数個の機器から構成される系において、単
一故障(故障源が1個)が発生した場合、故障源となっ
ている機器を、限られた数のセンサの情報から推定する
プラントの故障源推定方式に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides a method for identifying the source of failure when a single failure (one failure source) occurs in a system consisting of a plurality of devices such as an atomic couplant, a chemical plant, and a water and sewage plant. This invention relates to a method for estimating the source of a plant failure from information from a limited number of sensors.

プラントの機器の故障を調べる故障診断方式とし、従来
から種々の方式が知られているが、これらの方式では、 (1)センサは故障源となる機器に設置できること全前
提にしている、 (2)圧力、流量などの状態量と異常現象(故障源)と
の因果関係、たとえば圧力が低く、流量が少なくなった
場合は、配管のK(裂という関係を前もって作成してお
き、センサがら得られる現在の圧力、流量などの値と比
較することによって異常を診断する、 という特徴があった。そのため、(1)の前提では、現
存するセンサの種類から診断できる異常現象は少数に限
定される、(2)では、大規模・複雑なプラントを対象
とする場合には因果関係の作成が困!trillである
という欠点があった。
Various methods have been known to date as a fault diagnosis method for investigating failures in plant equipment, but these methods (1) are based on the assumption that the sensor can be installed on the equipment that is the source of the failure; (2) ) A causal relationship between state quantities such as pressure and flow rate and an abnormal phenomenon (failure source). For example, if the pressure is low and the flow rate is low, create the relationship K (crack) in the piping in advance and check the relationship between the sensor and the abnormal phenomenon (failure source). The characteristic is that abnormalities are diagnosed by comparing them with the current values of pressure, flow rate, etc., which are currently available.Therefore, under the assumption (1), the abnormal phenomena that can be diagnosed based on the types of existing sensors are limited to a small number. , (2) has the disadvantage that it is difficult to create causal relationships when dealing with large-scale and complex plants.

本発明の目的は、上記従来技術の間:61点を解決する
ために、限られた設置数のセンサの情報から、大規模・
抜雑なプラントにおいても、真の故障源を的確に推定し
、烙らに故障源である可能性の順序づけを行なうことが
できる故障源推定方式全提供することにある。
The purpose of the present invention is to solve the problems of the above-mentioned prior art by using information from a limited number of installed sensors.
The object of the present invention is to provide a complete fault source estimation method that can accurately estimate the true fault source even in a shoddy plant and efficiently order the possibilities of the fault source.

°このような目的′!f−達成するために、本発明は、
複数個の機器からなる系において、2機器間に直接的な
故障波及関係を与え、行列演算を行なうことによって、
全機器間での直接的・間接的な波及関係を求め、この波
及関係に、センサから得られる異常情報と正常情報を与
え、故障源全推定するようになっている。また、本発明
は、故障源と推定したものが複数個ある場合は、各機器
の故障率、2機器間の故1暉波及確率によって、複数個
の推定故障源の間に、故障源である可能性の高い順に優
先問をつけるようにするものである。
°Such a purpose’! f- To achieve, the present invention:
In a system consisting of multiple devices, by creating a direct fault propagation relationship between two devices and performing matrix operations,
Direct and indirect ripple relationships between all devices are determined, abnormal information and normal information obtained from sensors are applied to this ripple relationship, and all sources of failure are estimated. In addition, in the case where there are multiple estimated failure sources, the present invention can identify the failure source between the multiple estimated failure sources based on the failure rate of each device and the probability of failure spreading between two devices. This allows questions to be prioritized in order of likelihood.

1″J、ド、本究明の実Mli N全第1図〜第7図に
より訂惰用に、脱明する。
1''J, Do, This study's fruit Mli N All figures 1 to 7 are used for revision purposes.

第1図は本発明による故障源+ifl定方式全方式する
プラント系の一実施例のす177成を示すものである。
FIG. 1 shows the configuration of an embodiment of a plant system using the failure source + ifl determination method according to the present invention.

、11図において、プラント101は、複数個の構成機
器102と、その中のいくつかの機器の状態を検出する
ためのセンサ103とからなる。これらのセンサ103
は各+tit成機器102の動作状態、たとえば、流計
、温度、周波数などの信号104を検出し、検出信号1
05を各センサ103に対応した異常検知器106から
なる異常検知装置107に出力する。異常検知装置t1
07には、あらかじめ、各信号が正常か異常かを判定す
る基準信号が記憶されており、基準信号と検出信号10
5を比較し、各検出信号105が正常か異常かの信号1
08を故障源推定装置109に出力する。故障源推定装
置109では信号108と、初期データ入力装置110
から入力された故障波及方向、波及時間、波及確率、各
@器の故障率に対応した信号111とに基づいて、故障
源の推定と優先順位づけを行なって、その信号112を
表示装置113に出力する。
, 11, a plant 101 includes a plurality of component devices 102 and sensors 103 for detecting the status of some of the devices. These sensors 103
detects the operating status of each +tit component 102, such as a current meter, temperature, frequency, etc. signal 104, and detects the detection signal 1
05 is output to an abnormality detection device 107 consisting of an abnormality detector 106 corresponding to each sensor 103. Abnormality detection device t1
07 stores in advance a reference signal for determining whether each signal is normal or abnormal, and the reference signal and detection signal 10
Signal 1 indicates whether each detection signal 105 is normal or abnormal.
08 is output to the failure source estimation device 109. The failure source estimation device 109 uses the signal 108 and the initial data input device 110.
Based on the failure propagation direction, propagation time, propagation probability, and the signal 111 corresponding to the failure rate of each device inputted from the Output.

なお、初期データは一度入力しておけば、データの変更
を行なわない限り、再入力の必要はない。
Note that once the initial data is input, there is no need to input it again unless the data is changed.

第2図は、第1図の故障源推定装置f 109での処J
ulの(At、れの−例を示すフローチャートである。
Figure 2 shows the processing in the failure source estimating device f109 in Figure 1.
It is a flowchart which shows an example of (At, re) of ul.

第:3図は、2系統からなるIJPG(しquifie
dpetroleum Qas )プラントのポンプ設
備ノー例における機器名、系統名金示した系統図である
Figure 3 shows IJPG (Squifie) consisting of two systems.
dpetroleum Qas) is a system diagram showing equipment names and system names in an example of pump equipment of a plant.

第3図のように、ポンプ設備のfl(を成機器は、]、
 P G主管1.18,19、スルース弁2,5゜10
 、 13、LI’Gポンプ3,11、電源4゜12、
流粧トランスミツタロ、14、流&を指示調節計7.1
5、エアモータハンドル付弁8 、16、空気作切弁9
,17である。
As shown in Figure 3, the fl of the pump equipment is
PG main pipe 1.18, 19, sluice valve 2.5゜10
, 13, LI'G pump 3, 11, power supply 4゜12,
Flow Transmitter Mitsutaro, 14, flow & indicator controller 7.1
5, Valve with air motor handle 8, 16, Air operated cutoff valve 9
, 17.

このような複数個の礪2:号において、2機器間で故障
が直接波及する場合には、波及方向と波及時間を与え、
この関f、%’に第4図に示すように行列表現する。こ
の行列*A=[a++:]、  ’ l J = 11
2+・・・、21とすると、たとえば、行列Aの1行2
列目の100は、機器1から機器2へ故障の影響が直接
波及し、その時間が100秒であることを示すことにな
る。空白部分は直接波及がないことを甘味し、演算上ば
Oとして扱う。−また、20と21はそれぞれダミー人
力節点、ダミー出力節点を表わし、演算の便宜上追加し
たものである。
In such cases, if a failure directly spreads between two devices, give the direction and time of the spread,
This function f,%' is expressed in a matrix as shown in FIG. This matrix *A=[a++:], ' l J = 11
2+..., 21, for example, 1st row 2 of matrix A
100 in the column indicates that the influence of the failure directly spreads from device 1 to device 2, and the time period is 100 seconds. Blank areas indicate that there is no direct influence, and are treated as O in calculations. - Also, 20 and 21 represent a dummy manual node and a dummy output node, respectively, and are added for convenience of calculation.

行列Aで表わされる機器間の故障波及関係をネットワー
ク状に書き直すと、第5図に示すようになる。図中、X
濁1””1121・・・、21は、各構成機器lに対応
しており、矢印上の数字は故障の影響が波及する時間を
示している。
When the fault propagation relationship between devices represented by matrix A is rewritten in a network form, it becomes as shown in FIG. In the diagram,
1121..., 21 correspond to each component 1, and the number above the arrow indicates the time during which the influence of the failure spreads.

上記行列Aは2機器間の直接的な故障波及関係(波及時
間と波及方向)を表わしている。以下では、故障源推定
の第1ステツプとして、故障の影響がある要素全経由し
て他の要素に波及するという間接的な波及関係も含んだ
形で波及方向のみ全表示する。これには、まず、以下の
演算を簡単にするため、行列Ak、要素の値が0または
1からなる行列Bに変換する。すなわち行列Aで、ある
値をもつ要素に対応した要素の値を1とし、他は0とす
る。この演算は第2図のブロック114で行なわれ、そ
の結果は第6図に示すようになる。
The above matrix A represents the direct failure propagation relationship (propagation time and propagation direction) between two devices. In the following, as the first step in estimating the fault source, only the propagation direction will be displayed in its entirety, including indirect propagation relationships in which the fault spreads to other elements via all the elements affected by the fault. To do this, first, in order to simplify the following calculations, the matrix Ak is converted into a matrix B whose elements have values of 0 or 1. That is, in matrix A, the value of an element corresponding to an element having a certain value is set to 1, and the other values are set to 0. This operation is performed in block 114 of FIG. 2, and the result is shown in FIG.

次にBに単位行列■を加え、(Il+I )j = (
B+I )J”となるまでべき乗演算し、第2図のブロ
ック115のように、故障波及経路全構成する。この結
果は第7図に示すようになり、この行列を可到達行列と
よびBとする。
Next, add the identity matrix ■ to B, and (Il+I)j = (
B+I)J", and all fault propagation paths are constructed as shown in block 115 of FIG. 2. The result is shown in FIG. 7, and this matrix is called the reachability matrix and B do.

行列■3の要素で1の値をもつものは、その行番号に対
応した故障要素から列番号に対応した故障要素へ最大j
−1個の故障要素を経由すれは故障の影響が必ず波及す
ることを示している。一方、0の値をもつものは、行i
′lT号に対応した要素から列番号に対応した要素へ故
障の影響が決して波及しないことを示している。
An element of matrix ■3 with a value of 1 is transferred from the faulty element corresponding to the row number to the faulty element corresponding to the column number up to j
-This shows that the influence of a failure will definitely spread through one failure element. On the other hand, those with a value of 0 are row i
This shows that the influence of a failure never spreads from the element corresponding to the column number 'lT to the element corresponding to the column number.

以下では、第2図のブロック116のように、信号10
8としての異常情報により、故障源を推定する方法につ
いて述べる。い址、第5図の口で囲んで示したように、
センサの設けられている機器全9.19,15.17と
し、異常信号を出している機器−i9,19、正常信号
を出している機器を15.17とする。
In the following, signal 10, as block 116 in FIG.
A method for estimating the source of failure using abnormality information as shown in Section 8 will be described. However, as shown in the box in Figure 5,
All the devices equipped with sensors are 9.19 and 15.17, and the devices emitting abnormal signals are i9 and 19, and the devices emitting normal signals are 15.17.

故障源全推定するには、異常が検知された、X、とX、
。に至る矢印金節にたどり、それぞれの経路にに・らる
共通の磯2ニーr全選定する。団体的な演舅の方法とし
ては、第7図でxoに対応する9列目とII9に対応す
る19列目を調べ、それぞれ共通に1の値ヲもつ行、す
なわち1,2,3,4゜20行に対応した、1,2,3
,4.20のいずれかが故障源と推定する。畑らにダミ
ー’116点である20を除くと、推定故障源は1,2
,3.4となる。
To estimate all the failure sources, the abnormality is detected, X, and
. Follow the arrows that lead to , and select all of the common rocky shores and knees that follow each route. As a method for group performance, examine the 9th column corresponding to xo and the 19th column corresponding to II9 in Figure 7, and find the rows that have a value of 1 in common, that is, 1, 2, 3, 4.゜1, 2, 3 corresponding to 20 lines
, 4.20 is presumed to be the source of the failure. Excluding 20, which is the 116 point of the dummy in Hata et al., the estimated failure sources are 1 and 2.
, 3.4.

次に、第2図のブロック117において、推定故障源の
中で推定数1傘源から除くべきものがあるか否かを、正
常1d号金出している機器15.17に基づいて以下の
方法でチェックする。チェック方法は、まず15.17
へ至る矢印全それぞれ逆にたどシ、上記の推定故障源と
共心となる機器1全求める。次に、機器1から異常機器
9に至る矢数個の経路について最短時間t?+−“ =
300に求める。同様に、1711〜 =400を求め
る。第3に、”冑ト”7’+”o  f!: k比軟L
、最大(D (fll ”°8tTIn=400を求め
る。maze、min、、故障mk x + トL*場
合に、故障発生後、少なくとも400秒は経過している
と考えられる時間を示す。第4に、機器1から正常機器
15に至る経路について最長時間t 、m〕1 =41
0を求める。同様に、’I’l”7=420を求める(
計算時間の短縮を図りたい場合は、計算が容易な最短時
間全求めることも可能であるが、この場合は、11.定
故障源のチェックが不十分になル’jfJ 合fr”j
b ル。)o iiJ’45K、’7’lxlト17”
l”7 (!: ’e比1咬シ、最小)埴m” t”、
”= 410= 、I+1m八 を求メる。ml 、 
tlllaKは、もしX、が酸11?S源であれば、遅
くとも410秒後には、X5wで異常が生じるというこ
とを示している。しかし、410秒後に必ず異常が生じ
るか否かは、XlからXII+までの故障波及確率が1
.0であるか否かに1ぺ存するため、次に波及確率から
の検N=J全行なう。すなわち、第6として、機器1か
ら15−まで故障の影響が波及する確率II J’をN
−13’Jする。II P (1,(lの場合は、故障
発生i、410秒経過してもX4で異常が生じない場合
もあるため、機器1を)イ1モ定故11?F源に含める
Next, in block 117 of FIG. 2, it is determined whether or not any of the estimated failure sources should be excluded from the estimated number 1 umbrella sources using the following method based on the equipment 15.17 that is operating normally. Check it out. To check, first check 15.17
Follow all the arrows in the opposite direction to find all the devices that are concentric with the above estimated failure source. Next, the shortest time t for several routes from device 1 to abnormal device 9? +-“=
Ask for 300. Similarly, calculate 1711~=400. Thirdly, “Kat” 7’+”of!: k ratio soft L
, Maximum (D (fll ”°8tTIn = 400 is determined. maze, min, , In the case of failure mk Then, the longest time t , m〕1 = 41 for the route from device 1 to normal device 15
Find 0. Similarly, find 'I'l'7=420 (
If you want to shorten the calculation time, it is possible to find the shortest total time that is easy to calculate, but in this case, 11. Insufficient checking of fixed failure sources.
b Le. )o iiJ'45K,'7'lxlto17"
l"7 (!: 'e ratio 1 bite, minimum) Hani m"t",
Find ``= 410= , I+1m8.ml ,
tllaK is, if X is acid 11? This indicates that if it is an S source, an abnormality will occur in X5w after 410 seconds at the latest. However, whether an abnormality will definitely occur after 410 seconds is determined by the failure propagation probability of 1 from Xl to XII+.
.. Since there is a difference between 0 and 0, next we perform all tests N=J from the propagation probability. That is, as the sixth factor, the probability II J' that the influence of the failure will spread from equipment 1 to equipment 15- is N
-13'J. II P (1, (In the case of l, failure occurrence i. Since there are cases where an abnormality does not occur in X4 even after 410 seconds, equipment 1) is included in the I1mo constant fault 11?F source.

、/7 p = 1.、0 (7)場合は、m” t7
1+ト”” 、″、axト金比i1RL、maw 1.
≧n□Ink、  なら、機器15で異常が生じるはず
であるのに正常値を示しているため、機器1は故障源で
はないと考え、機器1を1111足故障源か(9) ら1dfL、ra*x tT”< ml°t7X i 
ラ、m器15 テ異常が生じるか否かは、芒らに時間の
経過ktだねばならず、現時点で、故障源でないとは決
定できないから、機器1全推定故障源に含めるものとす
る。
, /7 p = 1. , 0 (7) If m” t7
1+t"",", axt gold ratio i1RL, maw 1.
If ≧n□Ink, then device 15 should have an abnormality, but it shows a normal value, so we consider that device 1 is not the source of the failure, and determine whether device 1 is the source of the 1111 failure (9) and 1dfL. ra*x tT"< ml°t7X i
Whether or not an abnormality occurs will depend on the passage of time, and it cannot be determined at this point that it is not the source of the failure, so it shall be included in the total estimated failure sources of equipment 1.

本芙施例でpHP= 1.0とすると、maxtr” 
−400(””tT” =410と7Thるから機器1
を推定故障源に含める。
In this example, if pHP = 1.0, maxtr”
-400 ("tT" = 410 and 7Th, so device 1
are included in the probable failure sources.

次に、第2図のブロック118において、推定故障源を
、各機器の故障率PIと機器間の故障波及確率P+ j
k用いて故障源である確からしさの優先度づけを以下の
方法で行なう。
Next, in block 118 of FIG. 2, the estimated failure source is calculated using the failure rate PI of each device and the probability of failure spread between devices P+ j
k is used to prioritize the probability of the failure source using the following method.

先ず、複数個の推定故障源の中から、最も下流側にある
要素X!  (=(機器3)を選ぶ。次に、X3以外の
推定故障源からX、に至る経路について、以下の頭金計
算し、機器3の酸1fit率P、も含めてそのii十n
:It自金上い吹する。H−1’ )’L ILL:I
の太きいものほど優先度(酸13?五〇?である可能性
)が太きいとする。
First, the element X! which is the most downstream among the multiple estimated failure sources! (= Select (equipment 3).Next, calculate the down payment below for the route from the estimated failure source other than X3 to
: It blows up its own money. H-1')'L ILL:I
It is assumed that the thicker the value, the higher the priority (the possibility that the acid is 13? 50?).

実施例では、 (10) Pl ・P3,2 ・P2、。In the example, (10) Pl・P3,2・P2,.

P、・P2.。P,・P2. .

3 P4  ・P、1゜ の値を比較することになる。3 P4 ・P, 1゜ The values of will be compared.

上記優先度つけ方法は、厳密なに1゛算ではあるが、ネ
ットワークが大きくなると長い計算時間が必要となる。
Although the above prioritization method is strictly a 1 calculation, it requires a long calculation time as the network becomes large.

厳密烙には欠けるが唱°宍時回の短縮を図るには、以下
の2つの方法が考えられる。
The following two methods can be considered in order to shorten the number of chanting times, although they are not very precise.

(1)推足故ij4源各々の故障率の大小により優先度
づけ全行なう。例では、PI I P21 Pg 1P
4の頭金比軟する。
(1) Prioritize each of the four sources based on the failure rate. In the example, PI I P21 Pg 1P
The down payment ratio of 4 is soft.

(2)複数昭の11F足故(II;C源の中から最も下
流側にある要素X、Aぶ。次に、」二流1則にあるx2
 とX4とを求め、t’s、s l J’4.m があ
る与えられた閾ID’j以丁かどうかをチェックする。
(2) Due to the 11F foot of multiple states (II; Elements X, A, which are the most downstream from the C source.Next,
and X4, t's, s l J'4. Check whether m is greater than a given threshold ID'j.

閾値以下のものが・ちる1ル)イ1、たとえばl、’、
、s = (15(閾値=()、8、I’s、5−I)
−9>閾値= 0.8とすると、x3より」1流側にあ
るx2とxlす:故障ゆに候補からはずし、残りのXs
とX4について厳密を優先度(11) づけ方法を通用する。
Those below the threshold are ・chiru1ru)i1, for example l,',
, s = (15(threshold=(), 8, I's, 5-I)
-9>Threshold = 0.8, x2 and
For X4 and X4, the method of prioritizing strictness (11) is applicable.

上述した実施例によれは、 (1)  複数11+’iの嵌結から構成6れるプラン
トを対象とし、設置できるセンサの数が限られていても
故障源の推定可能、 (2)故障源である可能性の大きいものから順に表示可
能、 という効果がある。
According to the above-mentioned embodiment, (1) the source of the failure can be estimated even if the number of sensors that can be installed is limited even if the target is a plant consisting of a plurality of 11+'i fittings, and (2) the source of the failure can be estimated. This has the effect of being able to display items in descending order of probability.

以上述べたように、本発明によれば、 (1)センサおよび異常検知装置が設置埒nてぃない機
器を含む系においても故障分を推定可能、(2)正常信
号、故障波及確率を利用して、(1)で求めた推定故障
源を芒らにしぼることが可能、(3)各慎器の故lS率
、故障波及確率を用いて、故障源である可能性の優先度
づけが可能、となる。
As described above, according to the present invention, (1) failures can be estimated even in systems that include equipment in which sensors and abnormality detection devices are not installed, (2) normal signals and failure propagation probability are used. Then, the estimated failure sources obtained in (1) can be narrowed down to the awns. (3) Using the failure IS rate and failure propagation probability of each safety device, it is possible to prioritize the possibility of being the failure source. Possible.

このため、従来方法では出来なかった故障源推足が可能
となシ、故障兄生時の対策を容易にできるという効果が
ある。
Therefore, it is possible to determine the source of the failure, which was not possible with conventional methods, and it is possible to easily take countermeasures in the event of a failure.

【図面の簡単な説明】[Brief explanation of the drawing]

(12) 第1図は本発明の故障σ≦を推定方式全実現するプラン
ト系の一例の構成図、第2図は第1図の故障源J11L
定装jh:での処Jlの一例を示すフローチャート、第
3図〜第7図は本発明による故11iλ源推定方式の一
例を説明するだめの図で、第3図はL P Gプラント
のポンプ設備系統図、第4図は故障波及確率行列を示す
図、第5図はポンプ設備の故11&波及網と設置センサ
の位置を示す図、第6図は故障波及関連行列のプール行
列を示す図、第7181は故障波及関連行列の町到達行
列を示す1ン1 代哩人 弁理士 l専田利幸 (13) 第 1 図 ¥i4 図 第 5 図 χ2I y−ミー出カ台9点、
(12) Figure 1 is a configuration diagram of an example of a plant system that fully implements the fault σ≦ estimation method of the present invention, and Figure 2 is the fault source J11L in Figure 1.
A flowchart showing an example of the process Jl in a fixed installation jh: Figs. Equipment system diagram, Figure 4 is a diagram showing the failure propagation probability matrix, Figure 5 is a diagram showing the position of the failure propagation network and installed sensors of pump equipment, and Figure 6 is a diagram showing the pool matrix of the failure propagation related matrix. , No. 7181 shows the town arrival matrix of the failure propagation related matrix.

Claims (1)

【特許請求の範囲】 1、複数個の機器からなり、限られた機器に対応するセ
ンサの情報によシ、故障源となる機器を推定するプラン
トの故障源推定方式において、全機器間での故障数及関
係を求め、求められた故障波及確率と上記センサの情報
から得られた異常、正常情報とに基づいて、故障源を推
定するようにしたことkm徴とするプラントの故障源推
定方式。 2、各機器の故障率および機器間の故障波及確率の少な
くとも一方に基づいて、推定された故障源の浸先順位付
けを行なうようにしたこと全特徴とするプラントの故障
源推定方式。
[Claims] 1. In a plant failure source estimation method that estimates a device that is a failure source based on sensor information corresponding to a limited number of devices that are made up of a plurality of devices, A system for estimating the source of failure in a plant, in which the number of failures and their relationships are determined, and the source of the failure is estimated based on the determined failure propagation probability and the abnormality and normality information obtained from the sensor information. . 2. A plant failure source estimation method, which is characterized in that the estimated failure sources are ranked based on at least one of the failure rate of each device and the failure propagation probability between devices.
JP18787881A 1981-11-25 1981-11-25 Inferring system for in-plant trouble cause Pending JPS5890122A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18787881A JPS5890122A (en) 1981-11-25 1981-11-25 Inferring system for in-plant trouble cause

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18787881A JPS5890122A (en) 1981-11-25 1981-11-25 Inferring system for in-plant trouble cause

Publications (1)

Publication Number Publication Date
JPS5890122A true JPS5890122A (en) 1983-05-28

Family

ID=16213781

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18787881A Pending JPS5890122A (en) 1981-11-25 1981-11-25 Inferring system for in-plant trouble cause

Country Status (1)

Country Link
JP (1) JPS5890122A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6076640A (en) * 1983-10-03 1985-05-01 Toshiba Corp Abnormal-operation diagnosing apparatus for rotary machine

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5617404A (en) * 1979-07-23 1981-02-19 Hitachi Ltd Plant-state supervising method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5617404A (en) * 1979-07-23 1981-02-19 Hitachi Ltd Plant-state supervising method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6076640A (en) * 1983-10-03 1985-05-01 Toshiba Corp Abnormal-operation diagnosing apparatus for rotary machine

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