JPS589155B2 - Ion plating couch - Google Patents
Ion plating couchInfo
- Publication number
- JPS589155B2 JPS589155B2 JP3203275A JP3203275A JPS589155B2 JP S589155 B2 JPS589155 B2 JP S589155B2 JP 3203275 A JP3203275 A JP 3203275A JP 3203275 A JP3203275 A JP 3203275A JP S589155 B2 JPS589155 B2 JP S589155B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- plate
- shutter
- ion plating
- high frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007733 ion plating Methods 0.000 title claims description 8
- 239000000758 substrate Substances 0.000 claims description 26
- 239000000126 substance Substances 0.000 claims description 15
- 238000001704 evaporation Methods 0.000 claims description 9
- 230000008020 evaporation Effects 0.000 claims description 9
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 7
- 229910052786 argon Inorganic materials 0.000 description 6
- -1 argon ions Chemical class 0.000 description 5
- 150000002500 ions Chemical class 0.000 description 5
- 239000012495 reaction gas Substances 0.000 description 5
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
Description
【発明の詳細な説明】
本発明は真空中で基板上に被膜を生成させるイオンプレ
ーテイング装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an ion plating apparatus for forming a film on a substrate in vacuum.
真空中で基板上に被膜を生成させる方法には、真空蒸着
とスパッタリングによるものとがあるが、蒸着物質をエ
ネルギー的にみた場合、前者は加熱温度が2300°K
の場合でも約0.2eV、後者は平均10eV程度であ
って蒸着物質は殆んど中性の原子又は分子である。There are two methods for forming a film on a substrate in vacuum: vacuum evaporation and sputtering. When looking at the energy of the evaporation material, the former requires a heating temperature of 2300°K.
In this case, the voltage is about 0.2 eV, and the latter is about 10 eV on average, and the vapor deposited substance is mostly neutral atoms or molecules.
これに対し、蒸着物質の蒸発源と被膜を生成させる基板
との間に電圧を印加して蒸発物質を積極的にイオン化し
、これを加速して基板に射突させると、従来の真空蒸着
又はスパッタリングによる被膜よりはるかに強固で密着
力のすぐれた被膜のえられることが1963年米国のM
ATTOXによって発表され、これをイオンプレーテイ
ング法と称している。On the other hand, if a voltage is applied between the evaporation source of the evaporation material and the substrate on which the film is to be formed, the evaporation material is actively ionized, and then the evaporated material is accelerated and bombarded with the substrate. In 1963, the American M
This method was announced by ATTOX and is called the ion plating method.
このイオンプレーティング法には直流グロー放電による
ものと、高周波グロー放電によるものとがあって、それ
ぞれ長短があり、用途によって使い分けているが、これ
らに共通した点は、基板上に被膜を生成させる際、蒸発
物質の蒸発源と基板との間に設ける蒸気遮蔽板の配置お
よび電位が基板上に生成される被膜に大きく影響する。There are two types of ion plating methods, one using direct current glow discharge and the other using high frequency glow discharge. Each has advantages and disadvantages and is used depending on the application, but the common point between them is that a film is formed on the substrate. In this case, the arrangement and potential of the vapor shield plate provided between the evaporation source of the evaporative substance and the substrate greatly influence the film formed on the substrate.
第1図は高周波グロー放電を用いた従来のイオンプレー
テイング装置である。FIG. 1 shows a conventional ion plating apparatus using high frequency glow discharge.
同図において、1は真空容器、2は蒸発物質3の蒸発源
で例えば抵抗加熱式のボートよりなり電源4によって加
熱される。In the figure, 1 is a vacuum container, and 2 is an evaporation source for an evaporative substance 3, which is, for example, a resistance heating type boat and is heated by a power source 4.
6は被膜生成用の基板5を保持する保持板で、マスト7
によって支持されている。6 is a holding plate that holds the substrate 5 for film production;
Supported by
8はボート2と基板5の間に設けられた高周波電極で、
9はその高周波電源である。8 is a high frequency electrode provided between the boat 2 and the substrate 5;
9 is its high frequency power source.
10は高周波電極8と基板5との間に高電圧を印加する
直流電源で、そのいづれの側を負電位にしてもよいが、
この実施例では基板6の側を負電位とする。10 is a DC power supply that applies a high voltage between the high frequency electrode 8 and the substrate 5, and either side thereof may be set to a negative potential;
In this embodiment, the substrate 6 side is set to a negative potential.
11は反応ガス導入管、12はそのバリアプルリークバ
ルブである。11 is a reaction gas introduction pipe, and 12 is its barrier pull leak valve.
13はマスト7、高周波電極8およびボート2の支持体
が真空容器10台板14を貫通する部分に設けた絶縁ブ
ツシング、15は図示してない真空ポンプによる排気口
である。Reference numeral 13 indicates an insulating bushing provided at a portion where the mast 7, the high-frequency electrode 8, and the support of the boat 2 pass through the base plate 14 of the vacuum vessel 10, and 15 indicates an exhaust port by a vacuum pump (not shown).
16は高周波電極8とボート2の間に設けた遮蔽板で、
シャッター窓17を有する。16 is a shielding plate provided between the high frequency electrode 8 and the boat 2;
It has a shutter window 17.
18はシャッター窓17を開閉するシャッター板で、1
9はその操作棒である。18 is a shutter plate for opening and closing the shutter window 17;
9 is its operating stick.
ボート2はその一端が接地されている。遮蔽板16およ
びシャッター板18は接地する場合と接地しない場合が
あるが、この実施例においては接地電位にあるものとす
る。Boat 2 is grounded at one end. The shielding plate 16 and the shutter plate 18 may or may not be grounded, but in this embodiment, they are assumed to be at ground potential.
真空容器内の空気を排気した後、高周波電源9をたとえ
ば13.56MHzで動作させると高周波電極8とシャ
ッター板18との間にグロー放電が発生する。After exhausting the air in the vacuum container, when the high frequency power source 9 is operated at, for example, 13.56 MHz, a glow discharge is generated between the high frequency electrode 8 and the shutter plate 18.
目的に応じて反応ガス導入管11からパルブ12を調節
して、例えばアルゴンガスを導入し、真空容器1内を1
0−3〜10−4Torrに保持すると、基板5の表面
はアルゴンイオンの射突によりクリーニングされる。Adjust the valve 12 from the reaction gas introduction pipe 11 depending on the purpose to introduce, for example, argon gas, and
When maintained at 0-3 to 10-4 Torr, the surface of the substrate 5 is cleaned by bombardment with argon ions.
そして電源4によりボート2を加熱すると蒸発物質3が
蒸発するのでシャッター板18を開くと、蒸発物質3の
一部が高周波電界によってイオン化され、直流電源10
によって加速され、基板5に吸引される。Then, when the boat 2 is heated by the power source 4, the evaporated substance 3 is evaporated, so when the shutter plate 18 is opened, a part of the evaporated substance 3 is ionized by the high frequency electric field, and the DC power source 10
and is attracted to the substrate 5.
ところで、この装置はシャツタ{18を開くと容器内の
電界に急峻な変化が生じ、その結果、グロー放電の状態
が瞬時変化する。By the way, in this device, when the shutter 18 is opened, a sharp change occurs in the electric field within the container, and as a result, the state of glow discharge changes instantaneously.
したがって、アルゴンイオンと蒸発物質イオンとの割合
を所定の値に制御しようとするとき、シャッター板開放
前にアルゴンイオンの量を調整してもシャッター板を開
放したときの電界の変化によってアルゴンイオンの量が
変化する。Therefore, when trying to control the ratio of argon ions and evaporated substance ions to a predetermined value, even if the amount of argon ions is adjusted before the shutter plate is opened, the change in the electric field when the shutter plate is opened causes the argon ions to be The amount changes.
そしてシャッター板開放と同時に蒸発物質のイオンが含
まれるのでアルゴンイオンと蒸発物質イオンとの適正な
割合を作業開始前に設定することが困難となる。Since ions of the evaporated substance are included at the same time as the shutter plate is opened, it becomes difficult to set an appropriate ratio of argon ions and evaporated substance ions before starting work.
このことは導入するガスがN2,O2,C2H2のよう
な反応性ガスで蒸発物質との間の化学反応によって被膜
を生成させようとする場合に著しい障害となる。This poses a significant problem when the introduced gas is a reactive gas such as N2, O2, or C2H2 and a film is to be formed by chemical reaction with the evaporated substance.
たとえばN2とTiとによってTiNの被膜を生成しよ
うとする場合に初期にTi2N3の被膜が発生して純粋
のTiNがえられないことである。For example, when attempting to produce a TiN film using N2 and Ti, a Ti2N3 film is initially generated, making it impossible to obtain pure TiN.
本発明は以上のような障害のないイオンプレーテイング
装置とすることを目的とするものであって、蒸発物質を
加熱蒸発させる蒸発源と被膜を生成させる基板との間に
グロー放電を発生させる電極を備えた真空容器内におい
て、前記基板の前面にこれと近接して遮蔽板を設け、該
遮蔽板のシャッター窓を開閉するシャッター板を前記基
板とほぼ同電位に保持することを特徴とする。The present invention aims to provide an ion plating apparatus free from the above-mentioned problems, and includes an electrode that generates a glow discharge between an evaporation source that heats and evaporates the evaporated substance and a substrate that forms a film. A shielding plate is provided in the front surface of the substrate in close proximity to the substrate, and a shutter plate for opening and closing a shutter window of the shielding plate is held at approximately the same potential as the substrate.
以下、その実施例を第2図および第3図について説明す
る。The embodiment will be described below with reference to FIGS. 2 and 3.
第2図において、1ないし15は第1図のものと,同等
であるからその説明を省略する。In FIG. 2, numerals 1 to 15 are the same as those in FIG. 1, so their explanation will be omitted.
20は本発明のシャッター板で、基板5の前面にスタン
ド21によって支持された遮蔽板22のシャッター窓2
3を開閉する。Reference numeral 20 denotes a shutter plate of the present invention, in which a shutter window 2 of a shielding plate 22 is supported by a stand 21 on the front side of a substrate 5.
Open and close 3.
このシャッター板20ぱ絶縁性物質よりなる支柱24と
アーム25によって結合されている。This shutter plate 20 is connected to a column 24 and an arm 25 made of an insulating material.
26は支柱24に続く操作棒で、該操作棒26を回動す
ることによってシャッター板20は第3図に点線で示す
ように水平方向に移動し、シャッター窓23を開閉する
。Reference numeral 26 denotes an operating rod following the column 24. By rotating the operating rod 26, the shutter plate 20 moves horizontally as shown by the dotted line in FIG. 3, and the shutter window 23 is opened and closed.
なおシャッター板20および遮蔽板22は導線27によ
って基板5と同電位が与えてある。Note that the shutter plate 20 and the shielding plate 22 are given the same potential as the substrate 5 through a conductive wire 27.
本発明の装置は以上の構成を有するので、真空容器1内
の空気を排気口15から排気して10−5〜10−6T
orr程度の真空にした後、パルブ12を調節して反応
ガス例えばN2を導入管11から真空容器1内に導入し
、5×10−4Torr程度にする。Since the apparatus of the present invention has the above configuration, the air in the vacuum container 1 is exhausted from the exhaust port 15 to 10-5 to 10-6T.
After creating a vacuum of about 5.0 or more Torr, the valve 12 is adjusted to introduce a reaction gas, for example, N2, into the vacuum vessel 1 from the introduction pipe 11 to make the vacuum about 5.times.10@-4 Torr.
そして高周波電源9をスイッチインして高周波電極8と
ボート2との間に高周波グロー放電を発生させる。Then, the high frequency power source 9 is switched on to generate a high frequency glow discharge between the high frequency electrode 8 and the boat 2.
しかる後、ボート2を電源4で加熱し、蒸発物質3例え
ばTiを蒸発させる。Thereafter, the boat 2 is heated by a power source 4 to evaporate the evaporable substance 3, such as Ti.
このときTiNの生成に最適の条件かえられるよう高周
源電源9、電源4、パルブ12を調整し、調整が終って
からシャーター窓23を開くと基板5にTiNの被膜を
生成させることができる。At this time, adjust the high frequency power source 9, power source 4, and pulse 12 so that the conditions are optimal for TiN generation, and after the adjustment is completed, open the shutter window 23 to generate a TiN film on the substrate 5. .
従来の装置(第1図)はシャッター板が高周波電極8と
ボート2との間にあっただめ、シャッター板の開閉によ
って高周波グロー放電の状態が変化して、前述のように
、最初から反応ガスと蒸発物質を適正な割合に設定する
ことが困難であったが、本発明の装置(第2図)はシャ
ッター板20を基板5の前面にこれと近接して配置し、
かつ、これと同電位に保持してあるのでその開閉は高周
波電界に影響がなく、したがって、最初に設定した適正
の反応ガスイオンの量と蒸発物質イオンの量とによって
良質の被膜を生成することができる。In the conventional device (Fig. 1), since the shutter plate was located between the high-frequency electrode 8 and the boat 2, the state of the high-frequency glow discharge changes by opening and closing the shutter plate, and as mentioned above, the reaction gas and evaporation are mixed from the beginning. Although it has been difficult to set the substances in appropriate proportions, the device of the present invention (FIG. 2) places the shutter plate 20 in front of the substrate 5 in close proximity thereto.
In addition, since it is held at the same potential as this, opening and closing does not affect the high frequency electric field, and therefore a high quality film can be produced with the appropriate amount of reactant gas ions and evaporated substance ions set at the beginning. Can be done.
なお、以上高周波グロー放電の場合について述べたが、
低周波グロー放電および直流グロー放亀の場合にも、本
発明を適用することができる。In addition, although the case of high-frequency glow discharge has been described above,
The present invention can also be applied to low frequency glow discharge and DC glow discharge.
第1図:従来のイオンプレーテイング装置の縦断面図、
第2図二本発明の実施例の縦断面図、第3図:第2図の
シャッター板の平面図。
記号1・・・真空容器、2・・・光源(ボート)、3・
・・蒸発物質、4・・・電源、5・・・基板、6・・・
保持板、7・・・マスト、8・・・高周波電極、9・・
・高周波電源、10・・・直流電源、11・・・反応ガ
ス導入管、12・・・パルブ、13・・・プツシング、
14・・・台板、15・・・排気口、20・・・シャッ
ター板、21・・・スタンド、22・・・遮蔽板、23
・・・シャッター窓、24・・・支柱、25・・・アー
ム、26・・・操作棒、27・・・導線。Figure 1: Longitudinal cross-sectional view of a conventional ion plating device.
FIG. 2 is a longitudinal sectional view of an embodiment of the present invention; FIG. 3 is a plan view of the shutter plate of FIG. 2; Symbol 1... Vacuum container, 2... Light source (boat), 3...
... Evaporated substance, 4... Power source, 5... Substrate, 6...
Holding plate, 7... Mast, 8... High frequency electrode, 9...
・High frequency power supply, 10... DC power supply, 11... Reaction gas introduction pipe, 12... Pulve, 13... Pushing,
14... Base plate, 15... Exhaust port, 20... Shutter plate, 21... Stand, 22... Shielding plate, 23
...shutter window, 24...post, 25...arm, 26...operating rod, 27...conductor.
Claims (1)
基板との間にグロー放電を発生させる電極を備えた真空
容器内において、前記基板の前面にこれと近接して遮蔽
板を設け、この遮蔽板のシャッター窓を開閉するシャッ
ター板を前記基板とほソ同電位に保持することを特徴と
するイオンプレーテイング装置。1. In a vacuum container equipped with an electrode that generates a glow discharge between an evaporation source that heats and evaporates the evaporated substance and a substrate that generates a film, a shielding plate is provided on the front surface of the substrate in close proximity to the substrate. An ion plating apparatus characterized in that a shutter plate for opening and closing a shutter window of the plate is held at approximately the same potential as the substrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3203275A JPS589155B2 (en) | 1975-03-17 | 1975-03-17 | Ion plating couch |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3203275A JPS589155B2 (en) | 1975-03-17 | 1975-03-17 | Ion plating couch |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS51106640A JPS51106640A (en) | 1976-09-21 |
| JPS589155B2 true JPS589155B2 (en) | 1983-02-19 |
Family
ID=12347518
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3203275A Expired JPS589155B2 (en) | 1975-03-17 | 1975-03-17 | Ion plating couch |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS589155B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0383555U (en) * | 1989-12-18 | 1991-08-26 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106244985B (en) * | 2016-09-22 | 2019-01-11 | 铜陵市铜创电子科技有限公司 | Film-coating mechanism is used in a kind of processing of metallized film |
-
1975
- 1975-03-17 JP JP3203275A patent/JPS589155B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0383555U (en) * | 1989-12-18 | 1991-08-26 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS51106640A (en) | 1976-09-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH02285072A (en) | Coating of surface of workpiece and workpiece thereof | |
| KR20000071541A (en) | Method of forming transparent conductive film and transparent conductive film formed by the method | |
| JPH02290965A (en) | Vacuum deposition system of thin film and method thereof | |
| US4933065A (en) | Apparatus for applying dielectric or metallic materials | |
| JPS589155B2 (en) | Ion plating couch | |
| US3428546A (en) | Apparatus for vacuum deposition on a negatively biased substrate | |
| JP2700280B2 (en) | Ion beam generator, film forming apparatus and film forming method | |
| JP3406769B2 (en) | Ion plating equipment | |
| JPH11335832A (en) | Ion implantation and ion implantation device | |
| JPH0639707B2 (en) | Thin film forming equipment | |
| JP2687468B2 (en) | Thin film forming equipment | |
| JPH05295526A (en) | Vapor deposition method and vapor deposition device | |
| JPH048506B2 (en) | ||
| JPH0372068A (en) | Solid ion source | |
| JPH02296724A (en) | Manufacturing method of thin film superconductor | |
| JPH0542764B2 (en) | ||
| JPH02155148A (en) | Ion source | |
| JPH0754147A (en) | Dynamic mixing device | |
| JPH0598429A (en) | Method for manufacturing transparent electrically conductive film and apparatus for manufacturing transparent electrically conductive film | |
| JPS595732Y2 (en) | Ion plating equipment | |
| JPH04154962A (en) | Thin film forming equipment | |
| JPH06306578A (en) | Method and device for forming electromagnetic shielding film | |
| JPH0499169A (en) | Thin film forming equipment | |
| JPH07243035A (en) | Method and apparatus for preparing compound thin film | |
| JPS6053113B2 (en) | Film formation method |