JPS59195728A - デ−タ処理装置 - Google Patents

デ−タ処理装置

Info

Publication number: JPS59195728A
Authority: JP; Japan
Prior art keywords: signal; bus; data processing; operations; circuit
Prior art date: 1983-04-22
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

JP7108683A

Other languages

English (en)

Japanese (ja)

Other versions

JPS6367702B2 (fr

Inventor

Nobuteru Morita

森田　信輝

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

NEC Corp

Original Assignee

NEC Corp

Nippon Electric Co Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1983-04-22

Filing date

1983-04-22

Publication date

1984-11-06

1983-04-22 Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp

1983-04-22 Priority to JP7108683A priority Critical patent/JPS59195728A/ja

1984-11-06 Publication of JPS59195728A publication Critical patent/JPS59195728A/ja

1988-12-27 Publication of JPS6367702B2 publication Critical patent/JPS6367702B2/ja

Status Granted legal-status Critical Current

Links

230000010365 information processing Effects 0.000 claims abstract description 7
238000010586 diagram Methods 0.000 description 4
230000004044 response Effects 0.000 description 4
240000002853 Nelumbo nucifera Species 0.000 description 2
235000006508 Nelumbo nucifera Nutrition 0.000 description 2
235000006510 Nelumbo pentapetala Nutrition 0.000 description 2
OIQXFRANQVWXJF-LIQNAMIISA-N (1s,2z,4r)-2-benzylidene-4,7,7-trimethylbicyclo[2.2.1]heptan-3-one Chemical compound O=C([C@]1(C)CC[C@H]2C1(C)C)\C2=C/C1=CC=CC=C1 OIQXFRANQVWXJF-LIQNAMIISA-N 0.000 description 1
238000000034 method Methods 0.000 description 1

Landscapes

Multi Processors (AREA)
Bus Control (AREA)

JP7108683A 1983-04-22 1983-04-22 デ−タ処理装置 Granted JPS59195728A (ja)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP7108683A JPS59195728A (ja)	1983-04-22	1983-04-22	デ−タ処理装置

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP7108683A JPS59195728A (ja)	1983-04-22	1983-04-22	デ−タ処理装置

Publications (2)

Publication Number	Publication Date
JPS59195728A true JPS59195728A (ja)	1984-11-06
JPS6367702B2 JPS6367702B2 (fr)	1988-12-27

Family

ID=13450362

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP7108683A Granted JPS59195728A (ja)	1983-04-22	1983-04-22	デ−タ処理装置

Country Status (1)

Country	Link
JP (1)	JPS59195728A (fr)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS61198355A (ja) *	1985-02-28	1986-09-02	Toshiba Corp	マルチプロセツサシステム
JPH04310165A (ja) *	1991-04-09	1992-11-02	Nec Corp	バスロック制御機構
JPH06314232A (ja) *	1993-05-06	1994-11-08	Mitsubishi Electric Corp	メモリ切替制御回路
US6333510B1 (en)	1997-08-11	2001-12-25	Hitachi, Ltd.	Electron beam exposure or system inspection of measurement apparatus and its method and height detection apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS4941044A (fr) *	1972-08-26	1974-04-17

1983
- 1983-04-22 JP JP7108683A patent/JPS59195728A/ja active Granted

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS4941044A (fr) *	1972-08-26	1974-04-17

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS61198355A (ja) *	1985-02-28	1986-09-02	Toshiba Corp	マルチプロセツサシステム
JPH04310165A (ja) *	1991-04-09	1992-11-02	Nec Corp	バスロック制御機構
JPH06314232A (ja) *	1993-05-06	1994-11-08	Mitsubishi Electric Corp	メモリ切替制御回路
US6333510B1 (en)	1997-08-11	2001-12-25	Hitachi, Ltd.	Electron beam exposure or system inspection of measurement apparatus and its method and height detection apparatus
US6753518B2 (en)	1997-08-11	2004-06-22	Hitachi, Ltd.	Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus
US6919577B2 (en)	1997-08-11	2005-07-19	Hitachi, Ltd.	Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus
US7329889B2 (en)	1997-08-11	2008-02-12	Hitachi, Ltd.	Electron beam apparatus and method with surface height calculator and a dual projection optical unit
US7692144B2 (en)	1997-08-11	2010-04-06	Hitachi, Ltd.	Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus
US8212227B2 (en)	1997-08-11	2012-07-03	Hitachi, Ltd.	Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus

Also Published As

Publication number	Publication date
JPS6367702B2 (fr)	1988-12-27

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