JPS5952737A - X線結晶方位測定装置 - Google Patents

X線結晶方位測定装置

Info

Publication number
JPS5952737A
JPS5952737A JP16452782A JP16452782A JPS5952737A JP S5952737 A JPS5952737 A JP S5952737A JP 16452782 A JP16452782 A JP 16452782A JP 16452782 A JP16452782 A JP 16452782A JP S5952737 A JPS5952737 A JP S5952737A
Authority
JP
Japan
Prior art keywords
sample
rays
ray
crystal orientation
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16452782A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0136899B2 (de
Inventor
Haruo Sekiguchi
関口 晴男
Ryoichi Shimizu
良一 清水
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP16452782A priority Critical patent/JPS5952737A/ja
Publication of JPS5952737A publication Critical patent/JPS5952737A/ja
Publication of JPH0136899B2 publication Critical patent/JPH0136899B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP16452782A 1982-09-20 1982-09-20 X線結晶方位測定装置 Granted JPS5952737A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16452782A JPS5952737A (ja) 1982-09-20 1982-09-20 X線結晶方位測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16452782A JPS5952737A (ja) 1982-09-20 1982-09-20 X線結晶方位測定装置

Publications (2)

Publication Number Publication Date
JPS5952737A true JPS5952737A (ja) 1984-03-27
JPH0136899B2 JPH0136899B2 (de) 1989-08-03

Family

ID=15794856

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16452782A Granted JPS5952737A (ja) 1982-09-20 1982-09-20 X線結晶方位測定装置

Country Status (1)

Country Link
JP (1) JPS5952737A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102642254A (zh) * 2012-05-14 2012-08-22 云南蓝晶科技股份有限公司 晶面定向检测粘接台

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102642254A (zh) * 2012-05-14 2012-08-22 云南蓝晶科技股份有限公司 晶面定向检测粘接台

Also Published As

Publication number Publication date
JPH0136899B2 (de) 1989-08-03

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