JPS5952737A - X線結晶方位測定装置 - Google Patents
X線結晶方位測定装置Info
- Publication number
- JPS5952737A JPS5952737A JP16452782A JP16452782A JPS5952737A JP S5952737 A JPS5952737 A JP S5952737A JP 16452782 A JP16452782 A JP 16452782A JP 16452782 A JP16452782 A JP 16452782A JP S5952737 A JPS5952737 A JP S5952737A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- rays
- ray
- crystal orientation
- axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16452782A JPS5952737A (ja) | 1982-09-20 | 1982-09-20 | X線結晶方位測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16452782A JPS5952737A (ja) | 1982-09-20 | 1982-09-20 | X線結晶方位測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5952737A true JPS5952737A (ja) | 1984-03-27 |
| JPH0136899B2 JPH0136899B2 (de) | 1989-08-03 |
Family
ID=15794856
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16452782A Granted JPS5952737A (ja) | 1982-09-20 | 1982-09-20 | X線結晶方位測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5952737A (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102642254A (zh) * | 2012-05-14 | 2012-08-22 | 云南蓝晶科技股份有限公司 | 晶面定向检测粘接台 |
-
1982
- 1982-09-20 JP JP16452782A patent/JPS5952737A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102642254A (zh) * | 2012-05-14 | 2012-08-22 | 云南蓝晶科技股份有限公司 | 晶面定向检测粘接台 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0136899B2 (de) | 1989-08-03 |
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