JPH0136899B2 - - Google Patents

Info

Publication number: JPH0136899B2
Authority: JP; Japan
Prior art keywords: sample; rays; crystal; ray; axis
Prior art date: 1982-09-20
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired

Application number

JP16452782A

Other languages

English (en)

Japanese (ja)

Other versions

JPS5952737A (ja

Inventor

Haruo Sekiguchi

Ryoichi Shimizu

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Shimadzu Corp

Original Assignee

Shimadzu Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1982-09-20

Filing date

1982-09-20

Publication date

1989-08-03

1982-09-20 Application filed by Shimadzu Corp filed Critical Shimadzu Corp

1982-09-20 Priority to JP16452782A priority Critical patent/JPS5952737A/ja

1984-03-27 Publication of JPS5952737A publication Critical patent/JPS5952737A/ja

1989-08-03 Publication of JPH0136899B2 publication Critical patent/JPH0136899B2/ja

Status Granted legal-status Critical Current

Links

239000013078 crystal Substances 0.000 claims description 31
238000005162 X-ray Laue diffraction Methods 0.000 claims description 13
238000000034 method Methods 0.000 claims description 11
238000001514 detection method Methods 0.000 claims description 2
238000005259 measurement Methods 0.000 description 4
230000005855 radiation Effects 0.000 description 3
ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
230000001678 irradiating effect Effects 0.000 description 2
229910052750 molybdenum Inorganic materials 0.000 description 2
239000011733 molybdenum Substances 0.000 description 2
239000000758 substrate Substances 0.000 description 2
RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
229910052782 aluminium Inorganic materials 0.000 description 1
230000005540 biological transmission Effects 0.000 description 1
229910052802 copper Inorganic materials 0.000 description 1
239000010949 copper Substances 0.000 description 1
238000010586 diagram Methods 0.000 description 1
230000000694 effects Effects 0.000 description 1
238000002360 preparation method Methods 0.000 description 1
238000001228 spectrum Methods 0.000 description 1
239000013077 target material Substances 0.000 description 1
WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
229910052721 tungsten Inorganic materials 0.000 description 1
239000010937 tungsten Substances 0.000 description 1

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

Chemical & Material Sciences (AREA)
Crystallography & Structural Chemistry (AREA)
Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Analysing Materials By The Use Of Radiation (AREA)

JP16452782A 1982-09-20 1982-09-20 Ｘ線結晶方位測定装置 Granted JPS5952737A (ja)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP16452782A JPS5952737A (ja)	1982-09-20	1982-09-20	Ｘ線結晶方位測定装置

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP16452782A JPS5952737A (ja)	1982-09-20	1982-09-20	Ｘ線結晶方位測定装置

Publications (2)

Publication Number	Publication Date
JPS5952737A JPS5952737A (ja)	1984-03-27
JPH0136899B2 true JPH0136899B2 (de)	1989-08-03

Family

ID=15794856

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP16452782A Granted JPS5952737A (ja)	1982-09-20	1982-09-20	Ｘ線結晶方位測定装置

Country Status (1)

Country	Link
JP (1)	JPS5952737A (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CN102642254B (zh) *	2012-05-14	2014-04-23	云南蓝晶科技股份有限公司	晶面定向检测粘接台

1982
- 1982-09-20 JP JP16452782A patent/JPS5952737A/ja active Granted

Also Published As

Publication number	Publication date
JPS5952737A (ja)	1984-03-27

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