JPS5969934A - Etching method - Google Patents

Etching method

Info

Publication number
JPS5969934A
JPS5969934A JP57180775A JP18077582A JPS5969934A JP S5969934 A JPS5969934 A JP S5969934A JP 57180775 A JP57180775 A JP 57180775A JP 18077582 A JP18077582 A JP 18077582A JP S5969934 A JPS5969934 A JP S5969934A
Authority
JP
Japan
Prior art keywords
substrate
mask
groove
thermal expansion
hydrogen peroxide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57180775A
Other languages
Japanese (ja)
Inventor
Yukihiro Hosomi
細見 幸弘
Yoshifumi Matsushita
松下 欣史
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Sanyo Denki Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Sanyo Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd, Sanyo Denki Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP57180775A priority Critical patent/JPS5969934A/en
Publication of JPS5969934A publication Critical patent/JPS5969934A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices

Landscapes

  • ing And Chemical Polishing (AREA)
  • Weting (AREA)

Abstract

PURPOSE:To form a narrow deep groove to a substrate consisting of a GaAlAs group single crystal by forming a mask composed of a material, a thermal expansion coefficient thereof differs from the substrate, and dipping the mask in an ammonia-hydrogen peroxide aqueous solution. CONSTITUTION:The mask 12 laminated on the GaAs substrate 11 consists of SiO2, the thermal expansion coefficient thereof differs from the substrate 11, etc. When the substrate 11 to which the mask 12 is formed is dipped in the solution composed of 30wt% hydrogen peroxide water containing 1% ammonia, the narrow deep V-shaped groove 13 is obtained along the mask 12. Stress is generated in a section along the mask 12 because the thermal expansion coefficients of the substrate 11 and the mask 12 differ, bonding power among crystals weakens, and the substrate is etched in this manner.

Description

【発明の詳細な説明】 く技術分野〉 本発明はエツチング方法に関し、特にGaAl!AB系
材料のエツチング方法に関する。
DETAILED DESCRIPTION OF THE INVENTION Technical Field The present invention relates to an etching method, particularly for GaAl! This invention relates to a method for etching AB-based materials.

〈従来技術〉 第1図乃至第3図は従来のエツチング方法全説明するた
めのものである。
<Prior Art> FIGS. 1 to 3 are for explaining the entire conventional etching method.

図中、(11は例えばGaA、8(ガリウム砒素)単結
晶基板、I21は該基板の一主面に形成された例えば5
102からなるエツチングマスクであり、該マスクには
上記基板il+の一部が露出するように窓(3)が形成
され−Cいる。その後折るマスク(21が形成された基
板11J、Y適当な例えば硫酸:酸化水素水:水が3:
1 :1となるエツチング液【二浸漬テることにより、
第2図に示す如(表面開口部が上記窓(3)形状に対応
した溝(4)が得られる。
In the figure, (11 is, for example, a GaA, 8 (gallium arsenide) single crystal substrate, and I21 is, for example, a 5
102, and a window (3) is formed in the mask so that a part of the substrate il+ is exposed. After that, fold the mask (21) on the substrate 11J, Y suitable for example sulfuric acid: hydrogen oxide water: water 3:
Etching solution with a ratio of 1:1 [by dipping twice,
As shown in FIG. 2, a groove (4) whose surface opening corresponds to the shape of the window (3) is obtained.

゛ところが斯る従来方法では溝幅iBとし、R深さiD
としかつB <Dとなるような溝を得ることは不可能で
あった。つまり第3図に示す如く窓(3)の幅)2Bと
してエツチング液に浸漬して深さDの溝を得ようとして
もマスク(2)においてアンダーエツチングが生じ、開
口部の溝幅lはBより大となる。
However, in the conventional method, the groove width is iB and the R depth is iD.
However, it was impossible to obtain a groove such that B<D. In other words, even if an attempt is made to obtain a groove of depth D by immersing it in an etching solution as shown in FIG. becomes larger.

例えば溝幅2戸m、溝深さ10メm程度の溝をつと溝の
深さが10/Imとなるとき斯!の開口部付近の幅はア
ンダーエツチングC二より8〜10メm程度となる。
For example, if you make a groove with a groove width of 2 meters and a groove depth of about 10 mm, the depth of the groove will be 10/Im. The width near the opening of the under-etching C2 is about 8 to 10 mm.

従って従来は溝幅が狭く、恭溝深さの深い溝は得られな
かった。
Therefore, in the past, grooves with narrow groove widths and deep groove depths could not be obtained.

〈発明の目的〉 本発明は斯る点に鑑みてなされたもので、GaAl!A
S系単結晶からなる基板に幅が狭くかつ深い溝を形成可
能なエツチング方法を提供せんとするものである。
<Object of the invention> The present invention was made in view of the above points, and GaAl! A
The present invention aims to provide an etching method capable of forming narrow and deep grooves in a substrate made of S-based single crystal.

〈発明の構成〉 本発明エツチング方法の特徴はGaAJAs系唾結晶材
料からなる基板上に将来形成される溝の一端に沿い形成
されると共に少なくとも上記基板とM〜膨張係数が異な
る材料からなるマスクが形成される工程、上記マスクが
形成された基板をアンモニア−過酸化水素水系溶液に浸
漬することにある。
<Structure of the Invention> A feature of the etching method of the present invention is that a mask is formed along one end of a groove to be formed in the future on a substrate made of a GaAJAs-based saliva crystal material, and a mask made of a material having an expansion coefficient different from that of the substrate is at least The forming step consists in immersing the substrate on which the mask is formed in an ammonia-hydrogen peroxide aqueous solution.

〈実施例〉 第4図及び第5図は本発明の一実施例を示し、tl 1
1 バー主面が(100)面とqるcaAs基板、02
は該基板上2二積層されたマスクであり、該マスクは上
記基板(11)と熱膨張係数の異なる例えば5i02等
からなる。斯るマスクO2が形成された基板■をアンモ
ニア−過酸化水素水系溶液、好適には1%のアンモニア
を含有する3 0!it%の過酸化水素水からな声液に
釣6分間浸漬すると、第5図に示Tm<、深さD==1
[]、am、溝幅B−=2pmと幅が狭くかつ深いV字
溝031が上記マスク(121に沿って得られた。尚上
記溶液のGaAs基板に対するエツチング力は非常に弱
い。
<Example> FIG. 4 and FIG. 5 show an example of the present invention, and tl 1
1 caAs substrate whose main surface is the (100) plane, 02
is a mask laminated on the substrate (11), and the mask is made of a material such as 5i02 having a different coefficient of thermal expansion from that of the substrate (11). The substrate (1) on which such a mask O2 is formed is treated with an ammonia-hydrogen peroxide aqueous solution, preferably containing 1% ammonia. When the fish is immersed in vocal fluid made of hydrogen peroxide solution for 6 minutes, as shown in Fig. 5, Tm<, depth D==1.
[], am, groove width B-=2 pm, and a narrow and deep V-shaped groove 031 was obtained along the above mask (121).The etching power of the above solution on the GaAs substrate was very weak.

このようr(V字溝が形成されるメカニズムははっきり
しないが基板0υとマスクOaとの熱膨張係数が異なる
ため斯るマスク[+21形成後基板旧]−に特に上記マ
スク021に沿った部分にストノスが生じ斯る部分の結
晶間の結合力が弱まり、従って斯る部分のみ上記溶液に
よりエツチングされるためだと考えられる。、 尚実施例では基板としてCa Asを用いたがGaAJ
Asからなる基板を用いて同様な効雫が得られる。また
マスク材料もSiO2に限らずGaARAB系材料と熱
膨張係数がP、なりかつ上記溶液によりエツチングされ
ない材料であればよい。
The mechanism by which the V-groove is formed is not clear, but because the thermal expansion coefficients of the substrate 0υ and the mask Oa are different, there is a difference in the thermal expansion coefficient between the substrate 0υ and the mask Oa. It is thought that this is because the bonding force between the crystals in such a region is weakened by the occurrence of stonos, and therefore only such a region is etched by the above solution.Although CaAs was used as the substrate in the example, GaAJ
A similar effect can be obtained using a substrate made of As. Further, the mask material is not limited to SiO2, but may be any material that has a thermal expansion coefficient of P with respect to the GaARAB material and is not etched by the above solution.

く応用例〉 本発明の応用として好適例は、基板−ヒにpn接合が形
成されたGaJ’As系43光ダイオードウェハをベレ
ット単位に分離の際に用いられる。斯る’1NItに本
発明を用いると溝幅ン小さく分離可能であるため一枚の
ウニへから得られるベレットの有効面積比が人となる・ また、他の応用例としCは、第6図に示す如く半導体レ
ーザの壌流鋏窄用の溝の形成に用いられる。図中211
はn坐GaAs基板、 +721は該基板上に積層され
た発振層であり、該発振層は活性層Q、(lと該活性層
を挟装する@1.第2クラッド層f2111251から
なる。また斯る活性層(231及び第1、第2クラブト
層(lrht2511d G a A l A s糸材
料カラ71 iJ、カッ第1、第2クラッド層124+
1251は活性周回)よりバンドギャップが人であるn
型及びP型となる。C26)はト記発振層(221上に
形成されたP型GaASからなるキャップ層、開は該キ
ャップ層上に形成されたオーミック性の電極であり、該
電極は紙面垂直方向に延在するストライプ形状tなT、
f281は上記電極C2L両側に設けられた溝であり、
該溝は第2クラッド1 層のに達する。C291絶縁層であり、U絶縁層は上記
ハ 電極C27+の形成されていないキャップ層シロ)表面
及び上記溝(5内に形成され、刀)つ5iOz刀\らな
る。
Application Example A preferred example of the application of the present invention is used to separate into pellet units a GaJ'As-based 43 photodiode wafer in which a pn junction is formed between the substrate and the substrate. When the present invention is applied to such '1NIt, the groove width can be made smaller and separation is possible, so the effective area ratio of the pellet obtained from one sea urchin becomes larger. As shown in Fig. 2, it is used to form grooves for narrowing grooves in semiconductor lasers. 211 in the diagram
is an n-type GaAs substrate, +721 is an oscillation layer laminated on the substrate, and the oscillation layer consists of an active layer Q, (l) and a second cladding layer f2111251 sandwiching the active layer. Such an active layer (231 and the first and second cladding layers (lrht2511d GaAlAs yarn material collar 71 iJ, first and second cladding layers 124+
1251 is an active cycle), the bandgap is human.
type and P type. C26) is a cap layer made of P-type GaAS formed on the oscillation layer (221), and the opening is an ohmic electrode formed on the cap layer, and the electrode is a stripe extending in the direction perpendicular to the plane of the paper. T shape t,
f281 is a groove provided on both sides of the electrode C2L,
The groove reaches the second cladding layer. The C291 insulating layer is an insulating layer, and the U insulating layer consists of the surface of the cap layer on which the electrode C27+ is not formed, and the groove (formed inside the cap layer 5).

斯る半導体レーザではR1滲及び絶縁層6により電極(
27)より印加される磁流が狭窄されるため活性層I2
31において高効率のレーザ発振が得られる。
In such a semiconductor laser, the electrode (
27) Since the applied magnetic current is constricted, the active layer I2
Highly efficient laser oscillation can be obtained at 31.

また、−上記溝12&は電極(z7)をマスクとして溝
幅の、小なるものが得られるので斯る溝ケ埋込むための
5iOzの箪も少なくなる。
Further, since the trench 12 & described above can be made smaller in width using the electrode (z7) as a mask, the amount of 5 iOz trench needed to fill the trench is reduced.

く効  東〉 jヅ上の説明から明らかな如く、本発明によれば幅が小
で深さが大である溝が簡単に得られるのでペレットの分
離等に応用して効果が人となる。
As is clear from the above description, according to the present invention, grooves with a small width and a large depth can be easily obtained, so that the present invention can be applied to separation of pellets, etc., and is very effective.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図乃至第6図は従来例7示す断面図、第4図及び第
5図は本発明の実施例を示す断面図、第6図は本発明の
一応用例乞示す断面図である。 旧]・・・基板、  0帽・・マスク、 (131・・
・溝第1図 j 第3図 第5図 第2図 第4図 Ie? 第6図 135−
1 to 6 are cross-sectional views showing a conventional example 7, FIGS. 4 and 5 are cross-sectional views showing an embodiment of the present invention, and FIG. 6 is a cross-sectional view showing an example of an application of the present invention. old]... board, 0 cap... mask, (131...
・Groove Fig. 1j Fig. 3 Fig. 5 Fig. 2 Fig. 4 Ie? Figure 6 135-

Claims (1)

【特許請求の範囲】[Claims] Ill  G a A I A s系単結晶拐料からな
る基板上に将来形成される溝の一端に沿い形成されると
共に少なくとも上記基板と熱膨張係数が異なる材料から
fIるマスクが形成される工程、上記マスクが形成され
た基板?アンモニアー過酸化水素水系の溶液ζ二浸漬T
ることを特徴とするエツチング方法
a step of forming a mask along one end of a groove to be formed in the future on a substrate made of IllGaAIAs single crystal nanocrystalline material, and made of a material having a coefficient of thermal expansion at least different from that of the substrate; The substrate on which the above mask was formed? Ammonia hydrogen peroxide solution ζ2 immersion T
An etching method characterized by
JP57180775A 1982-10-14 1982-10-14 Etching method Pending JPS5969934A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57180775A JPS5969934A (en) 1982-10-14 1982-10-14 Etching method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57180775A JPS5969934A (en) 1982-10-14 1982-10-14 Etching method

Publications (1)

Publication Number Publication Date
JPS5969934A true JPS5969934A (en) 1984-04-20

Family

ID=16089106

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57180775A Pending JPS5969934A (en) 1982-10-14 1982-10-14 Etching method

Country Status (1)

Country Link
JP (1) JPS5969934A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5168771A (en) * 1974-12-11 1976-06-14 Matsushita Electric Industrial Co Ltd Heterokozohandotaino sentakufushokuhoho

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5168771A (en) * 1974-12-11 1976-06-14 Matsushita Electric Industrial Co Ltd Heterokozohandotaino sentakufushokuhoho

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