JPS60143731A - Temperature detecting apparatus - Google Patents
Temperature detecting apparatusInfo
- Publication number
- JPS60143731A JPS60143731A JP58251330A JP25133083A JPS60143731A JP S60143731 A JPS60143731 A JP S60143731A JP 58251330 A JP58251330 A JP 58251330A JP 25133083 A JP25133083 A JP 25133083A JP S60143731 A JPS60143731 A JP S60143731A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- thermistors
- thermistor
- data
- waveform
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
- G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、複数個のサーミスタを有する温度検知装置に
関するものである。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a temperature sensing device having a plurality of thermistors.
従来例の構成とその問題点
従来、複数個のサーミスタを有する温度検知装置におい
て、その温度検知方法は、第1図に示す抵抗値と抵抗R
A−RB−により分圧された電圧vaあるいはvbと、
温度スキャン発生装置3より構成された階段波形との比
較により、サーミスタからの情報を、温度データとして
検知するものであるが、サーミスタを、複数個有する場
合には、それぞれのサーミスタに関して、温度データ信
号を形成するために抵抗RA−RBが必要であり、比較
装置4もサーミスタの個数だけ必要であった。同様に、
これらセンサデータを解析し実質的な温度認識を行なう
解析装置もセンサーの個数だけ必要であった。Configuration of conventional example and its problems Conventionally, in a temperature sensing device having a plurality of thermistors, the temperature sensing method is based on the resistance value and resistance R shown in Fig. 1.
A voltage va or vb divided by A-RB-,
The information from the thermistor is detected as temperature data by comparing it with the staircase waveform formed by the temperature scan generator 3. However, if there are multiple thermistors, the temperature data signal for each thermistor is detected. The resistors RA-RB were required to form the same number of comparators 4 as the thermistors. Similarly,
Analyzers for analyzing these sensor data and performing actual temperature recognition were also required for the same number of sensors.
しだがってこのような方法では、部品数がセンサの数が
増えれば、その数だけ必要となる。また、回路7溝成は
、センサが同じであるならば、同一の回路がセンサーの
数だけ存在することになり、非常に無駄な回路構成であ
ることがよくわかる。また、同じ回路が複数個存在する
ということは、それぞれが持つ、誤差、ばらつきという
ものが、検知データに非常に大きな影響を与えることに
なり、信頼性の面からも間頚であAへ
発明の目的
そこで本発明は、上記従来の問題点を解消し、一つの基
本回路構成だけにより、複数個の温度検知装置からのデ
ータを検知することにより、部品数の減少と、温度検知
の精度向上をはかることを目的とするものである。Therefore, in this method, as the number of sensors increases, the number of components required increases. Furthermore, it is clear that the seven-channel circuit configuration is a very wasteful circuit configuration because if the sensors are the same, there will be as many identical circuits as there are sensors. In addition, the presence of multiple identical circuits means that the errors and variations in each circuit have a very large effect on the detected data, and from the standpoint of reliability, it is difficult to invent A. Therefore, the present invention solves the above conventional problems and detects data from multiple temperature detection devices using only one basic circuit configuration, thereby reducing the number of parts and improving the accuracy of temperature detection. The purpose is to measure the
発明の構成
この目的を達成するだめに本発明は、複数個の感温抵抗
素子を有する温度検知装置において、これら複数個の感
温抵抗素子を実際的な温度判断を行なう、1組の温度ス
キャン発生装置、比較装置。SUMMARY OF THE INVENTION In order to achieve this object, the present invention provides a temperature sensing device having a plurality of temperature-sensitive resistance elements, and a set of temperature scans for making practical temperature judgments of the plurality of temperature-sensitive resistance elements. Generator, comparison device.
解析装置とに、時分割で選択、切換を行なわせる切換装
置を設けたものである。The analysis device is provided with a switching device that allows selection and switching to be performed on a time-sharing basis.
この構成により、一つの基本回路構成だけで、複数個の
感温抵抗素子からのデータを検知することが可能となり
、部品数の減少と、同じ回路での判断を行なえることに
より、温度検知の精度向上がはかれることになる。This configuration makes it possible to detect data from multiple temperature-sensitive resistive elements with just one basic circuit configuration, reducing the number of components and making decisions using the same circuit. Accuracy will be improved.
実施例の説明
以下、本発明をその一実施例を示す添付図面を参考に説
明する。DESCRIPTION OF EMBODIMENTS The present invention will now be described with reference to the accompanying drawings showing one embodiment thereof.
第2図、第3図において、サーミスタの温度変化に対応
した抵抗値の増減により、基準電圧レベルの変化により
温度変化をとらえることが可能なサーミスタ装置は、抵
抗RA−RB及びサーミスターa、1b より構成され
ており、サーミスタの変−化に対応してV の電圧レベ
ルが変化することになる。またこの2つのサーミスタは
基本回路であるRA−RBを共用化しているため、時分
割な検知方法をとることになる、すなわち、切換装置に
より2つのサーミスタの一方しかつながないようにして
あり、この動作を第4図R1・R2のような信号を与え
ることにより、一定周期で繰り返している。またこの動
作タイミングは、温度スキャン波形の一周明と同期させ
てあり、vpの温度データである電圧は、このタイミン
グにのって電圧波形を構成している。In Figures 2 and 3, the thermistor devices that can detect temperature changes from changes in the reference voltage level by increasing or decreasing the resistance value corresponding to the temperature changes of the thermistors are resistors RA-RB and thermistors a and 1b. The voltage level of V changes in response to changes in the thermistor. In addition, since these two thermistors share the basic circuit RA-RB, a time-sharing detection method is used.In other words, a switching device is used to connect only one of the two thermistors. The operation is repeated at regular intervals by applying signals such as R1 and R2 in FIG. Further, this operation timing is synchronized with one round of the temperature scan waveform, and the voltage that is the temperature data of vp forms a voltage waveform based on this timing.
これを比較装置4のコンパレータの一方に入力する。ま
たもう一方には、温度スキャン発生装置より抵抗を介し
て、第4回置度スキャン波形の階段波形が入力される。This is input to one of the comparators of the comparing device 4. On the other hand, a staircase waveform of the fourth rotational degree scan waveform is inputted from the temperature scan generator via a resistor.
この階段レベルは、サーミスタよりの温度データに対応
しており、レベルの大・小により、コンパレータ4より
の出力波形のデータが異ってくる。第4図の11 は、
コンノ(レータ4の出力波形であるが、サーミスタ1a
、1bのそれぞれのデータは、T領域の中のtl及びt
2のHi時間データとして変換されており、これら情報
を、解析装置に入力し、データを読み取るものである。This staircase level corresponds to the temperature data from the thermistor, and the output waveform data from the comparator 4 differs depending on the level. 11 in Figure 4 is
This is the output waveform of controller 4, but thermistor 1a
, 1b are tl and t in the T area.
This information is input into an analysis device and read out.
この方法であれば、サーミスタの数が複数個ある場合で
も、基本的な温度検知のだめの回路構成は1つで済み、
同一の回路構成を、サーミスタの数だけ必要とした従来
例のように、各サーミスタに対応した入力ボート(解析
装置)も共用化でき、非常に合理的であり、部品数も少
なくて済み、コスト的にも安価になることがわかり、利
用価値は大なるものである。With this method, even if there are multiple thermistors, only one basic temperature detection circuit configuration is required.
Unlike the conventional case where the same circuit configuration is required for the number of thermistors, the input board (analysis device) corresponding to each thermistor can also be shared, which is very rational and reduces the number of parts, reducing costs. It turns out that it is also inexpensive, and its utility value is great.
発明の効果
上記実施例より明らかなように本発明は、複数tFIA
I7″1廿−タストを曲分制で遺釈、切換を行なう切換
装置を設けた温度検知装置において、温度検知を行なう
基本的な回路構成を、サーミスタの数に関係なく1つで
済ますことが可能となり、大幅な部品数の減少が出来る
他、温度検知を基本的な同一の回路構成で行なうため、
複数の回路構成がもつ相互間の誤差、ばらつきがなくな
り、より精度の高い検知が可能となり、利用価値は大な
るも図は同温度検出装置のタイミングチャートである。Effects of the Invention As is clear from the above embodiments, the present invention has multiple tFIA
In a temperature detection device equipped with a switching device that changes and switches the I7''1-taste in a curved manner, the basic circuit configuration for temperature detection can be completed with just one thermistor regardless of the number of thermistors. In addition to significantly reducing the number of parts, temperature detection is performed using the same basic circuit configuration.
Errors and variations between multiple circuit configurations are eliminated, and more accurate detection is possible, which has great utility value. The figure is a timing chart of the same temperature detection device.
1a、1b・・・・・・サーミスタ、2・・・・・・切
換装置、3・・・・・・温度スキャン発生装置、4・・
・・・・比較装置、5・・・・・解析装置。1a, 1b...Thermistor, 2...Switching device, 3...Temperature scan generator, 4...
... Comparison device, 5... Analysis device.
Claims (1)
のサーミスタを時分割で選択、切換を行なう切換装置と
、温度を電圧波形で構成した7階段波形を発生する温度
スキャン発生装置と、この階段波形とセンサ装置より電
圧変換された温度データとを比較する比較装置と、この
時分割された複数個のサーミスタの比較データより温度
を検知する解析装置とより構成した温度検知装置。A sensor device having a plurality of thermistors, a switching device that selects and switches the plurality of thermistors in a time-sharing manner, a temperature scan generator that generates a seven-step waveform in which temperature is constituted by a voltage waveform, and A temperature detection device comprising a comparison device that compares temperature data converted into voltage from a sensor device, and an analysis device that detects temperature from the time-divided comparison data of a plurality of thermistors.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58251330A JPS60143731A (en) | 1983-12-29 | 1983-12-29 | Temperature detecting apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58251330A JPS60143731A (en) | 1983-12-29 | 1983-12-29 | Temperature detecting apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS60143731A true JPS60143731A (en) | 1985-07-30 |
Family
ID=17221208
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58251330A Pending JPS60143731A (en) | 1983-12-29 | 1983-12-29 | Temperature detecting apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60143731A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61129541A (en) * | 1984-11-28 | 1986-06-17 | Matsushita Electric Ind Co Ltd | temperature detection device |
| US9267848B2 (en) | 2014-01-02 | 2016-02-23 | King Abdullah International Medical Research Center | Thermometer using differential temperature measurements |
-
1983
- 1983-12-29 JP JP58251330A patent/JPS60143731A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61129541A (en) * | 1984-11-28 | 1986-06-17 | Matsushita Electric Ind Co Ltd | temperature detection device |
| US9267848B2 (en) | 2014-01-02 | 2016-02-23 | King Abdullah International Medical Research Center | Thermometer using differential temperature measurements |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Nagarajan et al. | Improved single-element resistive sensor-to-microcontroller interface | |
| KR910010193A (en) | Auto Function Multimeter | |
| JPS63164016U (en) | ||
| CN104198883A (en) | System and method for detecting wire breaks | |
| US6910804B2 (en) | Resistive temperature device (RTD) module with improved noise immunity | |
| US5874790A (en) | Method and apparatus for a plurality of modules to independently read a single sensor | |
| JPS60143731A (en) | Temperature detecting apparatus | |
| SE8403843D0 (en) | DEVICE ON TEMPERATURE SENSOR | |
| JPH04307Y2 (en) | ||
| JP3211020B2 (en) | Displacement detector | |
| JPH0629722Y2 (en) | AE measuring device | |
| JP3469369B2 (en) | Electric measuring instrument | |
| JPH0629683Y2 (en) | Measured electrical signal level sudden change detection device | |
| JPS6353462A (en) | Method and device for detecting stand-by state of oxygen measuring sensor | |
| JPH02304662A (en) | Electronic apparatus | |
| SU1580283A1 (en) | Digital ohmmeter | |
| JPH073352Y2 (en) | Measuring device equipped with an AC voltage source having a waveform control function | |
| JPS62170829A (en) | Temperature detection circuit | |
| JP4130860B2 (en) | Sensor input device | |
| SU777434A1 (en) | Device for registering the process of propagation of cracks | |
| JPS61243328A (en) | Automatic tester for industrial instrument | |
| JPH0673227B2 (en) | Magnetic disk characteristics measuring device | |
| JPS59137867A (en) | Compensation of attenuator | |
| JPS63271171A (en) | Power source diagnostic system | |
| JPH01153912A (en) | Thermal type air flow rate measuring instrument |