JPS60203432A - Manufacture of transparent conductive film - Google Patents

Manufacture of transparent conductive film

Info

Publication number
JPS60203432A
JPS60203432A JP5950584A JP5950584A JPS60203432A JP S60203432 A JPS60203432 A JP S60203432A JP 5950584 A JP5950584 A JP 5950584A JP 5950584 A JP5950584 A JP 5950584A JP S60203432 A JPS60203432 A JP S60203432A
Authority
JP
Japan
Prior art keywords
conductive film
transparent conductive
film
resin
cured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5950584A
Other languages
Japanese (ja)
Other versions
JPS6332617B2 (en
Inventor
順二 田中
平野 久一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Bakelite Co Ltd
Original Assignee
Sumitomo Bakelite Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Bakelite Co Ltd filed Critical Sumitomo Bakelite Co Ltd
Priority to JP5950584A priority Critical patent/JPS60203432A/en
Publication of JPS60203432A publication Critical patent/JPS60203432A/en
Publication of JPS6332617B2 publication Critical patent/JPS6332617B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Laminated Bodies (AREA)
  • Physical Vapour Deposition (AREA)
  • Non-Insulated Conductors (AREA)
  • Manufacturing Of Electric Cables (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は高分子に酸化インジウムを主体とする金属導電
膜を付与した液晶用透明′成極に用いる透明導電フィル
ムの製造方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for producing a transparent conductive film used for transparent polarization for liquid crystals, in which a metal conductive film mainly composed of indium oxide is provided on a polymer.

従来、透明導電フィルムは、主にポリエステルフィルム
tベースとし、エレクトロルミネッセンスディスプレイ
やエレクトロクロミックディスプレイの透明電極、ディ
フロスタ、透明ヒータ等の面発熱体やタッチパネル等の
面スィッチ、赤外線反射膜及び透明7レキシプル回路板
等に広く用いられているが、最近は液晶表示素子への適
用も検討されている。これは、フィルム状の電極tf用
することにより、素子を薄型化できること、又生産工程
において取り扱い易く、打抜き加工等も可・。
Conventionally, transparent conductive films are mainly based on polyester films, and are used for transparent electrodes in electroluminescent displays and electrochromic displays, surface heating elements such as defrosters and transparent heaters, surface switches such as touch panels, infrared reflective films, and transparent 7 lexiple circuits. Although it is widely used for plates, etc., its application to liquid crystal display elements is also being considered recently. This is because the device can be made thinner by using a film-like electrode tf, and it is easy to handle in the production process and can be processed by punching.

能であり、フィルム状素材から連続生産が可能であると
いう特徴tもっている。
It has the characteristics of being able to be produced continuously from film-like materials.

透明導電性フィルムは篩分子フィルム上に真空蒸着法、
イオンブレーティング法らるいはスパッタリング法にて
導電膜全形成することによって作製する。導電膜として
はインジウムを主成分とする酸化Wを用いる場合が多い
が、高導電性の他に高透明性が要求されることから、膜
厚會薄くする場合が多い。このため機械的強度に乏しく
、また耐薬品性にも問題が生じる。透明導電性フィルム
の刀ロエ工程に2いては傷による断線を防止するため耐
擦過傷注又、細線回路を形成する際に用いるしシスト剥
離液であるアルカリによって生じるクラックが断線の原
因となるため耐アルカリ性という性能が要求でれ、これ
らの対策が必要でめる。
The transparent conductive film is made by vacuum deposition method on the sieve molecular film.
It is manufactured by completely forming a conductive film using an ion blasting method or a sputtering method. W oxide containing indium as a main component is often used as the conductive film, but since high transparency is required in addition to high conductivity, the film thickness is often made thin. For this reason, it lacks mechanical strength and also has problems with chemical resistance. In order to prevent wire breakage due to scratches in the transparent conductive film manufacturing process, scratch resistance is required (Note) and cracks caused by the alkaline cyst-removal liquid used to form thin wire circuits can cause wire breakage. Since alkaline performance is required, these measures are necessary.

従来、この耐擦過傷性、耐アルカリ性という2つの性能
に関してはアンダーコート層及びトップコート層を付与
することにより改善してきた。アンダーコート層及びト
ップコート層のいずれかのみでは、充分な性能が得られ
ず、両方行う必要がある。しかし、この点に関しては製
造工程の複雑化を招くとともにコスト高になるため好ま
しくない。さらにトップコートに関しては脆弱な無機薄
膜上にコーティング?するという技術的に困難な問題を
かかえている。
Conventionally, the two properties of scratch resistance and alkali resistance have been improved by providing an undercoat layer and a topcoat layer. Sufficient performance cannot be obtained with either the undercoat layer or the topcoat layer alone, and it is necessary to perform both. However, this is not preferable because it complicates the manufacturing process and increases costs. Furthermore, regarding the top coat, is it coated on a fragile inorganic thin film? We are facing a technically difficult problem.

本発明者らは、この点に関して鋭意検討した結果、アン
ダーコート材として熱硬化型樹脂を用い、あらかじめ低
い硬化状態にて透明導電膜?形成し、その後再加熱する
と、透明導電膜がアンダーコート内に一部もしくは完全
に包埋された状態で硬化反応が終了することt見出した
。このような状態においては、アンダーコート樹脂中に
透明導電膜が包埋固定化されているため、従来の製法で
は得られなかった耐擦過傷性、耐アルカリ性などの加工
性にすぐれた安定した透明導電性フィルムとなる。以下
その製造方法について詳細に述べる。
As a result of intensive study on this point, the inventors of the present invention found that using a thermosetting resin as an undercoat material, a transparent conductive film was prepared in a low cured state in advance. It has been found that when the transparent conductive film is formed and then reheated, the curing reaction is completed with the transparent conductive film partially or completely embedded in the undercoat. In such a state, the transparent conductive film is embedded and fixed in the undercoat resin, resulting in stable transparent conductivity with excellent processability such as scratch resistance and alkali resistance that could not be obtained with conventional manufacturing methods. It becomes a sexual film. The manufacturing method will be described in detail below.

アンダーコート材としては基材フィルムとの密着性があ
る熱硬化型樹脂を用いる。この場合、熱以外にも紫外線
照射、放射線照射等によっても硬化可能なものが好まし
い。これは基材フィルムにコーティングし前硬化させる
が、この段階全紫外線硬化等で行い工程時間の短縮が行
えるからである。この段階での前硬化には、以下の作業
工程においての取り扱いを容易にする目的と、導電膜形
成時の真空中でのガス放出を避ける目的がある。
As the undercoat material, a thermosetting resin that has adhesive properties with the base film is used. In this case, it is preferable to use a material that can be cured not only by heat but also by ultraviolet irradiation, radiation irradiation, etc. This is because the base film is coated and pre-cured, and the process time can be shortened by performing full ultraviolet curing at this stage. The precuring at this stage has two purposes: to facilitate handling in the following work steps, and to avoid gas release in vacuum during formation of the conductive film.

すなわち導電膜の形成はプラスチック基板を用いる場合
、真空蒸着法、イオンブレーティング法又はスパッタリ
ング法のいずれかで行う。これらはいずれも真空中で行
う物理的成膜法であり、基板からの放出ガスは膜質に悪
影響を及ぼす場合が多い。しかし、この段階で前硬化反
応が進みすぎると、導電膜形成後に加熱しても透明導電
膜が包埋されず、目的とする性能を持った透明導電性フ
ィルムは製造できない。前硬化をどの程度行うかは、ア
ンダーコート材の反応速度、ガラス転移温度、揮発成分
賞等によって大きく異なり、−概には言えないが、硬化
反応率が70%’に越えると目的とする透明導電性フィ
ルムの製造はどの熱硬化型樹脂tアンダーコート材とし
ても不可能である。また前硬化の硬化反応率が80%以
下であると、透明導電膜の形成が著しく阻災される。前
硬化の硬化反応率が50〜70%でめることが望ましい
That is, when a plastic substrate is used, the conductive film is formed by vacuum evaporation, ion blasting, or sputtering. These are all physical film forming methods performed in a vacuum, and gas released from the substrate often has a negative effect on film quality. However, if the precuring reaction progresses too much at this stage, the transparent conductive film will not be embedded even if heated after the conductive film is formed, and a transparent conductive film with the desired performance cannot be manufactured. The extent to which pre-curing is carried out varies greatly depending on the reaction rate, glass transition temperature, volatile component ratio, etc. of the undercoat material, and although it cannot be generalized, if the curing reaction rate exceeds 70%, the desired transparency It is not possible to produce a conductive film using any thermosetting resin undercoat material. Furthermore, if the curing reaction rate of the pre-curing is 80% or less, the formation of a transparent conductive film is significantly hindered. It is desirable that the curing reaction rate of the pre-curing is 50 to 70%.

ここで、硬化反応率は溶剤抽出によって検出される未反
応モノマーW1原材料WOとした時アンダーコート材と
しては、アクリル樹脂、メラミン樹月旨、フェノール樹
りl旨、エポキシ樹脂など各種、sP4硬化型樹脂が使
用できる。ただし、完全硬化した場合の硬度がJIS 
K−5400に従い鉛筆硬度で2H〜5Hのものでなけ
ればならない。2H以下であれば耐擦過傷性が不良とな
り、5H以上ならばアンダーコート材の硬化の際のスト
レスが導′1膜にかかるため高抵抗化するからである。
Here, the curing reaction rate is the unreacted monomer detected by solvent extraction, W1, raw material WO, and undercoating materials such as acrylic resin, melamine resin, phenol resin, epoxy resin, etc., and sP4 curing type. Resin can be used. However, the hardness when fully cured is JIS
It must have a pencil hardness of 2H to 5H according to K-5400. If it is less than 2H, the scratch resistance will be poor, and if it is more than 5H, stress will be applied to the conductive film during curing of the undercoat material, resulting in high resistance.

基材のプラスチックフィルムはアンダーコート材の反応
温度より高い耐熱性?持つことが必要である。
Does the base plastic film have a higher heat resistance than the reaction temperature of the undercoat material? It is necessary to have it.

前記のアンダーコーティング材tコーティングしたプラ
スチック基板に真空蒸着法、イオンブレーティング法あ
るいはスパッタリング法にて導゛は換金形成した後、加
熱し後硬化全行う。
A conductive layer is formed on the plastic substrate coated with the above-mentioned undercoating material by vacuum evaporation, ion blasting or sputtering, followed by heating and post-hardening.

以下本発明の実施例について示す。Examples of the present invention will be shown below.

実施例1 基材として厚さ100μmのポリエーテルサルフオンフ
ィルム金用いた。このフィルムにコーティング樹脂とし
て熱及び紫外線によって硬化するアクリル系樹脂ケ厚さ
5μmとなるようにコーティングし、前硬化で硬化反応
率が60チまで硬化式せた。
Example 1 A polyether sulfon film gold having a thickness of 100 μm was used as a base material. This film was coated with an acrylic resin that is cured by heat and ultraviolet light as a coating resin to a thickness of 5 μm, and pre-cured to a curing reaction rate of 60 inches.

この樹脂は、紫外線により迅速に硬化するため非常に作
業性にすぐれている。このアクリル系樹脂は完全硬化す
ると鉛筆硬度で4Hのものt用いた。
This resin has excellent workability because it cures quickly with ultraviolet light. This acrylic resin had a pencil hardness of 4H when completely cured.

このようにアンダーコートを行っり後に、スノくツタリ
ング法によって導電膜全形成した。条件はマグネトロン
型スパッタリング装置を用い、酸素を1.5 vo 1
%言有するアルゴンを系内に導入し付着速度180人/
fninで行った。
After undercoating in this manner, a conductive film was entirely formed by the snot tuttering method. The conditions were to use a magnetron type sputtering device and to use oxygen at 1.5 vo 1.
By introducing argon into the system, the adhesion rate was 180 people/
I went with fnin.

膜厚は450人とした。これ全加熱し硬化反応全終了ぢ
ぜた。このようにして得られた透明導電フィルムはシー
ト抵抗が2800為で、可視光線の透過率が82%のも
のでめった。耐擦過傷性の評価は荷重を刀)けたガーゼ
で数回こするという方法にて行った。耐アルカリ性の評
価は10%の水酸化ナトリウムに5分間浸漬するという
方法にて行った。
The film thickness was set at 450 people. This was completely heated and the curing reaction was completed. The transparent conductive film thus obtained had a sheet resistance of 2800 and a visible light transmittance of 82%. Abrasion resistance was evaluated by rubbing the sample several times with gauze that had been applied with a load. The alkali resistance was evaluated by immersing the sample in 10% sodium hydroxide for 5 minutes.

いずれの試験を行っても抵抗値の変化はほとんどなく良
好であった。尚、比較例として以下の検討全行った。
No matter which test was conducted, there was almost no change in resistance value and the results were good. In addition, all of the following studies were conducted as a comparative example.

比較例1 100μmのポリエーテルサルホンフィルムtアンダー
コートせずに実施例と同一条件で導電膜を形成した。こ
の場合抵抗値が600Ω1つとなり耐擦過傷性、耐アル
カリ性が不良でめった。
Comparative Example 1 A conductive film was formed under the same conditions as in Example without undercoating a 100 μm polyether sulfone film. In this case, the resistance value was 600Ω, which resulted in poor scratch resistance and alkali resistance.

比較例2 実施例1とコーティングw脂として同じ樹脂を前硬化で
硬化反応率90チとしたものについて以下実施例と同一
条件で透明導電性フィルム金作製した。この場合耐擦過
傷性、耐アルカリ性が不良でめった。
Comparative Example 2 A transparent conductive film was produced using the same resin as in Example 1 as the coating w resin, but with a curing reaction rate of 90% by pre-curing, under the same conditions as in the Example. In this case, the scratch resistance and alkali resistance were poor and it was unsuccessful.

比較例8 コーティング樹脂として完全硬化した場合、鉛筆硬度7
Hまで達するアクリル系樹脂ケ用いて実施例と同一条件
にて透明導電性フィルムを作製した。この場合シート抵
抗が2000Ωんとなった。
Comparative Example 8 When completely cured as coating resin, pencil hardness is 7
A transparent conductive film was produced using an acrylic resin having a temperature of up to H under the same conditions as in the example. In this case, the sheet resistance was 2000Ω.

比較例4 コーティング樹脂として完全硬化しfc場合、鉛g&硬
度IHのアクリル系樹脂を用い、実施例1と同様の条件
にて透明電導性フィルム?作製した。
Comparative Example 4 In the case of completely curing FC as a coating resin, a transparent conductive film was prepared under the same conditions as Example 1 using an acrylic resin with lead g and hardness IH. Created.

この場合、耐擦過傷性が不良となった。In this case, the scratch resistance was poor.

以上の結果t−第1表にまとめたが、この第1表より明
らかなように、不実施例が他の条件で作製さnた透明導
電性フィルムよりすぐれft%注を有することがわかる
The above results are summarized in Table 1, and as is clear from Table 1, it can be seen that the non-examples had a better ft% than the transparent conductive films produced under other conditions.

Claims (1)

【特許請求の範囲】[Claims] (1)尚分子フィルムに熱、紫外線又は放射線照射によ
っても硬化可能な熱硬化m樹脂を片面もしくは両面にコ
ーティングし、該コーティングした樹脂全硬化反応率が
80〜70%まで前硬化させて後インジウムを主成分と
する金属酸化物層を真空蒸着法、イオンブレーティング
法あるいはスパッタリング法で形成した後、〃p熱しコ
ーティング層中に金ll4IR化物層?一部もしくは完
全に包埋きせるとともに硬化反応?終了させることt%
徴とする透明導電性フィルムの製造方法。
(1) The molecular film is coated on one or both sides with a thermosetting resin that can be cured by heat, ultraviolet rays, or radiation, and the coated resin is precured to a total curing reaction rate of 80 to 70%, and then indium is cured. After forming a metal oxide layer containing as the main component by vacuum evaporation, ion blating or sputtering, it is heated to form a gold IR compound layer in the coating layer. Partial or complete embedding and curing reaction? Terminating t%
A method for producing a transparent conductive film.
JP5950584A 1984-03-29 1984-03-29 Manufacture of transparent conductive film Granted JPS60203432A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5950584A JPS60203432A (en) 1984-03-29 1984-03-29 Manufacture of transparent conductive film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5950584A JPS60203432A (en) 1984-03-29 1984-03-29 Manufacture of transparent conductive film

Publications (2)

Publication Number Publication Date
JPS60203432A true JPS60203432A (en) 1985-10-15
JPS6332617B2 JPS6332617B2 (en) 1988-06-30

Family

ID=13115186

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5950584A Granted JPS60203432A (en) 1984-03-29 1984-03-29 Manufacture of transparent conductive film

Country Status (1)

Country Link
JP (1) JPS60203432A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6319708A (en) * 1986-07-10 1988-01-27 東レ株式会社 Transparent conducting film and manufacture thereof
JPS6471003A (en) * 1987-09-10 1989-03-16 Fuji Photo Film Co Ltd Transparent conductive film

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4624894B2 (en) * 2005-09-16 2011-02-02 大日本印刷株式会社 Gas barrier structure and method for producing the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6319708A (en) * 1986-07-10 1988-01-27 東レ株式会社 Transparent conducting film and manufacture thereof
JPS6471003A (en) * 1987-09-10 1989-03-16 Fuji Photo Film Co Ltd Transparent conductive film

Also Published As

Publication number Publication date
JPS6332617B2 (en) 1988-06-30

Similar Documents

Publication Publication Date Title
JP3819927B2 (en) Transparent conductive film
US20130186548A1 (en) Method for producing laminated film
JP2003151358A (en) Transparent conductive film and touch panel
CN109313963B (en) Transparent conductive film and touch panel
JP2002316378A (en) Transparent conductive laminate and touch panel using the same
JPS60203432A (en) Manufacture of transparent conductive film
JP3983580B2 (en) Transparent conductive film for touch panel
JP3204356B2 (en) Transparent conductive film
JPH11174424A (en) Substrate for liquid crystal display panel
JPS60255969A (en) Manufacture of electrically conductive transparent film
JPS63906A (en) Transparent conducting film
JP2003115221A (en) Transparent conductive film and touch panel
JPH09254303A (en) Transparent conductive film
JPH08294989A (en) Laminate film
JPH0499620A (en) Laminated film
JP2004306586A (en) Manufacturing process of plastic sheet for display panel
JP5076267B2 (en) Polymer sheet manufacturing method and display element substrate using the same
JP2000319422A (en) Laminated film and liquid crystal display device using the same
JPH0449724B2 (en)
JPH09262926A (en) Transparent conductive laminate for touch panel and method of manufacturing the same
JP3397547B2 (en) Resistive transparent touch panel
JPH09174747A (en) Transparent conductive film
JP2003080637A (en) Method for producing polymer sheet and display element substrate using the same
JP5883085B2 (en) Manufacturing method of transparent substrate
JPH09277426A (en) Transparent conductive film and method for producing the same