JPS61149339U - - Google Patents
Info
- Publication number
- JPS61149339U JPS61149339U JP3250585U JP3250585U JPS61149339U JP S61149339 U JPS61149339 U JP S61149339U JP 3250585 U JP3250585 U JP 3250585U JP 3250585 U JP3250585 U JP 3250585U JP S61149339 U JPS61149339 U JP S61149339U
- Authority
- JP
- Japan
- Prior art keywords
- reading device
- automatic
- semiconductor wafer
- storage means
- wafer prober
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 9
- 238000003384 imaging method Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3250585U JPS61149339U (da) | 1985-03-07 | 1985-03-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3250585U JPS61149339U (da) | 1985-03-07 | 1985-03-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61149339U true JPS61149339U (da) | 1986-09-16 |
Family
ID=30534080
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3250585U Pending JPS61149339U (da) | 1985-03-07 | 1985-03-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61149339U (da) |
-
1985
- 1985-03-07 JP JP3250585U patent/JPS61149339U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4780670A (en) | Active probe card for high resolution/low noise wafer level testing | |
| US5086270A (en) | Probe apparatus | |
| JPS61149339U (da) | ||
| JPS6276273A (ja) | Icソケツト | |
| JPS6276274A (ja) | Icソケツト | |
| JPS63114229A (ja) | プロ−ブ装置 | |
| JPH02119235A (ja) | プローブ装置 | |
| JP2541191Y2 (ja) | フローティングガイド付きハンドラ用キャリア | |
| JPH01169031U (da) | ||
| JP2583781B2 (ja) | プローブカード及びプローブ装置 | |
| JPS612080A (ja) | プロ−ブ装置及びプロ−ブカ−ド | |
| JPH0328772A (ja) | 半導体ウエハ測定用プローブカード収納ケース | |
| JPH0697242A (ja) | プローブ装置 | |
| JPH02130477A (ja) | プローピング方式 | |
| JP3052874B2 (ja) | Bga型半導体装置のプローブ装置 | |
| JPS60129677U (ja) | 集積回路用テストボ−ド | |
| JPS59148251U (ja) | ウエハプロ−バの測定針研磨装置 | |
| JPH0342682Y2 (da) | ||
| JPS58169924A (ja) | Icウエハの試験装置 | |
| JPS59173338U (ja) | 半導体ウエハの検査装置 | |
| JPS6196544U (da) | ||
| JPH01181432A (ja) | ウエハプローバ | |
| JPS62119934A (ja) | 半導体ウエ−ハのチツプ検査方法 | |
| JPS60144237U (ja) | 半導体装置の検査装置 | |
| JPS6132968U (ja) | テストプロ−ブカ−ド |