JPS6237953A - Manufacture of lead frame - Google Patents
Manufacture of lead frameInfo
- Publication number
- JPS6237953A JPS6237953A JP17737085A JP17737085A JPS6237953A JP S6237953 A JPS6237953 A JP S6237953A JP 17737085 A JP17737085 A JP 17737085A JP 17737085 A JP17737085 A JP 17737085A JP S6237953 A JPS6237953 A JP S6237953A
- Authority
- JP
- Japan
- Prior art keywords
- lead frame
- manufacturing
- manufacture
- etching
- cleaning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Lead Frames For Integrated Circuits (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は特にリードフレームの表面にアルミニウム皮膜
を蒸着(以下A1蒸着と略記する)する一般に、半導体
デバイス等に用いるり一1′フレームの製造方法におい
てフォトエツチングによって形状加工されたリードフレ
ームの表面にワイヤボンディングを良好にするためアル
ミニウム皮1%を蒸着するようにしたリードフレームの
製造人θには知られている。DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field) The present invention is particularly applicable to the production of 1' frames used in semiconductor devices, etc., in which an aluminum film is deposited on the surface of a lead frame (hereinafter abbreviated as A1 deposition). It is known from a lead frame manufacturer θ that in a method, 1% aluminum skin is deposited on the surface of a lead frame shaped by photoetching to improve wire bonding.
このようなり−1フレームの製造方法についてさらに詳
細に説明すると、先ず、フォトエツチング処理は次のよ
うに行う。例えば板厚0.25mmの42アロイ材の平
板を用意し、この平板の表面を跣lγ1するとともにレ
ジスl−股の塗布、乾燥を行い、さらにリードフレーム
パターンの焼付け、現像等の処理を行う。このl&塩化
第二鉄液を主成分とする腐蝕液でエツチングを行い、水
洗い、レジスl−膜の剥離、純水洗い等を経て水切り乾
燥を行う。To explain in more detail the method for manufacturing the -1 frame, first, the photo-etching process is performed as follows. For example, a flat plate of 42 alloy material with a thickness of 0.25 mm is prepared, and the surface of this flat plate is rolled over, a resist layer is coated and dried, and a lead frame pattern is baked and developed. Etching is performed with an etchant containing this l&ferric chloride solution as a main component, washing with water, peeling off the resist l-film, washing with pure water, etc., followed by draining and drying.
そして、このようにして得たリードフレームへワイヤボ
ンディングエリアを含むゼ・要な部分に、Al蒸着を行
うための基板(冶具)を取付け、真空蒸着法、スパッタ
リング法等の成欣法によりA7!蒸着を行う。Then, a substrate (jig) for performing Al vapor deposition is attached to the main parts of the lead frame obtained in this way, including the wire bonding area, and A7! Perform vapor deposition.
(発明が解決しようとする問題点)
しかし、上述した従来におけるリードフレームの製造方
法は次のような問題点がある。(Problems to be Solved by the Invention) However, the conventional lead frame manufacturing method described above has the following problems.
つまり、フォトエツチングにより形4ノJ加−Fされた
リート”フレームの表面はウェソEプロセスであるため
エツチング液、レタスl−111剥1i1i11液等に
直接触れており、異物等が残留する。これを除去するた
め各工程ごとに、洗浄、さらには純水洗い等を行ってい
る。In other words, the surface of the LEET frame, which has been subjected to photoetching into the shape 4J-F, is in direct contact with the etching solution, lettuce peeling liquid, etc. due to the WesoE process, and foreign matter remains. In order to remove these substances, cleaning and further washing with pure water are performed after each process.
このような洗浄を行っても異物等の残留は完全に除去で
きず、水洗いの場合、洗浄時間や乾燥方法等の条件によ
って錆等の変質(変色)が生じ、また、純水洗いの場合
であっても洗浄水の水りJり時までにリードフレームを
損傷させない配慮から水切り方法が制限され水切りが部
分的に不完全になりしみ等が生じてしまう。さらにエツ
チング時に生ずる微小ピンホール等の四部には液溜りや
異物の残留が生し7、これを有効に防止する手段がない
のが実情である。Even if such cleaning is performed, residual foreign matter cannot be completely removed, and when washing with water, deterioration (discoloration) such as rust may occur depending on conditions such as washing time and drying method, and when washing with pure water, However, in order to prevent the lead frame from being damaged by the time the cleaning water is poured, the method of draining is limited, resulting in partially incomplete draining, resulting in stains and the like. Furthermore, liquid pools and foreign matter remain in the microscopic pinholes and the like that occur during etching7, and the reality is that there is no means to effectively prevent this.
なお、このよ・うな問題はリードフレームのように後工
程でAp落着し、しかも高精度、高純度を要求される半
導体装置用部品にとってはアルミニウム皮膜の膨れや密
着不良等の原因となり、半導体デバイス等にとって致命
的な不良を招いてしまう。Incidentally, this kind of problem causes Ap deposits in post-processing, such as lead frames, and causes blistering of the aluminum film and poor adhesion for semiconductor device parts that require high precision and high purity. etc., resulting in fatal defects.
(問題点を解決するための手段)
本発明は」二連した従来の方法における問題点を解決し
たリードフレームの製造方法であり、次の手段によって
達成することができる。(Means for Solving the Problems) The present invention is a lead frame manufacturing method that solves two problems in the conventional methods, and can be achieved by the following means.
つまり、図面に示すようにフォトエツチング工程八によ
って成形(形状加工)したリート−フレームの表面にA
n蒸着工工程にてAffi着を施すようにしたリードフ
レームの製造方法において、上記エツチング液稈AとA
p蒸着Z「程りの間に、高温下の水素を含む雰囲気中に
一定時間リードフレームを放置する浄化工程Bを含むよ
うにしたこと、を特徴とする。In other words, as shown in the drawing, A
In a method for manufacturing a lead frame in which Affi deposition is performed in the vapor deposition process, the etching solution culms A and A are
P vapor deposition Z is characterized by including a cleaning step B in which the lead frame is left in an atmosphere containing hydrogen at high temperature for a certain period of time.
(作用) 次に、本発明の作用について説明する。(effect) Next, the operation of the present invention will be explained.
上述した浄化工程Bにおいて、リードフレームの錆等の
変質は水素による還元作用によで回復され、また付着し
た異物は高温下による燃焼気化によって除去される。こ
の場合トライプロセスのため水分に基づく後発の変質や
異物残留は全くなく完全に浄化することができる。In the above-mentioned purification step B, deterioration such as rust on the lead frame is recovered by the reducing action of hydrogen, and attached foreign matter is removed by combustion and vaporization at high temperatures. In this case, due to the trial process, there is no subsequent deterioration due to moisture or residual foreign matter, and complete purification can be achieved.
(実施例)
以下には本発明に係る好適な実施例を図面に基づき詳述
する。(Example) Hereinafter, preferred embodiments of the present invention will be described in detail based on the drawings.
図面は本発明に係るリードフレームの製造方法の工程図
である。The drawings are process diagrams of a method for manufacturing a lead frame according to the present invention.
なお、図面に示す工程(A)〜(D)はリードフレーム
を製造する主要工程を示しており、この工程中において
特に本発明は浄化工程Bを新に付加又は他の洗浄工程等
と入れ替えてなることを特徴とするものである。Note that the steps (A) to (D) shown in the drawings indicate the main steps for manufacturing a lead frame, and in this process, the present invention particularly adds a cleaning step B or replaces it with another cleaning step, etc. It is characterized by:
次に、同図に従って各工程について順次説明する。Next, each step will be sequentially explained according to the figure.
前述したように、42アロイ材等の平板を洗浄し、レジ
スト膜の塗布、乾燥を行うとともにリードフレームパタ
ーンの焼付け、現像等の処理を行う。As described above, a flat plate made of 42 alloy material or the like is cleaned, a resist film is applied and dried, and a lead frame pattern is baked and developed.
この後、塩化第二鉄液を主成分とする腐食液でエツチン
グし、レジスト皮膜除去、洗浄等を行いリードフレーム
の形状を完成させる。Thereafter, etching is performed with a corrosive solution containing ferric chloride solution as a main component, and the resist film is removed and cleaning is performed to complete the shape of the lead frame.
リードフレームの表面は本発明に従って設けられた浄化
工程によって浄化される。The surface of the lead frame is cleaned by a cleaning process provided in accordance with the present invention.
前述のフォトエツチング工程Aにおける洗浄は完全では
ないがほぼ異物の除去が行われる。しかし微細な残留異
物や表面の変質等は除去できないため本工程Bによって
表面の完全な浄化を行う。Although the cleaning in the photoetching step A described above is not complete, most of the foreign matter is removed. However, since fine residual foreign matter and surface deterioration cannot be removed, the surface is completely cleaned in step B.
本工程Bは下記の条件の雰囲気中にリードフレームを放
置することにより行われる。This step B is carried out by leaving the lead frame in an atmosphere under the following conditions.
温度 :約500℃
時間 ;約 10分
通流ガス
Hバ水素ガス):N、(窒素ガス)−11の混合ガスを
流す。Temperature: Approximately 500° C. Time: Approximately 10 minutes Flowing gas (H hydrogen gas): A mixed gas of N, (nitrogen gas)-11 is flowed.
なお、温度は400℃程度以上であれば十分効果のある
ことが確認された。また通流ガスは混合ガスを用いるこ
とができるし、他の不活性ガスが混入していてもよい。It has been confirmed that a temperature of about 400° C. or higher is sufficiently effective. Further, a mixed gas may be used as the flowing gas, or another inert gas may be mixed therein.
なお、この場合還元作用を行わしめるため酸素の混入は
避けるべきである。In this case, mixing of oxygen should be avoided in order to cause a reduction effect.
上記T稈Bによって表面が浄化されたり一部フレームに
番才A1M着すべきエリアが露出し、他の残部が覆いl
!」されるような所定の基板(治具)に取付けられる。The surface is purified by the above T culm B, and the area where A1M should be attached is exposed on a part of the frame, and the rest is covered.
! It is attached to a predetermined board (jig) such as "
これにより、ワイヤボンディングに必要な領域やガラス
封止等を考慮した必要部分にのみAρ蒸着されるように
する。This ensures that Aρ is deposited only on the necessary areas in consideration of areas necessary for wire bonding, glass sealing, and the like.
[Al!茎着工程D]
り記工程Cにおいて基板により部分的にマスクされたり
一部フレームには真空蒸着法などの成膜性によりA1皮
膜を3μm程度施し、所望のリードフレームを完成する
。[Al! Stem attaching step D] In step C described below, an A1 film of about 3 μm is applied to the frame partially masked by the substrate or to a part of the frame using a film forming method such as a vacuum evaporation method to complete a desired lead frame.
以上、実施例について詳細に説明したが、本発明はこの
ような実施例に限定されるものではなく、細部の構成、
手順、処理方法、数値等において本発明の精神を逸脱し
ない範囲で任意に変更実施することができる。Although the embodiments have been described in detail above, the present invention is not limited to such embodiments, and the detailed configuration,
Any changes may be made in the procedures, processing methods, numerical values, etc. without departing from the spirit of the present invention.
(発明の効果)
このように、本発明に係るリードフレームの製造方法は
フォ1エソチング工程とアルミニうム芸着工程の間に、
高温下の水素を含む雰囲気中に一定時間リードフレーム
を放置する浄化工程を含むようにしてなるため、リード
フレームから異物や変質を完全に除去してアルミニウム
蒸着工程に臨ませることができ、このような異物等に起
因する障害、例えばアルミニウム蒸着皮膜の剥離や膨れ
(密着性不良)、さらにワイヤボンディング不良等の半
導体装W製造工程での致命的不良を著しく減少させるこ
とができる。特にドライプロセスのため、容易に安定し
た処理を行うことができる。(Effects of the Invention) As described above, in the lead frame manufacturing method according to the present invention, between the photolithography process and the aluminum lining process,
Since this process includes a purification process in which the lead frame is left in an atmosphere containing hydrogen at high temperatures for a certain period of time, it is possible to completely remove foreign matter and deterioration from the lead frame before the aluminum deposition process. Failures caused by such problems, such as peeling and blistering of the aluminum vapor deposited film (poor adhesion), and fatal defects in the semiconductor device W manufacturing process such as wire bonding defects can be significantly reduced. In particular, since it is a dry process, stable processing can be easily performed.
図面は本発明に係るリードフレームの製造方法を示す工
程図。
尚図面中、A・・・エソチング工程、
B・・・浄化工程、 D・・・Aρ茎着二1程。The drawings are process diagrams showing a method for manufacturing a lead frame according to the present invention. In addition, in the drawings, A... Esoching process, B... Purification process, D... Aρ stem-attaching process.
Claims (1)
表面にアルミニウム皮膜を蒸着するようにしたリードフ
レームの製造方法において、前記フォトエッチング工程
とアルミニウム蒸着工程の間に、高温下の水素を含む雰
囲気中に一定時間リードフレームを放置する浄化工程を
含むことを特徴とするリードフレームの製造方法。1. In a lead frame manufacturing method in which an aluminum film is deposited on the surface of a lead frame formed by photo-etching, between the photo-etching step and the aluminum vapor deposition step, the lead frame is placed in an atmosphere containing hydrogen at high temperature for a certain period of time. A method for manufacturing a lead frame, comprising a purification step of leaving the lead frame alone.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17737085A JPS6237953A (en) | 1985-08-12 | 1985-08-12 | Manufacture of lead frame |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17737085A JPS6237953A (en) | 1985-08-12 | 1985-08-12 | Manufacture of lead frame |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6237953A true JPS6237953A (en) | 1987-02-18 |
Family
ID=16029766
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17737085A Pending JPS6237953A (en) | 1985-08-12 | 1985-08-12 | Manufacture of lead frame |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6237953A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01128555A (en) * | 1987-11-13 | 1989-05-22 | Hitachi Cable Ltd | Lead frame manufacturing method |
| JPH01140750A (en) * | 1987-11-27 | 1989-06-01 | Hitachi Cable Ltd | Manufacture of lead frame |
| JPH01253947A (en) * | 1988-04-04 | 1989-10-11 | Hitachi Cable Ltd | Lead frame pretreatment method |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53133371A (en) * | 1977-04-27 | 1978-11-21 | Nec Corp | Lead frame of plastic package for integrated circuit |
| JPS5983764A (en) * | 1982-11-05 | 1984-05-15 | Nisshin Steel Co Ltd | Manufacture of vacuum deposition lead plated steel sheet |
-
1985
- 1985-08-12 JP JP17737085A patent/JPS6237953A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53133371A (en) * | 1977-04-27 | 1978-11-21 | Nec Corp | Lead frame of plastic package for integrated circuit |
| JPS5983764A (en) * | 1982-11-05 | 1984-05-15 | Nisshin Steel Co Ltd | Manufacture of vacuum deposition lead plated steel sheet |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01128555A (en) * | 1987-11-13 | 1989-05-22 | Hitachi Cable Ltd | Lead frame manufacturing method |
| JPH01140750A (en) * | 1987-11-27 | 1989-06-01 | Hitachi Cable Ltd | Manufacture of lead frame |
| JPH01253947A (en) * | 1988-04-04 | 1989-10-11 | Hitachi Cable Ltd | Lead frame pretreatment method |
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