JPS6252400B2 - - Google Patents

Info

Publication number: JPS6252400B2
Authority: JP; Japan
Prior art keywords: tester; test; generator; array; data
Prior art date: 1983-09-28
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired

Application number

JP59171674A

Other languages

English (en)

Japanese (ja)

Other versions

JPS6076100A (ja

Inventor

Maikeru Piitaasu Robaato

Daniiru Shunaaman Enri

Jon Uideyunasu Ruisu

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

International Business Machines Corp

Original Assignee

International Business Machines Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1983-09-28

Filing date

1984-08-20

Publication date

1987-11-05

1984-08-20 Application filed by International Business Machines Corp filed Critical International Business Machines Corp

1985-04-30 Publication of JPS6076100A publication Critical patent/JPS6076100A/ja

1987-11-05 Publication of JPS6252400B2 publication Critical patent/JPS6252400B2/ja

Status Granted legal-status Critical Current

Links

238000012360 testing method Methods 0.000 claims abstract description 329
230000015654 memory Effects 0.000 claims abstract description 107
230000001419 dependent effect Effects 0.000 claims abstract description 9
238000013479 data entry Methods 0.000 abstract description 50
230000002452 interceptive effect Effects 0.000 abstract description 33
238000003491 array Methods 0.000 abstract description 13
238000012545 processing Methods 0.000 description 43
238000007726 management method Methods 0.000 description 26
238000000034 method Methods 0.000 description 26
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PWPJGUXAGUPAHP-UHFFFAOYSA-N lufenuron Chemical compound C1=C(Cl)C(OC(F)(F)C(C(F)(F)F)F)=CC(Cl)=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F PWPJGUXAGUPAHP-UHFFFAOYSA-N 0.000 description 1
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Classifications

- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/54—Arrangements for designing test circuits, e.g. design for test [DFT] tools
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F02—COMBUSTION ENGINES; HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
- F02B—INTERNAL-COMBUSTION PISTON ENGINES; COMBUSTION ENGINES IN GENERAL
- F02B75/00—Other engines
- F02B75/02—Engines characterised by their cycles, e.g. six-stroke
- F02B2075/022—Engines characterised by their cycles, e.g. six-stroke having less than six strokes per cycle
- F02B2075/027—Engines characterised by their cycles, e.g. six-stroke having less than six strokes per cycle four
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Tests Of Electronic Circuits (AREA)
Test And Diagnosis Of Digital Computers (AREA)
Techniques For Improving Reliability Of Storages (AREA)
For Increasing The Reliability Of Semiconductor Memories (AREA)

JP59171674A 1983-09-28 1984-08-20 メモリ・アレイ・テスタ・システム Granted JPS6076100A (ja)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
US536597		1983-09-28
US06/536,597 US4606025A (en)	1983-09-28	1983-09-28	Automatically testing a plurality of memory arrays on selected memory array testers

Publications (2)

Publication Number	Publication Date
JPS6076100A JPS6076100A (ja)	1985-04-30
JPS6252400B2 true JPS6252400B2 (de)	1987-11-05

Family

ID=24139168

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP59171674A Granted JPS6076100A (ja)	1983-09-28	1984-08-20	メモリ・アレイ・テスタ・システム

Country Status (3)

Country	Link
US (1)	US4606025A (de)
EP (1)	EP0135864A3 (de)
JP (1)	JPS6076100A (de)

Families Citing this family (45)

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DE3572244D1 (en) *	1985-03-29	1989-09-14	Ibm Deutschland	Stability testing of semiconductor memories
EP0198935A1 (de) *	1985-04-23	1986-10-29	Deutsche ITT Industries GmbH	Elektrisch umprogrammierbarer Halbleiterspeicher mit Redundanz
US4899306A (en) *	1985-08-26	1990-02-06	American Telephone And Telegraph Company, At&T Bell Laboratories	Test interface circuit which generates different interface control signals for different target computers responding to control signals from host computer
US4713815A (en) *	1986-03-12	1987-12-15	International Business Machines Corp.	Automatic fault location system for electronic devices
US5021997A (en) *	1986-09-29	1991-06-04	At&T Bell Laboratories	Test automation system
US4860291A (en) *	1987-12-28	1989-08-22	Tektronix, Inc.	Test vector definition system employing template concept
JPH01195381A (ja) *	1988-01-29	1989-08-07	Mitsubishi Electric Corp	測定プログラム作成装置
US4949290A (en) *	1988-04-05	1990-08-14	Hewlett-Packard Company	Method and apparatus for defining test sequences for a signal measurement system
JPH0789144B2 (ja) *	1988-06-01	1995-09-27	株式会社東芝	集積回路の検査方法
JP2697861B2 (ja) *	1988-06-28	1998-01-14	三菱電機株式会社	測定プログラム自動作成装置
US5067129A (en) *	1989-08-16	1991-11-19	International Business Machines Corp.	Service processor tester
JP2739365B2 (ja) *	1989-12-25	1998-04-15	富士写真フイルム株式会社	画像ファイリング装置
US5039602A (en) *	1990-03-19	1991-08-13	National Semiconductor Corporation	Method of screening A.C. performance characteristics during D.C. parametric test operation
US5095267A (en) *	1990-03-19	1992-03-10	National Semiconductor Corporation	Method of screening A.C. performance characteristics during D.C. parametric test operation
US5469361A (en) *	1991-08-08	1995-11-21	The Board Of Regents Acting For And On Behalf Of The University Of Michigan	Generic cell controlling method and apparatus for computer integrated manufacturing system
US5391984A (en) *	1991-11-01	1995-02-21	Sgs-Thomson Microelectronics, Inc.	Method and apparatus for testing integrated circuit devices
US5504670A (en) *	1993-03-31	1996-04-02	Intel Corporation	Method and apparatus for allocating resources in a multiprocessor system
US5522038A (en) *	1993-04-16	1996-05-28	Micron Technology, Inc.	Testing mapped signal sources
US5497378A (en) *	1993-11-02	1996-03-05	International Business Machines Corporation	System and method for testing a circuit network having elements testable by different boundary scan standards
US5758063A (en) *	1995-05-04	1998-05-26	Micron Technology, Inc.	Testing mapped signal sources
US5778004A (en) *	1995-06-02	1998-07-07	Unisys Corporation	Vector translator
US6182253B1 (en) *	1997-07-16	2001-01-30	Tanisys Technology, Inc.	Method and system for automatic synchronous memory identification
JPH11202028A (ja) *	1998-01-14	1999-07-30	Mitsubishi Electric Corp	Ｉｃテスタ
JP2000122886A (ja) *	1998-10-10	2000-04-28	Advantest Corp	半導体試験装置のプログラム作成方式
US7546444B1 (en)	1999-09-01	2009-06-09	Intel Corporation	Register set used in multithreaded parallel processor architecture
CA2386558C (en)	1999-09-01	2010-03-09	Intel Corporation	Register set used in multithreaded parallel processor architecture
US20010049710A1 (en) *	2000-05-16	2001-12-06	Curey Randall K.	Partitioned executive structure for real-time programs
JP2001349928A (ja) *	2000-06-06	2001-12-21	Advantest Corp	半導体試験システム
US7681018B2 (en)	2000-08-31	2010-03-16	Intel Corporation	Method and apparatus for providing large register address space while maximizing cycletime performance for a multi-threaded register file set
US20020053017A1 (en) *	2000-09-01	2002-05-02	Adiletta Matthew J.	Register instructions for a multithreaded processor
DE10213009A1 (de) *	2002-03-22	2003-10-09	Infineon Technologies Ag	Verfahren zum elektronischen Testen von Speichermodulen
US7437724B2 (en) *	2002-04-03	2008-10-14	Intel Corporation	Registers for data transfers
DE60202443T2 (de) *	2002-05-08	2006-01-12	Infineon Technologies Ag	Methode zum Testen eines elektronischen Bauteils
US20030229643A1 (en) *	2002-05-29	2003-12-11	Digimarc Corporation	Creating a footprint of a computer file
US20050169072A1 (en) *	2002-10-01	2005-08-04	Advantest Corporation	Pattern generator, memory controller, and test device
US7117501B2 (en) *	2002-11-21	2006-10-03	International Business Machines Corporation	Application-level access to kernel input/output state
US6941232B2 (en) *	2003-01-28	2005-09-06	Texas Instruments Incorporated	Method and apparatus for performing multi-site integrated circuit device testing
DE10317431A1 (de) *	2003-04-15	2004-10-28	Rood Technology Deutschland Gmbh + Co	Verfahren zur Generierung von Testersteuerungen
US7369998B2 (en) *	2003-08-14	2008-05-06	Voxtec International, Inc.	Context based language translation devices and methods
USD501459S1 (en)	2004-02-19	2005-02-01	Marine Acoustics, Inc.	Hand-held device
JP4542811B2 (ja) *	2004-04-23	2010-09-15	東芝マイクロエレクトロニクス株式会社	テストプログラム自動生成装置、テストプログラム自動生成方法及びテストプログラム自動生成プログラム
US20050273685A1 (en) *	2004-06-08	2005-12-08	Sanjay Sachdev	Automated and customizable generation of efficient test programs for multiple electrical test equipment platforms
US10394998B2 (en) *	2012-02-22	2019-08-27	International Business Machines Corporation	Acceleration of memory walking sequences during simulation
CN113506572A (zh) *	2021-07-08	2021-10-15	东北师范大学	一种便携式实时反馈语言学习系统
CN114400042B (zh) *	2022-03-22	2022-06-10	合肥悦芯半导体科技有限公司	存储器测试系统

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US4055801A (en) *	1970-08-18	1977-10-25	Pike Harold L	Automatic electronic test equipment and method
US3733587A (en) *	1971-05-10	1973-05-15	Westinghouse Electric Corp	Universal buffer interface for computer controlled test systems
US4044244A (en) *	1976-08-06	1977-08-23	International Business Machines Corporation	Automatic tester for complex semiconductor components including combinations of logic, memory and analog devices and processes of testing thereof
US4108358A (en) *	1977-03-22	1978-08-22	The Bendix Corporation	Portable circuit tester
US4168527A (en) *	1978-02-17	1979-09-18	Winkler Dean A	Analog and digital circuit tester
GB2041574B (en) *	1978-12-08	1983-03-09	Inoue Japax Res	Microprocessor - controlled edm method and apparatus
US4335457A (en) *	1980-08-08	1982-06-15	Fairchild Camera & Instrument Corp.	Method for semiconductor memory testing
US4402055A (en) *	1981-01-27	1983-08-30	Westinghouse Electric Corp.	Automatic test system utilizing interchangeable test devices

1983
- 1983-09-28 US US06/536,597 patent/US4606025A/en not_active Expired - Fee Related
1984
- 1984-08-20 JP JP59171674A patent/JPS6076100A/ja active Granted
- 1984-09-05 EP EP84110538A patent/EP0135864A3/de not_active Withdrawn

Also Published As

Publication number	Publication date
US4606025A (en)	1986-08-12
JPS6076100A (ja)	1985-04-30
EP0135864A3 (de)	1988-04-20
EP0135864A2 (de)	1985-04-03

Publication	Publication Date	Title
JPS6252400B2 (de)	1987-11-05
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