JPS6286821A - Semiconductor manufacturing equipment - Google Patents

Semiconductor manufacturing equipment

Info

Publication number
JPS6286821A
JPS6286821A JP60228096A JP22809685A JPS6286821A JP S6286821 A JPS6286821 A JP S6286821A JP 60228096 A JP60228096 A JP 60228096A JP 22809685 A JP22809685 A JP 22809685A JP S6286821 A JPS6286821 A JP S6286821A
Authority
JP
Japan
Prior art keywords
mask
masks
wafer
semiconductor manufacturing
pellets
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60228096A
Other languages
Japanese (ja)
Inventor
Yuji Noda
野田 雄二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP60228096A priority Critical patent/JPS6286821A/en
Publication of JPS6286821A publication Critical patent/JPS6286821A/en
Pending legal-status Critical Current

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  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

PURPOSE:To form several kinds of pellets on one wafer by using plural masks and by selecting a combination of the selection of a mask the driving method of the wafer. CONSTITUTION:A mask controller 21 selects specific one mask among plural masks 11-14 supported by a susceptor 61 and switches to an optical system for copying and exposure. For the exposure, a required mask is selected among the masks installed on the susceptor 61 by rotating the susceptor 61 a required angle with the controller 21. By selecting a combination of selecting the masks and the driving method of a wafer, the arrangement of pellets on the wafer can be changed. This enables forming several kinds of the pellets on one wafer.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体製造装置に関し、特に露光装置に関する
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to semiconductor manufacturing equipment, and particularly to exposure equipment.

〔従来の技術〕[Conventional technology]

従来、この種の露光装置は第4図(a)に示すように、
1種類のマスクパターン15が形成された1枚のマスク
11或いは第4図(b)に示すように数種類のマスクツ
クターン15〜18が形成された1枚のマスク21を使
用し、第2図に示すように同一ウエーノ・41上に数種
類のマスク・母ターン15〜18を転写露光するか、或
いは第5図に示すように1種類のマスクツクターン15
を複数転写露光していた。ウェーハ41に転写露光され
たマスク・ぐターン部分にそれぞれ被レットが形成され
る。
Conventionally, this type of exposure apparatus has the following steps, as shown in FIG. 4(a):
Using one mask 11 on which one type of mask pattern 15 is formed or one mask 21 on which several types of mask patterns 15 to 18 are formed as shown in FIG. As shown in FIG. 5, several types of masks/mother turns 15 to 18 are transferred and exposed on the same wafer 41, or one type of mask/mother turns 15 is exposed as shown in FIG.
Multiple transfer exposures were performed. A ret is formed in each of the mask pattern portions transferred onto the wafer 41 and exposed.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

第5図に示す1種類のベレノ)n+による生産方法は、
少品種を多量に生産する少品種多量生産においては非常
に効率的な生産方法であった。しかし、多品種を少量生
産する多品種少量生産では必ずしも得策とは言えない。
The production method using one type of bereno)n+ shown in Figure 5 is as follows:
It was a very efficient production method for producing large quantities of small varieties. However, high-mix, low-volume production is not necessarily a good idea.

拡散層および配線層゛を形成するウェーハの前処理工程
は、同一種類のウェーハの枚数が多い程生産効率は向上
する。したがって、1種類のペレットの配列により構成
されたウェーハによる生産方法は、多品種少量生産の場
合、同一種類のウェーノ・の枚数が少なくなり生産効率
が低下するという問題点があった。
In the wafer pretreatment process for forming the diffusion layer and wiring layer, the production efficiency improves as the number of wafers of the same type increases. Therefore, the production method using wafers composed of an array of one type of pellets has a problem that, in the case of high-mix, low-volume production, the number of wafers of the same type decreases, resulting in a decrease in production efficiency.

多品種少量生産において同一種類のウェーハの枚数を増
加する一方法として、第2図に示す様に数種類のベレノ
) n1〜n4の配列により構成されたウェーハによる
生産方法が考えられる。
One possible method for increasing the number of wafers of the same type in high-mix, low-volume production is a production method using wafers arranged in several types of wafers (n1 to n4) as shown in FIG.

この場合使用するマスクは従来第4図(b)に示すよう
に1枚のマスク上に数種類のマスクツやターンが形成さ
れていたため、各マスクツ母ターンの組み合わせは固定
であり、任意に変化することは不可能であった。
Conventionally, the mask used in this case had several types of masks and turns formed on one mask as shown in Figure 4(b), so the combination of each mask and mother turns was fixed and could not be changed arbitrarily. was impossible.

本発明は前記問題点を解消し、マスク・ぐターンの組合
せに自由度をもたせてこの組合せのマスクパターンを同
一ウェーハに転写露光する半導体製造装置を提供するも
のである。
The present invention solves the above-mentioned problems and provides a semiconductor manufacturing apparatus that allows flexibility in the combination of masks and patterns and transfers and exposes mask patterns of this combination onto the same wafer.

〔問題点を解決するだめの手段〕[Failure to solve the problem]

本発明は複数のマスクパターンを同一ウェーハ上に繰り
返し転写露光する半導体製造装置において、それぞれ個
別に1種類のマスクパターンを形成した複数枚のマスク
と、該複数枚のマスクを支持するマスク支持台と、該マ
スク支持台に支持された複数枚のマスクの中から特定の
1枚のマスクを選定し該特定のマスクを前記マスク支持
台により転写露光用の光学系に切替えて設置するマスク
制御部とを有することを特徴とする半導体製造装置であ
る。
The present invention provides a semiconductor manufacturing apparatus that repeatedly transfers and exposes a plurality of mask patterns onto the same wafer, which includes a plurality of masks each having one type of mask pattern formed thereon, and a mask support stand that supports the plurality of masks. , a mask control unit that selects a specific mask from among the plurality of masks supported on the mask support base, and switches and installs the specific mask in an optical system for transfer exposure using the mask support base; This is a semiconductor manufacturing apparatus characterized by having the following.

〔実施例〕〔Example〕

以下、本発明の一実施例を図により説明する。 Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

第1図において、本実施例は光源19と、光学系20と
、ウェーハ駆動機構60と、それぞれ個別に1種類のマ
スクツ4ターン15〜18ヲ形成した複数枚のマスク1
1〜14を同一円周上に支持するマスク支持台61と、
マスク支持台61を必要な角度回転させることにより特
定の1枚のマスクを選定し該特定のマスクを光学系20
間に切替えて設置するマスク制御部21とを有するもの
である。ここで、各マスクには外形形状及び寸法を統一
してマスク・ぐターンが形成される。またマスク支持台
61に装着されている各マスク11〜14はベースライ
ンオフセット機構62によシあらかじめウェーハとベー
スラインオフセットを行った後、露光作動に移る。露光
作業はマスク制御部21によりマスク支持台61ヲ必要
な角度だけ回転させることにより、マスク支持台61に
装着されたマスクの中から必要なマスクを選定する。マ
スクの選定とウェーハ駆動方法の組合せを選ぶことによ
シウェーハ上のベレットの配列は例えば第2図および第
3図の様に変化させることができる。第2図はnl、n
2.n3およびn4の4種類のベレットが繰り返し配列
されている場合を示し、第3図はJ、n2およびn3の
3種類のベレットが1列ごとに繰り返されている場合を
示す。
In FIG. 1, this embodiment includes a light source 19, an optical system 20, a wafer drive mechanism 60, and a plurality of masks 1 each having four turns 15 to 18 of one type of mask.
A mask support stand 61 that supports 1 to 14 on the same circumference;
A specific mask is selected by rotating the mask support base 61 by a required angle, and the specific mask is transferred to the optical system 20.
It has a mask control section 21 that is switched and installed between the two. Here, a mask pattern is formed on each mask so that the external shape and dimensions are unified. Each of the masks 11 to 14 mounted on the mask support stand 61 is subjected to baseline offset from the wafer by the baseline offset mechanism 62 before proceeding to the exposure operation. In the exposure operation, the mask control unit 21 rotates the mask support 61 by a necessary angle, thereby selecting a necessary mask from among the masks mounted on the mask support 61. By selecting a combination of mask selection and wafer driving method, the arrangement of the pellets on the wafer can be changed, for example, as shown in FIGS. 2 and 3. Figure 2 shows nl, n
2. A case is shown in which four types of bellets n3 and n4 are repeatedly arranged, and FIG. 3 shows a case in which three types of bellets J, n2 and n3 are repeated in each row.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、複数枚のマスクを使用し
マスクの選定とウェーハ、駆動方法の組合せを選ぶこと
により、1枚のウェーハ上に数種類の波レットを構成し
、任意にその組み合わせを変化することができ、したが
って1枚のウェーハ上に数種類のベレットが配列された
多品種少量生産においてその効果は大きい。
As explained above, the present invention uses a plurality of masks and selects combinations of masks, wafers, and driving methods to form several types of wavelets on one wafer, and to arbitrarily create the combinations. Therefore, it is very effective in high-mix, low-volume production where several types of pellets are arranged on one wafer.

又、マスク支持台に装着されたマスクの中から1種類の
マスクだけを選定することにより、1枚のウェーハ上の
ベレットを1種類とし少品種多量生産に対応できる効果
を有するものである。
Furthermore, by selecting only one type of mask from among the masks mounted on the mask support stand, only one type of pellet can be used on one wafer, making it possible to cope with high-volume production of small numbers of products.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の露光装置を示す図、第2図、第3図お
よび第5図はにレットの配列を示すウェーハの平面図、
第4図は従来のマスクの平面図である。 11.12,13.14・・・マスク、15.16,1
7.18・・・マスクツ母ターン、19・・・光源、2
0・・・光学系、21・・・マスク制御部、41・・・
ウェーハ、60・・・ウェーハ駆動機構、61・・・マ
スク支持台、62・・・ベースラインオフセット機構。 特許出願人  日本電気株式会社 %1図 第2図 第3図 (α) (b) 第4図
FIG. 1 is a diagram showing an exposure apparatus of the present invention, FIGS. 2, 3, and 5 are plan views of a wafer showing an arrangement of Nilets;
FIG. 4 is a plan view of a conventional mask. 11.12, 13.14... Mask, 15.16, 1
7.18...Masukutsu mother turn, 19...Light source, 2
0... Optical system, 21... Mask control section, 41...
Wafer, 60... Wafer drive mechanism, 61... Mask support stand, 62... Baseline offset mechanism. Patent applicant NEC Corporation%1 Figure 2 Figure 3 (α) (b) Figure 4

Claims (1)

【特許請求の範囲】[Claims] (1)複数のマスクパターンを同一ウェーハ上に繰り返
し転写露光する半導体製造装置において、それぞれ個別
に1種類のマスクパターンを形成した複数枚のマスクと
、該複数枚のマスクを支持するマスク支持台と、該マス
ク支持台に支持された複数枚のマスクの中から特定の1
枚のマスクを選定し該特定のマスクを前記マスク支持台
により転写露光用の光学系に切替えて設置するマスク制
御部を有することを特徴とする半導体製造装置。
(1) In a semiconductor manufacturing apparatus that repeatedly transfers and exposes multiple mask patterns onto the same wafer, a plurality of masks each having one type of mask pattern formed thereon, and a mask support stand that supports the multiple masks are used. , a specific one from among the plurality of masks supported on the mask support stand.
1. A semiconductor manufacturing apparatus, comprising: a mask control unit that selects one mask and switches and installs the specific mask in an optical system for transfer exposure using the mask support.
JP60228096A 1985-10-14 1985-10-14 Semiconductor manufacturing equipment Pending JPS6286821A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60228096A JPS6286821A (en) 1985-10-14 1985-10-14 Semiconductor manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60228096A JPS6286821A (en) 1985-10-14 1985-10-14 Semiconductor manufacturing equipment

Publications (1)

Publication Number Publication Date
JPS6286821A true JPS6286821A (en) 1987-04-21

Family

ID=16871122

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60228096A Pending JPS6286821A (en) 1985-10-14 1985-10-14 Semiconductor manufacturing equipment

Country Status (1)

Country Link
JP (1) JPS6286821A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63211622A (en) * 1987-02-17 1988-09-02 Yokogawa Hewlett Packard Ltd Multilevel-reticle and pattern transfer method
JPH0223606A (en) * 1988-07-12 1990-01-25 Fujitsu Ltd Reticle moving exchanger

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63211622A (en) * 1987-02-17 1988-09-02 Yokogawa Hewlett Packard Ltd Multilevel-reticle and pattern transfer method
JPH0223606A (en) * 1988-07-12 1990-01-25 Fujitsu Ltd Reticle moving exchanger

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