JPS63301952A - イオンビーム加工方法およびその装置 - Google Patents
イオンビーム加工方法およびその装置Info
- Publication number
- JPS63301952A JPS63301952A JP62058360A JP5836087A JPS63301952A JP S63301952 A JPS63301952 A JP S63301952A JP 62058360 A JP62058360 A JP 62058360A JP 5836087 A JP5836087 A JP 5836087A JP S63301952 A JPS63301952 A JP S63301952A
- Authority
- JP
- Japan
- Prior art keywords
- ion beam
- pattern
- focused ion
- mask
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62058360A JPS63301952A (ja) | 1986-12-26 | 1987-03-13 | イオンビーム加工方法およびその装置 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31526386 | 1986-12-26 | ||
| JP61-315263 | 1986-12-26 | ||
| JP62058360A JPS63301952A (ja) | 1986-12-26 | 1987-03-13 | イオンビーム加工方法およびその装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63301952A true JPS63301952A (ja) | 1988-12-08 |
| JPH0553259B2 JPH0553259B2 (2) | 1993-08-09 |
Family
ID=18063323
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62058360A Granted JPS63301952A (ja) | 1986-12-26 | 1987-03-13 | イオンビーム加工方法およびその装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63301952A (2) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5036044A (en) * | 1988-09-29 | 1991-07-30 | University Of Arkansas | R-Tl-Sr-Ca-Cu-O superconductors |
| JPH04288542A (ja) * | 1991-02-27 | 1992-10-13 | Mitsubishi Electric Corp | 位相シフトマスクおよびその修正方法 |
| US5807650A (en) * | 1992-03-24 | 1998-09-15 | Kabushiki Kaisha Toshiba | Photo mask and apparatus for repairing photo mask |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4997690A (2) * | 1973-01-19 | 1974-09-14 | ||
| JPS55150225A (en) * | 1979-05-11 | 1980-11-22 | Hitachi Ltd | Method of correcting white spot fault of photomask |
| JPS5693329A (en) * | 1979-12-26 | 1981-07-28 | Nec Corp | Etching device |
| JPS5713177A (en) * | 1980-06-24 | 1982-01-23 | Toshiba Corp | Etching method |
| JPS5856332A (ja) * | 1981-09-30 | 1983-04-04 | Hitachi Ltd | マスクの欠陥修正方法 |
| JPS59151427A (ja) * | 1983-02-18 | 1984-08-29 | Agency Of Ind Science & Technol | イオンビ−ム加工装置 |
| JPS59208830A (ja) * | 1983-05-13 | 1984-11-27 | Hitachi Ltd | イオンビ−ム加工方法およびその装置 |
-
1987
- 1987-03-13 JP JP62058360A patent/JPS63301952A/ja active Granted
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4997690A (2) * | 1973-01-19 | 1974-09-14 | ||
| JPS55150225A (en) * | 1979-05-11 | 1980-11-22 | Hitachi Ltd | Method of correcting white spot fault of photomask |
| JPS5693329A (en) * | 1979-12-26 | 1981-07-28 | Nec Corp | Etching device |
| JPS5713177A (en) * | 1980-06-24 | 1982-01-23 | Toshiba Corp | Etching method |
| JPS5856332A (ja) * | 1981-09-30 | 1983-04-04 | Hitachi Ltd | マスクの欠陥修正方法 |
| JPS59151427A (ja) * | 1983-02-18 | 1984-08-29 | Agency Of Ind Science & Technol | イオンビ−ム加工装置 |
| JPS59208830A (ja) * | 1983-05-13 | 1984-11-27 | Hitachi Ltd | イオンビ−ム加工方法およびその装置 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5036044A (en) * | 1988-09-29 | 1991-07-30 | University Of Arkansas | R-Tl-Sr-Ca-Cu-O superconductors |
| JPH04288542A (ja) * | 1991-02-27 | 1992-10-13 | Mitsubishi Electric Corp | 位相シフトマスクおよびその修正方法 |
| US5807650A (en) * | 1992-03-24 | 1998-09-15 | Kabushiki Kaisha Toshiba | Photo mask and apparatus for repairing photo mask |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0553259B2 (2) | 1993-08-09 |
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