JPS6350071U - - Google Patents
Info
- Publication number
- JPS6350071U JPS6350071U JP14460286U JP14460286U JPS6350071U JP S6350071 U JPS6350071 U JP S6350071U JP 14460286 U JP14460286 U JP 14460286U JP 14460286 U JP14460286 U JP 14460286U JP S6350071 U JPS6350071 U JP S6350071U
- Authority
- JP
- Japan
- Prior art keywords
- electronic components
- section
- sorting
- characteristic measurement
- conveyor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004092 self-diagnosis Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims 3
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14460286U JPS6350071U (2) | 1986-09-20 | 1986-09-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14460286U JPS6350071U (2) | 1986-09-20 | 1986-09-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6350071U true JPS6350071U (2) | 1988-04-05 |
Family
ID=31055356
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14460286U Pending JPS6350071U (2) | 1986-09-20 | 1986-09-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6350071U (2) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0391146U (2) * | 1989-12-29 | 1991-09-17 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6015568A (ja) * | 1983-07-06 | 1985-01-26 | Mitsubishi Electric Corp | 半導体試験装置 |
| JPS62280662A (ja) * | 1986-05-29 | 1987-12-05 | Toshiba Corp | 半導体装置の測定装置の測定精度管理方法 |
-
1986
- 1986-09-20 JP JP14460286U patent/JPS6350071U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6015568A (ja) * | 1983-07-06 | 1985-01-26 | Mitsubishi Electric Corp | 半導体試験装置 |
| JPS62280662A (ja) * | 1986-05-29 | 1987-12-05 | Toshiba Corp | 半導体装置の測定装置の測定精度管理方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0391146U (2) * | 1989-12-29 | 1991-09-17 |
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