JPS6367239U - - Google Patents

Info

Publication number
JPS6367239U
JPS6367239U JP16276486U JP16276486U JPS6367239U JP S6367239 U JPS6367239 U JP S6367239U JP 16276486 U JP16276486 U JP 16276486U JP 16276486 U JP16276486 U JP 16276486U JP S6367239 U JPS6367239 U JP S6367239U
Authority
JP
Japan
Prior art keywords
heating
fluid
bernoulli chuck
heating device
semiconductor wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16276486U
Other languages
Japanese (ja)
Other versions
JPH0341461Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16276486U priority Critical patent/JPH0341461Y2/ja
Publication of JPS6367239U publication Critical patent/JPS6367239U/ja
Application granted granted Critical
Publication of JPH0341461Y2 publication Critical patent/JPH0341461Y2/ja
Expired legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本考案に係る加熱装置の一実施例を
示す縦断側面図、第2図は上記加熱装置における
ベルヌーイチヤツクの流体噴出孔の形状変更例を
示す平面図である。第3図は在来の加熱装置を示
す縦断側面図である。 W……半導体ウエーハ、10……テーブル、2
0……ベルヌーイチヤツク、21……凹部、22
……噴出孔(流体噴出孔)、30……加熱手段、
40……流体の加熱機構。
FIG. 1 is a longitudinal sectional side view showing an embodiment of the heating device according to the present invention, and FIG. 2 is a plan view showing an example of a modified shape of the Bernoullich fluid jet hole in the heating device. FIG. 3 is a longitudinal sectional side view showing a conventional heating device. W...Semiconductor wafer, 10...Table, 2
0...Bernoullich, 21...Recess, 22
...Ejection hole (fluid ejection hole), 30...Heating means,
40...Fluid heating mechanism.

Claims (1)

【実用新案登録請求の範囲】 加熱手段を内蔵したテーブルと、 上記テーブルの上面に形成され、流体の噴出作
用により半導体ウエーハを非接触状態で浮上保持
するベルヌーイチヤツクと、 上記ベルヌーイチヤツクに供給する流体を予め
加熱する加熱機構を具備することを特徴とする加
熱装置。
[Scope of Claim for Utility Model Registration] A table with a built-in heating means; a Bernoulli chuck formed on the top surface of the table to levitate and hold a semiconductor wafer in a non-contact state by means of a fluid jet; and a supply to the Bernoulli chuck. 1. A heating device comprising a heating mechanism for preheating a fluid to be heated.
JP16276486U 1986-10-22 1986-10-22 Expired JPH0341461Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16276486U JPH0341461Y2 (en) 1986-10-22 1986-10-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16276486U JPH0341461Y2 (en) 1986-10-22 1986-10-22

Publications (2)

Publication Number Publication Date
JPS6367239U true JPS6367239U (en) 1988-05-06
JPH0341461Y2 JPH0341461Y2 (en) 1991-08-30

Family

ID=31090339

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16276486U Expired JPH0341461Y2 (en) 1986-10-22 1986-10-22

Country Status (1)

Country Link
JP (1) JPH0341461Y2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0475328A (en) * 1990-07-18 1992-03-10 Toshiba Corp Method and apparatus for treatment of semiconductor
JP2003530681A (en) * 1999-03-08 2003-10-14 エイエスエム・インターナシヨナル・エヌ・ブイ Apparatus and method for rotating a wafer
JP2009088222A (en) * 2007-09-28 2009-04-23 Tokyo Electron Ltd Substrate holding apparatus, substrate holding method, semiconductor manufacturing apparatus, and storage medium
KR20180127390A (en) * 2016-03-18 2018-11-28 에이씨엠 리서치 (상하이) 인코포레이티드 Substrate heat treatment apparatus

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0475328A (en) * 1990-07-18 1992-03-10 Toshiba Corp Method and apparatus for treatment of semiconductor
JP2003530681A (en) * 1999-03-08 2003-10-14 エイエスエム・インターナシヨナル・エヌ・ブイ Apparatus and method for rotating a wafer
JP2009088222A (en) * 2007-09-28 2009-04-23 Tokyo Electron Ltd Substrate holding apparatus, substrate holding method, semiconductor manufacturing apparatus, and storage medium
KR20180127390A (en) * 2016-03-18 2018-11-28 에이씨엠 리서치 (상하이) 인코포레이티드 Substrate heat treatment apparatus
CN109075102A (en) * 2016-03-18 2018-12-21 盛美半导体设备(上海)有限公司 Substrate annealing device
JP2019510375A (en) * 2016-03-18 2019-04-11 エーシーエム リサーチ (シャンハイ) インコーポレーテッド Substrate heat treatment equipment
CN109075102B (en) * 2016-03-18 2022-07-12 盛美半导体设备(上海)股份有限公司 Substrate heat treatment apparatus
US11854842B2 (en) 2016-03-18 2023-12-26 Acm Research (Shanghai), Inc. Substrate heat treatment apparatus

Also Published As

Publication number Publication date
JPH0341461Y2 (en) 1991-08-30

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