JPS641977A - Tester - Google Patents

Tester

Info

Publication number
JPS641977A
JPS641977A JP62156991A JP15699187A JPS641977A JP S641977 A JPS641977 A JP S641977A JP 62156991 A JP62156991 A JP 62156991A JP 15699187 A JP15699187 A JP 15699187A JP S641977 A JPS641977 A JP S641977A
Authority
JP
Japan
Prior art keywords
tape carrier
electrode terminal
inspection
probe pin
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62156991A
Other languages
Japanese (ja)
Other versions
JPH011977A (en
Inventor
Yuichi Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to JP62-156991A priority Critical patent/JPH011977A/en
Priority claimed from JP62-156991A external-priority patent/JPH011977A/en
Publication of JPS641977A publication Critical patent/JPS641977A/en
Publication of JPH011977A publication Critical patent/JPH011977A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To reduce the fraction defective in an after-process and improve the yield by positioning and connecting a terminal connected to a tester and the electrode terminal of a tape carrier mounted with an IC and inspecting the electric characteristics of the IC.
CONSTITUTION: An accommodating side reel and a sprocket 5 for feeding a tape carrier 4 are rotated and it is conveyed to a position where the electrode terminal 12 of the tape carrier 4 mounted with a semiconductor chip and a probe pin 14 provided on an inspecting unit can be connected to each other. At this time, the tape carrier 4 is positioned by the tractor 10 of the sprocket 5. The probe pin 14 is connected to the electrode terminal of the tape carrier 4. In this connection condition, an electric inspection is performed by a tester 13. After the inspection, the electrode terminal and the probe pin 14 are disconnected and the tape carrier 4 is conveyed by a predetermined amount for the inspection of the subsequent semiconductor chip.
COPYRIGHT: (C)1989,JPO&Japio
JP62-156991A 1987-06-23 Inspection equipment Pending JPH011977A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62-156991A JPH011977A (en) 1987-06-23 Inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62-156991A JPH011977A (en) 1987-06-23 Inspection equipment

Publications (2)

Publication Number Publication Date
JPS641977A true JPS641977A (en) 1989-01-06
JPH011977A JPH011977A (en) 1989-01-06

Family

ID=

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0312945A (en) * 1989-06-09 1991-01-21 Toshiba Corp Tape carrier and testing method therefor

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6265500A (en) * 1985-09-18 1987-03-24 三菱電機株式会社 Conveying method for electric circuit element

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6265500A (en) * 1985-09-18 1987-03-24 三菱電機株式会社 Conveying method for electric circuit element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0312945A (en) * 1989-06-09 1991-01-21 Toshiba Corp Tape carrier and testing method therefor

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