JPS6478176A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPS6478176A
JPS6478176A JP62234964A JP23496487A JPS6478176A JP S6478176 A JPS6478176 A JP S6478176A JP 62234964 A JP62234964 A JP 62234964A JP 23496487 A JP23496487 A JP 23496487A JP S6478176 A JPS6478176 A JP S6478176A
Authority
JP
Japan
Prior art keywords
circuit
signal
output
input
comparing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62234964A
Other languages
Japanese (ja)
Inventor
Hironori Taniguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP62234964A priority Critical patent/JPS6478176A/en
Publication of JPS6478176A publication Critical patent/JPS6478176A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00Testing or measuring during manufacture or treatment of wafers, substrates or devices

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To obtain an integrated circuit for outputting a deciding signal which can discriminate whether an output signal to an input signal is correct or erroneous by constituting said circuit so that a coincidence signal can be outputted from a comparing circuit when input and output signals of an amplifying circuit coincides. CONSTITUTION:The integrated circuit is provided with a comparing circuit 4 consisting of an exclusive OR circuit for comparing input and output signals of an amplifying circuit 2, and an FF circuit 5 for outputting an output signal synchronized by a comparison timing signal for correcting an erroneous output of the comparing circuit 4 caused by the amplifying circuit 2. In this state, when the input and the output signals of the amplifying circuit 2 coincides, a coincidence signal is outputted from the comparing circuit 4, and when the input and the output of the amplifying circuit 2 becomes a discrepancy, a discrepancy signal is outputted from the comparing circuit 4. Also, when the output signal of the amplifying circuit 2 is brought to output delay due to an external load capacity, etc., and the comparison of the input and the output signals of the amplifying circuit 2 becomes a discrepancy, it is corrected by the FF circuit 5 and the coincidence signal is outputted.
JP62234964A 1987-09-21 1987-09-21 Semiconductor integrated circuit Pending JPS6478176A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62234964A JPS6478176A (en) 1987-09-21 1987-09-21 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62234964A JPS6478176A (en) 1987-09-21 1987-09-21 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS6478176A true JPS6478176A (en) 1989-03-23

Family

ID=16979010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62234964A Pending JPS6478176A (en) 1987-09-21 1987-09-21 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS6478176A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007309733A (en) * 2006-05-17 2007-11-29 Matsushita Electric Ind Co Ltd Semiconductor integrated circuit and inspection method for semiconductor integrated circuit
JP2009245496A (en) * 2008-03-31 2009-10-22 Renesas Technology Corp Semiconductor integrated circuit device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007309733A (en) * 2006-05-17 2007-11-29 Matsushita Electric Ind Co Ltd Semiconductor integrated circuit and inspection method for semiconductor integrated circuit
JP2009245496A (en) * 2008-03-31 2009-10-22 Renesas Technology Corp Semiconductor integrated circuit device

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