JPS6484166A - Testing method for electronic circuit module - Google Patents
Testing method for electronic circuit moduleInfo
- Publication number
- JPS6484166A JPS6484166A JP62240619A JP24061987A JPS6484166A JP S6484166 A JPS6484166 A JP S6484166A JP 62240619 A JP62240619 A JP 62240619A JP 24061987 A JP24061987 A JP 24061987A JP S6484166 A JPS6484166 A JP S6484166A
- Authority
- JP
- Japan
- Prior art keywords
- module
- voltage
- measurement
- electronic circuit
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title abstract 3
- 238000005259 measurement Methods 0.000 abstract 4
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To automate the determination of the kind of an electronic circuit module to be tested by varying a DC power source from a low level to a high level with respect, to the electronic circuit module to be tested. CONSTITUTION:A terminal is selected first. Then a voltage which is high enough to operate the input/output module 2 to be tested and low enough not to damage the module is applied. This voltage is outputted to a contact point 11 from a testing device main body 1 and applied to the module 2 through a terminal screw 9. The response of the module 2 to the application of this low voltage is measured automatically to confirm whether or not the module 2 functions electrically. The measurement result is compared with reference data by kinds which are measured in advance and a kind is determined when coincidence is obtained. Then a function test is conducted. If it is found that there is no coincident kind as a result of the measurement, the polarity is inverted and measurement is performed again. When a coincident kind is found, the kind is determined. When not, the DC voltage is increased and applied to the module 2 and measurement is performed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62240619A JP2530664B2 (en) | 1987-09-28 | 1987-09-28 | Electronic circuit module test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62240619A JP2530664B2 (en) | 1987-09-28 | 1987-09-28 | Electronic circuit module test method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6484166A true JPS6484166A (en) | 1989-03-29 |
| JP2530664B2 JP2530664B2 (en) | 1996-09-04 |
Family
ID=17062190
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62240619A Expired - Lifetime JP2530664B2 (en) | 1987-09-28 | 1987-09-28 | Electronic circuit module test method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2530664B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5356313A (en) * | 1992-03-26 | 1994-10-18 | The Whitaker Corporation | Shielded electrical connector and mounting fixture therefor |
| US5393234A (en) * | 1992-09-28 | 1995-02-28 | The Whitaker Corporation | Edge connectors and contacts used therein |
-
1987
- 1987-09-28 JP JP62240619A patent/JP2530664B2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5356313A (en) * | 1992-03-26 | 1994-10-18 | The Whitaker Corporation | Shielded electrical connector and mounting fixture therefor |
| US5393234A (en) * | 1992-09-28 | 1995-02-28 | The Whitaker Corporation | Edge connectors and contacts used therein |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2530664B2 (en) | 1996-09-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE3773645D1 (en) | DEVICE AND METHOD FOR MEASURING THE BATTERY STATE. | |
| EP0309956A3 (en) | Method of testing semiconductor elements and apparatus for testing the same | |
| DE59208512D1 (en) | Electrochemical analysis system | |
| KR830009489A (en) | High precision AC electric energy measuring system | |
| RU94019412A (en) | ELECTROCHEMICAL CURRENT SOURCE AND ELECTRONIC DEVICE, SENSITIVE TO HUMIDITY COMPONENT | |
| JPS6484166A (en) | Testing method for electronic circuit module | |
| DE3463091D1 (en) | Device for testing specimens containing electrical circuits | |
| JPS57186351A (en) | Semiconductor device | |
| AU7071594A (en) | Process and device for testing an integrated circuit soldered on a board | |
| JPS6454379A (en) | Probe substrate for measuring semiconductor integrated circuit | |
| DE59805921D1 (en) | DEVICE FOR TESTING CIRCUIT BOARDS | |
| JPS57124266A (en) | Method and device for simulating battery | |
| JPS57137868A (en) | Test equipment for electronic wattmeter | |
| ATE228251T1 (en) | PHASE TEST DEVICE | |
| JPS5483381A (en) | Detection method of integrated circuit insertion direction | |
| NO942034L (en) | Test apparatus | |
| JPS6491069A (en) | Insulation tester by partial discharge method | |
| SU1688194A1 (en) | Electrical circuit insulation resistance tester | |
| GB2253064A (en) | Multifunction circuit tester | |
| JPS52128071A (en) | Automatic test unit | |
| JPS57113377A (en) | Semiconductor testing device | |
| JPS6491070A (en) | Insulation tester | |
| SU1383231A1 (en) | Device for checking quality of ic contact | |
| JPS6469971A (en) | Checking apparatus of characteristics of semiconductor element | |
| JPS568566A (en) | General-purpose circuit tester |