JPS6491069A - Insulation tester by partial discharge method - Google Patents

Insulation tester by partial discharge method

Info

Publication number
JPS6491069A
JPS6491069A JP25054187A JP25054187A JPS6491069A JP S6491069 A JPS6491069 A JP S6491069A JP 25054187 A JP25054187 A JP 25054187A JP 25054187 A JP25054187 A JP 25054187A JP S6491069 A JPS6491069 A JP S6491069A
Authority
JP
Japan
Prior art keywords
section
control circuit
measuring device
interface section
analysis function
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP25054187A
Other languages
Japanese (ja)
Other versions
JPH07117565B2 (en
Inventor
Koji Ashizawa
Yasuyuki Ikeda
Tatsumare Okamoto
Nobuatsu Terao
Yoshio Tsunoda
Akio Miura
Hiroshi Hara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Central Research Institute of Electric Power Industry
Mitsubishi Cable Industries Ltd
Tokyo Electric Power Co Holdings Inc
Original Assignee
Central Research Institute of Electric Power Industry
Mitsubishi Cable Industries Ltd
Tokyo Electric Power Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Central Research Institute of Electric Power Industry, Mitsubishi Cable Industries Ltd, Tokyo Electric Power Co Inc filed Critical Central Research Institute of Electric Power Industry
Priority to JP25054187A priority Critical patent/JPH07117565B2/en
Publication of JPS6491069A publication Critical patent/JPS6491069A/en
Publication of JPH07117565B2 publication Critical patent/JPH07117565B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Relating To Insulation (AREA)
  • Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)

Abstract

PURPOSE:To forecast timing of a dielectric breakdown as well, by connecting a voltage analysis function section and an S plane analysis function section to an output terminal of an automatic voltage adjustor while a control circuit or an interface section is connected to another insulation test measuring device. CONSTITUTION:A control circuit 1 is connected to a terminal 2 for input and output, an interface section 3 and an S plane analysis function section 4 to enable mutual data communication. The interface section 3 is also connected to an automatic voltage adjustor 5 and a voltage-charge analysis measuring device section 6 to enable bi-directional data communication. Moreover, the control circuit 1 or the interface section 3 is made connectable to another insulation measuring device 11. In this manner, this realizes a reduction in testing time and a labor saving for input with a better operability thereby facilitating the processing of a test data and evaluation of the state of insulation while permitting the forecasting of timing of a dielectric breakdown and integration with another insulation tester.
JP25054187A 1987-09-30 1987-09-30 Insulation test equipment by partial discharge method Expired - Lifetime JPH07117565B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25054187A JPH07117565B2 (en) 1987-09-30 1987-09-30 Insulation test equipment by partial discharge method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25054187A JPH07117565B2 (en) 1987-09-30 1987-09-30 Insulation test equipment by partial discharge method

Publications (2)

Publication Number Publication Date
JPS6491069A true JPS6491069A (en) 1989-04-10
JPH07117565B2 JPH07117565B2 (en) 1995-12-18

Family

ID=17209443

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25054187A Expired - Lifetime JPH07117565B2 (en) 1987-09-30 1987-09-30 Insulation test equipment by partial discharge method

Country Status (1)

Country Link
JP (1) JPH07117565B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5028650A (en) * 1988-01-27 1991-07-02 W. R. Grace & Co.-Conn. Boron nitride sheets
JP2015169474A (en) * 2014-03-05 2015-09-28 三菱電線工業株式会社 Partial discharge measuring device
CN111781407A (en) * 2020-07-03 2020-10-16 四川中迪电力工程有限公司 Special operating platform for extra-high voltage transformer partial discharge test capable of being adjusted in multiple directions

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6242070A (en) * 1985-08-19 1987-02-24 Nippon Kokan Kk <Nkk> Insulation deterioration degree diagnosing device
JPS6255571A (en) * 1985-09-03 1987-03-11 Hitoshi Terase Automatic insulation property analysis device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6242070A (en) * 1985-08-19 1987-02-24 Nippon Kokan Kk <Nkk> Insulation deterioration degree diagnosing device
JPS6255571A (en) * 1985-09-03 1987-03-11 Hitoshi Terase Automatic insulation property analysis device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5028650A (en) * 1988-01-27 1991-07-02 W. R. Grace & Co.-Conn. Boron nitride sheets
JP2015169474A (en) * 2014-03-05 2015-09-28 三菱電線工業株式会社 Partial discharge measuring device
CN111781407A (en) * 2020-07-03 2020-10-16 四川中迪电力工程有限公司 Special operating platform for extra-high voltage transformer partial discharge test capable of being adjusted in multiple directions
CN111781407B (en) * 2020-07-03 2022-11-01 四川中迪电力工程有限公司 Special operating platform for extra-high voltage transformer partial discharge test capable of being adjusted in multiple directions

Also Published As

Publication number Publication date
JPH07117565B2 (en) 1995-12-18

Similar Documents

Publication Publication Date Title
SE8601959L (en) METHOD AND APPARATUS FOR TESTING COMMUNICATION SYSTEMS
KR880700275A (en) Electronic device testing methods and integrated circuit testers for testing
JPS6491069A (en) Insulation tester by partial discharge method
EP0311376A3 (en) Automatic short circuit tester control device
EP0152904A3 (en) Method and device for the testing of, and/or the measuring at electrically conductive test pieces
JPS6454379A (en) Probe substrate for measuring semiconductor integrated circuit
JPS6491070A (en) Insulation tester
JPS5710467A (en) Terminal device for testing appliance
JPS6491072A (en) Insulation tester by ac method
JPS6443773A (en) Propagation delay testing method for logic circuit
JPS57154070A (en) Automatic testing apparatus for sequence control device
KR930006962B1 (en) Semiconductor testing method
JPS6484166A (en) Testing method for electronic circuit module
JPS6415675A (en) Circuit for testing integrated circuit
KR930018426A (en) Curing Screening Device
JPS57111714A (en) Integrated circuit
JPS55135760A (en) Connector for wiring test unit
JPS578411A (en) Testing system
JPS5760865A (en) Integrated circuit device
JPS6447975A (en) Testing of integrated circuit
JPS56106166A (en) Method for measuring sustaining voltage
JPS5683045A (en) Wafer probe
JPS641976A (en) Characteristic measuring apparatus for discharge lamp stabilizer
JPS5715526A (en) Signal detecting circuit
JPS57211076A (en) Semiconductor integrated circuit device

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term
FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20071218

Year of fee payment: 12